JP7547362B2 - シャワーヘッド覆い - Google Patents
シャワーヘッド覆い Download PDFInfo
- Publication number
- JP7547362B2 JP7547362B2 JP2021557604A JP2021557604A JP7547362B2 JP 7547362 B2 JP7547362 B2 JP 7547362B2 JP 2021557604 A JP2021557604 A JP 2021557604A JP 2021557604 A JP2021557604 A JP 2021557604A JP 7547362 B2 JP7547362 B2 JP 7547362B2
- Authority
- JP
- Japan
- Prior art keywords
- processing chamber
- section
- sections
- cover housing
- showerhead
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Images
Classifications
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/455—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
- C23C16/45563—Gas nozzles
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/455—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
- C23C16/45563—Gas nozzles
- C23C16/45565—Shower nozzles
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/50—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating using electric discharges
- C23C16/505—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating using electric discharges using radio frequency discharges
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32009—Arrangements for generation of plasma specially adapted for examination or treatment of objects, e.g. plasma sources
- H01J37/32082—Radio frequency generated discharge
- H01J37/32174—Circuits specially adapted for controlling the RF discharge
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32431—Constructional details of the reactor
- H01J37/3244—Gas supply means
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32431—Constructional details of the reactor
- H01J37/32623—Mechanical discharge control means
- H01J37/32651—Shields, e.g. dark space shields, Faraday shields
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32431—Constructional details of the reactor
- H01J37/32798—Further details of plasma apparatus not provided for in groups H01J37/3244 - H01J37/32788; special provisions for cleaning or maintenance of the apparatus
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32431—Constructional details of the reactor
- H01J37/32798—Further details of plasma apparatus not provided for in groups H01J37/3244 - H01J37/32788; special provisions for cleaning or maintenance of the apparatus
- H01J37/32899—Multiple chambers, e.g. cluster tools
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K9/00—Screening of apparatus or components against electric or magnetic fields
- H05K9/0007—Casings
- H05K9/0049—Casings being metallic containers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
- H01J2237/02—Details
- H01J2237/026—Shields
- H01J2237/0266—Shields electromagnetic
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
- H01J2237/32—Processing objects by plasma generation
- H01J2237/33—Processing objects by plasma generation characterised by the type of processing
- H01J2237/332—Coating
- H01J2237/3321—CVD [Chemical Vapor Deposition]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32009—Arrangements for generation of plasma specially adapted for examination or treatment of objects, e.g. plasma sources
- H01J37/32082—Radio frequency generated discharge
- H01J37/32174—Circuits specially adapted for controlling the RF discharge
- H01J37/32183—Matching circuits
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Plasma & Fusion (AREA)
- Analytical Chemistry (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Materials Engineering (AREA)
- Mechanical Engineering (AREA)
- General Chemical & Material Sciences (AREA)
- Power Engineering (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Chemical Vapour Deposition (AREA)
- Drying Of Semiconductors (AREA)
- Plasma Technology (AREA)
- Glass Compositions (AREA)
- Massaging Devices (AREA)
- Apparatuses And Processes For Manufacturing Resistors (AREA)
- Vehicle Body Suspensions (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2024146066A JP2024167308A (ja) | 2019-03-28 | 2024-08-28 | シャワーヘッド覆い |
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US201962825344P | 2019-03-28 | 2019-03-28 | |
| US62/825,344 | 2019-03-28 | ||
| PCT/US2020/024549 WO2020198267A1 (en) | 2019-03-28 | 2020-03-25 | Showerhead shroud |
Related Child Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2024146066A Division JP2024167308A (ja) | 2019-03-28 | 2024-08-28 | シャワーヘッド覆い |
Publications (4)
| Publication Number | Publication Date |
|---|---|
| JP2022523262A JP2022523262A (ja) | 2022-04-21 |
| JPWO2020198267A5 JPWO2020198267A5 (https=) | 2023-03-31 |
| JP2022523262A5 JP2022523262A5 (https=) | 2023-03-31 |
| JP7547362B2 true JP7547362B2 (ja) | 2024-09-09 |
Family
ID=72611750
Family Applications (2)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2021557604A Active JP7547362B2 (ja) | 2019-03-28 | 2020-03-25 | シャワーヘッド覆い |
| JP2024146066A Pending JP2024167308A (ja) | 2019-03-28 | 2024-08-28 | シャワーヘッド覆い |
Family Applications After (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2024146066A Pending JP2024167308A (ja) | 2019-03-28 | 2024-08-28 | シャワーヘッド覆い |
Country Status (7)
| Country | Link |
|---|---|
| US (2) | US20220093372A1 (https=) |
| JP (2) | JP7547362B2 (https=) |
| KR (2) | KR102890569B1 (https=) |
| CN (2) | CN116334588A (https=) |
| SG (1) | SG11202110566PA (https=) |
| TW (2) | TWI886120B (https=) |
| WO (1) | WO2020198267A1 (https=) |
Families Citing this family (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWI886120B (zh) * | 2019-03-28 | 2025-06-11 | 美商蘭姆研究公司 | 護罩殼及具有該護罩殼的設備 |
| US20250251140A1 (en) * | 2022-04-22 | 2025-08-07 | Lam Research Corporation | Heat guard |
| WO2024097853A1 (en) * | 2022-11-03 | 2024-05-10 | Lam Research Corporation | Segregated reactant delivery using showerhead and shroud |
| US20250022688A1 (en) * | 2023-07-11 | 2025-01-16 | Tokyo Electron Limited | Plasma processing method and apparatus |
Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2000064051A (ja) | 1998-08-11 | 2000-02-29 | Kokusai Electric Co Ltd | プラズマcvd処理装置 |
| JP2010050483A (ja) | 2001-12-25 | 2010-03-04 | Tokyo Electron Ltd | 受け渡し機構及び処理装置 |
| US20150024609A1 (en) | 2013-07-22 | 2015-01-22 | Asm Ip Holding B.V. | Semiconductor reaction chamber with plasma capabilities |
| JP2015079964A (ja) | 2007-07-27 | 2015-04-23 | マットソン テクノロジー インコーポレイテッドMattson Technology, Inc. | 多数の加工物を処理する進歩したチャンバ |
Family Cites Families (39)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US2488710A (en) * | 1946-09-23 | 1949-11-22 | Allegheny Ludlum Steel | Enclosing shield for electrical applications |
| US4806703A (en) * | 1988-01-11 | 1989-02-21 | The Curran Company | Panel system for EMI shielded enclosures |
| US4831211A (en) * | 1988-06-08 | 1989-05-16 | Rockwell International Corporation | EMI/RFI sealed microphonics isolation apparatus and methods |
| JP3342189B2 (ja) * | 1994-08-18 | 2002-11-05 | 富士通株式会社 | 電子装置の筐体構造 |
| DE59605897D1 (de) * | 1995-02-14 | 2000-10-26 | Knuerr Mechanik Ag | Rahmenkonstruktion für Gestelle und Gehäuse von Baugruppenträgern und Schränken zur Aufnahme von elektrischen und/oder elektronischen Bauteilen |
| US6193802B1 (en) * | 1995-09-25 | 2001-02-27 | Applied Materials, Inc. | Parallel plate apparatus for in-situ vacuum line cleaning for substrate processing equipment |
| US5661640A (en) * | 1996-01-05 | 1997-08-26 | Dell Usa, L.P. | Computer chassis having a size-adjustable, TEM-shielded circuit board support plate structure therein |
| JPH1156248A (ja) * | 1997-06-09 | 1999-03-02 | Ajinomoto Co Inc | 油糧種子から高濃度油脂含有物と未変性タンパク質を分離、製造する方法 |
| JPH11312886A (ja) * | 1998-04-28 | 1999-11-09 | Mitsubishi Electric Corp | 通信機器装置の筐体構造 |
| JP3863352B2 (ja) * | 2000-06-26 | 2006-12-27 | テクトロニクス・インターナショナル・セールス・ゲーエムベーハー | 電子機器筐体 |
| JP4460418B2 (ja) * | 2004-10-13 | 2010-05-12 | 東京エレクトロン株式会社 | シールド体および真空処理装置 |
| US9345183B2 (en) * | 2005-03-15 | 2016-05-17 | Stealthdrive Canada Corp. | EMI-shielding solutions for electronics enclosures using opposing three-dimensional shapes and channels formed in sheet metal |
| AU2007284072B2 (en) * | 2006-08-15 | 2011-01-20 | Scott Hope | A cage frame |
| US8673080B2 (en) | 2007-10-16 | 2014-03-18 | Novellus Systems, Inc. | Temperature controlled showerhead |
| US8137467B2 (en) * | 2007-10-16 | 2012-03-20 | Novellus Systems, Inc. | Temperature controlled showerhead |
| US20090095218A1 (en) * | 2007-10-16 | 2009-04-16 | Novellus Systems, Inc. | Temperature controlled showerhead |
| KR200454281Y1 (ko) * | 2007-10-16 | 2011-06-23 | 노벨러스 시스템즈, 인코포레이티드 | 온도 제어 샤워헤드 |
| KR200476124Y1 (ko) * | 2009-09-29 | 2015-01-30 | 어플라이드 머티어리얼스, 인코포레이티드 | Rf전력공급 샤워헤드를 위한 편심 접지 복귀 |
| CN106884157B (zh) * | 2011-03-04 | 2019-06-21 | 诺发系统公司 | 混合型陶瓷喷淋头 |
| US9293353B2 (en) * | 2011-04-28 | 2016-03-22 | Lam Research Corporation | Faraday shield having plasma density decoupling structure between TCP coil zones |
| CN102802386B (zh) * | 2011-05-25 | 2016-04-20 | 莱尔德电子材料(深圳)有限公司 | 电磁干扰屏蔽组件 |
| US9947512B2 (en) * | 2011-10-25 | 2018-04-17 | Lam Research Corporation | Window and mounting arrangement for twist-and-lock gas injector assembly of inductively coupled plasma chamber |
| US8780004B1 (en) * | 2012-01-31 | 2014-07-15 | Western Digital Technologies, Inc. | Dual configuration enclosure with optional shielding |
| US8987872B2 (en) * | 2013-03-11 | 2015-03-24 | Qualcomm Incorporated | Electromagnetic interference enclosure for radio frequency multi-chip integrated circuit packages |
| US9758349B2 (en) * | 2013-08-09 | 2017-09-12 | Man-D-Tec, Inc. | Elevator ventilation fan assembly |
| US9543158B2 (en) * | 2014-12-04 | 2017-01-10 | Lam Research Corporation | Technique to deposit sidewall passivation for high aspect ratio cylinder etch |
| US20150129131A1 (en) * | 2013-11-14 | 2015-05-14 | Taiwan Semiconductor Manufacturing Co., Ltd. | Semiconductor processing apparatus and pre-clean system |
| US20150185792A1 (en) * | 2013-12-26 | 2015-07-02 | Shih-Wun Li | DUAL-layer SYSTEM COMPUTER ENCLOSURE |
| US10081869B2 (en) * | 2014-06-10 | 2018-09-25 | Lam Research Corporation | Defect control in RF plasma substrate processing systems using DC bias voltage during movement of substrates |
| US10047438B2 (en) * | 2014-06-10 | 2018-08-14 | Lam Research Corporation | Defect control and stability of DC bias in RF plasma-based substrate processing systems using molecular reactive purge gas |
| US20160379851A1 (en) * | 2015-06-29 | 2016-12-29 | Bharath Swaminathan | Temperature controlled substrate processing |
| US10879041B2 (en) * | 2015-09-04 | 2020-12-29 | Applied Materials, Inc. | Method and apparatus of achieving high input impedance without using ferrite materials for RF filter applications in plasma chambers |
| US10373794B2 (en) * | 2015-10-29 | 2019-08-06 | Lam Research Corporation | Systems and methods for filtering radio frequencies from a signal of a thermocouple and controlling a temperature of an electrode in a plasma chamber |
| US20170194174A1 (en) * | 2015-12-30 | 2017-07-06 | Applied Materials, Inc. | Quad chamber and platform having multiple quad chambers |
| US9773643B1 (en) * | 2016-06-30 | 2017-09-26 | Lam Research Corporation | Apparatus and method for deposition and etch in gap fill |
| JP2018014406A (ja) * | 2016-07-21 | 2018-01-25 | 富士通株式会社 | 筐体及び電子機器 |
| KR102157824B1 (ko) * | 2016-08-01 | 2020-09-18 | 어플라이드 머티어리얼스, 인코포레이티드 | 저-손상 및 고-스루풋 플라즈마 프로세싱을 위한 대면적 vhf pecvd 챔버 |
| KR102330098B1 (ko) * | 2017-04-24 | 2021-11-23 | 주성엔지니어링(주) | 기판 처리 장치 |
| TWI886120B (zh) | 2019-03-28 | 2025-06-11 | 美商蘭姆研究公司 | 護罩殼及具有該護罩殼的設備 |
-
2020
- 2020-03-24 TW TW109109726A patent/TWI886120B/zh active
- 2020-03-24 TW TW114116543A patent/TW202542358A/zh unknown
- 2020-03-25 JP JP2021557604A patent/JP7547362B2/ja active Active
- 2020-03-25 US US17/598,433 patent/US20220093372A1/en active Pending
- 2020-03-25 KR KR1020227032315A patent/KR102890569B1/ko active Active
- 2020-03-25 KR KR1020217034994A patent/KR102445935B1/ko active Active
- 2020-03-25 SG SG11202110566PA patent/SG11202110566PA/en unknown
- 2020-03-25 CN CN202310180191.3A patent/CN116334588A/zh active Pending
- 2020-03-25 WO PCT/US2020/024549 patent/WO2020198267A1/en not_active Ceased
- 2020-03-25 CN CN202080025678.9A patent/CN113646466A/zh active Pending
-
2021
- 2021-12-10 US US17/643,718 patent/US11488810B2/en active Active
-
2024
- 2024-08-28 JP JP2024146066A patent/JP2024167308A/ja active Pending
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2000064051A (ja) | 1998-08-11 | 2000-02-29 | Kokusai Electric Co Ltd | プラズマcvd処理装置 |
| JP2010050483A (ja) | 2001-12-25 | 2010-03-04 | Tokyo Electron Ltd | 受け渡し機構及び処理装置 |
| JP2015079964A (ja) | 2007-07-27 | 2015-04-23 | マットソン テクノロジー インコーポレイテッドMattson Technology, Inc. | 多数の加工物を処理する進歩したチャンバ |
| US20150024609A1 (en) | 2013-07-22 | 2015-01-22 | Asm Ip Holding B.V. | Semiconductor reaction chamber with plasma capabilities |
Also Published As
| Publication number | Publication date |
|---|---|
| SG11202110566PA (en) | 2021-10-28 |
| CN113646466A (zh) | 2021-11-12 |
| US11488810B2 (en) | 2022-11-01 |
| KR102890569B1 (ko) | 2025-11-24 |
| TWI886120B (zh) | 2025-06-11 |
| WO2020198267A1 (en) | 2020-10-01 |
| JP2022523262A (ja) | 2022-04-21 |
| JP2024167308A (ja) | 2024-12-03 |
| KR102445935B1 (ko) | 2022-09-20 |
| KR20220132047A (ko) | 2022-09-29 |
| KR20210134427A (ko) | 2021-11-09 |
| US20220110230A1 (en) | 2022-04-07 |
| TW202542358A (zh) | 2025-11-01 |
| CN116334588A (zh) | 2023-06-27 |
| TW202104656A (zh) | 2021-02-01 |
| US20220093372A1 (en) | 2022-03-24 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| JP7313528B2 (ja) | 流れ均一性を改善させるためのフェースプレート穴を有する低容積シャワーヘッド | |
| JP7547362B2 (ja) | シャワーヘッド覆い | |
| JP2020025100A (ja) | 寄生プラズマを抑制してウエハ内での不均一性を低減するための基板処理システム | |
| KR102630920B1 (ko) | 구리를 포함하는 합금으로 이루어진 컴포넌트들을 갖는 기판 프로세싱 챔버들로 인한 구리 오염물을 감소시키기 위한 시스템들 및 방법들 | |
| TWI823977B (zh) | 預防半導體基板處理中基座上的沉積 | |
| JP7547378B2 (ja) | 基板処理システム用フィルタボックス | |
| TWI849145B (zh) | 基板處理系統用的縮小直徑承載環硬件 | |
| KR102957967B1 (ko) | 기판 프로세싱 시스템을 위한 필터 박스 | |
| WO2021247627A1 (en) | Monobloc pedestal for efficient heat transfer | |
| TWI906262B (zh) | 基板處理工具的線性配置 | |
| TW202609860A (zh) | 基板處理工具的線性配置 |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20230323 |
|
| A621 | Written request for application examination |
Free format text: JAPANESE INTERMEDIATE CODE: A621 Effective date: 20230323 |
|
| A131 | Notification of reasons for refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A131 Effective date: 20240305 |
|
| A977 | Report on retrieval |
Free format text: JAPANESE INTERMEDIATE CODE: A971007 Effective date: 20240306 |
|
| A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20240605 |
|
| TRDD | Decision of grant or rejection written | ||
| A01 | Written decision to grant a patent or to grant a registration (utility model) |
Free format text: JAPANESE INTERMEDIATE CODE: A01 Effective date: 20240806 |
|
| A61 | First payment of annual fees (during grant procedure) |
Free format text: JAPANESE INTERMEDIATE CODE: A61 Effective date: 20240828 |
|
| R150 | Certificate of patent or registration of utility model |
Ref document number: 7547362 Country of ref document: JP Free format text: JAPANESE INTERMEDIATE CODE: R150 |