JPH0253723B2 - - Google Patents

Info

Publication number
JPH0253723B2
JPH0253723B2 JP18423584A JP18423584A JPH0253723B2 JP H0253723 B2 JPH0253723 B2 JP H0253723B2 JP 18423584 A JP18423584 A JP 18423584A JP 18423584 A JP18423584 A JP 18423584A JP H0253723 B2 JPH0253723 B2 JP H0253723B2
Authority
JP
Japan
Prior art keywords
measured
plating layer
ray tube
rays
ray
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP18423584A
Other languages
English (en)
Japanese (ja)
Other versions
JPS6161003A (ja
Inventor
Hiroshi Ishijima
Susumu Hiradate
Yutaka Ichinomya
Minoru Handa
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Seiko Instruments Inc
Original Assignee
Seiko Instruments Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Seiko Instruments Inc filed Critical Seiko Instruments Inc
Priority to JP18423584A priority Critical patent/JPS6161003A/ja
Priority to DE19853531460 priority patent/DE3531460A1/de
Publication of JPS6161003A publication Critical patent/JPS6161003A/ja
Publication of JPH0253723B2 publication Critical patent/JPH0253723B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B15/00—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons
    • G01B15/02—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring thickness

Landscapes

  • Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • General Physics & Mathematics (AREA)
  • Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
JP18423584A 1984-09-03 1984-09-03 Ｘ線によるメツキ層の厚さ測定方法、及び測定装置 Granted JPS6161003A (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP18423584A JPS6161003A (ja) 1984-09-03 1984-09-03 Ｘ線によるメツキ層の厚さ測定方法、及び測定装置
DE19853531460 DE3531460A1 (de) 1984-09-03 1985-09-03 Verfahren und vorrichtung zum messen der dicke einer plattierten schicht

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP18423584A JPS6161003A (ja) 1984-09-03 1984-09-03 Ｘ線によるメツキ層の厚さ測定方法、及び測定装置

Publications (2)

Publication Number Publication Date
JPS6161003A JPS6161003A (ja) 1986-03-28
JPH0253723B2 true JPH0253723B2 (https=) 1990-11-19

Family

ID=16149738

Family Applications (1)

Application Number Title Priority Date Filing Date
JP18423584A Granted JPS6161003A (ja) 1984-09-03 1984-09-03 Ｘ線によるメツキ層の厚さ測定方法、及び測定装置

Country Status (2)

Country Link
JP (1) JPS6161003A (https=)
DE (1) DE3531460A1 (https=)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB8725741D0 (en) * 1987-11-03 1987-12-09 Secretary Trade Ind Brit Control of pyrometallurgical processes
US5754621A (en) * 1993-03-15 1998-05-19 Hitachi, Ltd. X-ray inspection method and apparatus, prepreg inspecting method, and method for fabricating multi-layer printed circuit board
JPH10267628A (ja) * 1997-01-23 1998-10-09 Hitachi Ltd ３次元形状検出方法およびその装置並びに基板の製造方法
JP2015158398A (ja) * 2014-02-24 2015-09-03 セイコーエプソン株式会社 実装基板
CN114047213A (zh) * 2021-11-17 2022-02-15 马鞍山钢铁股份有限公司 一种x射线荧光法测定锌层重量的方法

Also Published As

Publication number Publication date
JPS6161003A (ja) 1986-03-28
DE3531460A1 (de) 1986-03-13

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