JPH0119106Y2 - - Google Patents

Info

Publication number
JPH0119106Y2
JPH0119106Y2 JP1984044892U JP4489284U JPH0119106Y2 JP H0119106 Y2 JPH0119106 Y2 JP H0119106Y2 JP 1984044892 U JP1984044892 U JP 1984044892U JP 4489284 U JP4489284 U JP 4489284U JP H0119106 Y2 JPH0119106 Y2 JP H0119106Y2
Authority
JP
Japan
Prior art keywords
module
pin
laser beam
board
measurement
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP1984044892U
Other languages
English (en)
Japanese (ja)
Other versions
JPS60156466U (ja
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP4489284U priority Critical patent/JPS60156466U/ja
Publication of JPS60156466U publication Critical patent/JPS60156466U/ja
Application granted granted Critical
Publication of JPH0119106Y2 publication Critical patent/JPH0119106Y2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Measuring Leads Or Probes (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP4489284U 1984-03-28 1984-03-28 Icモジユ−ル検査装置 Granted JPS60156466U (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP4489284U JPS60156466U (ja) 1984-03-28 1984-03-28 Icモジユ−ル検査装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP4489284U JPS60156466U (ja) 1984-03-28 1984-03-28 Icモジユ−ル検査装置

Publications (2)

Publication Number Publication Date
JPS60156466U JPS60156466U (ja) 1985-10-18
JPH0119106Y2 true JPH0119106Y2 (enrdf_load_html_response) 1989-06-02

Family

ID=30557883

Family Applications (1)

Application Number Title Priority Date Filing Date
JP4489284U Granted JPS60156466U (ja) 1984-03-28 1984-03-28 Icモジユ−ル検査装置

Country Status (1)

Country Link
JP (1) JPS60156466U (enrdf_load_html_response)

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS55125639A (en) * 1979-03-23 1980-09-27 Hitachi Ltd Inspection apparatus

Also Published As

Publication number Publication date
JPS60156466U (ja) 1985-10-18

Similar Documents

Publication Publication Date Title
US5210485A (en) Probe for wafer burn-in test system
US6462570B1 (en) Breakout board using blind vias to eliminate stubs
JPH07209386A (ja) プリント回路基板のテスタと方法
ATE45427T1 (de) Adapter fuer ein leiterplattenpruefgeraet.
JPH0119106Y2 (enrdf_load_html_response)
US6326797B2 (en) Apparatus and method for evaluating printed circuit board assembly manufacturing processes
US6664794B1 (en) Apparatus and method for evaluating the surface insulation resistance of electronic assembly manufacture
US4947112A (en) Apparatus and method for testing printed circuit boards
JP2004061264A (ja) インサーキットテスタ及びプリント基板テスト方法
JPS6156880B2 (enrdf_load_html_response)
KR19980071445A (ko) 집합기판 및 그 집합기판을 이용한 전자기기의 제조방법
JPH03296672A (ja) スルーホールを有するプリント配線板の検査方法
US7323861B2 (en) Contact plate for use in standardizing tester channels of a tester system and a standardization system having such a contact plate
DE102018132940B4 (de) Vorrichtung und Verfahren zur Prüfung und Kalibrierung eines Bauteils
JP2976321B2 (ja) プローブ装置
EP0404940A1 (en) Memory testing system
JP3076424B2 (ja) 回路基板検査方法と検査基板並びに回路基板検査装置
JPH0648898Y2 (ja) プリント配線基板
US10966313B2 (en) Method for manufacturing printed circuit board having test point, and printed circuit board manufactured thereby
US6717423B1 (en) Substrate impedance measurement
JPH0315765A (ja) テストボード
DE10116823C2 (de) Verfahren zur Kalibirierung von Prüfkarten mit nichtfedernden Kontaktelementen
JPH11118878A (ja) Ic固定治具
JPH05226429A (ja) 実装基板検査用シートおよびこれを用いた実装基板の検査方法
KR19990081438A (ko) 집적회로장치용 번인 테스트 보드