JP7660212B2 - 自動分析装置 - Google Patents

自動分析装置 Download PDF

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Publication number
JP7660212B2
JP7660212B2 JP2023550409A JP2023550409A JP7660212B2 JP 7660212 B2 JP7660212 B2 JP 7660212B2 JP 2023550409 A JP2023550409 A JP 2023550409A JP 2023550409 A JP2023550409 A JP 2023550409A JP 7660212 B2 JP7660212 B2 JP 7660212B2
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Japan
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temperature
flow path
diluent
temperature control
internal standard
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Japanese (ja)
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JPWO2023053691A1 (https=
JPWO2023053691A5 (https=
Inventor
遇哲 山本
拓士 宮川
雅文 三宅
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Hitachi High Tech Corp
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Hitachi High Tech Corp
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N1/00—Sampling; Preparing specimens for investigation
    • G01N1/28—Preparing specimens for investigation including physical details of (bio-)chemical methods covered elsewhere, e.g. G01N33/50, C12Q
    • G01N1/38—Diluting, dispersing or mixing samples
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/08—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor using a stream of discrete samples flowing along a tube system, e.g. flow injection analysis
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N2035/00178—Special arrangements of analysers
    • G01N2035/00277—Special precautions to avoid contamination (e.g. enclosures, glove- boxes, sealed sample carriers, disposal of contaminated material)
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N2035/00346—Heating or cooling arrangements
    • G01N2035/00425—Heating or cooling means associated with pipettes or the like, e.g. for supplying sample/reagent at given temperature
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/10—Devices for transferring samples or any liquids to, in, or from, the analysis apparatus, e.g. suction devices, injection devices
    • G01N2035/1027—General features of the devices
    • G01N2035/1032—Dilution or aliquotting
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/10—Devices for transferring samples or any liquids to, in, or from, the analysis apparatus, e.g. suction devices, injection devices
    • G01N35/1002—Reagent dispensers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/10—Devices for transferring samples or any liquids to, in, or from, the analysis apparatus, e.g. suction devices, injection devices
    • G01N35/1095—Devices for transferring samples or any liquids to, in, or from, the analysis apparatus, e.g. suction devices, injection devices for supplying the samples to flow-through analysers

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  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Automatic Analysis And Handling Materials Therefor (AREA)
JP2023550409A 2021-09-30 2022-07-21 自動分析装置 Active JP7660212B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2021161042 2021-09-30
JP2021161042 2021-09-30
PCT/JP2022/028341 WO2023053691A1 (ja) 2021-09-30 2022-07-21 自動分析装置

Publications (3)

Publication Number Publication Date
JPWO2023053691A1 JPWO2023053691A1 (https=) 2023-04-06
JPWO2023053691A5 JPWO2023053691A5 (https=) 2024-06-04
JP7660212B2 true JP7660212B2 (ja) 2025-04-10

Family

ID=85782234

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2023550409A Active JP7660212B2 (ja) 2021-09-30 2022-07-21 自動分析装置

Country Status (5)

Country Link
US (1) US20250004003A1 (https=)
EP (1) EP4411380A4 (https=)
JP (1) JP7660212B2 (https=)
CN (1) CN117940775A (https=)
WO (1) WO2023053691A1 (https=)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP4600653A1 (en) * 2022-10-06 2025-08-13 Hitachi High-Tech Corporation Automated analyzing device, and method for operating automated analyzing device
WO2026042388A1 (ja) * 2024-08-22 2026-02-26 株式会社日立ハイテク 自動分析装置

Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20120173164A1 (en) 2009-09-09 2012-07-05 Endress +Hauser Conducta Gesellschaft Fur Mess-und Regeltechnik mbH +Co. KG Analytical device for automated determining of a measured variable of a liquid sample
US20120258542A1 (en) 2011-04-07 2012-10-11 Endress + Hauser Conducta Gesellschaft für Mess- und Regeltechnik mbH + Co. KG Analytical device for automated determination of a measured variable of a liquid sample
JP2017146182A (ja) 2016-02-17 2017-08-24 株式会社日立ハイテクノロジーズ 自動分析装置及びその洗浄方法
JP2018036080A (ja) 2016-08-30 2018-03-08 株式会社日立ハイテクノロジーズ 自動分析装置
JP2018146374A (ja) 2017-03-06 2018-09-20 テラメックス株式会社 温調システム
JP2019074311A (ja) 2016-02-19 2019-05-16 株式会社日立ハイテクノロジーズ 自動分析装置および分注プローブの洗浄方法
JP2020041875A (ja) 2018-09-10 2020-03-19 株式会社日立ハイテクノロジーズ 自動分析装置
JP2020106424A (ja) 2018-12-27 2020-07-09 株式会社日立ハイテク 自動分析装置

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6087887A (ja) * 1983-10-19 1985-05-17 Shinwa Control Kk 流水システムの配管系及びその滅菌法
JP4620551B2 (ja) * 2005-08-24 2011-01-26 株式会社日立ハイテクノロジーズ 電解質測定装置
JP2007093252A (ja) 2005-09-27 2007-04-12 Jokoh Co Ltd 電解質分析装置の温調システム
JP2012181102A (ja) 2011-03-01 2012-09-20 Jeol Ltd 電解質測定装置
CN113287022B (zh) * 2018-12-27 2023-12-12 株式会社日立高新技术 自动分析装置、自动分析系统及样品的自动分析方法
EP4040158A4 (en) * 2019-07-22 2023-12-06 Hitachi High-Tech Corporation Automatic analysis device and method of automatic sample analysis
CN115004020B (zh) * 2020-01-29 2024-08-27 株式会社日立高新技术 电解质分析装置
EP4105651B1 (en) * 2020-02-14 2025-08-13 Hitachi High-Tech Corporation Electrolyte analysis apparatus
JP7231576B2 (ja) * 2020-03-09 2023-03-01 株式会社日立ハイテク 電解質濃度測定装置

Patent Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20120173164A1 (en) 2009-09-09 2012-07-05 Endress +Hauser Conducta Gesellschaft Fur Mess-und Regeltechnik mbH +Co. KG Analytical device for automated determining of a measured variable of a liquid sample
US20120258542A1 (en) 2011-04-07 2012-10-11 Endress + Hauser Conducta Gesellschaft für Mess- und Regeltechnik mbH + Co. KG Analytical device for automated determination of a measured variable of a liquid sample
JP2017146182A (ja) 2016-02-17 2017-08-24 株式会社日立ハイテクノロジーズ 自動分析装置及びその洗浄方法
JP2019074311A (ja) 2016-02-19 2019-05-16 株式会社日立ハイテクノロジーズ 自動分析装置および分注プローブの洗浄方法
JP2018036080A (ja) 2016-08-30 2018-03-08 株式会社日立ハイテクノロジーズ 自動分析装置
JP2018146374A (ja) 2017-03-06 2018-09-20 テラメックス株式会社 温調システム
JP2020041875A (ja) 2018-09-10 2020-03-19 株式会社日立ハイテクノロジーズ 自動分析装置
JP2020106424A (ja) 2018-12-27 2020-07-09 株式会社日立ハイテク 自動分析装置

Also Published As

Publication number Publication date
CN117940775A (zh) 2024-04-26
WO2023053691A1 (ja) 2023-04-06
US20250004003A1 (en) 2025-01-02
EP4411380A4 (en) 2025-08-06
JPWO2023053691A1 (https=) 2023-04-06
EP4411380A1 (en) 2024-08-07

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