JPH0249520B2 - - Google Patents

Info

Publication number
JPH0249520B2
JPH0249520B2 JP59041067A JP4106784A JPH0249520B2 JP H0249520 B2 JPH0249520 B2 JP H0249520B2 JP 59041067 A JP59041067 A JP 59041067A JP 4106784 A JP4106784 A JP 4106784A JP H0249520 B2 JPH0249520 B2 JP H0249520B2
Authority
JP
Japan
Prior art keywords
pattern
write
data
pattern data
memories
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP59041067A
Other languages
English (en)
Japanese (ja)
Other versions
JPS60185300A (ja
Inventor
Shigehiro Kimura
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Advantest Corp
Original Assignee
Advantest Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Advantest Corp filed Critical Advantest Corp
Priority to JP59041067A priority Critical patent/JPS60185300A/ja
Publication of JPS60185300A publication Critical patent/JPS60185300A/ja
Publication of JPH0249520B2 publication Critical patent/JPH0249520B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/56—External testing equipment for static stores, e.g. automatic test equipment [ATE]; Interfaces therefor
JP59041067A 1984-03-02 1984-03-02 パタ−ンデ−タ転送装置 Granted JPS60185300A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP59041067A JPS60185300A (ja) 1984-03-02 1984-03-02 パタ−ンデ−タ転送装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP59041067A JPS60185300A (ja) 1984-03-02 1984-03-02 パタ−ンデ−タ転送装置

Publications (2)

Publication Number Publication Date
JPS60185300A JPS60185300A (ja) 1985-09-20
JPH0249520B2 true JPH0249520B2 (fr) 1990-10-30

Family

ID=12598089

Family Applications (1)

Application Number Title Priority Date Filing Date
JP59041067A Granted JPS60185300A (ja) 1984-03-02 1984-03-02 パタ−ンデ−タ転送装置

Country Status (1)

Country Link
JP (1) JPS60185300A (fr)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0541524U (ja) * 1991-11-11 1993-06-08 真弓 山本 ナプキン

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3820006B2 (ja) * 1997-09-19 2006-09-13 株式会社ルネサステクノロジ 半導体装置
JP2006294104A (ja) * 2005-04-08 2006-10-26 Yokogawa Electric Corp デバイス試験装置およびデバイス試験方法

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0541524U (ja) * 1991-11-11 1993-06-08 真弓 山本 ナプキン

Also Published As

Publication number Publication date
JPS60185300A (ja) 1985-09-20

Similar Documents

Publication Publication Date Title
US4680733A (en) Device for serializing/deserializing bit configurations of variable length
JPS58108475A (ja) テストベクトルのシーケンスを発生する装置
EP0805458B1 (fr) Un testeur de circuit ou carte électronique avec séquences de données comprimées
US4969126A (en) Semiconductor memory device having serial addressing and operating method thereof
JPH097393A (ja) マイクロエレクトロニック集積回路のためのメモリ試験装置
JPH0480350B2 (fr)
US4759021A (en) Test pattern generator
US4388701A (en) Recirculating loop memory array having a shift register buffer for parallel fetching and storing
JPS5847741B2 (ja) パタ−ン発生器
US6851078B2 (en) Data transfer apparatus, memory device testing apparatus, data transfer method, and memory device testing method
JPH10112199A (ja) メモリ試験装置
US6490700B1 (en) Memory device testing apparatus and data selection circuit
KR100208043B1 (ko) 시험 패턴 발생기
JPH0249520B2 (fr)
KR910014825A (ko) 데이타 처리 시스템 및 메모리 어레이 테스팅 처리 방법
KR19990067519A (ko) 메모리테스트회로
US6202187B1 (en) Pattern generator for use in a semiconductor test device
JP2000065904A (ja) 半導体試験装置
JPH0411959B2 (fr)
JPH0672910B2 (ja) テストパタ−ンメモリ回路
JP2824853B2 (ja) パターンデータ書込み方式
KR0143131B1 (ko) 램 테스트를 위한 최적 데이타 발생기
JPS6153665B2 (fr)
JPS593966A (ja) 半導体記憶装置試験方法
JPH0668539B2 (ja) 半導体メモリ試験装置