JPH0119803Y2 - - Google Patents
Info
- Publication number
- JPH0119803Y2 JPH0119803Y2 JP16290183U JP16290183U JPH0119803Y2 JP H0119803 Y2 JPH0119803 Y2 JP H0119803Y2 JP 16290183 U JP16290183 U JP 16290183U JP 16290183 U JP16290183 U JP 16290183U JP H0119803 Y2 JPH0119803 Y2 JP H0119803Y2
- Authority
- JP
- Japan
- Prior art keywords
- electron beam
- aperture
- lens
- energy
- fluorescent plate
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 238000010894 electron beam technology Methods 0.000 claims description 15
- OAICVXFJPJFONN-UHFFFAOYSA-N Phosphorus Chemical compound [P] OAICVXFJPJFONN-UHFFFAOYSA-N 0.000 claims description 3
- 238000002347 injection Methods 0.000 claims 1
- 239000007924 injection Substances 0.000 claims 1
- 238000010586 diagram Methods 0.000 description 3
- 238000001514 detection method Methods 0.000 description 2
- 239000002244 precipitate Substances 0.000 description 2
- 239000000919 ceramic Substances 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000001000 micrograph Methods 0.000 description 1
- 230000003287 optical effect Effects 0.000 description 1
- 238000001228 spectrum Methods 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
Landscapes
- Analysing Materials By The Use Of Radiation (AREA)
- Electron Tubes For Measurement (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP16290183U JPS6071064U (ja) | 1983-10-21 | 1983-10-21 | 分析電子顕微鏡 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP16290183U JPS6071064U (ja) | 1983-10-21 | 1983-10-21 | 分析電子顕微鏡 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS6071064U JPS6071064U (ja) | 1985-05-20 |
JPH0119803Y2 true JPH0119803Y2 (enrdf_load_stackoverflow) | 1989-06-07 |
Family
ID=30357594
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP16290183U Granted JPS6071064U (ja) | 1983-10-21 | 1983-10-21 | 分析電子顕微鏡 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS6071064U (enrdf_load_stackoverflow) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB8609740D0 (en) * | 1986-04-22 | 1986-05-29 | Spectros Ltd | Charged particle energy analyser |
-
1983
- 1983-10-21 JP JP16290183U patent/JPS6071064U/ja active Granted
Also Published As
Publication number | Publication date |
---|---|
JPS6071064U (ja) | 1985-05-20 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
US4810880A (en) | Direct imaging monochromatic electron microscope | |
JP3039563B2 (ja) | 走査電子顕微鏡及び走査電子顕微方法 | |
US4633085A (en) | Transmission-type electron microscope | |
US6930306B2 (en) | Electron microscope | |
JP3692806B2 (ja) | 走査電子顕微鏡 | |
US4623783A (en) | Method of displaying diffraction pattern by electron microscope | |
JPH0119803Y2 (enrdf_load_stackoverflow) | ||
JPH07110310A (ja) | 電子線マイクロアナライザ | |
JP3780620B2 (ja) | 電子分光器及びそれを備えた透過型電子顕微鏡 | |
US3107297A (en) | Electron probe X-ray analyzer wherein the emitted X-radiation passes through the objective lens | |
JPH01213944A (ja) | 電子線照射型分析装置 | |
US5895916A (en) | Method and apparatus for adjusting electron beam apparatus | |
JPH11265675A (ja) | 荷電粒子線装置 | |
JPH11264940A (ja) | 試料高さ合わせ調整装置 | |
JP2000304712A (ja) | 電子線分析・観察装置および電子線マイクロアナライザ | |
US20080037009A1 (en) | Spectrometer system with IR microscope and electronically switchable detectors | |
JP3715236B2 (ja) | 二次イオン質量分析による試料の深さ方向濃度分布測定方法 | |
JPS59119661A (ja) | 電子顕微鏡における電子線偏向方法 | |
JPH0243089Y2 (enrdf_load_stackoverflow) | ||
JP3270627B2 (ja) | 電子ビームマイクロアナライザーにおける試料の高さ表示方法 | |
JP2004281333A (ja) | 電子分光装置 | |
JP2004319233A (ja) | 電子顕微鏡 | |
JPH0566549U (ja) | 荷電粒子分析装置 | |
JPH04166753A (ja) | X線分光分析装置 | |
JPS5914243A (ja) | 走査形イオンマイクロアナライザ |