JPH02148485U - - Google Patents

Info

Publication number
JPH02148485U
JPH02148485U JP5759589U JP5759589U JPH02148485U JP H02148485 U JPH02148485 U JP H02148485U JP 5759589 U JP5759589 U JP 5759589U JP 5759589 U JP5759589 U JP 5759589U JP H02148485 U JPH02148485 U JP H02148485U
Authority
JP
Japan
Prior art keywords
signal
signal line
phase reference
under test
boards
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP5759589U
Other languages
Japanese (ja)
Other versions
JPH0714929Y2 (en
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP5759589U priority Critical patent/JPH0714929Y2/en
Publication of JPH02148485U publication Critical patent/JPH02148485U/ja
Application granted granted Critical
Publication of JPH0714929Y2 publication Critical patent/JPH0714929Y2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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  • Tests Of Electronic Circuits (AREA)

Description

【図面の簡単な説明】[Brief explanation of the drawing]

第1図はこの考案の一実施例を示す接続図、第
2図はこの考案によつて付加した信号線路とコネ
クタを用いてパフオーマンスボードに実装した位
相基準信号伝送路の可変遅延素子の遅延時間を調
整する方法を説明するための接続図、第3図は従
来の技術を説明するための接続図である。 10A〜10N……パフオーマンスボード、1
1……駆動回路、12……信号取込回路、13,
18……リレー接点、14……入出力端子、15
……分配器、16,17……可変遅延素子、20
……被試験IC、30……位相基準信号入力点、
31……信号線路、32……コネクタ。
Figure 1 is a connection diagram showing an embodiment of this invention, and Figure 2 shows the delay time of the variable delay element of the phase reference signal transmission line mounted on a performance board using the signal line and connector added according to this invention. FIG. 3 is a connection diagram for explaining a conventional technique. 10A~10N...Performance board, 1
1... Drive circuit, 12... Signal acquisition circuit, 13,
18... Relay contact, 14... Input/output terminal, 15
...Distributor, 16, 17...Variable delay element, 20
...IC under test, 30...Phase reference signal input point,
31...Signal line, 32...Connector.

Claims (1)

【実用新案登録請求の範囲】 A 被試験ICの端子に与える駆動回路及び被試
験ICから出力される信号を取込む信号取込回路
とが複数実装された複数のボードと、 B この複数のボードの各駆動回路及び信号取込
回路の接続点に位相基準信号を与える分配器と、 C 上記複数のボードのそれぞれに設けられ、各
ボードの位相基準信号入力点に与えられる位相基
準信号を直接取出すための信号線路及びこの信号
線路から位相基準信号を取出すコネクタと、 を具備して成るIC試験装置。
[Scope of Claim for Utility Model Registration] A. A plurality of boards on which a plurality of drive circuits for supplying to the terminals of the IC under test and a plurality of signal acquisition circuits for receiving signals output from the IC under test are mounted, and B. The plurality of boards. A distributor that provides a phase reference signal to the connection point of each drive circuit and signal acquisition circuit; An IC testing device comprising: a signal line for the signal line and a connector for extracting a phase reference signal from the signal line.
JP5759589U 1989-05-19 1989-05-19 IC test equipment Expired - Fee Related JPH0714929Y2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP5759589U JPH0714929Y2 (en) 1989-05-19 1989-05-19 IC test equipment

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP5759589U JPH0714929Y2 (en) 1989-05-19 1989-05-19 IC test equipment

Publications (2)

Publication Number Publication Date
JPH02148485U true JPH02148485U (en) 1990-12-17
JPH0714929Y2 JPH0714929Y2 (en) 1995-04-10

Family

ID=31582447

Family Applications (1)

Application Number Title Priority Date Filing Date
JP5759589U Expired - Fee Related JPH0714929Y2 (en) 1989-05-19 1989-05-19 IC test equipment

Country Status (1)

Country Link
JP (1) JPH0714929Y2 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005091108A (en) * 2003-09-16 2005-04-07 Advantest Corp Jitter generator and testing apparatus

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005091108A (en) * 2003-09-16 2005-04-07 Advantest Corp Jitter generator and testing apparatus

Also Published As

Publication number Publication date
JPH0714929Y2 (en) 1995-04-10

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