JP2022552253A5 - - Google Patents

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Publication number
JP2022552253A5
JP2022552253A5 JP2022521213A JP2022521213A JP2022552253A5 JP 2022552253 A5 JP2022552253 A5 JP 2022552253A5 JP 2022521213 A JP2022521213 A JP 2022521213A JP 2022521213 A JP2022521213 A JP 2022521213A JP 2022552253 A5 JP2022552253 A5 JP 2022552253A5
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JP
Japan
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signal
sample
detector
spatial filter
intensity
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JP2022521213A
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English (en)
Japanese (ja)
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JP7624440B2 (ja
JP2022552253A (ja
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Priority claimed from GB1914669.5A external-priority patent/GB2588378A/en
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JP2022521213A 2019-10-10 2020-10-09 最適化された干渉散乱顕微鏡法のための方法および装置 Active JP7624440B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
GB1914669.5 2019-10-10
GB1914669.5A GB2588378A (en) 2019-10-10 2019-10-10 Methods and apparatus for optimised interferometric scattering microscopy
PCT/GB2020/052522 WO2021069921A1 (en) 2019-10-10 2020-10-09 Methods and apparatus for optimised interferometric scattering microscopy

Publications (3)

Publication Number Publication Date
JP2022552253A JP2022552253A (ja) 2022-12-15
JP2022552253A5 true JP2022552253A5 (OSRAM) 2023-09-20
JP7624440B2 JP7624440B2 (ja) 2025-01-30

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JP2022521213A Active JP7624440B2 (ja) 2019-10-10 2020-10-09 最適化された干渉散乱顕微鏡法のための方法および装置

Country Status (7)

Country Link
US (1) US12111456B2 (OSRAM)
EP (1) EP4042223B1 (OSRAM)
JP (1) JP7624440B2 (OSRAM)
CN (1) CN114787609B (OSRAM)
ES (1) ES2985958T3 (OSRAM)
GB (1) GB2588378A (OSRAM)
WO (1) WO2021069921A1 (OSRAM)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2593194B (en) * 2020-03-18 2022-09-07 Refeyn Ltd Methods and apparatus for optimised interferometric scattering microscopy
CN115793222A (zh) * 2022-11-18 2023-03-14 上海交通大学 一种基于多方位角照明的成像方法及成像系统
CN116297334B (zh) * 2023-01-22 2025-10-03 清华大学 一种高灵敏度的单分子显微成像方法及系统
EP4677330A1 (en) * 2023-03-06 2026-01-14 Holtra Ab Interferometric microscopy
EP4528352A1 (en) 2023-09-20 2025-03-26 Ludwig-Maximilians-Universität München Interferometric scattering microscope with a drift stabilization system

Family Cites Families (26)

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Publication number Priority date Publication date Assignee Title
JP3117450B2 (ja) 1990-05-10 2000-12-11 日本分光工業株式会社 半透鏡
JP2000249816A (ja) 1998-12-28 2000-09-14 Hitachi Zosen Corp 光学ミラーおよびこの光学ミラーを使用したレーザー投受光装置ならびにレーザー測距装置
KR20020057797A (ko) 1999-04-28 2002-07-12 더 거버닝 카운실 오브 더 유니버시티 오브 토론토 특이적으로 표적화된 촉매적 안타고니스트 및 그 용도
US20060127010A1 (en) 1999-11-03 2006-06-15 Arkansas State University Optical fibers or other waveguide having one or more modeled tap structures for forming desired illumination patterns and method of making the same
US6775009B2 (en) 2000-07-27 2004-08-10 Zetetic Institute Differential interferometric scanning near-field confocal microscopy
JP2003098439A (ja) 2001-09-25 2003-04-03 Olympus Optical Co Ltd 観察切り替え可能な顕微鏡
US7557929B2 (en) 2001-12-18 2009-07-07 Massachusetts Institute Of Technology Systems and methods for phase measurements
US7223986B2 (en) * 2002-08-29 2007-05-29 Olympus Optical Co., Ltd. Laser scanning microscope
KR20050101335A (ko) 2003-02-13 2005-10-21 제테틱 인스티튜트 가로 미분 간섭계 공초점 현미경
US8705040B2 (en) 2004-03-06 2014-04-22 Michael Trainer Methods and apparatus for determining particle characteristics by measuring scattered light
US20060024722A1 (en) 2004-07-30 2006-02-02 Mark Fischer-Colbrie Samples for detection of oncofetal fibronectin and uses thereof
JP2007225392A (ja) 2006-02-22 2007-09-06 Spectratech Inc 光干渉装置
US8115919B2 (en) 2007-05-04 2012-02-14 The General Hospital Corporation Methods, arrangements and systems for obtaining information associated with a sample using optical microscopy
JP5259154B2 (ja) 2007-10-24 2013-08-07 オリンパス株式会社 走査型レーザ顕微鏡
US8570649B2 (en) 2009-10-29 2013-10-29 California Institute Of Technology Dual-mode raster point scanning/light sheet illumination microscope
WO2011132586A1 (ja) 2010-04-23 2011-10-27 浜松ホトニクス株式会社 細胞観察装置および細胞観察方法
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JP5492796B2 (ja) 2011-01-20 2014-05-14 株式会社日立製作所 光学装置
JP5611149B2 (ja) 2011-08-23 2014-10-22 株式会社日立ハイテクノロジーズ 光学顕微鏡装置及びこれを備えた検査装置
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JP6230358B2 (ja) 2013-10-07 2017-11-15 アストロデザイン株式会社 光学的距離計測装置
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GB2552195A (en) * 2016-07-13 2018-01-17 Univ Oxford Innovation Ltd Interferometric scattering microscopy
EP3276389A1 (en) 2016-07-27 2018-01-31 Fundació Institut de Ciències Fotòniques A common-path interferometric scattering imaging system and a method of using common-path interferometric scattering imaging to detect an object
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