JPH0160792B2 - - Google Patents

Info

Publication number
JPH0160792B2
JPH0160792B2 JP55121507A JP12150780A JPH0160792B2 JP H0160792 B2 JPH0160792 B2 JP H0160792B2 JP 55121507 A JP55121507 A JP 55121507A JP 12150780 A JP12150780 A JP 12150780A JP H0160792 B2 JPH0160792 B2 JP H0160792B2
Authority
JP
Japan
Prior art keywords
circuit
signal
test
test mode
input
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP55121507A
Other languages
English (en)
Japanese (ja)
Other versions
JPS5745471A (en
Inventor
Toshiaki Machida
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nippon Electric Co Ltd filed Critical Nippon Electric Co Ltd
Priority to JP55121507A priority Critical patent/JPS5745471A/ja
Publication of JPS5745471A publication Critical patent/JPS5745471A/ja
Publication of JPH0160792B2 publication Critical patent/JPH0160792B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2884—Testing of integrated circuits [IC] using dedicated test connectors, test elements or test circuits on the IC under test

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Semiconductor Integrated Circuits (AREA)
JP55121507A 1980-09-02 1980-09-02 Testing circuit for semiconductor integrated circuit Granted JPS5745471A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP55121507A JPS5745471A (en) 1980-09-02 1980-09-02 Testing circuit for semiconductor integrated circuit

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP55121507A JPS5745471A (en) 1980-09-02 1980-09-02 Testing circuit for semiconductor integrated circuit

Publications (2)

Publication Number Publication Date
JPS5745471A JPS5745471A (en) 1982-03-15
JPH0160792B2 true JPH0160792B2 (fr) 1989-12-25

Family

ID=14812901

Family Applications (1)

Application Number Title Priority Date Filing Date
JP55121507A Granted JPS5745471A (en) 1980-09-02 1980-09-02 Testing circuit for semiconductor integrated circuit

Country Status (1)

Country Link
JP (1) JPS5745471A (fr)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE19528733C1 (de) * 1995-08-04 1997-01-02 Siemens Ag Integrierte Schaltung

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS52123662A (en) * 1976-04-09 1977-10-18 Seiko Instr & Electronics Ltd Ic inspection circuit in electronic watches
JPS53128240A (en) * 1977-04-13 1978-11-09 Philips Nv Integrated circuit

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5734458Y2 (fr) * 1975-11-07 1982-07-29

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS52123662A (en) * 1976-04-09 1977-10-18 Seiko Instr & Electronics Ltd Ic inspection circuit in electronic watches
JPS53128240A (en) * 1977-04-13 1978-11-09 Philips Nv Integrated circuit

Also Published As

Publication number Publication date
JPS5745471A (en) 1982-03-15

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