JPH02150583U - - Google Patents

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Publication number
JPH02150583U
JPH02150583U JP6074589U JP6074589U JPH02150583U JP H02150583 U JPH02150583 U JP H02150583U JP 6074589 U JP6074589 U JP 6074589U JP 6074589 U JP6074589 U JP 6074589U JP H02150583 U JPH02150583 U JP H02150583U
Authority
JP
Japan
Prior art keywords
under test
signal
terminal
response
signals
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP6074589U
Other languages
Japanese (ja)
Other versions
JP2548477Y2 (en
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP1989060745U priority Critical patent/JP2548477Y2/en
Publication of JPH02150583U publication Critical patent/JPH02150583U/ja
Application granted granted Critical
Publication of JP2548477Y2 publication Critical patent/JP2548477Y2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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  • Tests Of Electronic Circuits (AREA)

Description

【図面の簡単な説明】[Brief explanation of the drawing]

第１図はこの考案の一実施例を示す系統図、第
２図は従来の技術を説明するための系統図である
。 １：被試験ＩＣ、２：パフオーマンスボード、
３：信号系路、３Ａ：駆動回路系、３Ｂ：信号取
込回路系、４：試験装置、１０：分岐線路、１１
：選択回路。 FIG. 1 is a system diagram showing an embodiment of this invention, and FIG. 2 is a system diagram for explaining the conventional technology. 1: IC under test, 2: Performance board,
3: Signal system path, 3A: Drive circuit system, 3B: Signal acquisition circuit system, 4: Test equipment, 10: Branch line, 11
: Selection circuit.

Claims (1)

【実用新案登録請求の範囲】 Ａ 試験装置から被試験ＩＣの各端子に、論理回
路の動作を試験するためのパターン信号を与える
複数の駆動回路系と、被試験ＩＣの各端子から出
力される応答信号を試験装置に送り込む複数の信
号取込回路系とを具備し、試験装置から被試験Ｉ
Ｃに与えたパターン信号に対し、被試験ＩＣから
出力された応答信号を上記試験装置において期待
値パターンと比較し、被試験ＩＣの良否を判定す
るＩＣ試験装置において、 Ｂ 上記被試験ＩＣから試験装置に応答信号を伝
送する信号取込回路系に接続した分岐線路と、 Ｃ この分岐線路に接続され、被試験ＩＣの任意
の端子から出力される信号の何れか一つを選択す
る選択回路と、 Ｄ この選択回路で取出した信号の周波数を測定
する周波数測定手段と、 を設けて成るＩＣ試験装置。[Claims for Utility Model Registration] A. A plurality of drive circuit systems that provide pattern signals for testing the operation of a logic circuit from a testing device to each terminal of the IC under test, and signals output from each terminal of the IC under test. It is equipped with a plurality of signal acquisition circuit systems that send response signals to the test equipment, and
In an IC testing device that compares the response signal output from the IC under test with the expected value pattern in the test device to determine the quality of the IC under test in response to the pattern signal given to B, A branch line connected to the signal acquisition circuit system that transmits the response signal to the device, and a selection circuit connected to this branch line and selecting one of the signals output from any terminal of the IC under test. , D A frequency measuring means for measuring the frequency of a signal taken out by this selection circuit; and an IC testing device comprising:
JP1989060745U 1989-05-24 1989-05-24 IC test equipment Expired - Lifetime JP2548477Y2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1989060745U JP2548477Y2 (en) 1989-05-24 1989-05-24 IC test equipment

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1989060745U JP2548477Y2 (en) 1989-05-24 1989-05-24 IC test equipment

Publications (2)

Publication Number Publication Date
JPH02150583U true JPH02150583U (en) 1990-12-26
JP2548477Y2 JP2548477Y2 (en) 1997-09-24

Family

ID=31588375

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1989060745U Expired - Lifetime JP2548477Y2 (en) 1989-05-24 1989-05-24 IC test equipment

Country Status (1)

Country Link
JP (1) JP2548477Y2 (en)

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5853776A (en) * 1981-09-25 1983-03-30 Nec Corp Integrated circuit measuring apparatus
JPS6217668A (en) * 1985-07-17 1987-01-26 Yokogawa Electric Corp Apparatus for inspecting semiconductor integrated circuit

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5853776A (en) * 1981-09-25 1983-03-30 Nec Corp Integrated circuit measuring apparatus
JPS6217668A (en) * 1985-07-17 1987-01-26 Yokogawa Electric Corp Apparatus for inspecting semiconductor integrated circuit

Also Published As

Publication number Publication date
JP2548477Y2 (en) 1997-09-24

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Legal Events

Date Code Title Description
EXPY Cancellation because of completion of term