JPH0134323B2 - - Google Patents
Info
- Publication number
- JPH0134323B2 JPH0134323B2 JP57090704A JP9070482A JPH0134323B2 JP H0134323 B2 JPH0134323 B2 JP H0134323B2 JP 57090704 A JP57090704 A JP 57090704A JP 9070482 A JP9070482 A JP 9070482A JP H0134323 B2 JPH0134323 B2 JP H0134323B2
- Authority
- JP
- Japan
- Prior art keywords
- pattern
- bit position
- circuit
- inspection
- predetermined number
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Preparing Plates And Mask In Photomechanical Process (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP57090704A JPS58207633A (ja) | 1982-05-28 | 1982-05-28 | 欠陥検査方法及びその装置 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP57090704A JPS58207633A (ja) | 1982-05-28 | 1982-05-28 | 欠陥検査方法及びその装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS58207633A JPS58207633A (ja) | 1983-12-03 |
JPH0134323B2 true JPH0134323B2 (enrdf_load_stackoverflow) | 1989-07-19 |
Family
ID=14005911
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP57090704A Granted JPS58207633A (ja) | 1982-05-28 | 1982-05-28 | 欠陥検査方法及びその装置 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS58207633A (enrdf_load_stackoverflow) |
Family Cites Families (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6256442A (ja) * | 1985-09-05 | 1987-03-12 | Sumikin Coke Co Ltd | ナフタレンの精製方法 |
-
1982
- 1982-05-28 JP JP57090704A patent/JPS58207633A/ja active Granted
Also Published As
Publication number | Publication date |
---|---|
JPS58207633A (ja) | 1983-12-03 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
US4745296A (en) | Process for optically testing circuit boards to detect incorrect circuit patterns | |
JPS6256442B2 (enrdf_load_stackoverflow) | ||
JPH0134323B2 (enrdf_load_stackoverflow) | ||
US4765744A (en) | Method for testing a photomask | |
JPS62229050A (ja) | 物体の表面欠陥検査方法 | |
JPH06331317A (ja) | 寸法測定装置 | |
JPS62233746A (ja) | チツプ搭載基板チエツカ | |
JPS61120907A (ja) | プリント基板のホ−ル検査方法 | |
JP2803427B2 (ja) | 表面実装icリードずれ検査装置 | |
JPS63132143A (ja) | 異物検査装置 | |
JPH0245706A (ja) | 形状検査装置 | |
JPH0569536A (ja) | 印刷物の検査装置における欠陥検出方法及び欠陥検出回路 | |
JP2535704Y2 (ja) | 濃淡画像処理装置 | |
JPH04125453A (ja) | パターン検査装置 | |
JP2536727B2 (ja) | パタ―ン検査装置 | |
WO2001013333A1 (fr) | Dispositif de controle de motifs et procede de controle de motifs | |
JPH0325739B2 (enrdf_load_stackoverflow) | ||
JPS6125245Y2 (enrdf_load_stackoverflow) | ||
JPH0290372A (ja) | ブリッヂ検出回路 | |
JPH01301151A (ja) | プリント配線検査装置 | |
JPS5974627A (ja) | フオトマスクの検査方法及び装置 | |
JPS60253222A (ja) | 欠陥検査方法 | |
JPS5974628A (ja) | フオトマスクの検査方法及び装置 | |
JPS5813391Y2 (ja) | マ−ク読取り装置用限度マ−ク見本媒体 | |
JPH01100474A (ja) | 回路基板検査装置 |