CN115280098A - 摄影装置 - Google Patents

摄影装置 Download PDF

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Publication number
CN115280098A
CN115280098A CN202080098553.9A CN202080098553A CN115280098A CN 115280098 A CN115280098 A CN 115280098A CN 202080098553 A CN202080098553 A CN 202080098553A CN 115280098 A CN115280098 A CN 115280098A
Authority
CN
China
Prior art keywords
sub
light source
terahertz wave
image
detector
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN202080098553.9A
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English (en)
Chinese (zh)
Inventor
浅井阳介
山田和宏
山口博史
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Intellectual Property Management Co Ltd
Original Assignee
Panasonic Intellectual Property Management Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Panasonic Intellectual Property Management Co Ltd filed Critical Panasonic Intellectual Property Management Co Ltd
Publication of CN115280098A publication Critical patent/CN115280098A/zh
Pending legal-status Critical Current

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    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B5/00—Optical elements other than lenses
    • G02B5/02—Diffusing elements; Afocal elements
    • G02B5/0273—Diffusing elements; Afocal elements characterized by the use
    • G02B5/0284—Diffusing elements; Afocal elements characterized by the use used in reflection
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
    • G01N21/3581—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light using far infrared light; using Terahertz radiation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/30—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces
    • G01B11/303—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces using photoelectric detection means
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G01J3/0205—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G01J3/0205—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows
    • G01J3/0208—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows using focussing or collimating elements, e.g. lenses or mirrors; performing aberration correction
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G01J3/10—Arrangements of light sources specially adapted for spectrometry or colorimetry
    • G01J3/108—Arrangements of light sources specially adapted for spectrometry or colorimetry for measurement in the infrared range
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28—Investigating the spectrum
    • G01J3/42—Absorption spectrometry; Double beam spectrometry; Flicker spectrometry; Reflection spectrometry
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
    • G01S17/00—Systems using the reflection or reradiation of electromagnetic waves other than radio waves, e.g. lidar systems
    • G01S17/87—Combinations of systems using electromagnetic waves other than radio waves
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
    • G01S17/00—Systems using the reflection or reradiation of electromagnetic waves other than radio waves, e.g. lidar systems
    • G01S17/88—Lidar systems specially adapted for specific applications
    • G01S17/89—Lidar systems specially adapted for specific applications for mapping or imaging
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
    • G01S7/00—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00
    • G01S7/48—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00 of systems according to group G01S17/00
    • G01S7/481—Constructional features, e.g. arrangements of optical elements
    • G01S7/4814—Constructional features, e.g. arrangements of optical elements of transmitters alone
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N22/00—Investigating or analysing materials by the use of microwaves or radio waves, i.e. electromagnetic waves with a wavelength of one millimetre or more
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/06—Illumination; Optics
    • G01N2201/063—Illuminating optical parts
    • G01N2201/0634—Diffuse illumination

Landscapes

  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Electromagnetism (AREA)
  • Remote Sensing (AREA)
  • Radar, Positioning & Navigation (AREA)
  • Computer Networks & Wireless Communication (AREA)
  • Health & Medical Sciences (AREA)
  • Biochemistry (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Toxicology (AREA)
  • General Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Chemical & Material Sciences (AREA)
  • Optics & Photonics (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
CN202080098553.9A 2020-03-18 2020-12-17 摄影装置 Pending CN115280098A (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2020048096 2020-03-18
JP2020-048096 2020-03-18
PCT/JP2020/047117 WO2021186822A1 (ja) 2020-03-18 2020-12-17 撮影装置

Publications (1)

Publication Number Publication Date
CN115280098A true CN115280098A (zh) 2022-11-01

Family

ID=77771913

Family Applications (1)

Application Number Title Priority Date Filing Date
CN202080098553.9A Pending CN115280098A (zh) 2020-03-18 2020-12-17 摄影装置

Country Status (5)

Country Link
US (1) US12259320B2 (https=)
EP (1) EP4123271A4 (https=)
JP (1) JP7645452B2 (https=)
CN (1) CN115280098A (https=)
WO (1) WO2021186822A1 (https=)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP4123271A4 (en) * 2020-03-18 2023-07-26 Panasonic Intellectual Property Management Co., Ltd. PHOTOGRAPHIC DEVICE

Citations (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001509269A (ja) * 1997-01-17 2001-07-10 イギリス国 ミリメートル波撮像装置
US6777684B1 (en) * 1999-08-23 2004-08-17 Rose Research L.L.C. Systems and methods for millimeter and sub-millimeter wave imaging
JP2009276080A (ja) * 2008-05-12 2009-11-26 Hamamatsu Photonics Kk テラヘルツ波周波数分解イメージング装置
CN103257149A (zh) * 2012-02-17 2013-08-21 许布奈有限公司 检查邮件的危险内容物的方法和设备
WO2014007386A1 (en) * 2012-07-03 2014-01-09 Canon Kabushiki Kaisha Terahertz wave generator, terahertz wave detector, and terahertz time domain spectroscopy device
JP2017009296A (ja) * 2015-06-16 2017-01-12 キヤノン株式会社 電磁波伝搬装置及び情報取得装置
EP3349062A1 (en) * 2017-01-17 2018-07-18 Shibuya Corporation Terahertz wave generator
CN108444913A (zh) * 2018-01-30 2018-08-24 中国科学院上海技术物理研究所 基于单元胞立体相位光栅和互参考技术的THz光谱仪
CN108885389A (zh) * 2016-03-25 2018-11-23 松下知识产权经营株式会社 反射镜面板、反射镜膜以及显示系统
CN109983322A (zh) * 2016-11-28 2019-07-05 佳能株式会社 图像捕获装置、用图像捕获装置捕获图像的方法和照射装置

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FI107407B (fi) * 1997-09-16 2001-07-31 Metorex Internat Oy Alimillimetriaalloilla toimiva kuvausjärjestelmä
JP2002258272A (ja) * 2001-02-28 2002-09-11 Nec Corp 反射板並びに反射型液晶表示装置
US20090240139A1 (en) * 2008-03-18 2009-09-24 Steven Yi Diffuse Optical Tomography System and Method of Use
US8497477B1 (en) 2010-02-10 2013-07-30 Mvt Equity Llc Method and apparatus for efficient removal of gain fluctuation effects in passive thermal images
US9086483B2 (en) * 2011-03-28 2015-07-21 Northrop Grumman Guidance And Electronics Company, Inc. Systems and methods for detecting and/or identifying materials
US9207317B2 (en) * 2011-04-15 2015-12-08 Ariel-University Research And Development Company Ltd. Passive millimeter-wave detector
US9268017B2 (en) * 2011-07-29 2016-02-23 International Business Machines Corporation Near-field millimeter wave imaging
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CA3090636A1 (en) * 2019-08-23 2021-02-23 Institut National D'optique Terahertz illumination source for terahertz imaging
WO2021070428A1 (ja) 2019-10-09 2021-04-15 パナソニックＩｐマネジメント株式会社 撮影装置
EP4123271A4 (en) * 2020-03-18 2023-07-26 Panasonic Intellectual Property Management Co., Ltd. PHOTOGRAPHIC DEVICE

Patent Citations (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001509269A (ja) * 1997-01-17 2001-07-10 イギリス国 ミリメートル波撮像装置
US6777684B1 (en) * 1999-08-23 2004-08-17 Rose Research L.L.C. Systems and methods for millimeter and sub-millimeter wave imaging
JP2009276080A (ja) * 2008-05-12 2009-11-26 Hamamatsu Photonics Kk テラヘルツ波周波数分解イメージング装置
CN103257149A (zh) * 2012-02-17 2013-08-21 许布奈有限公司 检查邮件的危险内容物的方法和设备
WO2014007386A1 (en) * 2012-07-03 2014-01-09 Canon Kabushiki Kaisha Terahertz wave generator, terahertz wave detector, and terahertz time domain spectroscopy device
JP2017009296A (ja) * 2015-06-16 2017-01-12 キヤノン株式会社 電磁波伝搬装置及び情報取得装置
CN108885389A (zh) * 2016-03-25 2018-11-23 松下知识产权经营株式会社 反射镜面板、反射镜膜以及显示系统
CN109983322A (zh) * 2016-11-28 2019-07-05 佳能株式会社 图像捕获装置、用图像捕获装置捕获图像的方法和照射装置
EP3349062A1 (en) * 2017-01-17 2018-07-18 Shibuya Corporation Terahertz wave generator
CN108444913A (zh) * 2018-01-30 2018-08-24 中国科学院上海技术物理研究所 基于单元胞立体相位光栅和互参考技术的THz光谱仪

Also Published As

Publication number Publication date
JP7645452B2 (ja) 2025-03-14
EP4123271A1 (en) 2023-01-25
US20230003643A1 (en) 2023-01-05
US12259320B2 (en) 2025-03-25
WO2021186822A1 (ja) 2021-09-23
JPWO2021186822A1 (https=) 2021-09-23
EP4123271A4 (en) 2023-07-26

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Application publication date: 20221101