JP7547362B2 - シャワーヘッド覆い - Google Patents

シャワーヘッド覆い Download PDF

Info

Publication number
JP7547362B2
JP7547362B2 JP2021557604A JP2021557604A JP7547362B2 JP 7547362 B2 JP7547362 B2 JP 7547362B2 JP 2021557604 A JP2021557604 A JP 2021557604A JP 2021557604 A JP2021557604 A JP 2021557604A JP 7547362 B2 JP7547362 B2 JP 7547362B2
Authority
JP
Japan
Prior art keywords
processing chamber
section
sections
cover housing
showerhead
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
JP2021557604A
Other languages
English (en)
Japanese (ja)
Other versions
JPWO2020198267A5 (https=
JP2022523262A5 (https=
JP2022523262A (ja
Inventor
ボース・アンドリュー
ラムゼイヤー・クリストファー
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Lam Research Corp
Original Assignee
Lam Research Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Lam Research Corp filed Critical Lam Research Corp
Publication of JP2022523262A publication Critical patent/JP2022523262A/ja
Publication of JPWO2020198267A5 publication Critical patent/JPWO2020198267A5/ja
Publication of JP2022523262A5 publication Critical patent/JP2022523262A5/ja
Priority to JP2024146066A priority Critical patent/JP2024167308A/ja
Application granted granted Critical
Publication of JP7547362B2 publication Critical patent/JP7547362B2/ja
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Classifications

    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/44Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
    • C23C16/455Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
    • C23C16/45563Gas nozzles
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/44Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
    • C23C16/455Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
    • C23C16/45563Gas nozzles
    • C23C16/45565Shower nozzles
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/44Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
    • C23C16/50Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating using electric discharges
    • C23C16/505Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating using electric discharges using radio frequency discharges
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/32Gas-filled discharge tubes
    • H01J37/32009Arrangements for generation of plasma specially adapted for examination or treatment of objects, e.g. plasma sources
    • H01J37/32082Radio frequency generated discharge
    • H01J37/32174Circuits specially adapted for controlling the RF discharge
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/32Gas-filled discharge tubes
    • H01J37/32431Constructional details of the reactor
    • H01J37/3244Gas supply means
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/32Gas-filled discharge tubes
    • H01J37/32431Constructional details of the reactor
    • H01J37/32623Mechanical discharge control means
    • H01J37/32651Shields, e.g. dark space shields, Faraday shields
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/32Gas-filled discharge tubes
    • H01J37/32431Constructional details of the reactor
    • H01J37/32798Further details of plasma apparatus not provided for in groups H01J37/3244 - H01J37/32788; special provisions for cleaning or maintenance of the apparatus
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/32Gas-filled discharge tubes
    • H01J37/32431Constructional details of the reactor
    • H01J37/32798Further details of plasma apparatus not provided for in groups H01J37/3244 - H01J37/32788; special provisions for cleaning or maintenance of the apparatus
    • H01J37/32899Multiple chambers, e.g. cluster tools
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K9/00Screening of apparatus or components against electric or magnetic fields
    • H05K9/0007Casings
    • H05K9/0049Casings being metallic containers
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/02Details
    • H01J2237/026Shields
    • H01J2237/0266Shields electromagnetic
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/32Processing objects by plasma generation
    • H01J2237/33Processing objects by plasma generation characterised by the type of processing
    • H01J2237/332Coating
    • H01J2237/3321CVD [Chemical Vapor Deposition]
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/32Gas-filled discharge tubes
    • H01J37/32009Arrangements for generation of plasma specially adapted for examination or treatment of objects, e.g. plasma sources
    • H01J37/32082Radio frequency generated discharge
    • H01J37/32174Circuits specially adapted for controlling the RF discharge
    • H01J37/32183Matching circuits

Landscapes

  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Plasma & Fusion (AREA)
  • Analytical Chemistry (AREA)
  • Metallurgy (AREA)
  • Organic Chemistry (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Materials Engineering (AREA)
  • Mechanical Engineering (AREA)
  • General Chemical & Material Sciences (AREA)
  • Power Engineering (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Chemical Vapour Deposition (AREA)
  • Drying Of Semiconductors (AREA)
  • Plasma Technology (AREA)
  • Glass Compositions (AREA)
  • Massaging Devices (AREA)
  • Apparatuses And Processes For Manufacturing Resistors (AREA)
  • Vehicle Body Suspensions (AREA)
JP2021557604A 2019-03-28 2020-03-25 シャワーヘッド覆い Active JP7547362B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2024146066A JP2024167308A (ja) 2019-03-28 2024-08-28 シャワーヘッド覆い

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US201962825344P 2019-03-28 2019-03-28
US62/825,344 2019-03-28
PCT/US2020/024549 WO2020198267A1 (en) 2019-03-28 2020-03-25 Showerhead shroud

Related Child Applications (1)

Application Number Title Priority Date Filing Date
JP2024146066A Division JP2024167308A (ja) 2019-03-28 2024-08-28 シャワーヘッド覆い

Publications (4)

Publication Number Publication Date
JP2022523262A JP2022523262A (ja) 2022-04-21
JPWO2020198267A5 JPWO2020198267A5 (https=) 2023-03-31
JP2022523262A5 JP2022523262A5 (https=) 2023-03-31
JP7547362B2 true JP7547362B2 (ja) 2024-09-09

Family

ID=72611750

Family Applications (2)

Application Number Title Priority Date Filing Date
JP2021557604A Active JP7547362B2 (ja) 2019-03-28 2020-03-25 シャワーヘッド覆い
JP2024146066A Pending JP2024167308A (ja) 2019-03-28 2024-08-28 シャワーヘッド覆い

Family Applications After (1)

Application Number Title Priority Date Filing Date
JP2024146066A Pending JP2024167308A (ja) 2019-03-28 2024-08-28 シャワーヘッド覆い

Country Status (7)

Country Link
US (2) US20220093372A1 (https=)
JP (2) JP7547362B2 (https=)
KR (2) KR102890569B1 (https=)
CN (2) CN116334588A (https=)
SG (1) SG11202110566PA (https=)
TW (2) TWI886120B (https=)
WO (1) WO2020198267A1 (https=)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI886120B (zh) * 2019-03-28 2025-06-11 美商蘭姆研究公司 護罩殼及具有該護罩殼的設備
US20250251140A1 (en) * 2022-04-22 2025-08-07 Lam Research Corporation Heat guard
WO2024097853A1 (en) * 2022-11-03 2024-05-10 Lam Research Corporation Segregated reactant delivery using showerhead and shroud
US20250022688A1 (en) * 2023-07-11 2025-01-16 Tokyo Electron Limited Plasma processing method and apparatus

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2000064051A (ja) 1998-08-11 2000-02-29 Kokusai Electric Co Ltd プラズマcvd処理装置
JP2010050483A (ja) 2001-12-25 2010-03-04 Tokyo Electron Ltd 受け渡し機構及び処理装置
US20150024609A1 (en) 2013-07-22 2015-01-22 Asm Ip Holding B.V. Semiconductor reaction chamber with plasma capabilities
JP2015079964A (ja) 2007-07-27 2015-04-23 マットソン テクノロジー インコーポレイテッドMattson Technology, Inc. 多数の加工物を処理する進歩したチャンバ

Family Cites Families (39)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2488710A (en) * 1946-09-23 1949-11-22 Allegheny Ludlum Steel Enclosing shield for electrical applications
US4806703A (en) * 1988-01-11 1989-02-21 The Curran Company Panel system for EMI shielded enclosures
US4831211A (en) * 1988-06-08 1989-05-16 Rockwell International Corporation EMI/RFI sealed microphonics isolation apparatus and methods
JP3342189B2 (ja) * 1994-08-18 2002-11-05 富士通株式会社 電子装置の筐体構造
DE59605897D1 (de) * 1995-02-14 2000-10-26 Knuerr Mechanik Ag Rahmenkonstruktion für Gestelle und Gehäuse von Baugruppenträgern und Schränken zur Aufnahme von elektrischen und/oder elektronischen Bauteilen
US6193802B1 (en) * 1995-09-25 2001-02-27 Applied Materials, Inc. Parallel plate apparatus for in-situ vacuum line cleaning for substrate processing equipment
US5661640A (en) * 1996-01-05 1997-08-26 Dell Usa, L.P. Computer chassis having a size-adjustable, TEM-shielded circuit board support plate structure therein
JPH1156248A (ja) * 1997-06-09 1999-03-02 Ajinomoto Co Inc 油糧種子から高濃度油脂含有物と未変性タンパク質を分離、製造する方法
JPH11312886A (ja) * 1998-04-28 1999-11-09 Mitsubishi Electric Corp 通信機器装置の筐体構造
JP3863352B2 (ja) * 2000-06-26 2006-12-27 テクトロニクス・インターナショナル・セールス・ゲーエムベーハー 電子機器筐体
JP4460418B2 (ja) * 2004-10-13 2010-05-12 東京エレクトロン株式会社 シールド体および真空処理装置
US9345183B2 (en) * 2005-03-15 2016-05-17 Stealthdrive Canada Corp. EMI-shielding solutions for electronics enclosures using opposing three-dimensional shapes and channels formed in sheet metal
AU2007284072B2 (en) * 2006-08-15 2011-01-20 Scott Hope A cage frame
US8673080B2 (en) 2007-10-16 2014-03-18 Novellus Systems, Inc. Temperature controlled showerhead
US8137467B2 (en) * 2007-10-16 2012-03-20 Novellus Systems, Inc. Temperature controlled showerhead
US20090095218A1 (en) * 2007-10-16 2009-04-16 Novellus Systems, Inc. Temperature controlled showerhead
KR200454281Y1 (ko) * 2007-10-16 2011-06-23 노벨러스 시스템즈, 인코포레이티드 온도 제어 샤워헤드
KR200476124Y1 (ko) * 2009-09-29 2015-01-30 어플라이드 머티어리얼스, 인코포레이티드 Rf­전력공급 샤워헤드를 위한 편심 접지 복귀
CN106884157B (zh) * 2011-03-04 2019-06-21 诺发系统公司 混合型陶瓷喷淋头
US9293353B2 (en) * 2011-04-28 2016-03-22 Lam Research Corporation Faraday shield having plasma density decoupling structure between TCP coil zones
CN102802386B (zh) * 2011-05-25 2016-04-20 莱尔德电子材料(深圳)有限公司 电磁干扰屏蔽组件
US9947512B2 (en) * 2011-10-25 2018-04-17 Lam Research Corporation Window and mounting arrangement for twist-and-lock gas injector assembly of inductively coupled plasma chamber
US8780004B1 (en) * 2012-01-31 2014-07-15 Western Digital Technologies, Inc. Dual configuration enclosure with optional shielding
US8987872B2 (en) * 2013-03-11 2015-03-24 Qualcomm Incorporated Electromagnetic interference enclosure for radio frequency multi-chip integrated circuit packages
US9758349B2 (en) * 2013-08-09 2017-09-12 Man-D-Tec, Inc. Elevator ventilation fan assembly
US9543158B2 (en) * 2014-12-04 2017-01-10 Lam Research Corporation Technique to deposit sidewall passivation for high aspect ratio cylinder etch
US20150129131A1 (en) * 2013-11-14 2015-05-14 Taiwan Semiconductor Manufacturing Co., Ltd. Semiconductor processing apparatus and pre-clean system
US20150185792A1 (en) * 2013-12-26 2015-07-02 Shih-Wun Li DUAL-layer SYSTEM COMPUTER ENCLOSURE
US10081869B2 (en) * 2014-06-10 2018-09-25 Lam Research Corporation Defect control in RF plasma substrate processing systems using DC bias voltage during movement of substrates
US10047438B2 (en) * 2014-06-10 2018-08-14 Lam Research Corporation Defect control and stability of DC bias in RF plasma-based substrate processing systems using molecular reactive purge gas
US20160379851A1 (en) * 2015-06-29 2016-12-29 Bharath Swaminathan Temperature controlled substrate processing
US10879041B2 (en) * 2015-09-04 2020-12-29 Applied Materials, Inc. Method and apparatus of achieving high input impedance without using ferrite materials for RF filter applications in plasma chambers
US10373794B2 (en) * 2015-10-29 2019-08-06 Lam Research Corporation Systems and methods for filtering radio frequencies from a signal of a thermocouple and controlling a temperature of an electrode in a plasma chamber
US20170194174A1 (en) * 2015-12-30 2017-07-06 Applied Materials, Inc. Quad chamber and platform having multiple quad chambers
US9773643B1 (en) * 2016-06-30 2017-09-26 Lam Research Corporation Apparatus and method for deposition and etch in gap fill
JP2018014406A (ja) * 2016-07-21 2018-01-25 富士通株式会社 筐体及び電子機器
KR102157824B1 (ko) * 2016-08-01 2020-09-18 어플라이드 머티어리얼스, 인코포레이티드 저-손상 및 고-스루풋 플라즈마 프로세싱을 위한 대면적 vhf pecvd 챔버
KR102330098B1 (ko) * 2017-04-24 2021-11-23 주성엔지니어링(주) 기판 처리 장치
TWI886120B (zh) 2019-03-28 2025-06-11 美商蘭姆研究公司 護罩殼及具有該護罩殼的設備

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2000064051A (ja) 1998-08-11 2000-02-29 Kokusai Electric Co Ltd プラズマcvd処理装置
JP2010050483A (ja) 2001-12-25 2010-03-04 Tokyo Electron Ltd 受け渡し機構及び処理装置
JP2015079964A (ja) 2007-07-27 2015-04-23 マットソン テクノロジー インコーポレイテッドMattson Technology, Inc. 多数の加工物を処理する進歩したチャンバ
US20150024609A1 (en) 2013-07-22 2015-01-22 Asm Ip Holding B.V. Semiconductor reaction chamber with plasma capabilities

Also Published As

Publication number Publication date
SG11202110566PA (en) 2021-10-28
CN113646466A (zh) 2021-11-12
US11488810B2 (en) 2022-11-01
KR102890569B1 (ko) 2025-11-24
TWI886120B (zh) 2025-06-11
WO2020198267A1 (en) 2020-10-01
JP2022523262A (ja) 2022-04-21
JP2024167308A (ja) 2024-12-03
KR102445935B1 (ko) 2022-09-20
KR20220132047A (ko) 2022-09-29
KR20210134427A (ko) 2021-11-09
US20220110230A1 (en) 2022-04-07
TW202542358A (zh) 2025-11-01
CN116334588A (zh) 2023-06-27
TW202104656A (zh) 2021-02-01
US20220093372A1 (en) 2022-03-24

Similar Documents

Publication Publication Date Title
JP7313528B2 (ja) 流れ均一性を改善させるためのフェースプレート穴を有する低容積シャワーヘッド
JP7547362B2 (ja) シャワーヘッド覆い
JP2020025100A (ja) 寄生プラズマを抑制してウエハ内での不均一性を低減するための基板処理システム
KR102630920B1 (ko) 구리를 포함하는 합금으로 이루어진 컴포넌트들을 갖는 기판 프로세싱 챔버들로 인한 구리 오염물을 감소시키기 위한 시스템들 및 방법들
TWI823977B (zh) 預防半導體基板處理中基座上的沉積
JP7547378B2 (ja) 基板処理システム用フィルタボックス
TWI849145B (zh) 基板處理系統用的縮小直徑承載環硬件
KR102957967B1 (ko) 기판 프로세싱 시스템을 위한 필터 박스
WO2021247627A1 (en) Monobloc pedestal for efficient heat transfer
TWI906262B (zh) 基板處理工具的線性配置
TW202609860A (zh) 基板處理工具的線性配置

Legal Events

Date Code Title Description
A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20230323

A621 Written request for application examination

Free format text: JAPANESE INTERMEDIATE CODE: A621

Effective date: 20230323

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20240305

A977 Report on retrieval

Free format text: JAPANESE INTERMEDIATE CODE: A971007

Effective date: 20240306

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20240605

TRDD Decision of grant or rejection written
A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

Effective date: 20240806

A61 First payment of annual fees (during grant procedure)

Free format text: JAPANESE INTERMEDIATE CODE: A61

Effective date: 20240828

R150 Certificate of patent or registration of utility model

Ref document number: 7547362

Country of ref document: JP

Free format text: JAPANESE INTERMEDIATE CODE: R150