JP7536540B2 - プラズマ処理装置及びプラズマ処理方法 - Google Patents

プラズマ処理装置及びプラズマ処理方法 Download PDF

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Publication number
JP7536540B2
JP7536540B2 JP2020122121A JP2020122121A JP7536540B2 JP 7536540 B2 JP7536540 B2 JP 7536540B2 JP 2020122121 A JP2020122121 A JP 2020122121A JP 2020122121 A JP2020122121 A JP 2020122121A JP 7536540 B2 JP7536540 B2 JP 7536540B2
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voltage
high frequency
edge ring
frequency power
plasma processing
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Japanese (ja)
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JP2022018776A (ja
JP2022018776A5 (enExample
Inventor
夏実 鳥井
幸一 永海
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Tokyo Electron Ltd
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Tokyo Electron Ltd
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Priority to JP2020122121A priority Critical patent/JP7536540B2/ja
Priority to TW110124343A priority patent/TW202209934A/zh
Priority to CN202110773998.9A priority patent/CN113948364B/zh
Priority to KR1020210092221A priority patent/KR20220009892A/ko
Priority to US17/376,771 priority patent/US11646181B2/en
Publication of JP2022018776A publication Critical patent/JP2022018776A/ja
Priority to US18/136,692 priority patent/US20230260766A1/en
Publication of JP2022018776A5 publication Critical patent/JP2022018776A5/ja
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    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/32—Gas-filled discharge tubes
    • H01J37/32009—Arrangements for generation of plasma specially adapted for examination or treatment of objects, e.g. plasma sources
    • H01J37/32082—Radio frequency generated discharge
    • H01J37/32137—Radio frequency generated discharge controlling of the discharge by modulation of energy
    • H01J37/32146—Amplitude modulation, includes pulsing
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/32—Gas-filled discharge tubes
    • H01J37/32009—Arrangements for generation of plasma specially adapted for examination or treatment of objects, e.g. plasma sources
    • H01J37/32082—Radio frequency generated discharge
    • H01J37/32174—Circuits specially adapted for controlling the RF discharge
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/32—Gas-filled discharge tubes
    • H01J37/32009—Arrangements for generation of plasma specially adapted for examination or treatment of objects, e.g. plasma sources
    • H01J37/32082—Radio frequency generated discharge
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/32—Gas-filled discharge tubes
    • H01J37/32009—Arrangements for generation of plasma specially adapted for examination or treatment of objects, e.g. plasma sources
    • H01J37/32082—Radio frequency generated discharge
    • H01J37/32091—Radio frequency generated discharge the radio frequency energy being capacitively coupled to the plasma
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/32—Gas-filled discharge tubes
    • H01J37/32009—Arrangements for generation of plasma specially adapted for examination or treatment of objects, e.g. plasma sources
    • H01J37/32082—Radio frequency generated discharge
    • H01J37/32174—Circuits specially adapted for controlling the RF discharge
    • H01J37/32183—Matching circuits
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/32—Gas-filled discharge tubes
    • H01J37/32431—Constructional details of the reactor
    • H01J37/32623—Mechanical discharge control means
    • H01J37/32642—Focus rings
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/32—Gas-filled discharge tubes
    • H01J37/32431—Constructional details of the reactor
    • H01J37/32715—Workpiece holder
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/32—Gas-filled discharge tubes
    • H01J37/32917—Plasma diagnostics
    • H01J37/32935—Monitoring and controlling tubes by information coming from the object and/or discharge
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
    • H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
    • H01L21/302—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
    • H01L21/306—Chemical or electrical treatment, e.g. electrolytic etching
    • H01L21/3065—Plasma etching; Reactive-ion etching
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
    • H01L21/6831—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using electrostatic chucks
    • H01L21/6833—Details of electrostatic chucks

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Plasma & Fusion (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Drying Of Semiconductors (AREA)
  • Plasma Technology (AREA)
JP2020122121A 2020-07-16 2020-07-16 プラズマ処理装置及びプラズマ処理方法 Active JP7536540B2 (ja)

Priority Applications (6)

Application Number Priority Date Filing Date Title
JP2020122121A JP7536540B2 (ja) 2020-07-16 2020-07-16 プラズマ処理装置及びプラズマ処理方法
TW110124343A TW202209934A (zh) 2020-07-16 2021-07-02 電漿處理裝置及電漿處理方法
CN202110773998.9A CN113948364B (zh) 2020-07-16 2021-07-08 等离子体处理装置和等离子体处理方法
KR1020210092221A KR20220009892A (ko) 2020-07-16 2021-07-14 플라즈마 처리 장치 및 플라즈마 처리 방법
US17/376,771 US11646181B2 (en) 2020-07-16 2021-07-15 Plasma processing apparatus and plasma processing method
US18/136,692 US20230260766A1 (en) 2020-07-16 2023-04-19 Plasma processing apparatus and plasma processing method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2020122121A JP7536540B2 (ja) 2020-07-16 2020-07-16 プラズマ処理装置及びプラズマ処理方法

Publications (3)

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JP2022018776A JP2022018776A (ja) 2022-01-27
JP2022018776A5 JP2022018776A5 (enExample) 2023-07-24
JP7536540B2 true JP7536540B2 (ja) 2024-08-20

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US (2) US11646181B2 (enExample)
JP (1) JP7536540B2 (enExample)
KR (1) KR20220009892A (enExample)
CN (1) CN113948364B (enExample)
TW (1) TW202209934A (enExample)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP7536540B2 (ja) * 2020-07-16 2024-08-20 東京エレクトロン株式会社 プラズマ処理装置及びプラズマ処理方法
JP7534235B2 (ja) * 2021-02-01 2024-08-14 東京エレクトロン株式会社 フィルタ回路及びプラズマ処理装置
JP7727714B2 (ja) * 2021-03-23 2025-08-21 東京エレクトロン株式会社 プラズマ処理装置及びプラズマ処理方法
KR20230175233A (ko) * 2021-04-23 2023-12-29 도쿄엘렉트론가부시키가이샤 플라즈마 처리 장치 및 기판 처리 방법
WO2023026317A1 (ja) * 2021-08-23 2023-03-02 株式会社日立ハイテク プラズマ処理装置及びプラズマ処理方法
TW202331780A (zh) * 2021-09-15 2023-08-01 日商東京威力科創股份有限公司 電漿處理裝置及電漿處理方法
KR20250084933A (ko) * 2022-09-30 2025-06-11 도쿄엘렉트론가부시키가이샤 기판 처리 시스템
CN120077467A (zh) * 2023-09-29 2025-05-30 东京毅力科创株式会社 等离子体处理装置和等离子体处理方法
KR102886431B1 (ko) * 2023-09-29 2025-11-17 도쿄엘렉트론가부시키가이샤 플라스마 처리 장치 및 기판 처리 시스템
WO2025182632A1 (ja) * 2024-02-28 2025-09-04 東京エレクトロン株式会社 プラズマ処理装置

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JP2010040627A (ja) 2008-08-01 2010-02-18 Tokyo Electron Ltd プラズマ処理方法及びプラズマ処理装置
JP2014186994A (ja) 2013-02-20 2014-10-02 Tokyo Electron Ltd プラズマ処理装置及びプラズマ処理方法
JP2019004027A (ja) 2017-06-14 2019-01-10 東京エレクトロン株式会社 プラズマ処理装置及びプラズマ処理方法
JP2020061546A (ja) 2018-10-10 2020-04-16 東京エレクトロン株式会社 プラズマ処理装置及び制御方法

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JP4833890B2 (ja) 2007-03-12 2011-12-07 東京エレクトロン株式会社 プラズマ処理装置及びプラズマ分布補正方法
US9039871B2 (en) * 2007-11-16 2015-05-26 Advanced Energy Industries, Inc. Methods and apparatus for applying periodic voltage using direct current
JP5281309B2 (ja) * 2008-03-28 2013-09-04 東京エレクトロン株式会社 プラズマエッチング装置及びプラズマエッチング方法及びコンピュータ読み取り可能な記憶媒体
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JP2010040627A (ja) 2008-08-01 2010-02-18 Tokyo Electron Ltd プラズマ処理方法及びプラズマ処理装置
JP2014186994A (ja) 2013-02-20 2014-10-02 Tokyo Electron Ltd プラズマ処理装置及びプラズマ処理方法
JP2019004027A (ja) 2017-06-14 2019-01-10 東京エレクトロン株式会社 プラズマ処理装置及びプラズマ処理方法
JP2020061546A (ja) 2018-10-10 2020-04-16 東京エレクトロン株式会社 プラズマ処理装置及び制御方法

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Publication number Publication date
US11646181B2 (en) 2023-05-09
KR20220009892A (ko) 2022-01-25
CN113948364A (zh) 2022-01-18
JP2022018776A (ja) 2022-01-27
US20230260766A1 (en) 2023-08-17
US20220020576A1 (en) 2022-01-20
TW202209934A (zh) 2022-03-01
CN113948364B (zh) 2025-10-31

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