CN114502967B - 电路特性测定系统及电路特性测定方法 - Google Patents

电路特性测定系统及电路特性测定方法 Download PDF

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Publication number
CN114502967B
CN114502967B CN202080067185.1A CN202080067185A CN114502967B CN 114502967 B CN114502967 B CN 114502967B CN 202080067185 A CN202080067185 A CN 202080067185A CN 114502967 B CN114502967 B CN 114502967B
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China
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circuit
periodic voltage
measured
signal
power
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Chinese (zh)
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CN114502967A (zh
Inventor
名仓彻
鸙野俊寿
山下宗寛
吉泽正充
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Noda Screen Printing Co ltd
Fukuoka University
Nidec Advance Technology Corp
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Noda Screen Printing Co ltd
Nidec Read Corp
Fukuoka University
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/28—Measuring attenuation, gain, phase shift or derived characteristics of electric four pole networks, i.e. two-port networks; Measuring transient response

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
CN202080067185.1A 2019-09-27 2020-09-28 电路特性测定系统及电路特性测定方法 Active CN114502967B (zh)

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JP2019-176576 2019-09-27
JP2019176576 2019-09-27
PCT/JP2020/036634 WO2021060558A1 (ja) 2019-09-27 2020-09-28 回路特性測定システム、及び回路特性測定方法

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CN114502967A CN114502967A (zh) 2022-05-13
CN114502967B true CN114502967B (zh) 2025-05-16

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Publication number Priority date Publication date Assignee Title
US12126391B2 (en) 2022-03-28 2024-10-22 Communications Test Design, Inc. Radio frequency detector for test chamber
CN117294363A (zh) 2022-06-23 2023-12-26 欧姆佳科技股份有限公司 多射频元件群测系统及其方法

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH09236627A (ja) * 1995-12-27 1997-09-09 Toshiba Corp 自励システムの雑音解析装置
US5794008A (en) * 1996-02-28 1998-08-11 Raytheon Company Electrical network modeling tool and analyzer

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JPH05260662A (ja) * 1992-03-10 1993-10-08 Tokyo Electric Power Co Inc:The アクティブフィルタを利用した電圧変動抑制装置
JP3257220B2 (ja) * 1994-01-12 2002-02-18 株式会社アドバンテスト 伝達関数非接触測定装置
JPH0894691A (ja) * 1994-09-29 1996-04-12 Meidensha Corp 系統周波数特性の検出方法
JP3381109B2 (ja) * 1994-12-28 2003-02-24 ソニー株式会社 伝達関数測定装置
US6847267B2 (en) * 2000-03-07 2005-01-25 Board Of Regents, The University Of Texas System Methods for transmitting a waveform having a controllable attenuation and propagation velocity
JP4769323B2 (ja) * 2007-03-29 2011-09-07 旭化成株式会社 信号処理装置、エコーキャンセラ、信号処理方法
JP5485618B2 (ja) * 2009-08-26 2014-05-07 パナソニック株式会社 センサ装置
JP5887110B2 (ja) * 2011-11-21 2016-03-16 株式会社ダイヘン 電力計測装置、インバータ制御回路、系統連系インバータシステム、および、電力計測方法
JP2016133490A (ja) * 2015-01-22 2016-07-25 日本電信電話株式会社 安定性判別装置
US9628104B2 (en) * 2015-03-13 2017-04-18 Rosemount Inc. High resolution sigma delta modulator for capacitance sensor terminal displacement measurement
JP2016223947A (ja) * 2015-06-01 2016-12-28 三菱電機株式会社 位相余裕ゲイン余裕測定回路
CN105222950B (zh) * 2015-09-18 2017-09-05 中国水利水电科学研究院 一种真假倍频压力脉动信号的区分方法
US10459013B2 (en) * 2016-06-17 2019-10-29 Analog Devices Global Apparatus for and method of providing measurements of uncertainty in respect of a transfer function
US11067604B2 (en) * 2017-08-30 2021-07-20 Analog Devices International Unlimited Company Managing the determination of a transfer function of a measurement sensor

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH09236627A (ja) * 1995-12-27 1997-09-09 Toshiba Corp 自励システムの雑音解析装置
US5794008A (en) * 1996-02-28 1998-08-11 Raytheon Company Electrical network modeling tool and analyzer

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JP7613663B2 (ja) 2025-01-15
WO2021060558A1 (ja) 2021-04-01
JPWO2021060558A1 (https=) 2021-04-01
CN114502967A (zh) 2022-05-13

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