JP7645452B2 - 撮影装置 - Google Patents

撮影装置 Download PDF

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Publication number
JP7645452B2
JP7645452B2 JP2022508065A JP2022508065A JP7645452B2 JP 7645452 B2 JP7645452 B2 JP 7645452B2 JP 2022508065 A JP2022508065 A JP 2022508065A JP 2022508065 A JP2022508065 A JP 2022508065A JP 7645452 B2 JP7645452 B2 JP 7645452B2
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JP
Japan
Prior art keywords
sub
image
light source
imaging device
reflector
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JP2022508065A
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English (en)
Japanese (ja)
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JPWO2021186822A5 (https=
JPWO2021186822A1 (https=
Inventor
陽介 淺井
和宏 山田
博史 山口
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Intellectual Property Management Co Ltd
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Panasonic Intellectual Property Management Co Ltd
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Publication of JPWO2021186822A5 publication Critical patent/JPWO2021186822A5/ja
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    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B5/00—Optical elements other than lenses
    • G02B5/02—Diffusing elements; Afocal elements
    • G02B5/0273—Diffusing elements; Afocal elements characterized by the use
    • G02B5/0284—Diffusing elements; Afocal elements characterized by the use used in reflection
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/30—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces
    • G01B11/303—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces using photoelectric detection means
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G01J3/0205—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G01J3/0205—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows
    • G01J3/0208—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows using focussing or collimating elements, e.g. lenses or mirrors; performing aberration correction
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G01J3/10—Arrangements of light sources specially adapted for spectrometry or colorimetry
    • G01J3/108—Arrangements of light sources specially adapted for spectrometry or colorimetry for measurement in the infrared range
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28—Investigating the spectrum
    • G01J3/42—Absorption spectrometry; Double beam spectrometry; Flicker spectrometry; Reflection spectrometry
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
    • G01S17/00—Systems using the reflection or reradiation of electromagnetic waves other than radio waves, e.g. lidar systems
    • G01S17/87—Combinations of systems using electromagnetic waves other than radio waves
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
    • G01S17/00—Systems using the reflection or reradiation of electromagnetic waves other than radio waves, e.g. lidar systems
    • G01S17/88—Lidar systems specially adapted for specific applications
    • G01S17/89—Lidar systems specially adapted for specific applications for mapping or imaging
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
    • G01S7/00—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00
    • G01S7/48—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00 of systems according to group G01S17/00
    • G01S7/481—Constructional features, e.g. arrangements of optical elements
    • G01S7/4814—Constructional features, e.g. arrangements of optical elements of transmitters alone
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
    • G01N21/3581—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light using far infrared light; using Terahertz radiation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N22/00—Investigating or analysing materials by the use of microwaves or radio waves, i.e. electromagnetic waves with a wavelength of one millimetre or more
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/06—Illumination; Optics
    • G01N2201/063—Illuminating optical parts
    • G01N2201/0634—Diffuse illumination

Landscapes

  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Electromagnetism (AREA)
  • Remote Sensing (AREA)
  • Radar, Positioning & Navigation (AREA)
  • Computer Networks & Wireless Communication (AREA)
  • Health & Medical Sciences (AREA)
  • Biochemistry (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Toxicology (AREA)
  • General Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Chemical & Material Sciences (AREA)
  • Optics & Photonics (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
JP2022508065A 2020-03-18 2020-12-17 撮影装置 Active JP7645452B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2020048096 2020-03-18
JP2020048096 2020-03-18
PCT/JP2020/047117 WO2021186822A1 (ja) 2020-03-18 2020-12-17 撮影装置

Publications (3)

Publication Number Publication Date
JPWO2021186822A1 JPWO2021186822A1 (https=) 2021-09-23
JPWO2021186822A5 JPWO2021186822A5 (https=) 2022-11-18
JP7645452B2 true JP7645452B2 (ja) 2025-03-14

Family

ID=77771913

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2022508065A Active JP7645452B2 (ja) 2020-03-18 2020-12-17 撮影装置

Country Status (5)

Country Link
US (1) US12259320B2 (https=)
EP (1) EP4123271A4 (https=)
JP (1) JP7645452B2 (https=)
CN (1) CN115280098A (https=)
WO (1) WO2021186822A1 (https=)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP4123271A4 (en) * 2020-03-18 2023-07-26 Panasonic Intellectual Property Management Co., Ltd. PHOTOGRAPHIC DEVICE

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001509269A (ja) 1997-01-17 2001-07-10 イギリス国 ミリメートル波撮像装置
JP2016144164A (ja) 2015-02-05 2016-08-08 国立研究開発法人情報通信研究機構 電波反射体

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US5517575A (en) * 1991-10-04 1996-05-14 Ladewski; Theodore B. Methods of correcting optically generated errors in an electro-optical gauging system
FI107407B (fi) * 1997-09-16 2001-07-31 Metorex Internat Oy Alimillimetriaalloilla toimiva kuvausjärjestelmä
US6777684B1 (en) * 1999-08-23 2004-08-17 Rose Research L.L.C. Systems and methods for millimeter and sub-millimeter wave imaging
JP2002258272A (ja) * 2001-02-28 2002-09-11 Nec Corp 反射板並びに反射型液晶表示装置
US20090240139A1 (en) * 2008-03-18 2009-09-24 Steven Yi Diffuse Optical Tomography System and Method of Use
JP5291983B2 (ja) * 2008-05-12 2013-09-18 浜松ホトニクス株式会社 テラヘルツ波周波数分解イメージング装置
US8497477B1 (en) 2010-02-10 2013-07-30 Mvt Equity Llc Method and apparatus for efficient removal of gain fluctuation effects in passive thermal images
US9086483B2 (en) * 2011-03-28 2015-07-21 Northrop Grumman Guidance And Electronics Company, Inc. Systems and methods for detecting and/or identifying materials
US9207317B2 (en) * 2011-04-15 2015-12-08 Ariel-University Research And Development Company Ltd. Passive millimeter-wave detector
US9268017B2 (en) * 2011-07-29 2016-02-23 International Business Machines Corporation Near-field millimeter wave imaging
DE102012003201A1 (de) * 2012-02-17 2013-08-22 Hübner GmbH Verfahren und Vorrichtung zur Untersuchung von Postsendungen im Hinblick auf gefährliche Inhaltsstoffe
JP2014029478A (ja) * 2012-07-03 2014-02-13 Canon Inc テラヘルツ波発生素子、テラヘルツ波検出素子、及びテラヘルツ時間領域分光装置
JP6290036B2 (ja) * 2013-09-25 2018-03-07 株式会社東芝 検査装置及び検査システム
WO2015050941A1 (en) * 2013-10-04 2015-04-09 Battelle Memorial Institute Contrast phantom for passive millimeter wave imaging systems
MX361644B (es) * 2013-12-24 2018-12-13 Halliburton Energy Services Inc Monitorización en tiempo real de la fabricación de elementos computacionales integrados.
WO2015101921A1 (en) * 2013-12-30 2015-07-09 University Of Manitoba Imaging using gated elements
JP2017009296A (ja) * 2015-06-16 2017-01-12 キヤノン株式会社 電磁波伝搬装置及び情報取得装置
JP6778856B2 (ja) * 2016-03-25 2020-11-04 パナソニックＩｐマネジメント株式会社 ミラーパネル、ミラーフィルム及び表示システム
US11385105B2 (en) * 2016-04-04 2022-07-12 Teledyne Flir, Llc Techniques for determining emitted radiation intensity
JP6843600B2 (ja) * 2016-11-28 2021-03-17 キヤノン株式会社 画像取得装置、これを用いた画像取得方法及び照射装置
JP6916435B2 (ja) * 2017-01-17 2021-08-11 澁谷工業株式会社 テラヘルツ光発生装置
US10585185B2 (en) * 2017-02-03 2020-03-10 Rohde & Schwarz Gmbh & Co. Kg Security scanning system with walk-through-gate
EP3613150A4 (en) * 2017-04-20 2020-12-02 The Board of Trustees of the Leland Stanford Junior University EXPANDABLE MILLIMETRIC WAVE NETWORKS WITH LARGE OPENINGS ACHIEVED BY MILLIMETRIC WAVE DIELECTRIC WAVE GUIDES
CN108444913A (zh) * 2018-01-30 2018-08-24 中国科学院上海技术物理研究所 基于单元胞立体相位光栅和互参考技术的THz光谱仪
CA3090636A1 (en) * 2019-08-23 2021-02-23 Institut National D'optique Terahertz illumination source for terahertz imaging
WO2021070428A1 (ja) 2019-10-09 2021-04-15 パナソニックＩｐマネジメント株式会社 撮影装置
EP4123271A4 (en) * 2020-03-18 2023-07-26 Panasonic Intellectual Property Management Co., Ltd. PHOTOGRAPHIC DEVICE

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001509269A (ja) 1997-01-17 2001-07-10 イギリス国 ミリメートル波撮像装置
JP2016144164A (ja) 2015-02-05 2016-08-08 国立研究開発法人情報通信研究機構 電波反射体

Also Published As

Publication number Publication date
EP4123271A1 (en) 2023-01-25
US20230003643A1 (en) 2023-01-05
US12259320B2 (en) 2025-03-25
WO2021186822A1 (ja) 2021-09-23
CN115280098A (zh) 2022-11-01
JPWO2021186822A1 (https=) 2021-09-23
EP4123271A4 (en) 2023-07-26

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