JP7624440B2 - 最適化された干渉散乱顕微鏡法のための方法および装置 - Google Patents

最適化された干渉散乱顕微鏡法のための方法および装置 Download PDF

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JP7624440B2
JP7624440B2 JP2022521213A JP2022521213A JP7624440B2 JP 7624440 B2 JP7624440 B2 JP 7624440B2 JP 2022521213 A JP2022521213 A JP 2022521213A JP 2022521213 A JP2022521213 A JP 2022521213A JP 7624440 B2 JP7624440 B2 JP 7624440B2
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signal
sample
detector
spatial filter
light
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JP2022552253A (ja
JP2022552253A5 (OSRAM
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ラングホースト，マティアス・カール・フランツ
コール，ダニエル・リチャード
グラハム，デビッド・ジョン・レハー
ククラ，フィリップ
プリースト，リー
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レフェイン・リミテッド
オックスフォード ユニヴァーシティ イノヴェーション リミテッド
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/41—Refractivity; Phase-affecting properties, e.g. optical path length
    • G01N21/45—Refractivity; Phase-affecting properties, e.g. optical path length using interferometric methods; using Schlieren methods
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/18—Arrangements with more than one light path, e.g. for comparing two specimens
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/36—Microscopes arranged for photographic purposes or projection purposes or digital imaging or video purposes including associated control and data processing arrangements
    • G02B21/361—Optical details, e.g. image relay to the camera or image sensor
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/36—Microscopes arranged for photographic purposes or projection purposes or digital imaging or video purposes including associated control and data processing arrangements
    • G02B21/365—Control or image processing arrangements for digital or video microscopes
    • G02B21/367—Control or image processing arrangements for digital or video microscopes providing an output produced by processing a plurality of individual source images, e.g. image tiling, montage, composite images, depth sectioning, image comparison
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N23/00—Cameras or camera modules comprising electronic image sensors; Control thereof
    • H04N23/70—Circuitry for compensating brightness variation in the scene
    • H04N23/72—Combination of two or more compensation controls
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/01—Arrangements or apparatus for facilitating the optical investigation
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/0092—Polarisation microscopes
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/06—Means for illuminating specimens
    • G02B21/08—Condensers
    • G02B21/14—Condensers affording illumination for phase-contrast observation
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/36—Microscopes arranged for photographic purposes or projection purposes or digital imaging or video purposes including associated control and data processing arrangements

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  • General Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Optics & Photonics (AREA)
  • Multimedia (AREA)
  • Engineering & Computer Science (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Signal Processing (AREA)
  • Microscoopes, Condenser (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
JP2022521213A 2019-10-10 2020-10-09 最適化された干渉散乱顕微鏡法のための方法および装置 Active JP7624440B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
GB1914669.5 2019-10-10
GB1914669.5A GB2588378A (en) 2019-10-10 2019-10-10 Methods and apparatus for optimised interferometric scattering microscopy
PCT/GB2020/052522 WO2021069921A1 (en) 2019-10-10 2020-10-09 Methods and apparatus for optimised interferometric scattering microscopy

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JP2022552253A JP2022552253A (ja) 2022-12-15
JP2022552253A5 JP2022552253A5 (OSRAM) 2023-09-20
JP7624440B2 true JP7624440B2 (ja) 2025-01-30

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US (1) US12111456B2 (OSRAM)
EP (1) EP4042223B1 (OSRAM)
JP (1) JP7624440B2 (OSRAM)
CN (1) CN114787609B (OSRAM)
ES (1) ES2985958T3 (OSRAM)
GB (1) GB2588378A (OSRAM)
WO (1) WO2021069921A1 (OSRAM)

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GB2593194B (en) * 2020-03-18 2022-09-07 Refeyn Ltd Methods and apparatus for optimised interferometric scattering microscopy
CN115793222A (zh) * 2022-11-18 2023-03-14 上海交通大学 一种基于多方位角照明的成像方法及成像系统
CN116297334B (zh) * 2023-01-22 2025-10-03 清华大学 一种高灵敏度的单分子显微成像方法及系统
EP4677330A1 (en) * 2023-03-06 2026-01-14 Holtra Ab Interferometric microscopy
EP4528352A1 (en) 2023-09-20 2025-03-26 Ludwig-Maximilians-Universität München Interferometric scattering microscope with a drift stabilization system

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JP2015075340A (ja) 2013-10-07 2015-04-20 アストロデザイン株式会社 光学的距離計測装置
JP2015096943A (ja) 2013-10-11 2015-05-21 パナソニックＩｐマネジメント株式会社 走査型光学顕微鏡
JP2019520612A (ja) 2016-07-13 2019-07-18 オックスフォード ユニヴァーシティ イノヴェーション リミテッド 干渉散乱顕微鏡

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JP2000249816A (ja) 1998-12-28 2000-09-14 Hitachi Zosen Corp 光学ミラーおよびこの光学ミラーを使用したレーザー投受光装置ならびにレーザー測距装置
KR20020057797A (ko) 1999-04-28 2002-07-12 더 거버닝 카운실 오브 더 유니버시티 오브 토론토 특이적으로 표적화된 촉매적 안타고니스트 및 그 용도
US20060127010A1 (en) 1999-11-03 2006-06-15 Arkansas State University Optical fibers or other waveguide having one or more modeled tap structures for forming desired illumination patterns and method of making the same
US6775009B2 (en) 2000-07-27 2004-08-10 Zetetic Institute Differential interferometric scanning near-field confocal microscopy
JP2003098439A (ja) 2001-09-25 2003-04-03 Olympus Optical Co Ltd 観察切り替え可能な顕微鏡
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US8705040B2 (en) 2004-03-06 2014-04-22 Michael Trainer Methods and apparatus for determining particle characteristics by measuring scattered light
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JP2015075340A (ja) 2013-10-07 2015-04-20 アストロデザイン株式会社 光学的距離計測装置
JP2015096943A (ja) 2013-10-11 2015-05-21 パナソニックＩｐマネジメント株式会社 走査型光学顕微鏡
JP2019520612A (ja) 2016-07-13 2019-07-18 オックスフォード ユニヴァーシティ イノヴェーション リミテッド 干渉散乱顕微鏡

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GB2588378A (en) 2021-04-28
US12111456B2 (en) 2024-10-08
EP4042223B1 (en) 2024-05-29
ES2985958T3 (es) 2024-11-07
JP2022552253A (ja) 2022-12-15
EP4042223C0 (en) 2024-05-29
US20220365329A1 (en) 2022-11-17
CN114787609A (zh) 2022-07-22
CN114787609B (zh) 2025-09-09
GB201914669D0 (en) 2019-11-27
WO2021069921A1 (en) 2021-04-15
EP4042223A1 (en) 2022-08-17

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