JPH0249572Y2 - - Google Patents
Info
- Publication number
- JPH0249572Y2 JPH0249572Y2 JP17653683U JP17653683U JPH0249572Y2 JP H0249572 Y2 JPH0249572 Y2 JP H0249572Y2 JP 17653683 U JP17653683 U JP 17653683U JP 17653683 U JP17653683 U JP 17653683U JP H0249572 Y2 JPH0249572 Y2 JP H0249572Y2
- Authority
- JP
- Japan
- Prior art keywords
- adapter
- basic
- probing pins
- grid
- diameter
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 238000012360 testing method Methods 0.000 claims description 15
- 239000011159 matrix material Substances 0.000 claims description 7
- 239000000758 substrate Substances 0.000 description 4
- 230000006835 compression Effects 0.000 description 3
- 238000007906 compression Methods 0.000 description 3
- 238000009413 insulation Methods 0.000 description 3
- 238000003780 insertion Methods 0.000 description 1
- 230000037431 insertion Effects 0.000 description 1
- 238000005476 soldering Methods 0.000 description 1
Landscapes
- Measuring Leads Or Probes (AREA)
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP17653683U JPS6083969U (ja) | 1983-11-15 | 1983-11-15 | アダプタ |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP17653683U JPS6083969U (ja) | 1983-11-15 | 1983-11-15 | アダプタ |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS6083969U JPS6083969U (ja) | 1985-06-10 |
JPH0249572Y2 true JPH0249572Y2 (enrdf_load_stackoverflow) | 1990-12-27 |
Family
ID=30383788
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP17653683U Granted JPS6083969U (ja) | 1983-11-15 | 1983-11-15 | アダプタ |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS6083969U (enrdf_load_stackoverflow) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2002043721A (ja) * | 2000-07-28 | 2002-02-08 | Sadao Goto | プリント基板の検査方法と検査装置 |
-
1983
- 1983-11-15 JP JP17653683U patent/JPS6083969U/ja active Granted
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2002043721A (ja) * | 2000-07-28 | 2002-02-08 | Sadao Goto | プリント基板の検査方法と検査装置 |
Also Published As
Publication number | Publication date |
---|---|
JPS6083969U (ja) | 1985-06-10 |
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