JP7103749B2 - 測定周期決定装置、測定周期決定プログラム、及びその方法 - Google Patents

測定周期決定装置、測定周期決定プログラム、及びその方法 Download PDF

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JP7103749B2
JP7103749B2 JP2016224222A JP2016224222A JP7103749B2 JP 7103749 B2 JP7103749 B2 JP 7103749B2 JP 2016224222 A JP2016224222 A JP 2016224222A JP 2016224222 A JP2016224222 A JP 2016224222A JP 7103749 B2 JP7103749 B2 JP 7103749B2
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measurement cycle
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JP2018081560A5 (enExample
JP2018081560A (ja
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丞 中山
一馬 布
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3M Innovative Properties Co
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Priority to CN201780071458.8A priority patent/CN109997159A/zh
Priority to PCT/US2017/060798 priority patent/WO2018093655A1/en
Priority to EP17808664.1A priority patent/EP3542324A1/en
Priority to US16/461,051 priority patent/US10955356B2/en
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Priority to US17/173,392 priority patent/US11635390B2/en
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    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06Q—INFORMATION AND COMMUNICATION TECHNOLOGY [ICT] SPECIALLY ADAPTED FOR ADMINISTRATIVE, COMMERCIAL, FINANCIAL, MANAGERIAL OR SUPERVISORY PURPOSES; SYSTEMS OR METHODS SPECIALLY ADAPTED FOR ADMINISTRATIVE, COMMERCIAL, FINANCIAL, MANAGERIAL OR SUPERVISORY PURPOSES, NOT OTHERWISE PROVIDED FOR
    • G06Q10/00—Administration; Management
    • G06Q10/06—Resources, workflows, human or project management; Enterprise or organisation planning; Enterprise or organisation modelling
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8803—Visual inspection
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8806—Specially adapted optical and illumination features
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N33/00—Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
    • G01N33/38—Concrete; Lime; Mortar; Gypsum; Bricks; Ceramics; Glass
    • G01N33/383—Concrete or cement
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8806—Specially adapted optical and illumination features
    • G01N2021/8845—Multiple wavelengths of illumination or detection

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JP2016224222A 2016-11-17 2016-11-17 測定周期決定装置、測定周期決定プログラム、及びその方法 Active JP7103749B2 (ja)

Priority Applications (7)

Application Number Priority Date Filing Date Title
JP2016224222A JP7103749B2 (ja) 2016-11-17 2016-11-17 測定周期決定装置、測定周期決定プログラム、及びその方法
PCT/US2017/060798 WO2018093655A1 (en) 2016-11-17 2017-11-09 Measurement cycle determination device, measurement cycle determination program, and method thereof
EP17808664.1A EP3542324A1 (en) 2016-11-17 2017-11-09 Measurement cycle determination device, measurement cycle determination program, and method thereof
US16/461,051 US10955356B2 (en) 2016-11-17 2017-11-09 Measurement cycle determination device, measurement cycle determination program and method thereof
CN201780071458.8A CN109997159A (zh) 2016-11-17 2017-11-09 测量周期确定设备、测量周期确定程序及其方法
US17/173,392 US11635390B2 (en) 2016-11-17 2021-02-11 Measurement cycle determination device, measurement cycle determination program and method thereof
JP2022016544A JP2022058907A (ja) 2016-11-17 2022-02-04 測定周期決定装置、測定周期決定プログラム、及びその方法

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JP2016224222A JP7103749B2 (ja) 2016-11-17 2016-11-17 測定周期決定装置、測定周期決定プログラム、及びその方法

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EP (1) EP3542324A1 (enExample)
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WO (1) WO2018093655A1 (enExample)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP7103749B2 (ja) * 2016-11-17 2022-07-20 スリーエム イノベイティブ プロパティズ カンパニー 測定周期決定装置、測定周期決定プログラム、及びその方法
JP7173720B2 (ja) 2016-12-22 2022-11-16 スリーエム イノベイティブ プロパティズ カンパニー シート及び建造物変形評価用物品
JP6849456B2 (ja) 2017-01-31 2021-03-24 スリーエム イノベイティブ プロパティズ カンパニー 画像領域抽出方法、画像領域抽出プログラム、画像領域抽出システム及び画像領域抽出装置
WO2022085047A1 (ja) * 2020-10-19 2022-04-28 日本電信電話株式会社 決定装置、決定システム、および決定方法
JP7559665B2 (ja) * 2021-04-20 2024-10-02 株式会社島津製作所 測定画像管理システム、測定画像管理用サーバ、および、測定画像管理方法
CN113378264B (zh) * 2021-05-31 2022-06-07 中国科学院武汉岩土力学研究所 山区桥梁综合选址方法及设备
JP7599767B1 (ja) * 2024-09-18 2024-12-16 株式会社Symmetry 検査装置、及び、検査方法

Citations (10)

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JP2003118794A (ja) 2001-10-12 2003-04-23 Sapporo Breweries Ltd 分離型飲料用サーバー保守点検日程の管理方法及び分離型飲料用サーバー保守点検日程の管理装置
JP2005018116A (ja) 2003-06-23 2005-01-20 Matsushita Electric Works Ltd 外回り部材の劣化状況予測プログラム及び当該プログラムを記録したコンピュータ読み取り可能な記録媒体、並びに劣化状況予測装置
JP2006251914A (ja) 2005-03-08 2006-09-21 Takeshi Obata 構造物診断システム、診断サーバ
JP2007140608A (ja) 2005-11-14 2007-06-07 Yamaguchi Univ 構造物補修施工計画支援システム
JP2007178292A (ja) 2005-12-28 2007-07-12 Toshiba Corp 破壊リスク評価装置およびその評価方法、記録媒体並びにプログラム
JP2011191282A (ja) 2010-03-12 2011-09-29 Hironobu Horiuchi モアレ縞を使った変位計測方法
JP2012103960A (ja) 2010-11-11 2012-05-31 Toyota Home Kk 住宅のメンテナンスシステム
JP2012247229A (ja) 2011-05-25 2012-12-13 Hiroshima Univ 歪量表示方法及びその装置、健全性評価方法
JP2015184043A (ja) 2014-03-20 2015-10-22 スリーエム イノベイティブ プロパティズ カンパニー シート及び建造物変形評価用物品
JP2016004285A (ja) 2014-06-13 2016-01-12 三菱電機株式会社 点検情報管理システム

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JP2942873B2 (ja) 1990-08-28 1999-08-30 マツダ株式会社 自動変速機の制御装置
JPH10301986A (ja) 1997-04-24 1998-11-13 Shiyouhei Fudosan Kk 建築物保守管理支援システムと建築物保守管理のためのプログラム記録媒体
JP4107359B2 (ja) 1998-05-14 2008-06-25 株式会社日立製作所 施設管理システム
US6141010A (en) 1998-07-17 2000-10-31 B. E. Technology, Llc Computer interface method and apparatus with targeted advertising
US7840376B2 (en) * 2008-03-20 2010-11-23 The Boeing Company Risk-based design and maintenance systems and methods
JP2010128717A (ja) 2008-11-26 2010-06-10 Shoei Computer:Kk 点検管理サーバ、点検管理方法及び点検管理システム
JP5616548B1 (ja) 2014-03-25 2014-10-29 日本ペイント株式会社 二液混合型塗料組成物及び塗膜形成方法
JP6741409B2 (ja) 2015-09-16 2020-08-19 スリーエム イノベイティブ プロパティズ カンパニー 変形量測定方法、プログラム、サーバ装置、およびシステム
JP7103749B2 (ja) * 2016-11-17 2022-07-20 スリーエム イノベイティブ プロパティズ カンパニー 測定周期決定装置、測定周期決定プログラム、及びその方法

Patent Citations (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2003118794A (ja) 2001-10-12 2003-04-23 Sapporo Breweries Ltd 分離型飲料用サーバー保守点検日程の管理方法及び分離型飲料用サーバー保守点検日程の管理装置
JP2005018116A (ja) 2003-06-23 2005-01-20 Matsushita Electric Works Ltd 外回り部材の劣化状況予測プログラム及び当該プログラムを記録したコンピュータ読み取り可能な記録媒体、並びに劣化状況予測装置
JP2006251914A (ja) 2005-03-08 2006-09-21 Takeshi Obata 構造物診断システム、診断サーバ
JP2007140608A (ja) 2005-11-14 2007-06-07 Yamaguchi Univ 構造物補修施工計画支援システム
JP2007178292A (ja) 2005-12-28 2007-07-12 Toshiba Corp 破壊リスク評価装置およびその評価方法、記録媒体並びにプログラム
JP2011191282A (ja) 2010-03-12 2011-09-29 Hironobu Horiuchi モアレ縞を使った変位計測方法
JP2012103960A (ja) 2010-11-11 2012-05-31 Toyota Home Kk 住宅のメンテナンスシステム
JP2012247229A (ja) 2011-05-25 2012-12-13 Hiroshima Univ 歪量表示方法及びその装置、健全性評価方法
JP2015184043A (ja) 2014-03-20 2015-10-22 スリーエム イノベイティブ プロパティズ カンパニー シート及び建造物変形評価用物品
JP2016004285A (ja) 2014-06-13 2016-01-12 三菱電機株式会社 点検情報管理システム

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JP2022058907A (ja) 2022-04-12
US20190310205A1 (en) 2019-10-10
CN109997159A (zh) 2019-07-09
US10955356B2 (en) 2021-03-23
US20210164911A1 (en) 2021-06-03
EP3542324A1 (en) 2019-09-25
US11635390B2 (en) 2023-04-25
WO2018093655A1 (en) 2018-05-24
JP2018081560A (ja) 2018-05-24

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