JPH0260013B2 - - Google Patents
Info
- Publication number
- JPH0260013B2 JPH0260013B2 JP60231467A JP23146785A JPH0260013B2 JP H0260013 B2 JPH0260013 B2 JP H0260013B2 JP 60231467 A JP60231467 A JP 60231467A JP 23146785 A JP23146785 A JP 23146785A JP H0260013 B2 JPH0260013 B2 JP H0260013B2
- Authority
- JP
- Japan
- Prior art keywords
- error
- bit
- bits
- word
- syndrome
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 208000011580 syndromic disease Diseases 0.000 claims abstract description 77
- 238000000034 method Methods 0.000 claims abstract description 16
- 238000012545 processing Methods 0.000 claims description 3
- 238000012937 correction Methods 0.000 abstract description 23
- 230000000295 complement effect Effects 0.000 description 7
- 238000010586 diagram Methods 0.000 description 4
- 239000011159 matrix material Substances 0.000 description 3
- 238000001514 detection method Methods 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 230000006870 function Effects 0.000 description 2
- 238000012827 research and development Methods 0.000 description 2
- 238000012360 testing method Methods 0.000 description 2
- 230000003213 activating effect Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000007689 inspection Methods 0.000 description 1
- 230000007334 memory performance Effects 0.000 description 1
- 238000005201 scrubbing Methods 0.000 description 1
- 238000012546 transfer Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/70—Masking faults in memories by using spares or by reconfiguring
- G11C29/88—Masking faults in memories by using spares or by reconfiguring with partially good memories
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/07—Responding to the occurrence of a fault, e.g. fault tolerance
- G06F11/08—Error detection or correction by redundancy in data representation, e.g. by using checking codes
- G06F11/10—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's
- G06F11/1008—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's in individual solid state devices
- G06F11/1012—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's in individual solid state devices using codes or arrangements adapted for a specific type of error
- G06F11/1024—Identification of the type of error
Landscapes
- Engineering & Computer Science (AREA)
- Theoretical Computer Science (AREA)
- Quality & Reliability (AREA)
- Physics & Mathematics (AREA)
- General Engineering & Computer Science (AREA)
- General Physics & Mathematics (AREA)
- Detection And Correction Of Errors (AREA)
- Techniques For Improving Reliability Of Storages (AREA)
- Error Detection And Correction (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
EP84430046A EP0186719B1 (en) | 1984-12-28 | 1984-12-28 | Device for correcting errors in memories |
EP84430046.7 | 1984-12-28 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS61157959A JPS61157959A (ja) | 1986-07-17 |
JPH0260013B2 true JPH0260013B2 (US07754267-20100713-C00017.png) | 1990-12-14 |
Family
ID=8192957
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP60231467A Granted JPS61157959A (ja) | 1984-12-28 | 1985-10-18 | メモリにおけるエラ−訂正方法 |
Country Status (4)
Country | Link |
---|---|
US (1) | US4712216A (US07754267-20100713-C00017.png) |
EP (1) | EP0186719B1 (US07754267-20100713-C00017.png) |
JP (1) | JPS61157959A (US07754267-20100713-C00017.png) |
DE (1) | DE3482509D1 (US07754267-20100713-C00017.png) |
Families Citing this family (28)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4937831A (en) * | 1986-03-05 | 1990-06-26 | Canon Kabushiki Kaisha | Data processing apparatus for a camera |
JPS62251949A (ja) * | 1986-04-25 | 1987-11-02 | Mitsubishi Electric Corp | 記憶装置の誤り訂正方法 |
US4852100A (en) * | 1986-10-17 | 1989-07-25 | Amdahl Corporation | Error detection and correction scheme for main storage unit |
JPS63200239A (ja) * | 1987-02-14 | 1988-08-18 | Victor Co Of Japan Ltd | 誤り訂正方式 |
EP0339166B1 (en) * | 1988-04-29 | 1993-07-07 | International Business Machines Corporation | Extended errors correcting device having single package error correcting and double package error detecting codes |
US4964130A (en) * | 1988-12-21 | 1990-10-16 | Bull Hn Information Systems Inc. | System for determining status of errors in a memory subsystem |
US5014273A (en) * | 1989-01-27 | 1991-05-07 | Digital Equipment Corporation | Bad data algorithm |
US5058115A (en) * | 1989-03-10 | 1991-10-15 | International Business Machines Corp. | Fault tolerant computer memory systems and components employing dual level error correction and detection with lock-up feature |
CA2002361C (en) * | 1989-03-10 | 1993-12-21 | Robert M. Blake | Fault tolerant computer memory systems and components employing dual level error correction and detection with disablement feature |
ATE127597T1 (de) * | 1990-04-27 | 1995-09-15 | Siemens Ag | Verfahren zum testen einer kleinsten adressierbaren einheit eines ram's auf über einer bestimmten zahl liegende bitfehler. |
AU660011B2 (en) * | 1991-04-26 | 1995-06-08 | Nec Corporation | Method and system for fault coverage testing memory |
US5313475A (en) * | 1991-10-31 | 1994-05-17 | International Business Machines Corporation | ECC function with self-contained high performance partial write or read/modify/write and parity look-ahead interface scheme |
US5539754A (en) * | 1992-10-05 | 1996-07-23 | Hewlett-Packard Company | Method and circuitry for generating syndrome bits within an error correction and detection circuit |
US5771541A (en) * | 1994-11-03 | 1998-06-30 | MTM--Modern Textile Machines Ltd. | Apparatus for cleaning fibers |
US5822339A (en) * | 1996-05-30 | 1998-10-13 | Rockwell International | Data decoder and method to correct inversions or phase ambiguity for M-ary transmitted data |
US6255970B1 (en) * | 1997-10-10 | 2001-07-03 | Photobit Corporation | Correction of missing codes nonlinearity in A to D converters |
US6519735B1 (en) * | 1998-12-22 | 2003-02-11 | Intel Corporation | Method and apparatus for detecting errors in data output from memory and a device failure in the memory |
JP2005537057A (ja) | 2002-08-29 | 2005-12-08 | ベクトン・ディキンソン・アンド・カンパニー | 微小突起物アレイ及びそれを用いて物質を組織内に送達する方法 |
US7048815B2 (en) * | 2002-11-08 | 2006-05-23 | Ues, Inc. | Method of making a high strength aluminum alloy composition |
US7272773B2 (en) * | 2003-04-17 | 2007-09-18 | International Business Machines Corporation | Cache directory array recovery mechanism to support special ECC stuck bit matrix |
US7430167B2 (en) * | 2003-09-18 | 2008-09-30 | International Business Machines Corporation | Method and system to enable an adaptive load balancing in a parallel packet switch |
US7328304B2 (en) * | 2004-02-27 | 2008-02-05 | Intel Corporation | Interface for a block addressable mass storage system |
JP4889343B2 (ja) * | 2006-03-31 | 2012-03-07 | パナソニック株式会社 | 半導体記憶装置 |
US9251882B2 (en) | 2011-09-16 | 2016-02-02 | Avalanche Technology, Inc. | Magnetic random access memory with dynamic random access memory (DRAM)-like interface |
US9658780B2 (en) | 2011-09-16 | 2017-05-23 | Avalanche Technology, Inc. | Magnetic random access memory with dynamic random access memory (DRAM)-like interface |
US8751905B2 (en) | 2011-09-16 | 2014-06-10 | Avalanche Technology, Inc. | Memory with on-chip error correction |
TWI486961B (zh) * | 2013-01-16 | 2015-06-01 | Univ Nat Taiwan Science Tech | 非揮發性記憶體的故障遮蔽方法 |
JP2018074545A (ja) * | 2016-11-04 | 2018-05-10 | 富士通株式会社 | データ処理システム及びデータ処理装置 |
Family Cites Families (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3623155A (en) * | 1969-12-24 | 1971-11-23 | Ibm | Optimum apparatus and method for check bit generation and error detection, location and correction |
US4037091A (en) * | 1976-04-05 | 1977-07-19 | Bell Telephone Laboratories, Incorporated | Error correction circuit utilizing multiple parity bits |
JPS5381036A (en) * | 1976-12-27 | 1978-07-18 | Hitachi Ltd | Error correction-detection system |
JPS592057B2 (ja) * | 1979-02-07 | 1984-01-17 | 株式会社日立製作所 | エラ−訂正・検出方式 |
US4319357A (en) * | 1979-12-14 | 1982-03-09 | International Business Machines Corp. | Double error correction using single error correcting code |
US4334309A (en) * | 1980-06-30 | 1982-06-08 | International Business Machines Corporation | Error correcting code system |
US4417339A (en) * | 1981-06-22 | 1983-11-22 | Burroughs Corporation | Fault tolerant error correction circuit |
EP0136587B1 (en) * | 1983-09-06 | 1991-04-17 | Kabushiki Kaisha Toshiba | Error correction circuit |
US4604751A (en) * | 1984-06-29 | 1986-08-05 | International Business Machines Corporation | Error logging memory system for avoiding miscorrection of triple errors |
-
1984
- 1984-12-28 DE DE8484430046T patent/DE3482509D1/de not_active Expired - Fee Related
- 1984-12-28 EP EP84430046A patent/EP0186719B1/en not_active Expired
-
1985
- 1985-10-18 JP JP60231467A patent/JPS61157959A/ja active Granted
- 1985-10-18 US US06/789,195 patent/US4712216A/en not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
US4712216A (en) | 1987-12-08 |
EP0186719A1 (en) | 1986-07-09 |
JPS61157959A (ja) | 1986-07-17 |
EP0186719B1 (en) | 1990-06-13 |
DE3482509D1 (de) | 1990-07-19 |
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