JPS54114130A - Mark quality deciding method - Google Patents
Mark quality deciding methodInfo
- Publication number
- JPS54114130A JPS54114130A JP2242978A JP2242978A JPS54114130A JP S54114130 A JPS54114130 A JP S54114130A JP 2242978 A JP2242978 A JP 2242978A JP 2242978 A JP2242978 A JP 2242978A JP S54114130 A JPS54114130 A JP S54114130A
- Authority
- JP
- Japan
- Prior art keywords
- mark
- pattern
- matching
- patterns
- decided
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Image Analysis (AREA)
- Character Input (AREA)
- Image Processing (AREA)
- Character Discrimination (AREA)
Abstract
PURPOSE: To simplify the circuit constitution as well as to increase the accuracy by using the matching pattern of both the thin and thick patterns as the reference pattern for decision of the quality.
CONSTITUTION: The thin pattern (a) and thick pattern (b) are memorized previously in the computer, and mark X and its periphery Y are scanned via the TV camera system. Then the video signals are fed into the computer to secure the matching between patterns (a) and (b). First, the matching is secured between pattern (a) and mark X to be decided to identify the gradation of mark X caused by the brightness levels at the area of mark X as well as the mark break. While the matching is obtained between pattern (b) and mark X to identify the excessive thinness or thickness of the line, the blur and the ink splash at the periphery of mark X. Thus, nondefective patterns (a) and (b) are decided as good products finally.
COPYRIGHT: (C)1979,JPO&Japio
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2242978A JPS54114130A (en) | 1978-02-27 | 1978-02-27 | Mark quality deciding method |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2242978A JPS54114130A (en) | 1978-02-27 | 1978-02-27 | Mark quality deciding method |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS54114130A true JPS54114130A (en) | 1979-09-06 |
Family
ID=12082439
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2242978A Pending JPS54114130A (en) | 1978-02-27 | 1978-02-27 | Mark quality deciding method |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS54114130A (en) |
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS61161583A (en) * | 1985-01-09 | 1986-07-22 | Matsushita Electric Ind Co Ltd | Pattern recognizing device |
| JPS62140185A (en) * | 1985-12-16 | 1987-06-23 | Edetsuku:Kk | Method and apparatus for deciding validity/invalidity of work |
| JPS62202289A (en) * | 1986-02-04 | 1987-09-05 | Fujitsu Ltd | Inspection method for display pattern |
| JPS62262192A (en) * | 1986-05-07 | 1987-11-14 | Datsuku Eng Kk | Mark inspection method |
| JPH0235576A (en) * | 1989-05-23 | 1990-02-06 | Hitachi Ltd | Detection of pattern fault |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5242025A (en) * | 1975-09-29 | 1977-04-01 | Fujitsu Ltd | Mask matching letter recognition system |
-
1978
- 1978-02-27 JP JP2242978A patent/JPS54114130A/en active Pending
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5242025A (en) * | 1975-09-29 | 1977-04-01 | Fujitsu Ltd | Mask matching letter recognition system |
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS61161583A (en) * | 1985-01-09 | 1986-07-22 | Matsushita Electric Ind Co Ltd | Pattern recognizing device |
| JPS62140185A (en) * | 1985-12-16 | 1987-06-23 | Edetsuku:Kk | Method and apparatus for deciding validity/invalidity of work |
| JPS62202289A (en) * | 1986-02-04 | 1987-09-05 | Fujitsu Ltd | Inspection method for display pattern |
| JPS62262192A (en) * | 1986-05-07 | 1987-11-14 | Datsuku Eng Kk | Mark inspection method |
| JPH0235576A (en) * | 1989-05-23 | 1990-02-06 | Hitachi Ltd | Detection of pattern fault |
| JPH0577112B2 (en) * | 1989-05-23 | 1993-10-26 | Hitachi Ltd |
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