JPH0445085B2 - - Google Patents
Info
- Publication number
- JPH0445085B2 JPH0445085B2 JP5943987A JP5943987A JPH0445085B2 JP H0445085 B2 JPH0445085 B2 JP H0445085B2 JP 5943987 A JP5943987 A JP 5943987A JP 5943987 A JP5943987 A JP 5943987A JP H0445085 B2 JPH0445085 B2 JP H0445085B2
- Authority
- JP
- Japan
- Prior art keywords
- plate
- thickness
- measured
- absorption coefficient
- mass absorption
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Landscapes
- Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP5943987A JPS63225114A (ja) | 1987-03-13 | 1987-03-13 | 放射線板厚測定方法 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP5943987A JPS63225114A (ja) | 1987-03-13 | 1987-03-13 | 放射線板厚測定方法 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS63225114A JPS63225114A (ja) | 1988-09-20 |
JPH0445085B2 true JPH0445085B2 (enrdf_load_stackoverflow) | 1992-07-23 |
Family
ID=13113311
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP5943987A Granted JPS63225114A (ja) | 1987-03-13 | 1987-03-13 | 放射線板厚測定方法 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS63225114A (enrdf_load_stackoverflow) |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2002350120A (ja) * | 2001-05-23 | 2002-12-04 | Anritsu Corp | X線による厚さ測定方法及びx線厚さ測定装置 |
JP7298577B2 (ja) * | 2020-10-01 | 2023-06-27 | Jfeスチール株式会社 | 板厚算出方法、板厚制御方法、板材の製造方法、板厚算出装置および板厚制御装置 |
-
1987
- 1987-03-13 JP JP5943987A patent/JPS63225114A/ja active Granted
Also Published As
Publication number | Publication date |
---|---|
JPS63225114A (ja) | 1988-09-20 |
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