JPH02262286A - Ic socket - Google Patents

Abstract

PURPOSE:To enhance an inspection efficiency while being free from the output and load of a circuit in the previous step by providing a switch which separates the pin of an IC socket from an insertion terminal at will, and a switch which sets up the power level to be applied to the IC insertion terminal. CONSTITUTION:A switch 1 is provided between the pin 3 of an IC socket and the insertion terminal 4 of the IC socket so that the pin 3 of the IC socket is separated from and/or connected with the insertion terminal 4 of the IC socket at will, and the Hi level and/or the Lo level of the insertion terminal are concurrently set up. In the second place, a switch 2 is provided so that the pin number of a power supply to be applied is designated when the insertion terminal is set up to the Hi level. In this manner, the power supply pin can be selected by means of the kind of a 16 pin MOSIC. By this constitution, the input of an IC can be set up at will while being free from the input/output of a circuit in the previous step, an inspection efficiency can thereby be enhanced with an influence removed on the loading side.

Description

DETAILED DESCRIPTION OF THE INVENTION (Field of Industrial Application) The present invention relates to an IC socket, and more particularly to an IC socket that allows circuit testing regardless of input signals from a circuit preceding the IC.

<Prior Art> Conventionally, IC sockets have been used for electrical performance inspection, defect inspection, and failure analysis of printed circuit boards manufactured using IC sockets, or experimental/prototype modules.

When electrically inspecting a manufactured module, especially when inspecting the middle part of a circuit to which the previous stage circuit is connected, it is often impossible to check subsequent circuits depending on the input signal from the previous stage. . For example, the previous stage output can be used as a control signal, gate signal, or
Such a check is impossible when used as an EN/DIS signal. Conventionally, in such cases, it was necessary to devise a combination of input signals to set the desired conditions, remove the wrapping wire during wrapping, or, if a pattern is occurring, cut the pattern and separate the previous stage circuit. Then, the circuit was tested by externally setting a desired level on the pin of the relevant IC.

(Problems to be Solved by the Invention) As mentioned above, in the past, if a predetermined test could not be performed due to the influence of the output of the previous stage, the IC of the previous stage was removed.
In the case of a 0MO3IC, this method is not practical in many cases because other circuits become open, or even the gates of the circuit to be tested are removed. Other methods include removing wrapping wiring or cutting patterns to separate the output from the previous stage. However, these methods are not only extremely inefficient, but also have drawbacks in terms of reliability.

(Means for Solving the Problems) The IC socket according to the present invention has a pin and an I
Switch means is provided between the C insertion terminals to separate any pin from the IC insertion terminal and to set the level supplied to the IC insertion terminal.

(Example) Next, the present invention will be explained with reference to the drawings.

FIG. 1 is an overview diagram showing one embodiment of the present invention, and is an example of a 16-pin deep IC socket.

16 switches 1 are inserted between the pins of each IC socket and the IC insertion terminal 4.
It has functions such as separating the insertion terminals (setting the insertion terminals open), setting the insertion terminals to Hi level, setting the insertion terminals to Lo level, and connecting between the IC socket pins and the insertion terminals, allowing you to set the desired mode. Set to .

The switch 2 is used to specify the pin number of the power supply to be supplied when setting the insertion terminal level to Hi level.

This is because some 16-pin CMO3ICs have the power pin pin 1 or pin 16, depending on the product.
The power supply pin is switched by switch 2, and the structure is such that it can be used with both types of ICs.

FIG. 2 shows a configuration circuit diagram of switches and the like within the IC socket. In the figure, 5 is the switch 1 in Figure 1.
It is a 4-terminal switch corresponding to , and is provided on all pins. Further, 6 corresponds to the switch 2 in FIG. 1, and is a two-terminal switch for switching whether the power for PULLUP is taken from pin 1 or pin 16, and from the common terminal, each PtJLL UP resistor 7 is connected. is connected to the PULL UP mode terminal of switch 2 via

Next, an example of the use of the IC socket according to the present invention will be explained with reference to FIG.

IC with ICI 1 installed that requires desired input settings
9, and place the IC socket 10 according to the present invention on top of the IC socket 9 for mounting.
Implement CII.

When you want to test a test circuit with a circuit configuration as shown in Figure 4, the gate E input to the gate of IC12 in the figure
The test circuit cannot be inspected unless the N/DIS signal 13 is set to Hi. At such a time, the gate of ICI 1 is removed, and the IC socket according to the present invention is mounted, and an IC is further mounted on it. Here, the count of gate 14 is EN/
By setting the switch connected to the pin of the IC socket to which the DIS signal 12 is connected to Hi level,
Test circuits can be inspected regardless of external signal input settings.

Also, set the input of the above input signal to 0PEN with a switch,
By inputting an external signal using an IC clip or the like, CLOCK can be controlled arbitrarily and a wide range of tests can be performed.

Furthermore, if the output 14 of ICI 2 is at an intermediate level, either the output of IC 12 is faulty or the output circuit is
There are two possibilities: a short circuit. In such a case, you can easily distinguish between the two by setting the output pin of the IC 12 to 0PEN and monitoring the output side circuit.

In the above embodiment, an example of a 16-PIN IC socket was shown, but it is clear that even if the power pins differ depending on the type of IC, such as a 6-bin IC, all can be accommodated by changing the switch settings.

(Effects of the Invention) As explained above, the present invention not only allows the input of the IC to be set arbitrarily without being affected by the input/output of the preceding stage circuit, and allows subsequent inspections to be performed smoothly, but also enables the output of the IC By setting the pin to 0PEN, the influence on the load side can be removed, and it is easy to determine whether there is a problem with the IC itself or a problem with the subsequent circuit (including patterns, etc.). That is,
According to the present invention, setting of desired inspection mode (pattern,
Not only can cutting of wrapping wires, etc., setting of Hi level of IC pins, etc.) be performed easily and efficiently, but also inspection can be performed without damaging the module. Furthermore, depending on the circuit conditions, there were parts that could not be monitored, but by using the present IC soget, this problem was resolved and the reliability and quality were improved.

...Mode setting switch for each pin, 9.IC socket with module mounted, 10.IC socket of the present invention, 11.IC 112 for which input/output is to be set.
...Gate IC213 for controlling the test circuit consisting of counters, flip-flops, etc.
・EN/DIS for controlling the test circuit
(Gate) signal, 14... Test circuit input signal gated with a control signal.

[Brief explanation of drawings]

FIG. 1 is an overview diagram showing an embodiment of the IC socket according to the present invention, FIG. 2 is a configuration diagram of switches in the IC socket according to the present invention, FIG. 3 is a detailed explanatory diagram of the present invention, and FIG. 4 is a diagram showing the implementation of the present invention. FIG. 3 is a diagram showing an example of a test circuit used in the example.

Claims (1)

[Claims] An IC socket characterized in that a switch means is provided between a pin of an IC socket and an IC insertion terminal to separate any pin from the IC insertion terminal and to set a level supplied to the IC insertion terminal.