JP7215121B2 - イオントラップ質量分析装置 - Google Patents

イオントラップ質量分析装置 Download PDF

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Publication number
JP7215121B2
JP7215121B2 JP2018228514A JP2018228514A JP7215121B2 JP 7215121 B2 JP7215121 B2 JP 7215121B2 JP 2018228514 A JP2018228514 A JP 2018228514A JP 2018228514 A JP2018228514 A JP 2018228514A JP 7215121 B2 JP7215121 B2 JP 7215121B2
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Japan
Prior art keywords
ion
ions
detector
period
voltage
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JP2018228514A
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English (en)
Japanese (ja)
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JP2020092005A (ja
JP2020092005A5 (enExample
Inventor
秀治 志知
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Shimadzu Corp
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Shimadzu Corp
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Publication date
Application filed by Shimadzu Corp filed Critical Shimadzu Corp
Priority to JP2018228514A priority Critical patent/JP7215121B2/ja
Priority to EP19192367.1A priority patent/EP3664123A1/en
Priority to US16/599,500 priority patent/US10923337B2/en
Publication of JP2020092005A publication Critical patent/JP2020092005A/ja
Publication of JP2020092005A5 publication Critical patent/JP2020092005A5/ja
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Publication of JP7215121B2 publication Critical patent/JP7215121B2/ja
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    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/26—Mass spectrometers or separator tubes
    • H01J49/34—Dynamic spectrometers
    • H01J49/42—Stability-of-path spectrometers, e.g. monopole, quadrupole, multipole, farvitrons
    • H01J49/426—Methods for controlling ions
    • H01J49/427—Ejection and selection methods
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/025—Detectors specially adapted to particle spectrometers
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/0027—Methods for using particle spectrometers
    • H01J49/0031—Step by step routines describing the use of the apparatus
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/022—Circuit arrangements, e.g. for generating deviation currents or voltages ; Components associated with high voltage supply

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  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Tubes For Measurement (AREA)
JP2018228514A 2018-12-05 2018-12-05 イオントラップ質量分析装置 Active JP7215121B2 (ja)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP2018228514A JP7215121B2 (ja) 2018-12-05 2018-12-05 イオントラップ質量分析装置
EP19192367.1A EP3664123A1 (en) 2018-12-05 2019-08-19 Ion trap mass spectrometer and ion trap mass spectrometry method
US16/599,500 US10923337B2 (en) 2018-12-05 2019-10-11 Ion trap mass spectrometer and ion trap mass spectrometry method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2018228514A JP7215121B2 (ja) 2018-12-05 2018-12-05 イオントラップ質量分析装置

Publications (3)

Publication Number Publication Date
JP2020092005A JP2020092005A (ja) 2020-06-11
JP2020092005A5 JP2020092005A5 (enExample) 2021-03-25
JP7215121B2 true JP7215121B2 (ja) 2023-01-31

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ID=67659319

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2018228514A Active JP7215121B2 (ja) 2018-12-05 2018-12-05 イオントラップ質量分析装置

Country Status (3)

Country Link
US (1) US10923337B2 (enExample)
EP (1) EP3664123A1 (enExample)
JP (1) JP7215121B2 (enExample)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2024174502A (ja) * 2023-06-05 2024-12-17 浜松ホトニクス株式会社 イオン検出器及び分析装置
CN116930306A (zh) * 2023-06-09 2023-10-24 清华大学 基于离子阱对样品进行淌度分析的方法、离子阱质谱仪及其用途

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001084954A (ja) 1999-09-14 2001-03-30 Hitachi Ltd 質量分析計
JP2015128031A (ja) 2013-12-27 2015-07-09 アジレント・テクノロジーズ・インクＡｇｉｌｅｎｔ Ｔｅｃｈｎｏｌｏｇｉｅｓ， Ｉｎｃ． 質量分析装置用の二次電子増倍管

Family Cites Families (21)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS57107550A (en) * 1980-12-24 1982-07-05 Jeol Ltd Ion detector for mass spectrograph
JPS58170555U (ja) * 1982-05-12 1983-11-14 株式会社日立製作所 質量分析計
US4766312A (en) * 1987-05-15 1988-08-23 Vestec Corporation Methods and apparatus for detecting negative ions from a mass spectrometer
DE60239607D1 (de) * 2001-05-25 2011-05-12 Ionwerks Inc Flugzeit-massenspektrometer zur überwachung schneller prozesse
JP3971958B2 (ja) * 2002-05-28 2007-09-05 株式会社日立ハイテクノロジーズ 質量分析装置
JP4223937B2 (ja) * 2003-12-16 2009-02-12 株式会社日立ハイテクノロジーズ 質量分析装置
CA2626701A1 (en) * 2005-11-23 2007-05-31 Applera Corporation Method and apparatus for scanning an ion trap mass spectrometer
TWI484529B (zh) * 2006-11-13 2015-05-11 Mks Instr Inc 離子阱質譜儀、利用其得到質譜之方法、離子阱、捕捉離子阱內之離子之方法和設備
WO2008126383A1 (ja) 2007-04-09 2008-10-23 Shimadzu Corporation イオントラップ質量分析装置
US8022363B2 (en) 2007-04-12 2011-09-20 Shimadzu Corporation Ion trap mass spectrometer
US7723680B2 (en) * 2007-08-31 2010-05-25 Agilent Technologies, Inc. Electron multiplier having electron filtering
US7947948B2 (en) * 2008-09-05 2011-05-24 Thermo Funnigan LLC Two-dimensional radial-ejection ion trap operable as a quadrupole mass filter
WO2010116396A1 (ja) 2009-03-30 2010-10-14 株式会社島津製作所 イオントラップ装置
WO2011079202A1 (en) * 2009-12-23 2011-06-30 Academia Sinica Apparatuses and methods for portable mass spectrometry
JP5737144B2 (ja) 2011-11-11 2015-06-17 株式会社島津製作所 イオントラップ質量分析装置
WO2014045360A1 (ja) * 2012-09-20 2014-03-27 株式会社島津製作所 質量分析装置
US9373492B2 (en) * 2013-03-14 2016-06-21 The University Of North Carolina At Chapel Hill Microscale mass spectrometry systems, devices and related methods
JP5979075B2 (ja) 2013-05-15 2016-08-24 株式会社島津製作所 飛行時間型質量分析装置
JP2015115202A (ja) * 2013-12-12 2015-06-22 株式会社日立ハイテクノロジーズ 質量分析方法
WO2017126006A1 (ja) 2016-01-18 2017-07-27 株式会社島津製作所 イオントラップ質量分析装置及び該装置を用いた質量分析方法
JP2018077180A (ja) 2016-11-11 2018-05-17 株式会社島津製作所 スペクトル演算処理装置、スペクトル演算処理方法、質量分析装置および質量分析方法

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001084954A (ja) 1999-09-14 2001-03-30 Hitachi Ltd 質量分析計
JP2015128031A (ja) 2013-12-27 2015-07-09 アジレント・テクノロジーズ・インクＡｇｉｌｅｎｔ Ｔｅｃｈｎｏｌｏｇｉｅｓ， Ｉｎｃ． 質量分析装置用の二次電子増倍管

Also Published As

Publication number Publication date
JP2020092005A (ja) 2020-06-11
EP3664123A1 (en) 2020-06-10
US10923337B2 (en) 2021-02-16
US20200185208A1 (en) 2020-06-11

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