JP7675663B2 - 13族元素窒化物結晶層の育成方法、窒化物半導体インゴットおよびスパッタリングターゲット - Google Patents

13族元素窒化物結晶層の育成方法、窒化物半導体インゴットおよびスパッタリングターゲット Download PDF

Info

Publication number
JP7675663B2
JP7675663B2 JP2021576608A JP2021576608A JP7675663B2 JP 7675663 B2 JP7675663 B2 JP 7675663B2 JP 2021576608 A JP2021576608 A JP 2021576608A JP 2021576608 A JP2021576608 A JP 2021576608A JP 7675663 B2 JP7675663 B2 JP 7675663B2
Authority
JP
Japan
Prior art keywords
crystal layer
group
nitride
nitride semiconductor
seed crystal
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
JP2021576608A
Other languages
English (en)
Japanese (ja)
Other versions
JPWO2022079962A5 (https=
JPWO2022079962A1 (https=
Inventor
義孝 倉岡
健太朗 野中
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NGK Insulators Ltd
Original Assignee
NGK Insulators Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NGK Insulators Ltd filed Critical NGK Insulators Ltd
Publication of JPWO2022079962A1 publication Critical patent/JPWO2022079962A1/ja
Publication of JPWO2022079962A5 publication Critical patent/JPWO2022079962A5/ja
Application granted granted Critical
Publication of JP7675663B2 publication Critical patent/JP7675663B2/ja
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Classifications

    • CCHEMISTRY; METALLURGY
    • C30CRYSTAL GROWTH
    • C30BSINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
    • C30B29/00Single crystals or homogeneous polycrystalline material with defined structure characterised by the material or by their shape
    • C30B29/10Inorganic compounds or compositions
    • C30B29/40AIIIBV compounds wherein A is B, Al, Ga, In or Tl and B is N, P, As, Sb or Bi
    • C30B29/403AIII-nitrides
    • C30B29/406Gallium nitride
    • CCHEMISTRY; METALLURGY
    • C30CRYSTAL GROWTH
    • C30BSINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
    • C30B29/00Single crystals or homogeneous polycrystalline material with defined structure characterised by the material or by their shape
    • C30B29/10Inorganic compounds or compositions
    • C30B29/38Nitrides
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C14/00Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/22Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
    • C23C14/34Sputtering
    • CCHEMISTRY; METALLURGY
    • C30CRYSTAL GROWTH
    • C30BSINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
    • C30B19/00Liquid-phase epitaxial-layer growth
    • C30B19/02Liquid-phase epitaxial-layer growth using molten solvents, e.g. flux
    • CCHEMISTRY; METALLURGY
    • C30CRYSTAL GROWTH
    • C30BSINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
    • C30B19/00Liquid-phase epitaxial-layer growth
    • C30B19/02Liquid-phase epitaxial-layer growth using molten solvents, e.g. flux
    • C30B19/04Liquid-phase epitaxial-layer growth using molten solvents, e.g. flux the solvent being a component of the crystal composition
    • CCHEMISTRY; METALLURGY
    • C30CRYSTAL GROWTH
    • C30BSINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
    • C30B19/00Liquid-phase epitaxial-layer growth
    • C30B19/12Liquid-phase epitaxial-layer growth characterised by the substrate
    • CCHEMISTRY; METALLURGY
    • C30CRYSTAL GROWTH
    • C30BSINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
    • C30B23/00Single-crystal growth by condensing evaporated or sublimed materials
    • C30B23/02Epitaxial-layer growth
    • CCHEMISTRY; METALLURGY
    • C30CRYSTAL GROWTH
    • C30BSINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
    • C30B23/00Single-crystal growth by condensing evaporated or sublimed materials
    • C30B23/02Epitaxial-layer growth
    • C30B23/025Epitaxial-layer growth characterised by the substrate
    • CCHEMISTRY; METALLURGY
    • C30CRYSTAL GROWTH
    • C30BSINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
    • C30B33/00After-treatment of single crystals or homogeneous polycrystalline material with defined structure
    • C30B33/06Joining of crystals
    • CCHEMISTRY; METALLURGY
    • C30CRYSTAL GROWTH
    • C30BSINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
    • C30B9/00Single-crystal growth from melt solutions using molten solvents
    • C30B9/04Single-crystal growth from melt solutions using molten solvents by cooling of the solution
    • C30B9/08Single-crystal growth from melt solutions using molten solvents by cooling of the solution using other solvents
    • C30B9/12Salt solvents, e.g. flux growth

Landscapes

  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Materials Engineering (AREA)
  • Metallurgy (AREA)
  • Organic Chemistry (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Inorganic Chemistry (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Mechanical Engineering (AREA)
  • Crystals, And After-Treatments Of Crystals (AREA)
JP2021576608A 2020-10-15 2021-07-12 13族元素窒化物結晶層の育成方法、窒化物半導体インゴットおよびスパッタリングターゲット Active JP7675663B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2020173913 2020-10-15
JP2020173913 2020-10-15
PCT/JP2021/026080 WO2022079962A1 (ja) 2020-10-15 2021-07-12 13族元素窒化物結晶層の育成方法、窒化物半導体インゴットおよびスパッタリングターゲット

Publications (3)

Publication Number Publication Date
JPWO2022079962A1 JPWO2022079962A1 (https=) 2022-04-21
JPWO2022079962A5 JPWO2022079962A5 (https=) 2022-10-04
JP7675663B2 true JP7675663B2 (ja) 2025-05-13

Family

ID=81207915

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2021576608A Active JP7675663B2 (ja) 2020-10-15 2021-07-12 13族元素窒化物結晶層の育成方法、窒化物半導体インゴットおよびスパッタリングターゲット

Country Status (4)

Country Link
US (1) US20230250555A1 (https=)
JP (1) JP7675663B2 (https=)
CN (1) CN116348631A (https=)
WO (1) WO2022079962A1 (https=)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN121057718A (zh) 2023-05-09 2025-12-02 日本碍子株式会社 接合体

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2017100944A (ja) 2017-02-22 2017-06-08 株式会社リコー 13族窒化物結晶および13族窒化物結晶基板
US20190096668A1 (en) 2017-09-26 2019-03-28 Sixpoint Materials, Inc. Seed crystal for growth of gallium nitride bulk crystal in supercritical ammonia and fabrication method

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5897790B2 (ja) * 2009-10-22 2016-03-30 日本碍子株式会社 3b族窒化物単結晶及びその製法
JP5446945B2 (ja) * 2010-02-01 2014-03-19 日亜化学工業株式会社 窒化物半導体単結晶及び窒化物半導体基板の製造方法
JP2018043893A (ja) * 2016-09-12 2018-03-22 株式会社リコー 13族窒化物結晶の製造方法及び13族窒化物結晶基板の製造方法
JP6861522B2 (ja) * 2017-01-23 2021-04-21 株式会社サイオクス 多結晶iii族窒化物ターゲットおよびその製造方法
TWI825187B (zh) * 2018-10-09 2023-12-11 日商東京威力科創股份有限公司 氮化物半導體膜之形成方法

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2017100944A (ja) 2017-02-22 2017-06-08 株式会社リコー 13族窒化物結晶および13族窒化物結晶基板
US20190096668A1 (en) 2017-09-26 2019-03-28 Sixpoint Materials, Inc. Seed crystal for growth of gallium nitride bulk crystal in supercritical ammonia and fabrication method

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
HAO Hangfei et al., Japanese Journal of Applied Physics, 2019年05月22日, 発行日, Vol.58, SC1048,1-5

Also Published As

Publication number Publication date
CN116348631A (zh) 2023-06-27
US20230250555A1 (en) 2023-08-10
WO2022079962A1 (ja) 2022-04-21
JPWO2022079962A1 (https=) 2022-04-21

Similar Documents

Publication Publication Date Title
KR101582021B1 (ko) 복합 기판, 그 제조 방법, 13족 원소 질화물로 이루어진 기능층의 제조 방법 및 기능 소자
JP7117690B2 (ja) Iii-v族化合物結晶の製造方法および半導体装置の製造方法
WO2009011407A1 (ja) Iii族窒化物単結晶の製造方法
CN108884594B (zh) 晶种基板的制造方法、13族元素氮化物结晶的制造方法及晶种基板
WO2009096125A1 (ja) Iii族窒化物単結晶インゴット、iii族窒化物単結晶基板、iii族窒化物単結晶インゴットの製造方法、及びiii族窒化物単結晶基板の製造方法
KR20090023198A (ko) Ⅲ족 질화물 반도체와 그 제조 방법
JP2006332570A (ja) Iii族窒化物結晶の表面平坦性改善方法、エピタキシャル成長用基板、および半導体素子
JP6526811B2 (ja) Iii族窒化物結晶を加工する方法
JP7675663B2 (ja) 13族元素窒化物結晶層の育成方法、窒化物半導体インゴットおよびスパッタリングターゲット
US11245054B2 (en) Base substrate, functional element, and production method for base substrate
US11437233B2 (en) Base substrate, functional element, and method for manufacturing base substrate
JP7704399B2 (ja) Ga2O3系単結晶基板並びにAlxGa(1-x)N系半導体積層体の製造方法
WO2022079939A1 (ja) Iii族元素窒化物半導体基板
JP7855059B2 (ja) Iii族元素窒化物基板およびiii族元素窒化物基板の製造方法
JP7855060B2 (ja) Iii族元素窒化物基板およびiii族元素窒化物基板の製造方法
TW202538821A (zh) 複合基板、半導體元件及複合基板的製造方法
WO2025196855A1 (ja) Iii族元素窒化物基板、貼合せ基板、半導体素子およびiii族元素窒化物基板の製造方法
WO2025032873A1 (ja) Iii族窒化物種結晶基板の構造とiii族窒化物結晶の製造方法
WO2025120853A1 (ja) Iii族元素窒化物基板、半導体素子、iii族元素窒化物基板の加工方法および半導体素子の製造方法
WO2026083764A1 (ja) 基板セット、単結晶基板、基板セットの製造方法および半導体素子の製造方法
WO2023157387A1 (ja) Iii族元素窒化物基板およびiii族元素窒化物基板の製造方法
TW202425164A (zh) Iii族元素氮化物基板之檢查方法、iii族元素氮化物基板之製造方法及半導體元件之製造方法
JP2007073975A (ja) Iii族窒化物結晶の品質改善方法、エピタキシャル成長用基板、および半導体素子
JP2010222192A (ja) 窒化物単結晶の製造方法、テンプレート基板、および窒化物単結晶基板

Legal Events

Date Code Title Description
A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20220114

A621 Written request for application examination

Free format text: JAPANESE INTERMEDIATE CODE: A621

Effective date: 20220114

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20230221

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20230403

A02 Decision of refusal

Free format text: JAPANESE INTERMEDIATE CODE: A02

Effective date: 20230727

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20231026

A911 Transfer to examiner for re-examination before appeal (zenchi)

Free format text: JAPANESE INTERMEDIATE CODE: A911

Effective date: 20231102

A912 Re-examination (zenchi) completed and case transferred to appeal board

Free format text: JAPANESE INTERMEDIATE CODE: A912

Effective date: 20240126

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20250108

A61 First payment of annual fees (during grant procedure)

Free format text: JAPANESE INTERMEDIATE CODE: A61

Effective date: 20250428

R150 Certificate of patent or registration of utility model

Ref document number: 7675663

Country of ref document: JP

Free format text: JAPANESE INTERMEDIATE CODE: R150