JP7240931B2 - 熱交換器の洗浄装置、および研磨装置 - Google Patents
熱交換器の洗浄装置、および研磨装置 Download PDFInfo
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- JP7240931B2 JP7240931B2 JP2019067930A JP2019067930A JP7240931B2 JP 7240931 B2 JP7240931 B2 JP 7240931B2 JP 2019067930 A JP2019067930 A JP 2019067930A JP 2019067930 A JP2019067930 A JP 2019067930A JP 7240931 B2 JP7240931 B2 JP 7240931B2
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- cleaning
- heat exchanger
- cleaning liquid
- tank
- polishing pad
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- 238000005498 polishing Methods 0.000 title claims description 228
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- 230000007246 mechanism Effects 0.000 claims description 183
- 230000003028 elevating effect Effects 0.000 claims description 14
- 239000000758 substrate Substances 0.000 claims description 7
- 238000007599 discharging Methods 0.000 claims description 6
- 238000003825 pressing Methods 0.000 claims description 3
- 238000010438 heat treatment Methods 0.000 description 36
- 238000010586 diagram Methods 0.000 description 35
- 239000000110 cooling liquid Substances 0.000 description 18
- 239000012530 fluid Substances 0.000 description 17
- 230000004048 modification Effects 0.000 description 13
- 238000012986 modification Methods 0.000 description 13
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 13
- 239000002826 coolant Substances 0.000 description 11
- 238000003384 imaging method Methods 0.000 description 11
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 10
- KFZMGEQAYNKOFK-UHFFFAOYSA-N Isopropanol Chemical compound CC(C)O KFZMGEQAYNKOFK-UHFFFAOYSA-N 0.000 description 9
- 238000002347 injection Methods 0.000 description 8
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- 238000005406 washing Methods 0.000 description 6
- 239000006061 abrasive grain Substances 0.000 description 5
- 230000009471 action Effects 0.000 description 5
- 229910052757 nitrogen Inorganic materials 0.000 description 5
- 238000011084 recovery Methods 0.000 description 5
- 239000007921 spray Substances 0.000 description 5
- 239000004065 semiconductor Substances 0.000 description 4
- 229920002545 silicone oil Polymers 0.000 description 4
- 238000005507 spraying Methods 0.000 description 4
- 239000000126 substance Substances 0.000 description 4
- 238000011109 contamination Methods 0.000 description 3
- 239000002002 slurry Substances 0.000 description 3
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- 238000000034 method Methods 0.000 description 1
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- 239000004745 nonwoven fabric Substances 0.000 description 1
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Images
Classifications
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- F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
- F28—HEAT EXCHANGE IN GENERAL
- F28G—CLEANING OF INTERNAL OR EXTERNAL SURFACES OF HEAT-EXCHANGE OR HEAT-TRANSFER CONDUITS, e.g. WATER TUBES OR BOILERS
- F28G15/00—Details
- F28G15/04—Feeding and driving arrangements, e.g. power operation
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/11—Lapping tools
- B24B37/20—Lapping pads for working plane surfaces
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- F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
- F28—HEAT EXCHANGE IN GENERAL
- F28G—CLEANING OF INTERNAL OR EXTERNAL SURFACES OF HEAT-EXCHANGE OR HEAT-TRANSFER CONDUITS, e.g. WATER TUBES OR BOILERS
- F28G13/00—Appliances or processes not covered by groups F28G1/00 - F28G11/00; Combinations of appliances or processes covered by groups F28G1/00 - F28G11/00
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/005—Control means for lapping machines or devices
- B24B37/015—Temperature control
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/04—Lapping machines or devices; Accessories designed for working plane surfaces
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/34—Accessories
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B57/00—Devices for feeding, applying, grading or recovering grinding, polishing or lapping agents
- B24B57/02—Devices for feeding, applying, grading or recovering grinding, polishing or lapping agents for feeding of fluid, sprayed, pulverised, or liquefied grinding, polishing or lapping agents
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- F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
- F28—HEAT EXCHANGE IN GENERAL
- F28G—CLEANING OF INTERNAL OR EXTERNAL SURFACES OF HEAT-EXCHANGE OR HEAT-TRANSFER CONDUITS, e.g. WATER TUBES OR BOILERS
- F28G1/00—Non-rotary, e.g. reciprocated, appliances
- F28G1/02—Non-rotary, e.g. reciprocated, appliances having brushes
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- F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
- F28—HEAT EXCHANGE IN GENERAL
- F28G—CLEANING OF INTERNAL OR EXTERNAL SURFACES OF HEAT-EXCHANGE OR HEAT-TRANSFER CONDUITS, e.g. WATER TUBES OR BOILERS
- F28G1/00—Non-rotary, e.g. reciprocated, appliances
- F28G1/16—Non-rotary, e.g. reciprocated, appliances using jets of fluid for removing debris
- F28G1/166—Non-rotary, e.g. reciprocated, appliances using jets of fluid for removing debris from external surfaces of heat exchange conduits
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- F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
- F28—HEAT EXCHANGE IN GENERAL
- F28G—CLEANING OF INTERNAL OR EXTERNAL SURFACES OF HEAT-EXCHANGE OR HEAT-TRANSFER CONDUITS, e.g. WATER TUBES OR BOILERS
- F28G15/00—Details
-
- F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
- F28—HEAT EXCHANGE IN GENERAL
- F28G—CLEANING OF INTERNAL OR EXTERNAL SURFACES OF HEAT-EXCHANGE OR HEAT-TRANSFER CONDUITS, e.g. WATER TUBES OR BOILERS
- F28G15/00—Details
- F28G15/02—Supports for cleaning appliances, e.g. frames
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- F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
- F28—HEAT EXCHANGE IN GENERAL
- F28G—CLEANING OF INTERNAL OR EXTERNAL SURFACES OF HEAT-EXCHANGE OR HEAT-TRANSFER CONDUITS, e.g. WATER TUBES OR BOILERS
- F28G3/00—Rotary appliances
- F28G3/02—Rotary appliances having abrasive tools
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- F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
- F28—HEAT EXCHANGE IN GENERAL
- F28G—CLEANING OF INTERNAL OR EXTERNAL SURFACES OF HEAT-EXCHANGE OR HEAT-TRANSFER CONDUITS, e.g. WATER TUBES OR BOILERS
- F28G9/00—Cleaning by flushing or washing, e.g. with chemical solvents
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/302—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
- H01L21/306—Chemical or electrical treatment, e.g. electrolytic etching
- H01L21/30625—With simultaneous mechanical treatment, e.g. mechanico-chemical polishing
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- H—ELECTRICITY
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- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
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- H01L21/67005—Apparatus not specifically provided for elsewhere
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
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- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67017—Apparatus for fluid treatment
- H01L21/67028—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like
- H01L21/6704—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
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- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67017—Apparatus for fluid treatment
- H01L21/67028—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like
- H01L21/6704—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing
- H01L21/67046—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing using mainly scrubbing means, e.g. brushes
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67017—Apparatus for fluid treatment
- H01L21/67028—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like
- H01L21/6704—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing
- H01L21/67051—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing using mainly spraying means, e.g. nozzles
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- H—ELECTRICITY
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- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
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- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
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- H—ELECTRICITY
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- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67098—Apparatus for thermal treatment
- H01L21/67103—Apparatus for thermal treatment mainly by conduction
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- H—ELECTRICITY
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- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
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- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67155—Apparatus for manufacturing or treating in a plurality of work-stations
- H01L21/67207—Apparatus for manufacturing or treating in a plurality of work-stations comprising a chamber adapted to a particular process
- H01L21/67219—Apparatus for manufacturing or treating in a plurality of work-stations comprising a chamber adapted to a particular process comprising at least one polishing chamber
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- H—ELECTRICITY
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- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L21/6838—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping with gripping and holding devices using a vacuum; Bernoulli devices
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L21/687—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches
- H01L21/68714—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support
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- F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
- F28—HEAT EXCHANGE IN GENERAL
- F28G—CLEANING OF INTERNAL OR EXTERNAL SURFACES OF HEAT-EXCHANGE OR HEAT-TRANSFER CONDUITS, e.g. WATER TUBES OR BOILERS
- F28G3/00—Rotary appliances
- F28G3/04—Rotary appliances having brushes
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/302—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
- H01L21/304—Mechanical treatment, e.g. grinding, polishing, cutting
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- Engineering & Computer Science (AREA)
- Mechanical Engineering (AREA)
- Computer Hardware Design (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Combustion & Propulsion (AREA)
- General Engineering & Computer Science (AREA)
- Chemical & Material Sciences (AREA)
- Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
- Mechanical Treatment Of Semiconductor (AREA)
Description
一態様では、前記洗浄機構は、前記洗浄槽に連結され、前記洗浄液を前記洗浄槽に供給する洗浄液供給ラインと、前記洗浄槽から溢れる前記洗浄液を受け止めるオーバーフロー槽と、前記オーバーフロー槽に連結され、前記洗浄液を前記オーバーフロー槽から排出する洗浄液排出ラインと、をさらに備える。
一態様では、前記洗浄機構は、前記洗浄槽に連結され、前記洗浄液を前記洗浄槽に供給する洗浄液供給ラインと、前記洗浄槽に連結され、前記洗浄液を前記洗浄槽から排出する洗浄液排出ラインと、をさらに備え、前記洗浄液排出ラインは、前記洗浄槽の内部に開口する入口を有しており、前記入口は、前記洗浄槽の上端よりも下方に位置する。
一態様では、前記洗浄機構は、前記洗浄槽に連結され、前記洗浄液を前記洗浄槽に供給する洗浄液供給ラインと、前記洗浄槽に連結され、前記洗浄液を前記洗浄槽から排出する洗浄液排出ラインと、をさらに備え、前記洗浄液排出ラインは、前記洗浄槽の最下端部に連結された入口と、大気に解放された出口と、を有しており、前記出口は、前記洗浄槽の上端よりも下方で、かつ前記洗浄槽の下端よりも上方に位置する。
一態様では、前記洗浄機構は、前記洗浄槽の底壁を構成するか、または前記洗浄槽の内部に配置される板部材を有しており、前記板部材は、前記洗浄液供給ラインに連結される流路と、該流路を前記洗浄槽の内部に連通させる複数の孔とを有している。
一態様では、前記回動機構は、アームを介して前記熱交換器に連結される軸と、前記軸を回動させることにより、前記アームおよび前記熱交換器を前記研磨パッドの表面に対して回動させるアクチュエータと、前記軸の回動動作を、前記熱交換器の旋回動作に変換するカム機構と、を備えており、前記カム機構は、前記アームに固定されたカムと、前記カムに接触し、前記熱交換器の旋回動作を案内するガイド面を有するガイド板と、を含む。
一参考例では、前記洗浄機構は、前記熱交換器が前記温度調整位置から前記待避位置まで移動する間に、前記熱交換器の底面と接触する洗浄部材を備える。
一参考例では、前記洗浄部材は、洗浄ブラシであり、前記洗浄ブラシは、前記研磨パッドを取り囲む円筒状カップの上端に形成された切り欠きに配置される。
一参考例では、前記洗浄部材は、洗浄ローラであり、前記洗浄機構は、前記洗浄ローラの表面に接触して、該洗浄ローラに付着した汚れを除去する洗浄板をさらに備える。
一参考例では、前記洗浄部材は、前記熱交換器の底面に接触するブラシを有する洗浄パッドであり、前記洗浄パッドは、自転可能、かつ前記熱交換器の底面に対して公転可能に構成されている。
一参考例では、前記洗浄パッドは、該洗浄パッドの上面に形成された凹部に配置され、前記熱交換器の底面の画像を取得可能な撮像装置と、前記凹部の開口を塞ぐ透明窓と、を有している。
図1は、一実施形態に係る研磨装置を示す模式図である。図2は、図1に示す研磨装置の主要部の概略断面図である。図1および図2に示す研磨装置は、基板の一例であるウェーハWを保持して回転させる研磨ヘッド1と、研磨パッド3を支持する研磨テーブル2と、研磨パッド3の表面に研磨液(例えばスラリー)を供給する研磨液供給ノズル4と、研磨パッド3の表面温度を調整するパッド温度調整装置5とを備えている。研磨パッド3の表面(上面)は、ウェーハWを研磨する研磨面を構成する。
2 研磨テーブル
3 研磨パッド
5 パッド温度調整装置
7 円筒状カップ
10 洗浄機構
11 熱交換器
13 回収パン
14 ドレイン
15 アーム
16,87 移動機構
20 軸
21 ボールスプライン軸受
22 回動機構
23 昇降機構
28A 洗浄液ノズル
35 ピストンシリンダ機構
60 洗浄槽
61 洗浄液供給ライン
63 洗浄液排出ライン
64 オーバーフロー槽
67 リング部材
70 板部材
73 噴射ノズル
75 ピストンシリンダ機構
80 ガイド板
83 支持部材
84 カム
98 洗浄ブラシ
100 洗浄ローラ
107 洗浄パッド
108,109 洗浄ブラシ
121 撮像装置
Claims (10)
- 研磨パッドの表面温度を調整する熱交換器の洗浄装置であって、
前記熱交換器を、該熱交換器が前記研磨パッドと熱交換可能な温度調整位置と、前記研磨パッドの表面から離間させる待避位置との間で移動させる移動機構と、
前記待避位置に移動した熱交換器の底面を洗浄液で洗浄する洗浄機構と、を備え、
前記待避位置は、前記研磨パッドの側方に位置しており、
前記洗浄機構は、前記待避位置に移動した熱交換器の底面に前記洗浄液を噴射する少なくとも1つの洗浄液ノズルを含み、
前記移動機構は、
前記熱交換器を前記研磨パッドの表面に対して水平方向に回動させつつ、該研磨パッドの表面に対して鉛直方向に旋回させる回動機構と、
前記熱交換器を前記研磨パッドの表面に対して上下動させる昇降機構と、を備えることを特徴とする洗浄装置。 - 研磨パッドの表面温度を調整する熱交換器の洗浄装置であって、
前記熱交換器を、該熱交換器が前記研磨パッドと熱交換可能な温度調整位置と、前記研磨パッドの表面から離間させる待避位置との間で移動させる移動機構と、
前記待避位置に移動した熱交換器の底面を洗浄液で洗浄する洗浄機構と、を備え、
前記待避位置は、前記研磨パッドの上方に位置しており、
前記移動機構は、前記熱交換器を前記研磨パッドの表面に対して上下動させる昇降機構を備え、
前記洗浄機構は、前記熱交換器の底面が前記洗浄液に浸漬可能な洗浄槽と、前記洗浄槽を水平方向に移動させる水平移動機構と、を含むことを特徴とする洗浄装置。 - 前記洗浄機構は、
前記洗浄槽に連結され、前記洗浄液を前記洗浄槽に供給する洗浄液供給ラインと、
前記洗浄槽に連結され、前記洗浄液を前記洗浄槽から排出する洗浄液排出ラインと、をさらに備え、
前記洗浄液排出ラインは、前記洗浄槽の最下端部に連結されることを特徴とする請求項2に記載の洗浄装置。 - 前記洗浄機構は、
前記洗浄槽に連結され、前記洗浄液を前記洗浄槽に供給する洗浄液供給ラインと、
前記洗浄槽から溢れる前記洗浄液を受け止めるオーバーフロー槽と、
前記オーバーフロー槽に連結され、前記洗浄液を前記オーバーフロー槽から排出する洗浄液排出ラインと、をさらに備えることを特徴とする請求項2に記載の洗浄装置。 - 前記洗浄機構は、
前記洗浄槽に連結され、前記洗浄液を前記洗浄槽に供給する洗浄液供給ラインと、
前記洗浄槽に連結され、前記洗浄液を前記洗浄槽から排出する洗浄液排出ラインと、をさらに備え、
前記洗浄液排出ラインは、前記洗浄槽の内部に開口する入口を有しており、
前記入口は、前記洗浄槽の上端よりも下方に位置することを特徴とする請求項2に記載の洗浄装置。 - 前記洗浄機構は、
前記洗浄槽に連結され、前記洗浄液を前記洗浄槽に供給する洗浄液供給ラインと、
前記洗浄槽に連結され、前記洗浄液を前記洗浄槽から排出する洗浄液排出ラインと、をさらに備え、
前記洗浄液排出ラインは、前記洗浄槽の最下端部に連結された入口と、大気に解放された出口と、を有しており、
前記出口は、前記洗浄槽の上端よりも下方で、かつ前記洗浄槽の下端よりも上方に位置することを特徴とする請求項2に記載の洗浄装置。 - 前記洗浄液供給ラインは、前記洗浄液が前記洗浄槽の接線方向に放出されるように、前記洗浄槽の側壁に取り付けられていることを特徴とする請求項3乃至6のいずれか一項に記載の洗浄装置。
- 前記洗浄機構は、
前記洗浄槽の底壁を構成するか、または前記洗浄槽の内部に配置される板部材を有しており、
前記板部材は、前記洗浄液供給ラインに連結される流路と、該流路を前記洗浄槽の内部に連通させる複数の孔とを有していることを特徴とする請求項4乃至6のいずれか一項に記載の洗浄装置。 - 前記回動機構は、
アームを介して前記熱交換器に連結される軸と、
前記軸を回動させることにより、前記アームおよび前記熱交換器を前記研磨パッドの表面に対して回動させるアクチュエータと、
前記軸の回動動作を、前記熱交換器の旋回動作に変換するカム機構と、を備えており、
前記カム機構は、
前記アームに固定されたカムと、
前記カムに接触し、前記熱交換器の旋回動作を案内するガイド面を有するガイド板と、を含むことを特徴とする請求項1に記載の洗浄装置。 - 研磨パッドを支持する研磨テーブルと、
基板を前記研磨パッドの表面に押し付けて該基板を研磨する研磨ヘッドと、
前記研磨パッドの表面温度を調整する熱交換器と、
前記熱交換器を洗浄する洗浄装置と、を備え、
前記洗浄装置は、請求項1乃至9のいずれか一項に記載の洗浄装置であることを特徴とする研磨装置。
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