JPH0132691B2 - - Google Patents

Info

Publication number
JPH0132691B2
JPH0132691B2 JP55023061A JP2306180A JPH0132691B2 JP H0132691 B2 JPH0132691 B2 JP H0132691B2 JP 55023061 A JP55023061 A JP 55023061A JP 2306180 A JP2306180 A JP 2306180A JP H0132691 B2 JPH0132691 B2 JP H0132691B2
Authority
JP
Japan
Prior art keywords
power supply
current
circuit
logic circuit
supply terminal
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP55023061A
Other languages
English (en)
Japanese (ja)
Other versions
JPS56119530A (en
Inventor
Tetsuo Ide
Fumi Fujeda
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP2306180A priority Critical patent/JPS56119530A/ja
Publication of JPS56119530A publication Critical patent/JPS56119530A/ja
Publication of JPH0132691B2 publication Critical patent/JPH0132691B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/316—Testing of analog circuits

Landscapes

  • Logic Circuits (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Semiconductor Integrated Circuits (AREA)
JP2306180A 1980-02-26 1980-02-26 Semiconductor integrated circuit Granted JPS56119530A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2306180A JPS56119530A (en) 1980-02-26 1980-02-26 Semiconductor integrated circuit

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2306180A JPS56119530A (en) 1980-02-26 1980-02-26 Semiconductor integrated circuit

Publications (2)

Publication Number Publication Date
JPS56119530A JPS56119530A (en) 1981-09-19
JPH0132691B2 true JPH0132691B2 (OSRAM) 1989-07-10

Family

ID=12099903

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2306180A Granted JPS56119530A (en) 1980-02-26 1980-02-26 Semiconductor integrated circuit

Country Status (1)

Country Link
JP (1) JPS56119530A (OSRAM)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58127371U (ja) * 1982-02-22 1983-08-29 日本電気株式会社 出力回路
JPS59145565A (ja) * 1983-02-09 1984-08-21 Matsushita Electronics Corp 半導体装置
JPS60248017A (ja) * 1984-05-23 1985-12-07 Rohm Co Ltd Ｉ２ｌ回路のインジエクタ電流供給回路
JPS63111027U (OSRAM) * 1987-01-08 1988-07-16

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5250181A (en) * 1975-10-21 1977-04-21 Oki Electric Ind Co Ltd Semiconductor integrated circuit device
JPS5362479A (en) * 1976-11-16 1978-06-03 Nec Corp Integrated circuit with power terminals for testing

Also Published As

Publication number Publication date
JPS56119530A (en) 1981-09-19

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