JPH0121458B2 - - Google Patents

Info

Publication number
JPH0121458B2
JPH0121458B2 JP55100693A JP10069380A JPH0121458B2 JP H0121458 B2 JPH0121458 B2 JP H0121458B2 JP 55100693 A JP55100693 A JP 55100693A JP 10069380 A JP10069380 A JP 10069380A JP H0121458 B2 JPH0121458 B2 JP H0121458B2
Authority
JP
Japan
Prior art keywords
chromium
chromate
film
amount
fluorescent
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP55100693A
Other languages
English (en)
Japanese (ja)
Other versions
JPS5724848A (en
Inventor
Hirotomo Ochi
Takeshi Tanaka
Isamu Iwamoto
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shimadzu Corp
Original Assignee
Shimadzu Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shimadzu Corp filed Critical Shimadzu Corp
Priority to JP10069380A priority Critical patent/JPS5724848A/ja
Publication of JPS5724848A publication Critical patent/JPS5724848A/ja
Publication of JPH0121458B2 publication Critical patent/JPH0121458B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/223Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00Investigating materials by wave or particle radiation
    • G01N2223/07Investigating materials by wave or particle radiation secondary emission
    • G01N2223/076X-ray fluorescence

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
JP10069380A 1980-07-22 1980-07-22 Analysis of chromium in chromate coating on aluminum Granted JPS5724848A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP10069380A JPS5724848A (en) 1980-07-22 1980-07-22 Analysis of chromium in chromate coating on aluminum

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP10069380A JPS5724848A (en) 1980-07-22 1980-07-22 Analysis of chromium in chromate coating on aluminum

Publications (2)

Publication Number Publication Date
JPS5724848A JPS5724848A (en) 1982-02-09
JPH0121458B2 true JPH0121458B2 (enrdf_load_stackoverflow) 1989-04-21

Family

ID=14280800

Family Applications (1)

Application Number Title Priority Date Filing Date
JP10069380A Granted JPS5724848A (en) 1980-07-22 1980-07-22 Analysis of chromium in chromate coating on aluminum

Country Status (1)

Country Link
JP (1) JPS5724848A (enrdf_load_stackoverflow)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60146814U (ja) * 1984-03-10 1985-09-30 大阪瓦斯株式会社 帰還型フルイデイツク流量計
CN102411011A (zh) * 2010-09-21 2012-04-11 上海宝钢工业检测公司 镀锡板表面铬量的快速测定方法

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5438195A (en) * 1977-09-01 1979-03-22 Toshiba Corp Fluorescent x-ray analytical method

Also Published As

Publication number Publication date
JPS5724848A (en) 1982-02-09

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