JPH0235576A - 配線パターン欠陥検出方法及び装置 - Google Patents
配線パターン欠陥検出方法及び装置Info
- Publication number
- JPH0235576A JPH0235576A JP1127793A JP12779389A JPH0235576A JP H0235576 A JPH0235576 A JP H0235576A JP 1127793 A JP1127793 A JP 1127793A JP 12779389 A JP12779389 A JP 12779389A JP H0235576 A JPH0235576 A JP H0235576A
- Authority
- JP
- Japan
- Prior art keywords
- pattern
- data
- connection data
- pattern defect
- defect detection
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Image Processing (AREA)
- Image Analysis (AREA)
- Length Measuring Devices By Optical Means (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1127793A JPH0235576A (ja) | 1989-05-23 | 1989-05-23 | 配線パターン欠陥検出方法及び装置 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1127793A JPH0235576A (ja) | 1989-05-23 | 1989-05-23 | 配線パターン欠陥検出方法及び装置 |
Related Parent Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP58065659A Division JPS59192945A (ja) | 1983-04-15 | 1983-04-15 | 配線パターン欠陥検出方法及びその装置 |
Related Child Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2093036A Division JPH02297198A (ja) | 1990-04-10 | 1990-04-10 | 配線パターン欠陥検出方法及び装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH0235576A true JPH0235576A (ja) | 1990-02-06 |
| JPH0577112B2 JPH0577112B2 (cs) | 1993-10-26 |
Family
ID=14968818
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1127793A Granted JPH0235576A (ja) | 1989-05-23 | 1989-05-23 | 配線パターン欠陥検出方法及び装置 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0235576A (cs) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2009005095A (ja) * | 2007-06-21 | 2009-01-08 | Mitsubishi Electric Corp | 監視カメラシステム |
Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS54114130A (en) * | 1978-02-27 | 1979-09-06 | Nec Home Electronics Ltd | Mark quality deciding method |
| JPS57106125A (en) * | 1980-12-24 | 1982-07-01 | Fujitsu Ltd | Inspecting method and device for pattern |
| JPS58179343A (ja) * | 1982-04-14 | 1983-10-20 | Nec Corp | 図形検査方法 |
-
1989
- 1989-05-23 JP JP1127793A patent/JPH0235576A/ja active Granted
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS54114130A (en) * | 1978-02-27 | 1979-09-06 | Nec Home Electronics Ltd | Mark quality deciding method |
| JPS57106125A (en) * | 1980-12-24 | 1982-07-01 | Fujitsu Ltd | Inspecting method and device for pattern |
| JPS58179343A (ja) * | 1982-04-14 | 1983-10-20 | Nec Corp | 図形検査方法 |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2009005095A (ja) * | 2007-06-21 | 2009-01-08 | Mitsubishi Electric Corp | 監視カメラシステム |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0577112B2 (cs) | 1993-10-26 |
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