JPS54114130A - Mark quality deciding method - Google Patents

Mark quality deciding method

Info

Publication number
JPS54114130A
JPS54114130A JP2242978A JP2242978A JPS54114130A JP S54114130 A JPS54114130 A JP S54114130A JP 2242978 A JP2242978 A JP 2242978A JP 2242978 A JP2242978 A JP 2242978A JP S54114130 A JPS54114130 A JP S54114130A
Authority
JP
Japan
Prior art keywords
mark
pattern
matching
patterns
decided
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2242978A
Other languages
Japanese (ja)
Inventor
Fumio Nakagawa
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Home Electronics Ltd
NEC Corp
Original Assignee
NEC Home Electronics Ltd
Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Home Electronics Ltd, Nippon Electric Co Ltd filed Critical NEC Home Electronics Ltd
Priority to JP2242978A priority Critical patent/JPS54114130A/en
Publication of JPS54114130A publication Critical patent/JPS54114130A/en
Pending legal-status Critical Current

Links

Landscapes

  • Character Input (AREA)
  • Image Processing (AREA)
  • Character Discrimination (AREA)
  • Image Analysis (AREA)

Abstract

PURPOSE: To simplify the circuit constitution as well as to increase the accuracy by using the matching pattern of both the thin and thick patterns as the reference pattern for decision of the quality.
CONSTITUTION: The thin pattern (a) and thick pattern (b) are memorized previously in the computer, and mark X and its periphery Y are scanned via the TV camera system. Then the video signals are fed into the computer to secure the matching between patterns (a) and (b). First, the matching is secured between pattern (a) and mark X to be decided to identify the gradation of mark X caused by the brightness levels at the area of mark X as well as the mark break. While the matching is obtained between pattern (b) and mark X to identify the excessive thinness or thickness of the line, the blur and the ink splash at the periphery of mark X. Thus, nondefective patterns (a) and (b) are decided as good products finally.
COPYRIGHT: (C)1979,JPO&Japio
JP2242978A 1978-02-27 1978-02-27 Mark quality deciding method Pending JPS54114130A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2242978A JPS54114130A (en) 1978-02-27 1978-02-27 Mark quality deciding method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2242978A JPS54114130A (en) 1978-02-27 1978-02-27 Mark quality deciding method

Publications (1)

Publication Number Publication Date
JPS54114130A true JPS54114130A (en) 1979-09-06

Family

ID=12082439

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2242978A Pending JPS54114130A (en) 1978-02-27 1978-02-27 Mark quality deciding method

Country Status (1)

Country Link
JP (1) JPS54114130A (en)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61161583A (en) * 1985-01-09 1986-07-22 Matsushita Electric Ind Co Ltd Pattern recognizing device
JPS62140185A (en) * 1985-12-16 1987-06-23 Edetsuku:Kk Method and apparatus for deciding validity/invalidity of work
JPS62202289A (en) * 1986-02-04 1987-09-05 Fujitsu Ltd Inspection method for display pattern
JPS62262192A (en) * 1986-05-07 1987-11-14 Datsuku Eng Kk Mark inspection method
JPH0235576A (en) * 1989-05-23 1990-02-06 Hitachi Ltd Detection of pattern fault

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5242025A (en) * 1975-09-29 1977-04-01 Fujitsu Ltd Mask matching letter recognition system

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5242025A (en) * 1975-09-29 1977-04-01 Fujitsu Ltd Mask matching letter recognition system

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61161583A (en) * 1985-01-09 1986-07-22 Matsushita Electric Ind Co Ltd Pattern recognizing device
JPS62140185A (en) * 1985-12-16 1987-06-23 Edetsuku:Kk Method and apparatus for deciding validity/invalidity of work
JPS62202289A (en) * 1986-02-04 1987-09-05 Fujitsu Ltd Inspection method for display pattern
JPS62262192A (en) * 1986-05-07 1987-11-14 Datsuku Eng Kk Mark inspection method
JPH0235576A (en) * 1989-05-23 1990-02-06 Hitachi Ltd Detection of pattern fault
JPH0577112B2 (en) * 1989-05-23 1993-10-26 Hitachi Ltd

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