JPH0222476B2 - - Google Patents
Info
- Publication number
- JPH0222476B2 JPH0222476B2 JP57189353A JP18935382A JPH0222476B2 JP H0222476 B2 JPH0222476 B2 JP H0222476B2 JP 57189353 A JP57189353 A JP 57189353A JP 18935382 A JP18935382 A JP 18935382A JP H0222476 B2 JPH0222476 B2 JP H0222476B2
- Authority
- JP
- Japan
- Prior art keywords
- amplifier
- terminal
- capacitor
- negative input
- input terminal
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 239000003990 capacitor Substances 0.000 claims description 77
- 238000000034 method Methods 0.000 claims description 20
- 238000005070 sampling Methods 0.000 claims description 10
- 230000003071 parasitic effect Effects 0.000 description 16
- 238000010586 diagram Methods 0.000 description 5
- 239000004065 semiconductor Substances 0.000 description 5
- 229910044991 metal oxide Inorganic materials 0.000 description 3
- 150000004706 metal oxides Chemical class 0.000 description 3
- 230000007423 decrease Effects 0.000 description 2
- 230000008859 change Effects 0.000 description 1
- 208000037516 chromosome inversion disease Diseases 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 230000005669 field effect Effects 0.000 description 1
- 230000010354 integration Effects 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000001151 other effect Effects 0.000 description 1
- 230000008569 process Effects 0.000 description 1
- 239000000758 substrate Substances 0.000 description 1
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C27/00—Electric analogue stores, e.g. for storing instantaneous values
- G11C27/02—Sample-and-hold arrangements
- G11C27/024—Sample-and-hold arrangements using a capacitive memory element
- G11C27/026—Sample-and-hold arrangements using a capacitive memory element associated with an amplifier
Landscapes
- Amplifiers (AREA)
- Analogue/Digital Conversion (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US06/316,453 US4439693A (en) | 1981-10-30 | 1981-10-30 | Sample and hold circuit with improved offset compensation |
US316453 | 1981-10-30 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5885998A JPS5885998A (ja) | 1983-05-23 |
JPH0222476B2 true JPH0222476B2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) | 1990-05-18 |
Family
ID=23229113
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP57189353A Granted JPS5885998A (ja) | 1981-10-30 | 1982-10-29 | サンプルアンドホ−ルド回路およびスイツチコンデンサ積分回路およびサンプルアンドホ−ルド回路の自動ゼロ調節方法 |
Country Status (4)
Families Citing this family (55)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5979496A (ja) * | 1982-10-29 | 1984-05-08 | Nec Corp | サンプルド・デ−タ回路 |
JPS6081685A (ja) * | 1983-10-11 | 1985-05-09 | Toshiba Corp | オ−ト・ゼロ積分器 |
JPS60154399A (ja) * | 1984-01-24 | 1985-08-14 | Nippon Telegr & Teleph Corp <Ntt> | サンプルホ−ルド回路 |
US4587443A (en) * | 1984-08-27 | 1986-05-06 | Signetics Corporation | Auto-zero sample and hold circuit |
US4642489A (en) * | 1984-10-03 | 1987-02-10 | National Semiconductor Corporation | Sampled data amplitude linear phase detector |
US4786831A (en) * | 1984-12-17 | 1988-11-22 | Hughes Aircraft Company | Integrating capacitively coupled transimpedance amplifier |
US4978872A (en) * | 1984-12-17 | 1990-12-18 | Hughes Aircraft Company | Integrating capactively coupled transimpedance amplifier |
US4565971A (en) * | 1985-01-28 | 1986-01-21 | Motorola, Inc. | Parasitic insensitive auto-zeroed operational amplifier |
CA1227247A (en) * | 1985-02-05 | 1987-09-22 | Thomas M. Dauphinee | Liquid conductivity measuring circuit |
NL8502071A (nl) * | 1985-07-18 | 1987-02-16 | Philips Nv | Vermenigvuldigschakeling van het geschakelde capaciteiten type. |
US4714843A (en) * | 1985-08-30 | 1987-12-22 | Thomson Components-Mostek Corporation | Semiconductor chip power supply monitor circuit arrangement |
AT386991B (de) * | 1986-06-11 | 1988-11-10 | Marek Jiri | Kapazitiver naeherungsgeber fuer kraftfahrzeuge |
US4691125A (en) * | 1986-10-03 | 1987-09-01 | Motorola, Inc. | One hundred percent duty cycle sample-and-hold circuit |
US4804863A (en) * | 1986-11-12 | 1989-02-14 | Crystal Semiconductor Corporation | Method and circuitry for generating reference voltages |
US4749953A (en) * | 1986-12-24 | 1988-06-07 | Zdzislaw Gulczynski | Operational amplifier or comparator circuit with minimized offset voltage and drift |
US4794333A (en) * | 1987-02-04 | 1988-12-27 | General Electric Company | Continuous switched-capacitor dual slope watthour meter circuit with charge injection offset compensation |
US4794247A (en) * | 1987-09-18 | 1988-12-27 | Santa Barbara Research Center | Read-out amplifier for photovoltaic detector |
US4948992A (en) * | 1988-10-31 | 1990-08-14 | International Business Machines Corporation | Static method to negate offset voltages in CMOS operational amplifiers |
JPH0334628A (ja) * | 1989-06-30 | 1991-02-14 | Yokogawa Electric Corp | オーバーサンプリングa/d変換器 |
US5027003A (en) * | 1989-12-29 | 1991-06-25 | Texas Instruments Incorporated | Read/write switching circuit |
US5142284A (en) * | 1990-04-25 | 1992-08-25 | Tektronix, Inc. | Sample and hold with intermediate reset voltage outside of the magnitude range of the input |
US5111072A (en) * | 1990-08-29 | 1992-05-05 | Ncr Corporation | Sample-and-hold switch with low on resistance and reduced charge injection |
US5258664A (en) * | 1991-07-05 | 1993-11-02 | Silicon Systems, Inc. | Operational amplifier with self contained sample and hold and auto zero |
JP3359046B2 (ja) * | 1991-11-29 | 2002-12-24 | キヤノン株式会社 | 音声出力装置 |
NL9200327A (nl) * | 1992-02-21 | 1993-09-16 | Sierra Semiconductor Bv | Offset-gecompenseerde bemonsterinrichting en werkwijze voor de bediening daarvan. |
JPH0645875A (ja) * | 1992-07-24 | 1994-02-18 | Nec Corp | スイッチトキャパシタ回路 |
GB9218987D0 (en) * | 1992-09-08 | 1992-10-21 | Fujitsu Ltd | Voltage storage circuits |
US5479130A (en) * | 1994-02-15 | 1995-12-26 | Analog Devices, Inc. | Auto-zero switched-capacitor integrator |
US5600322A (en) * | 1994-04-29 | 1997-02-04 | Analog Devices, Inc. | Low-voltage CMOS analog-to-digital converter |
US5600275A (en) * | 1994-04-29 | 1997-02-04 | Analog Devices, Inc. | Low-voltage CMOS comparator with offset cancellation |
WO1995030279A1 (en) * | 1994-04-29 | 1995-11-09 | Analog Devices, Inc. | Charge redistribution analog-to-digital converter with system calibration |
US5617093A (en) * | 1994-09-30 | 1997-04-01 | Imp, Inc. | Switched capacitor analog circuits with low input capacitance |
US5668551A (en) * | 1995-01-18 | 1997-09-16 | Analog Devices, Inc. | Power-up calibration of charge redistribution analog-to-digital converter |
US5621409A (en) * | 1995-02-15 | 1997-04-15 | Analog Devices, Inc. | Analog-to-digital conversion with multiple charge balance conversions |
JP3208299B2 (ja) * | 1995-02-20 | 2001-09-10 | シャープ株式会社 | アクティブマトリクス方式液晶駆動回路 |
GB2298329B (en) * | 1995-02-21 | 2000-02-16 | Plessey Semiconductors Ltd | Voltage offset compensation circuit |
KR100226594B1 (ko) * | 1995-09-18 | 1999-10-15 | 니시무로 타이죠 | 전자회로 및 이를 이용한 필터장치 |
US5724095A (en) * | 1995-10-03 | 1998-03-03 | Omnivision Technologies Inc. | Charge amplifier for MOS imaging array and method of making same |
US6351283B1 (en) * | 1995-10-03 | 2002-02-26 | Omnivision Technologies, Inc. | Charge amplifier for MOS imaging array |
DE19653192C2 (de) * | 1996-12-19 | 1999-01-07 | Sgs Thomson Microelectronics | Monolithisch integrierte Signalverarbeitungsschaltung |
GB9706943D0 (en) | 1997-04-04 | 1997-05-21 | Sharp Kk | Active matrix device circuits |
DE10010457A1 (de) * | 2000-03-03 | 2001-09-20 | Infineon Technologies Ag | Integrierter Speicher mit Speicherzellen mit magnetoresistivem Speichereffekt |
JP4336066B2 (ja) * | 2001-07-11 | 2009-09-30 | 株式会社豊田中央研究所 | 静電容量型センサ装置 |
US7052180B2 (en) * | 2002-01-04 | 2006-05-30 | Kelvin Shih | LED junction temperature tester |
US7282991B2 (en) * | 2004-07-12 | 2007-10-16 | Broadcom Corporation | On-chip amplifier/line driver compensation circuit |
US7002506B1 (en) * | 2004-12-23 | 2006-02-21 | Texas Instruments Incorporated | Providing pipe line ADC with acceptable bit error and power efficiency combination |
US7136000B1 (en) * | 2005-06-17 | 2006-11-14 | National Semiconductor Corporation | Selective offset adjustment of a track and hold circuit |
US8305131B2 (en) | 2006-03-21 | 2012-11-06 | Maxim Integrated, Inc. | Passive offset and overshoot cancellation for sampled-data circuits |
CN103065686B (zh) * | 2006-03-21 | 2016-09-14 | 剑桥模拟技术有限公司 | 采样数据电路的偏移消除 |
US8558852B2 (en) * | 2006-11-30 | 2013-10-15 | Seiko Epson Corporation | Source driver, electro-optical device, and electronic instrument |
CN101986559A (zh) * | 2009-07-29 | 2011-03-16 | 比亚迪股份有限公司 | 一种模拟信号处理电路 |
KR102071296B1 (ko) * | 2013-09-30 | 2020-03-02 | 주식회사 실리콘웍스 | 디스플레이 패널의 소스 드라이버 |
TWI527456B (zh) * | 2013-11-27 | 2016-03-21 | Univ Nat Chi Nan | Array read device, dual function read device and detection circuit |
CN110349535B (zh) * | 2018-04-02 | 2021-01-12 | 联咏科技股份有限公司 | 增益放大器 |
CN114401007A (zh) * | 2021-12-23 | 2022-04-26 | 矽力杰半导体技术(杭州)有限公司 | 采样保持放大器 |
Family Cites Families (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3050673A (en) * | 1960-10-14 | 1962-08-21 | Ibm | Voltage holding circuit |
US3667055A (en) * | 1969-06-28 | 1972-05-30 | Iwatsu Electric Co Ltd | Integrating network using at least one d-c amplifier |
US4163947A (en) * | 1977-09-23 | 1979-08-07 | Analogic Corporation | Current and voltage autozeroing integrator |
US4151429A (en) * | 1977-10-03 | 1979-04-24 | Northern Telecom Limited | Differential charge sensing circuit for MOS devices |
US4306196A (en) * | 1980-01-14 | 1981-12-15 | Bell Telephone Laboratories, Incorporated | Operational amplifier with offset compensation |
US4365204A (en) * | 1980-09-08 | 1982-12-21 | American Microsystems, Inc. | Offset compensation for switched capacitor integrators |
US4404525A (en) * | 1981-03-03 | 1983-09-13 | American Microsystems, Inc. | Switched capacitor gain stage with offset and switch feedthrough cancellation scheme |
US4393351A (en) * | 1981-07-27 | 1983-07-12 | American Microsystems, Inc. | Offset compensation for switched capacitor integrators |
-
1981
- 1981-10-30 US US06/316,453 patent/US4439693A/en not_active Expired - Lifetime
-
1982
- 1982-09-08 DE DE8282304720T patent/DE3279140D1/de not_active Expired
- 1982-09-08 EP EP82304720A patent/EP0078601B1/en not_active Expired
- 1982-10-29 JP JP57189353A patent/JPS5885998A/ja active Granted
Also Published As
Publication number | Publication date |
---|---|
DE3279140D1 (en) | 1988-11-24 |
US4439693A (en) | 1984-03-27 |
EP0078601A3 (en) | 1985-04-17 |
EP0078601A2 (en) | 1983-05-11 |
JPS5885998A (ja) | 1983-05-23 |
EP0078601B1 (en) | 1988-10-19 |
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