JP7671743B2 - 半導体装置 - Google Patents

半導体装置 Download PDF

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Publication number
JP7671743B2
JP7671743B2 JP2022519950A JP2022519950A JP7671743B2 JP 7671743 B2 JP7671743 B2 JP 7671743B2 JP 2022519950 A JP2022519950 A JP 2022519950A JP 2022519950 A JP2022519950 A JP 2022519950A JP 7671743 B2 JP7671743 B2 JP 7671743B2
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electrode
gate
semiconductor device
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pad
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JPWO2021225119A1 (https=
Inventor
佑紀 中野
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Rohm Co Ltd
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Rohm Co Ltd
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    • HELECTRICITY
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    • H10W20/40Interconnections external to wafers or substrates, e.g. back-end-of-line [BEOL] metallisations or vias connecting to gate electrodes
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    • H10D12/411Insulated-gate bipolar transistors [IGBT]
    • H10D12/441Vertical IGBTs
    • H10D12/461Vertical IGBTs having non-planar surfaces, e.g. having trenches, recesses or pillars in the surfaces of the emitter, base or collector regions
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    • H10D30/66Vertical DMOS [VDMOS] FETs
    • H10D30/668Vertical DMOS [VDMOS] FETs having trench gate electrodes, e.g. UMOS transistors
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    • H10D30/64Double-diffused metal-oxide semiconductor [DMOS] FETs
    • H10D30/66Vertical DMOS [VDMOS] FETs
    • H10D30/669Vertical DMOS [VDMOS] FETs having voltage-sensing or current-sensing structures, e.g. emulator sections or overcurrent sensing cells
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    • H10D64/23Electrodes carrying the current to be rectified, amplified, oscillated or switched, e.g. sources, drains, anodes or cathodes
    • H10D64/251Source or drain electrodes for field-effect devices
    • H10D64/256Source or drain electrodes for field-effect devices for lateral devices wherein the source or drain electrodes are recessed in semiconductor bodies
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    • H10D64/27Electrodes not carrying the current to be rectified, amplified, oscillated or switched, e.g. gates
    • H10D64/311Gate electrodes for field-effect devices
    • H10D64/411Gate electrodes for field-effect devices for FETs
    • H10D64/511Gate electrodes for field-effect devices for FETs for IGFETs
    • H10D64/517Gate electrodes for field-effect devices for FETs for IGFETs characterised by the conducting layers
    • H10D64/519Gate electrodes for field-effect devices for FETs for IGFETs characterised by the conducting layers characterised by their top-view geometrical layouts
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    • H10W20/482Interconnections external to wafers or substrates, e.g. back-end-of-line [BEOL] metallisations or vias connecting to gate electrodes for individual devices provided for in groups H10D8/00 - H10D48/00, e.g. for power transistors
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    • H10D62/124Shapes, relative sizes or dispositions of the regions of semiconductor bodies or of junctions between the regions
    • H10D62/126Top-view geometrical layouts of the regions or the junctions
    • H10D62/127Top-view geometrical layouts of the regions or the junctions of cellular field-effect devices, e.g. multicellular DMOS transistors or IGBTs
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    • H10D62/832Semiconductor bodies, or regions thereof, of devices having potential barriers characterised by the materials being Group IV materials, e.g. B-doped Si or undoped Ge being Group IV materials comprising two or more elements, e.g. SiGe
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JP2022519950A 2020-05-08 2021-04-30 半導体装置 Active JP7671743B2 (ja)

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US (1) US20230352371A1 (https=)
JP (2) JP7671743B2 (https=)
CN (1) CN115485858A (https=)
DE (2) DE212021000197U1 (https=)
WO (1) WO2021225119A1 (https=)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP7670694B2 (ja) * 2020-05-08 2025-04-30 ローム株式会社 半導体装置
US12477773B2 (en) 2020-09-17 2025-11-18 Rohm Co., Ltd. Semiconductor device including terminal electrodes
CN114512531A (zh) * 2020-11-16 2022-05-17 苏州东微半导体股份有限公司 碳化硅器件
WO2023080086A1 (ja) * 2021-11-05 2023-05-11 ローム株式会社 半導体装置
WO2023080087A1 (ja) * 2021-11-05 2023-05-11 ローム株式会社 半導体装置
US20240421230A1 (en) * 2023-06-14 2024-12-19 Microchip Technology Incorporated ELECTRONIC DEVICES WITH SUBSTRATES LESS THAN 50 µm THICK AND METHODS OF MANUFACTURE
WO2024258445A1 (en) * 2023-06-14 2024-12-19 Microchip Technology Incorporated Electronic devices with substrates less than 50 micrometer thick and methods of manufacture

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007048889A (ja) 2005-08-09 2007-02-22 Fuji Electric Holdings Co Ltd 半導体装置
JP2010087125A (ja) 2008-09-30 2010-04-15 Sanyo Electric Co Ltd 絶縁ゲート型半導体装置
JP2015222743A (ja) 2014-05-22 2015-12-10 三菱電機株式会社 半導体装置
WO2017199706A1 (ja) 2016-05-18 2017-11-23 三菱電機株式会社 電力用半導体装置およびその製造方法

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH09232334A (ja) * 1996-02-26 1997-09-05 Sanyo Electric Co Ltd 化合物半導体装置
JP5547022B2 (ja) 2010-10-01 2014-07-09 トヨタ自動車株式会社 半導体装置
JP5638340B2 (ja) * 2010-10-20 2014-12-10 ルネサスエレクトロニクス株式会社 半導体装置
TWI458072B (zh) * 2010-12-16 2014-10-21 索泰克公司 將半導體構造直接黏附在一起之方法以及應用此等方法所形成之黏附半導體構造
US9837526B2 (en) * 2014-12-08 2017-12-05 Nxp Usa, Inc. Semiconductor device wtih an interconnecting semiconductor electrode between first and second semiconductor electrodes and method of manufacture therefor
DE112018003873T5 (de) * 2017-04-24 2020-04-23 Rohm Co., Ltd. Elektronische komponente und halbleitervorrichtung
JP2019169579A (ja) * 2018-03-23 2019-10-03 株式会社東芝 半導体装置及びその製造方法
JP7123688B2 (ja) * 2018-08-06 2022-08-23 新光電気工業株式会社 半導体装置及びその製造方法
JP2020082750A (ja) 2018-11-15 2020-06-04 槌屋ヤック株式会社 自動車用灰皿
JP7394544B2 (ja) 2019-06-17 2023-12-08 株式会社日本総合研究所 コミュニケーション支援システム

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007048889A (ja) 2005-08-09 2007-02-22 Fuji Electric Holdings Co Ltd 半導体装置
JP2010087125A (ja) 2008-09-30 2010-04-15 Sanyo Electric Co Ltd 絶縁ゲート型半導体装置
JP2015222743A (ja) 2014-05-22 2015-12-10 三菱電機株式会社 半導体装置
WO2017199706A1 (ja) 2016-05-18 2017-11-23 三菱電機株式会社 電力用半導体装置およびその製造方法

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