JP7613663B2 - 回路特性測定システム、及び回路特性測定方法 - Google Patents

回路特性測定システム、及び回路特性測定方法 Download PDF

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JP7613663B2
JP7613663B2 JP2021548477A JP2021548477A JP7613663B2 JP 7613663 B2 JP7613663 B2 JP 7613663B2 JP 2021548477 A JP2021548477 A JP 2021548477A JP 2021548477 A JP2021548477 A JP 2021548477A JP 7613663 B2 JP7613663 B2 JP 7613663B2
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circuit
periodic voltage
power
signal
frequency
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Japanese (ja)
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JPWO2021060558A1 (https=
JPWO2021060558A5 (https=
Inventor
徹 名倉
俊寿 ▲ひばり▼野
宗寛 山下
正充 吉澤
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Noda Screen Co Ltd
Fukuoka University
Nidec Advance Technology Corp
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Noda Screen Co Ltd
Fukuoka University
Nidec Advance Technology Corp
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/28—Measuring attenuation, gain, phase shift or derived characteristics of electric four pole networks, i.e. two-port networks; Measuring transient response

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
JP2021548477A 2019-09-27 2020-09-28 回路特性測定システム、及び回路特性測定方法 Active JP7613663B2 (ja)

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JP2019176576 2019-09-27
JP2019176576 2019-09-27
PCT/JP2020/036634 WO2021060558A1 (ja) 2019-09-27 2020-09-28 回路特性測定システム、及び回路特性測定方法

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JPWO2021060558A1 JPWO2021060558A1 (https=) 2021-04-01
JPWO2021060558A5 JPWO2021060558A5 (https=) 2022-06-07
JP7613663B2 true JP7613663B2 (ja) 2025-01-15

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Publication number Priority date Publication date Assignee Title
US12126391B2 (en) 2022-03-28 2024-10-22 Communications Test Design, Inc. Radio frequency detector for test chamber
CN117294363A (zh) 2022-06-23 2023-12-26 欧姆佳科技股份有限公司 多射频元件群测系统及其方法

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005536749A (ja) 2002-08-20 2005-12-02 ザ ボード オブ リージェンツ，ザ ユニバーシティ オブ テキサス システム 制御可能な減衰と伝播速度とを有する波形を伝送する方法
JP2016223947A (ja) 2015-06-01 2016-12-28 三菱電機株式会社 位相余裕ゲイン余裕測定回路
JP2018509620A (ja) 2015-03-13 2018-04-05 ローズマウント インコーポレイテッド 静電容量式センサの電極変位計測のための高分解能デルタシグマ変調器
US20190064222A1 (en) 2017-08-30 2019-02-28 Analog Devices Global Unlimited Company Managing the determination of a transfer function of a measurement sensor

Family Cites Families (12)

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JPH05260662A (ja) * 1992-03-10 1993-10-08 Tokyo Electric Power Co Inc:The アクティブフィルタを利用した電圧変動抑制装置
JP3257220B2 (ja) * 1994-01-12 2002-02-18 株式会社アドバンテスト 伝達関数非接触測定装置
JPH0894691A (ja) * 1994-09-29 1996-04-12 Meidensha Corp 系統周波数特性の検出方法
JP3381109B2 (ja) * 1994-12-28 2003-02-24 ソニー株式会社 伝達関数測定装置
JP3270348B2 (ja) * 1995-12-27 2002-04-02 株式会社東芝 自励システムの雑音解析装置
US5794008A (en) * 1996-02-28 1998-08-11 Raytheon Company Electrical network modeling tool and analyzer
JP4769323B2 (ja) * 2007-03-29 2011-09-07 旭化成株式会社 信号処理装置、エコーキャンセラ、信号処理方法
JP5485618B2 (ja) * 2009-08-26 2014-05-07 パナソニック株式会社 センサ装置
JP5887110B2 (ja) * 2011-11-21 2016-03-16 株式会社ダイヘン 電力計測装置、インバータ制御回路、系統連系インバータシステム、および、電力計測方法
JP2016133490A (ja) * 2015-01-22 2016-07-25 日本電信電話株式会社 安定性判別装置
CN105222950B (zh) * 2015-09-18 2017-09-05 中国水利水电科学研究院 一种真假倍频压力脉动信号的区分方法
US10459013B2 (en) * 2016-06-17 2019-10-29 Analog Devices Global Apparatus for and method of providing measurements of uncertainty in respect of a transfer function

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005536749A (ja) 2002-08-20 2005-12-02 ザ ボード オブ リージェンツ，ザ ユニバーシティ オブ テキサス システム 制御可能な減衰と伝播速度とを有する波形を伝送する方法
JP2018509620A (ja) 2015-03-13 2018-04-05 ローズマウント インコーポレイテッド 静電容量式センサの電極変位計測のための高分解能デルタシグマ変調器
JP2016223947A (ja) 2015-06-01 2016-12-28 三菱電機株式会社 位相余裕ゲイン余裕測定回路
US20190064222A1 (en) 2017-08-30 2019-02-28 Analog Devices Global Unlimited Company Managing the determination of a transfer function of a measurement sensor

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CN114502967B (zh) 2025-05-16
WO2021060558A1 (ja) 2021-04-01
JPWO2021060558A1 (https=) 2021-04-01
CN114502967A (zh) 2022-05-13

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