JP7118658B2 - 撮像装置、撮像システム、移動体 - Google Patents

撮像装置、撮像システム、移動体 Download PDF

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Publication number
JP7118658B2
JP7118658B2 JP2018022404A JP2018022404A JP7118658B2 JP 7118658 B2 JP7118658 B2 JP 7118658B2 JP 2018022404 A JP2018022404 A JP 2018022404A JP 2018022404 A JP2018022404 A JP 2018022404A JP 7118658 B2 JP7118658 B2 JP 7118658B2
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chip
imaging device
ramp signal
input
transmission line
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Japanese (ja)
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JP2019140535A5 (enExample
JP2019140535A (ja
Inventor
恒一 中村
昌弘 小林
秀央 小林
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Canon Inc
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Canon Inc
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Priority to JP2018022404A priority Critical patent/JP7118658B2/ja
Priority to US16/268,269 priority patent/US11108985B2/en
Publication of JP2019140535A publication Critical patent/JP2019140535A/ja
Publication of JP2019140535A5 publication Critical patent/JP2019140535A5/ja
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    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10FINORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F39/00Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
    • H10F39/80Constructional details of image sensors
    • H10F39/809Constructional details of image sensors of hybrid image sensors
    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04NPICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/60Noise processing, e.g. detecting, correcting, reducing or removing noise
    • H04N25/618Noise processing, e.g. detecting, correcting, reducing or removing noise for random or high-frequency noise
    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04NPICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/60Noise processing, e.g. detecting, correcting, reducing or removing noise
    • H04N25/62Detection or reduction of noise due to excess charges produced by the exposure, e.g. smear, blooming, ghost image, crosstalk or leakage between pixels
    • H04N25/628Detection or reduction of noise due to excess charges produced by the exposure, e.g. smear, blooming, ghost image, crosstalk or leakage between pixels for reducing horizontal stripes caused by saturated regions of CMOS sensors
    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04NPICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/60Noise processing, e.g. detecting, correcting, reducing or removing noise
    • H04N25/68Noise processing, e.g. detecting, correcting, reducing or removing noise applied to defects
    • H04N25/69SSIS comprising testing or correcting structures for circuits other than pixel cells
    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04NPICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/70SSIS architectures; Circuits associated therewith
    • H04N25/76Addressed sensors, e.g. MOS or CMOS sensors
    • H04N25/77Pixel circuitry, e.g. memories, A/D converters, pixel amplifiers, shared circuits or shared components
    • H04N25/772Pixel circuitry, e.g. memories, A/D converters, pixel amplifiers, shared circuits or shared components comprising A/D, V/T, V/F, I/T or I/F converters
    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04NPICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/70SSIS architectures; Circuits associated therewith
    • H04N25/76Addressed sensors, e.g. MOS or CMOS sensors
    • H04N25/78Readout circuits for addressed sensors, e.g. output amplifiers or A/D converters
    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04NPICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/70SSIS architectures; Circuits associated therewith
    • H04N25/79Arrangements of circuitry being divided between different or multiple substrates, chips or circuit boards, e.g. stacked image sensors
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10FINORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F39/00Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
    • H10F39/80Constructional details of image sensors
    • H10F39/811Interconnections

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  • Engineering & Computer Science (AREA)
  • Multimedia (AREA)
  • Signal Processing (AREA)
  • Transforming Light Signals Into Electric Signals (AREA)
  • Solid State Image Pick-Up Elements (AREA)
JP2018022404A 2018-02-09 2018-02-09 撮像装置、撮像システム、移動体 Active JP7118658B2 (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP2018022404A JP7118658B2 (ja) 2018-02-09 2018-02-09 撮像装置、撮像システム、移動体
US16/268,269 US11108985B2 (en) 2018-02-09 2019-02-05 Imaging device, imaging system, and movable object

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2018022404A JP7118658B2 (ja) 2018-02-09 2018-02-09 撮像装置、撮像システム、移動体

Publications (3)

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JP2019140535A JP2019140535A (ja) 2019-08-22
JP2019140535A5 JP2019140535A5 (enExample) 2021-04-01
JP7118658B2 true JP7118658B2 (ja) 2022-08-16

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JP2018022404A Active JP7118658B2 (ja) 2018-02-09 2018-02-09 撮像装置、撮像システム、移動体

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US (1) US11108985B2 (enExample)
JP (1) JP7118658B2 (enExample)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP7676319B2 (ja) * 2019-11-29 2025-05-14 ソニーセミコンダクタソリューションズ株式会社 撮像装置および電子機器
US12477854B2 (en) * 2023-03-08 2025-11-18 Semiconductor Components Industries, Llc Image sensor signal path routing

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2013168880A (ja) 2012-02-16 2013-08-29 Sony Corp 比較器、ad変換器、固体撮像装置、カメラシステム、および電子機器
WO2016009832A1 (ja) 2014-07-14 2016-01-21 ソニー株式会社 比較器、ad変換器、固体撮像装置、電子機器、および比較器の制御方法
JP2018019354A (ja) 2016-07-29 2018-02-01 キヤノン株式会社 撮像装置

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6140877A (en) * 1998-12-11 2000-10-31 Micron Technology, Inc. Low power supply CMOS differential amplifier topology
JP2014060573A (ja) 2012-09-18 2014-04-03 Sony Corp 固体撮像素子、制御方法、および電子機器
US10051221B2 (en) 2014-12-25 2018-08-14 Sony Corporation Solid-state imaging device and electronic apparatus
WO2016136448A1 (ja) 2015-02-23 2016-09-01 ソニー株式会社 比較器、ad変換器、固体撮像装置、電子機器、比較器の制御方法、データ書込回路、データ読出回路、およびデータ転送回路
WO2016151837A1 (ja) * 2015-03-26 2016-09-29 オリンパス株式会社 固体撮像装置
KR20160121189A (ko) * 2015-04-10 2016-10-19 삼성전자주식회사 아날로그-디지털 변환기의 선형성을 향상시키는 이미지 센서 및 이를 포함하는 이미지 처리 시스템
US9848140B2 (en) * 2016-03-31 2017-12-19 Omnivision Technologies, Inc. Horizontal banding reduction with ramp generator isolation in an image sensor
US11706538B2 (en) * 2017-02-16 2023-07-18 Sony Semiconductor Solutions Corporation Imaging system and imaging device

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2013168880A (ja) 2012-02-16 2013-08-29 Sony Corp 比較器、ad変換器、固体撮像装置、カメラシステム、および電子機器
WO2016009832A1 (ja) 2014-07-14 2016-01-21 ソニー株式会社 比較器、ad変換器、固体撮像装置、電子機器、および比較器の制御方法
JP2018019354A (ja) 2016-07-29 2018-02-01 キヤノン株式会社 撮像装置

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US11108985B2 (en) 2021-08-31
US20190253653A1 (en) 2019-08-15
JP2019140535A (ja) 2019-08-22

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