JPS56119530A - Semiconductor integrated circuit - Google Patents

Semiconductor integrated circuit

Info

Publication number
JPS56119530A
JPS56119530A JP2306180A JP2306180A JPS56119530A JP S56119530 A JPS56119530 A JP S56119530A JP 2306180 A JP2306180 A JP 2306180A JP 2306180 A JP2306180 A JP 2306180A JP S56119530 A JPS56119530 A JP S56119530A
Authority
JP
Japan
Prior art keywords
test
power source
resistance
logic circuit
circuit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2306180A
Other languages
Japanese (ja)
Other versions
JPH0132691B2 (en
Inventor
Tetsuo Ide
Fumi Fujieda
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP2306180A priority Critical patent/JPS56119530A/en
Publication of JPS56119530A publication Critical patent/JPS56119530A/en
Publication of JPH0132691B2 publication Critical patent/JPH0132691B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/316—Testing of analog circuits

Landscapes

  • Logic Circuits (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Semiconductor Integrated Circuits (AREA)

Abstract

PURPOSE:To make a high-speed function test possible, by supplying the power source current for test to the integrated injection logic I<2>L circuit without causing it to pass throgh the current limiting resistance. CONSTITUTION:Power source terminal 12 for the test is provided separately which supplies current I3 to power source input point N2 of I<2>L logic circuit 2 through no resistance R1, and only at the test time, power source E is connected through resistance R2. Consequently, since I<2>L logic circuit 2 is operated in a high speed with a short delay time, the test time is shortened. Since the bad influence upon input/ output circuit 4 is prevented and terminal 12 is made unusable after the test end, low power consumption of I<2>L logic circuit 2 for normal use is held.
JP2306180A 1980-02-26 1980-02-26 Semiconductor integrated circuit Granted JPS56119530A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2306180A JPS56119530A (en) 1980-02-26 1980-02-26 Semiconductor integrated circuit

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2306180A JPS56119530A (en) 1980-02-26 1980-02-26 Semiconductor integrated circuit

Publications (2)

Publication Number Publication Date
JPS56119530A true JPS56119530A (en) 1981-09-19
JPH0132691B2 JPH0132691B2 (en) 1989-07-10

Family

ID=12099903

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2306180A Granted JPS56119530A (en) 1980-02-26 1980-02-26 Semiconductor integrated circuit

Country Status (1)

Country Link
JP (1) JPS56119530A (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58127371U (en) * 1982-02-22 1983-08-29 日本電気株式会社 Output circuit
JPS59145565A (en) * 1983-02-09 1984-08-21 Matsushita Electronics Corp Semiconductor device
JPS60248017A (en) * 1984-05-23 1985-12-07 Rohm Co Ltd Injector current supply circuit for i2l circuit
JPS63111027U (en) * 1987-01-08 1988-07-16

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5250181A (en) * 1975-10-21 1977-04-21 Oki Electric Ind Co Ltd Semiconductor integrated circuit device
JPS5362479A (en) * 1976-11-16 1978-06-03 Nec Corp Integrated circuit with power terminals for testing

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5250181A (en) * 1975-10-21 1977-04-21 Oki Electric Ind Co Ltd Semiconductor integrated circuit device
JPS5362479A (en) * 1976-11-16 1978-06-03 Nec Corp Integrated circuit with power terminals for testing

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58127371U (en) * 1982-02-22 1983-08-29 日本電気株式会社 Output circuit
JPH0318954Y2 (en) * 1982-02-22 1991-04-22
JPS59145565A (en) * 1983-02-09 1984-08-21 Matsushita Electronics Corp Semiconductor device
JPH0425713B2 (en) * 1983-02-09 1992-05-01 Matsushita Electronics Corp
JPS60248017A (en) * 1984-05-23 1985-12-07 Rohm Co Ltd Injector current supply circuit for i2l circuit
JPS63111027U (en) * 1987-01-08 1988-07-16

Also Published As

Publication number Publication date
JPH0132691B2 (en) 1989-07-10

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