JPH0159550B2 - - Google Patents

Info

Publication number
JPH0159550B2
JPH0159550B2 JP55115187A JP11518780A JPH0159550B2 JP H0159550 B2 JPH0159550 B2 JP H0159550B2 JP 55115187 A JP55115187 A JP 55115187A JP 11518780 A JP11518780 A JP 11518780A JP H0159550 B2 JPH0159550 B2 JP H0159550B2
Authority
JP
Japan
Prior art keywords
input
circuit
integrated circuit
bias application
timing pulse
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP55115187A
Other languages
English (en)
Japanese (ja)
Other versions
JPS5739623A (en
Inventor
Hiroshi Tanaka
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nippon Electric Co Ltd filed Critical Nippon Electric Co Ltd
Priority to JP55115187A priority Critical patent/JPS5739623A/ja
Publication of JPS5739623A publication Critical patent/JPS5739623A/ja
Publication of JPH0159550B2 publication Critical patent/JPH0159550B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/316—Testing of analog circuits

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Logic Circuits (AREA)
JP55115187A 1980-08-21 1980-08-21 Integrated circuit device Granted JPS5739623A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP55115187A JPS5739623A (en) 1980-08-21 1980-08-21 Integrated circuit device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP55115187A JPS5739623A (en) 1980-08-21 1980-08-21 Integrated circuit device

Publications (2)

Publication Number Publication Date
JPS5739623A JPS5739623A (en) 1982-03-04
JPH0159550B2 true JPH0159550B2 (de) 1989-12-18

Family

ID=14656503

Family Applications (1)

Application Number Title Priority Date Filing Date
JP55115187A Granted JPS5739623A (en) 1980-08-21 1980-08-21 Integrated circuit device

Country Status (1)

Country Link
JP (1) JPS5739623A (de)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2603095B2 (ja) * 1988-03-07 1997-04-23 シャープ株式会社 半導体集積回路
JPH04335858A (ja) * 1991-05-10 1992-11-24 Ezaki Glico Co Ltd 難結晶性糖液による糖蔵果実の製造法

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS53121543A (en) * 1977-03-31 1978-10-24 Toshiba Corp Check circuit

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS53121543A (en) * 1977-03-31 1978-10-24 Toshiba Corp Check circuit

Also Published As

Publication number Publication date
JPS5739623A (en) 1982-03-04

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