JP7450700B2 - 加工装置 - Google Patents
加工装置 Download PDFInfo
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- JP7450700B2 JP7450700B2 JP2022501793A JP2022501793A JP7450700B2 JP 7450700 B2 JP7450700 B2 JP 7450700B2 JP 2022501793 A JP2022501793 A JP 2022501793A JP 2022501793 A JP2022501793 A JP 2022501793A JP 7450700 B2 JP7450700 B2 JP 7450700B2
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- 238000012545 processing Methods 0.000 title claims description 48
- 239000007788 liquid Substances 0.000 claims description 133
- 238000004140 cleaning Methods 0.000 claims description 129
- 239000000758 substrate Substances 0.000 claims description 64
- 239000007921 spray Substances 0.000 claims description 38
- 238000009826 distribution Methods 0.000 claims description 9
- 238000000227 grinding Methods 0.000 description 182
- 238000012423 maintenance Methods 0.000 description 12
- 239000012530 fluid Substances 0.000 description 11
- 238000002347 injection Methods 0.000 description 11
- 239000007924 injection Substances 0.000 description 11
- 238000005192 partition Methods 0.000 description 9
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 9
- 238000005520 cutting process Methods 0.000 description 7
- 238000006243 chemical reaction Methods 0.000 description 6
- 238000003780 insertion Methods 0.000 description 5
- 230000037431 insertion Effects 0.000 description 5
- 238000005507 spraying Methods 0.000 description 5
- CURLTUGMZLYLDI-UHFFFAOYSA-N Carbon dioxide Chemical compound O=C=O CURLTUGMZLYLDI-UHFFFAOYSA-N 0.000 description 4
- 230000003028 elevating effect Effects 0.000 description 4
- 238000005516 engineering process Methods 0.000 description 4
- 238000003754 machining Methods 0.000 description 4
- 230000002265 prevention Effects 0.000 description 4
- 239000002699 waste material Substances 0.000 description 4
- 239000006061 abrasive grain Substances 0.000 description 3
- 230000008859 change Effects 0.000 description 3
- 239000008367 deionised water Substances 0.000 description 3
- 229910021641 deionized water Inorganic materials 0.000 description 3
- 230000001965 increasing effect Effects 0.000 description 3
- 239000000463 material Substances 0.000 description 3
- 238000000034 method Methods 0.000 description 3
- 239000011347 resin Substances 0.000 description 3
- 229920005989 resin Polymers 0.000 description 3
- 239000004065 semiconductor Substances 0.000 description 3
- 238000003860 storage Methods 0.000 description 3
- CBENFWSGALASAD-UHFFFAOYSA-N Ozone Chemical compound [O-][O+]=O CBENFWSGALASAD-UHFFFAOYSA-N 0.000 description 2
- 229910002092 carbon dioxide Inorganic materials 0.000 description 2
- 239000001569 carbon dioxide Substances 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 239000011521 glass Substances 0.000 description 2
- 230000005484 gravity Effects 0.000 description 2
- 230000007246 mechanism Effects 0.000 description 2
- 239000002184 metal Substances 0.000 description 2
- 238000005498 polishing Methods 0.000 description 2
- 230000008569 process Effects 0.000 description 2
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 1
- 238000007792 addition Methods 0.000 description 1
- 238000005054 agglomeration Methods 0.000 description 1
- 230000002776 aggregation Effects 0.000 description 1
- 150000001875 compounds Chemical class 0.000 description 1
- 238000000354 decomposition reaction Methods 0.000 description 1
- 238000012217 deletion Methods 0.000 description 1
- 230000037430 deletion Effects 0.000 description 1
- 239000000428 dust Substances 0.000 description 1
- 238000009429 electrical wiring Methods 0.000 description 1
- 239000002360 explosive Substances 0.000 description 1
- 230000020169 heat generation Effects 0.000 description 1
- 238000009434 installation Methods 0.000 description 1
- -1 microbubbles Chemical compound 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 230000003647 oxidation Effects 0.000 description 1
- 238000007254 oxidation reaction Methods 0.000 description 1
- 229910052710 silicon Inorganic materials 0.000 description 1
- 239000010703 silicon Substances 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
- 238000006467 substitution reaction Methods 0.000 description 1
- 239000013585 weight reducing agent Substances 0.000 description 1
Images
Classifications
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B55/00—Safety devices for grinding or polishing machines; Accessories fitted to grinding or polishing machines for keeping tools or parts of the machine in good working condition
- B24B55/06—Dust extraction equipment on grinding or polishing machines
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67017—Apparatus for fluid treatment
- H01L21/67023—Apparatus for fluid treatment for general liquid treatment, e.g. etching followed by cleaning
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23Q—DETAILS, COMPONENTS, OR ACCESSORIES FOR MACHINE TOOLS, e.g. ARRANGEMENTS FOR COPYING OR CONTROLLING; MACHINE TOOLS IN GENERAL CHARACTERISED BY THE CONSTRUCTION OF PARTICULAR DETAILS OR COMPONENTS; COMBINATIONS OR ASSOCIATIONS OF METAL-WORKING MACHINES, NOT DIRECTED TO A PARTICULAR RESULT
- B23Q11/00—Accessories fitted to machine tools for keeping tools or parts of the machine in good working condition or for cooling work; Safety devices specially combined with or arranged in, or specially adapted for use in connection with, machine tools
- B23Q11/0042—Devices for removing chips
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23Q—DETAILS, COMPONENTS, OR ACCESSORIES FOR MACHINE TOOLS, e.g. ARRANGEMENTS FOR COPYING OR CONTROLLING; MACHINE TOOLS IN GENERAL CHARACTERISED BY THE CONSTRUCTION OF PARTICULAR DETAILS OR COMPONENTS; COMBINATIONS OR ASSOCIATIONS OF METAL-WORKING MACHINES, NOT DIRECTED TO A PARTICULAR RESULT
- B23Q11/00—Accessories fitted to machine tools for keeping tools or parts of the machine in good working condition or for cooling work; Safety devices specially combined with or arranged in, or specially adapted for use in connection with, machine tools
- B23Q11/08—Protective coverings for parts of machine tools; Splash guards
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B7/00—Machines or devices designed for grinding plane surfaces on work, including polishing plane glass surfaces; Accessories therefor
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B7/00—Machines or devices designed for grinding plane surfaces on work, including polishing plane glass surfaces; Accessories therefor
- B24B7/20—Machines or devices designed for grinding plane surfaces on work, including polishing plane glass surfaces; Accessories therefor characterised by a special design with respect to properties of the material of non-metallic articles to be ground
- B24B7/22—Machines or devices designed for grinding plane surfaces on work, including polishing plane glass surfaces; Accessories therefor characterised by a special design with respect to properties of the material of non-metallic articles to be ground for grinding inorganic material, e.g. stone, ceramics, porcelain
- B24B7/228—Machines or devices designed for grinding plane surfaces on work, including polishing plane glass surfaces; Accessories therefor characterised by a special design with respect to properties of the material of non-metallic articles to be ground for grinding inorganic material, e.g. stone, ceramics, porcelain for grinding thin, brittle parts, e.g. semiconductors, wafers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic System or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/302—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
- H01L21/304—Mechanical treatment, e.g. grinding, polishing, cutting
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67017—Apparatus for fluid treatment
- H01L21/67028—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like
- H01L21/6704—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing
- H01L21/67051—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing using mainly spraying means, e.g. nozzles
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67092—Apparatus for mechanical treatment
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67155—Apparatus for manufacturing or treating in a plurality of work-stations
- H01L21/6719—Apparatus for manufacturing or treating in a plurality of work-stations characterized by the construction of the processing chambers, e.g. modular processing chambers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67155—Apparatus for manufacturing or treating in a plurality of work-stations
- H01L21/67207—Apparatus for manufacturing or treating in a plurality of work-stations comprising a chamber adapted to a particular process
- H01L21/67219—Apparatus for manufacturing or treating in a plurality of work-stations comprising a chamber adapted to a particular process comprising at least one polishing chamber
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67242—Apparatus for monitoring, sorting or marking
- H01L21/67253—Process monitoring, e.g. flow or thickness monitoring
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L21/687—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches
Description
20 チャック
31 可動部
50 筐体
70 散布器
75 固定部
76 回転部
761 ノズル
762 回転ブロック
D 研削工具
W 基板
Claims (18)
- 基板を保持するチャックと、
前記基板を加工する加工工具が装着される可動部と、
前記可動部の外部から、前記可動部を洗浄する洗浄液を散布する散布器と、
前記チャックと前記加工工具と前記散布器とを収容する筐体と、を有し、
前記散布器は、前記筐体の内部に固定される固定部と、前記固定部に回転自在に支持される回転部と、有し、
前記回転部は、前記洗浄液を噴射するノズルと、前記ノズルを保持する回転ブロックと、含み、
前記回転ブロックの回転中心線に対して平行な方向から見て、前記ノズルの射線は、前記回転ブロックの回転中心線の直交線に対して平行にずらして配置される、加工装置。 - 基板を保持するチャックと、
前記基板を加工する加工工具が装着される可動部と、
前記可動部の外部から、前記可動部を洗浄する洗浄液を散布する散布器と、
前記チャックと前記加工工具と前記散布器とを収容する筐体と、を有し、
前記散布器は、前記筐体の内部に固定される固定部と、前記固定部に回転自在に支持される回転部と、有し、
前記回転部は、前記洗浄液を噴射するノズルと、前記ノズルを保持する回転ブロックと、含み、
前記散布器は、前記回転ブロックを介して前記固定部から前記ノズルまで前記洗浄液を供給する第1流路と、前記第1流路から分岐して前記固定部と前記回転ブロックの間から前記洗浄液を漏出させる第2流路と、を有し、
前記第2流路は、前記回転ブロックの回転中心線を中心とする円筒部を含む、加工装置。 - 前記回転ブロックの回転中心線は、鉛直に配置され、
前記第2流路は、前記回転ブロックの上面に前記洗浄液を供給する第1供給部を含む、請求項2に記載の加工装置。 - 前記回転ブロックの上面は、前記回転ブロックの回転中心線の径方向外方に向うほど鉛直下方に傾斜する円錐面を含む、請求項3に記載の加工装置。
- 前記第2流路は、前記回転ブロックの下面に前記洗浄液を供給する第2供給部を含む、請求項3又は4に記載の加工装置。
- 前記散布器は、前記ノズルによって噴射する前記洗浄液の流量と、前記固定部と前記回転ブロックの間から漏出する前記洗浄液の流量との配分を調整する調整部を有する、請求項2~5のいずれか1項に記載の加工装置。
- 前記回転ブロックの回転中心線は、鉛直に配置され、
前記第2流路は、前記回転ブロックの上面に前記洗浄液を供給する第1供給部と、前記円筒部と前記第1供給部の間に設けられる第1中間部と、前記回転ブロックの下面に前記洗浄液を供給する第2供給部と、前記円筒部と前記第2供給部の間に設けられる第2中間部とを有し、
前記散布器は、前記ノズルによって噴射する前記洗浄液の流量と、前記固定部と前記回転ブロックの間から漏出する前記洗浄液の流量との配分を調整する調整部を有し、
前記調整部は、前記第1中間部と前記第2中間部にそれぞれ配置される、請求項2に記載の加工装置。 - 基板を保持するチャックと、
前記基板を加工する加工工具が装着される可動部と、
前記可動部の外部から、前記可動部を洗浄する洗浄液を散布する散布器と、
前記チャックと前記加工工具と前記散布器とを収容する筐体と、を有し、
前記散布器は、前記筐体の内部に固定される固定部と、前記固定部に回転自在に支持される回転部と、有し、
前記回転部は、前記洗浄液を噴射するノズルと、前記ノズルを保持する回転ブロックと、含み、
前記固定部は、前記筐体に対して装着される取付板と、前記回転ブロックの回転中心線に配置される固定軸と、前記固定軸の一端にて前記回転ブロックとの間に隙間を形成する第1隙間形成部と、前記固定軸の他端にて前記回転ブロックとの間に隙間を形成する第2隙間形成部と、を含む、加工装置。 - 基板を保持するチャックと、
前記基板を加工する加工工具が装着される可動部と、
前記可動部の外部から、前記可動部を洗浄する洗浄液を散布する散布器と、
前記チャックと前記加工工具と前記散布器とを収容する筐体と、を有し、
前記散布器は、前記筐体の内部に固定される固定部と、前記固定部に回転自在に支持される回転部と、有し、
前記回転部は、前記洗浄液を噴射するノズルと、前記ノズルを保持する回転ブロックと、含み、
前記筐体は、前記筐体の上面を形成する上面パネルを有し、
前記固定部は、前記上面パネルの下面に水平に装着される取付板と、前記回転ブロックの回転中心線に配置される固定軸と、前記取付板の下面の周縁から下方に突出し前記固定軸を囲むリングと、含む、加工装置。 - 基板を保持するチャックと、
前記基板を加工する加工工具が装着される可動部と、
前記可動部の外部から、前記可動部を洗浄する洗浄液を散布する散布器と、
前記チャックと前記加工工具と前記散布器とを収容する筐体と、を有し、
前記散布器は、前記筐体の内部に固定される固定部と、前記固定部に回転自在に支持される回転部と、有し、
前記回転部は、前記洗浄液を噴射するノズルと、前記ノズルを保持する回転ブロックと、含み、
前記筐体は、前記筐体の上面を形成する上面パネルと、前記筐体の側面を形成する側面パネルとを有し、
前記散布器は、前記上面パネル又は前記側面パネルに対して前記洗浄液を供給する位置に配置され、
前記側面パネルは、鉛直に固定される側面固定部と、前記側面固定部に対して第1ヒンジで連結される側面可動部とを含み、
前記上面パネルは、水平に固定される上面固定部と、前記側面可動部に対して第2ヒンジで連結される上面可動部とを含み、
前記散布器は、前記上面可動部又は前記側面可動部に対して前記洗浄液を供給する位置に配置される、加工装置。 - 前記上面可動部と前記側面可動部とが水平に折り畳まれた際に、前記上面可動部と前記側面可動部との間の隙間よりも前記散布器の厚みが小さく、前記隙間に前記散布器が配置される、請求項10に記載の加工装置。
- 複数の前記ノズルが、一の前記回転ブロックに装着される、請求項1~11のいずれか1項に記載の加工装置。
- 噴射角の異なる複数の前記ノズルが、一の前記回転ブロックに装着される、請求項12に記載の加工装置。
- 複数の前記ノズルが、一の前記回転ブロックの回転中心線を中心に回転対称に配置される、請求項12に記載の加工装置。
- 前記回転部は、前記回転ブロックの回転中心線を基準に前記ノズルとは反対側に、カウンターウェイトを含む、請求項1~11のいずれか1項に記載の加工装置。
- 前記散布器の前記回転部の回転停止を検出する回転停止検出器を有する、請求項1~15のいずれか1項に記載の加工装置。
- 前記回転停止検出器は、前記筐体の外部に位置し、発光器と受光器とを有し、
前記散布器の前記回転部は、前記発光器の光を前記受光器に反射する光反射部を含み、
前記散布器の前記固定部と前記筐体とのそれぞれに、前記光の通路である貫通穴が形成される、請求項16に記載の加工装置。 - 前記チャックで保持された前記基板の厚みを測定する測定器を有し、
前記散布器は、前記可動部と前記測定器に対して前記洗浄液を供給する、請求項1~9のいずれか1項に記載の加工装置。
Applications Claiming Priority (5)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2020023923 | 2020-02-17 | ||
JP2020023923 | 2020-02-17 | ||
JP2020196352 | 2020-11-26 | ||
JP2020196352 | 2020-11-26 | ||
PCT/JP2021/004340 WO2021166687A1 (ja) | 2020-02-17 | 2021-02-05 | 加工装置 |
Publications (3)
Publication Number | Publication Date |
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JPWO2021166687A1 JPWO2021166687A1 (ja) | 2021-08-26 |
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JP2011049578A (ja) | 2010-10-12 | 2011-03-10 | Hitachi High-Tech Instruments Co Ltd | 電子部品装着装置 |
JP2017047510A (ja) | 2015-09-03 | 2017-03-09 | 株式会社ディスコ | 研削装置 |
JP2017059809A (ja) | 2015-09-18 | 2017-03-23 | 東京エレクトロン株式会社 | 基板処理装置および処理チャンバ洗浄方法 |
JP2017094420A (ja) | 2015-11-20 | 2017-06-01 | ファナック株式会社 | 工作機械 |
JP2017127910A (ja) | 2016-01-18 | 2017-07-27 | 株式会社ディスコ | 切削装置 |
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JP5669461B2 (ja) * | 2010-07-01 | 2015-02-12 | 株式会社ディスコ | スピンナ洗浄装置 |
JP5966729B2 (ja) * | 2012-07-30 | 2016-08-10 | ブラザー工業株式会社 | 工作機械 |
JP6305040B2 (ja) * | 2013-12-04 | 2018-04-04 | 株式会社ディスコ | 洗浄装置 |
JP6353684B2 (ja) | 2014-04-04 | 2018-07-04 | 株式会社ディスコ | 研削ホイール及び研削室の洗浄方法 |
JP6789038B2 (ja) * | 2016-08-29 | 2020-11-25 | 株式会社Screenホールディングス | 基板処理装置 |
JP7002400B2 (ja) * | 2018-04-27 | 2022-01-20 | 株式会社ディスコ | 洗浄装置 |
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JP2011049578A (ja) | 2010-10-12 | 2011-03-10 | Hitachi High-Tech Instruments Co Ltd | 電子部品装着装置 |
JP2017047510A (ja) | 2015-09-03 | 2017-03-09 | 株式会社ディスコ | 研削装置 |
JP2017059809A (ja) | 2015-09-18 | 2017-03-23 | 東京エレクトロン株式会社 | 基板処理装置および処理チャンバ洗浄方法 |
JP2017094420A (ja) | 2015-11-20 | 2017-06-01 | ファナック株式会社 | 工作機械 |
JP2017127910A (ja) | 2016-01-18 | 2017-07-27 | 株式会社ディスコ | 切削装置 |
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