CN109997159A - 测量周期确定设备、测量周期确定程序及其方法 - Google Patents

测量周期确定设备、测量周期确定程序及其方法 Download PDF

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Publication number
CN109997159A
CN109997159A CN201780071458.8A CN201780071458A CN109997159A CN 109997159 A CN109997159 A CN 109997159A CN 201780071458 A CN201780071458 A CN 201780071458A CN 109997159 A CN109997159 A CN 109997159A
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measurement period
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crack
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CN201780071458.8A
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Chinese (zh)
Inventor
中山丞
布一马
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3M Innovative Properties Co
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3M Innovative Properties Co
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Publication of CN109997159A publication Critical patent/CN109997159A/zh
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06Q—INFORMATION AND COMMUNICATION TECHNOLOGY [ICT] SPECIALLY ADAPTED FOR ADMINISTRATIVE, COMMERCIAL, FINANCIAL, MANAGERIAL OR SUPERVISORY PURPOSES; SYSTEMS OR METHODS SPECIALLY ADAPTED FOR ADMINISTRATIVE, COMMERCIAL, FINANCIAL, MANAGERIAL OR SUPERVISORY PURPOSES, NOT OTHERWISE PROVIDED FOR
    • G06Q10/00—Administration; Management
    • G06Q10/06—Resources, workflows, human or project management; Enterprise or organisation planning; Enterprise or organisation modelling
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8803—Visual inspection
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8806—Specially adapted optical and illumination features
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N33/00—Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
    • G01N33/38—Concrete; Lime; Mortar; Gypsum; Bricks; Ceramics; Glass
    • G01N33/383—Concrete or cement
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8806—Specially adapted optical and illumination features
    • G01N2021/8845—Multiple wavelengths of illumination or detection

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Business, Economics & Management (AREA)
  • Pathology (AREA)
  • Immunology (AREA)
  • General Health & Medical Sciences (AREA)
  • Biochemistry (AREA)
  • Analytical Chemistry (AREA)
  • Strategic Management (AREA)
  • Human Resources & Organizations (AREA)
  • Economics (AREA)
  • Entrepreneurship & Innovation (AREA)
  • Educational Administration (AREA)
  • General Business, Economics & Management (AREA)
  • Quality & Reliability (AREA)
  • Theoretical Computer Science (AREA)
  • Tourism & Hospitality (AREA)
  • Operations Research (AREA)
  • Marketing (AREA)
  • Development Economics (AREA)
  • Game Theory and Decision Science (AREA)
  • Ceramic Engineering (AREA)
  • Medicinal Chemistry (AREA)
  • Food Science & Technology (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Signal Processing (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Management, Administration, Business Operations System, And Electronic Commerce (AREA)
CN201780071458.8A 2016-11-17 2017-11-09 测量周期确定设备、测量周期确定程序及其方法 Withdrawn CN109997159A (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2016-224222 2016-11-17
JP2016224222A JP7103749B2 (ja) 2016-11-17 2016-11-17 測定周期決定装置、測定周期決定プログラム、及びその方法
PCT/US2017/060798 WO2018093655A1 (en) 2016-11-17 2017-11-09 Measurement cycle determination device, measurement cycle determination program, and method thereof

Publications (1)

Publication Number Publication Date
CN109997159A true CN109997159A (zh) 2019-07-09

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CN201780071458.8A Withdrawn CN109997159A (zh) 2016-11-17 2017-11-09 测量周期确定设备、测量周期确定程序及其方法

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US (2) US10955356B2 (enExample)
EP (1) EP3542324A1 (enExample)
JP (2) JP7103749B2 (enExample)
CN (1) CN109997159A (enExample)
WO (1) WO2018093655A1 (enExample)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP7103749B2 (ja) * 2016-11-17 2022-07-20 スリーエム イノベイティブ プロパティズ カンパニー 測定周期決定装置、測定周期決定プログラム、及びその方法
JP7173720B2 (ja) 2016-12-22 2022-11-16 スリーエム イノベイティブ プロパティズ カンパニー シート及び建造物変形評価用物品
JP6849456B2 (ja) 2017-01-31 2021-03-24 スリーエム イノベイティブ プロパティズ カンパニー 画像領域抽出方法、画像領域抽出プログラム、画像領域抽出システム及び画像領域抽出装置
WO2022085047A1 (ja) * 2020-10-19 2022-04-28 日本電信電話株式会社 決定装置、決定システム、および決定方法
JP7559665B2 (ja) * 2021-04-20 2024-10-02 株式会社島津製作所 測定画像管理システム、測定画像管理用サーバ、および、測定画像管理方法
CN113378264B (zh) * 2021-05-31 2022-06-07 中国科学院武汉岩土力学研究所 山区桥梁综合选址方法及设备
JP7599767B1 (ja) * 2024-09-18 2024-12-16 株式会社Symmetry 検査装置、及び、検査方法

Family Cites Families (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2942873B2 (ja) 1990-08-28 1999-08-30 マツダ株式会社 自動変速機の制御装置
JPH10301986A (ja) 1997-04-24 1998-11-13 Shiyouhei Fudosan Kk 建築物保守管理支援システムと建築物保守管理のためのプログラム記録媒体
JP4107359B2 (ja) 1998-05-14 2008-06-25 株式会社日立製作所 施設管理システム
US6141010A (en) 1998-07-17 2000-10-31 B. E. Technology, Llc Computer interface method and apparatus with targeted advertising
JP4166008B2 (ja) 2001-10-12 2008-10-15 サッポロビール株式会社 分離型飲料用サーバー保守点検日程の管理方法及び分離型飲料用サーバー保守点検日程の管理装置
JP2005018116A (ja) 2003-06-23 2005-01-20 Matsushita Electric Works Ltd 外回り部材の劣化状況予測プログラム及び当該プログラムを記録したコンピュータ読み取り可能な記録媒体、並びに劣化状況予測装置
JP2006251914A (ja) 2005-03-08 2006-09-21 Takeshi Obata 構造物診断システム、診断サーバ
JP3975406B2 (ja) 2005-11-14 2007-09-12 国立大学法人山口大学 構造物補修施工計画支援システム
JP2007178292A (ja) 2005-12-28 2007-07-12 Toshiba Corp 破壊リスク評価装置およびその評価方法、記録媒体並びにプログラム
US7840376B2 (en) * 2008-03-20 2010-11-23 The Boeing Company Risk-based design and maintenance systems and methods
JP2010128717A (ja) 2008-11-26 2010-06-10 Shoei Computer:Kk 点検管理サーバ、点検管理方法及び点検管理システム
JP2011191282A (ja) 2010-03-12 2011-09-29 Hironobu Horiuchi モアレ縞を使った変位計測方法
JP5690117B2 (ja) 2010-11-11 2015-03-25 トヨタホーム株式会社 住宅のメンテナンスシステム
JP5843256B2 (ja) 2011-05-25 2016-01-13 国立大学法人広島大学 歪量表示方法及びその装置
JP6321418B2 (ja) 2014-03-20 2018-05-09 スリーエム イノベイティブ プロパティズ カンパニー シート及び建造物変形評価用物品
JP5616548B1 (ja) 2014-03-25 2014-10-29 日本ペイント株式会社 二液混合型塗料組成物及び塗膜形成方法
JP6395460B2 (ja) 2014-06-13 2018-09-26 三菱電機株式会社 点検情報管理システム及び携帯端末
JP6741409B2 (ja) 2015-09-16 2020-08-19 スリーエム イノベイティブ プロパティズ カンパニー 変形量測定方法、プログラム、サーバ装置、およびシステム
JP7103749B2 (ja) * 2016-11-17 2022-07-20 スリーエム イノベイティブ プロパティズ カンパニー 測定周期決定装置、測定周期決定プログラム、及びその方法

Also Published As

Publication number Publication date
JP7103749B2 (ja) 2022-07-20
JP2022058907A (ja) 2022-04-12
US20190310205A1 (en) 2019-10-10
US10955356B2 (en) 2021-03-23
US20210164911A1 (en) 2021-06-03
EP3542324A1 (en) 2019-09-25
US11635390B2 (en) 2023-04-25
WO2018093655A1 (en) 2018-05-24
JP2018081560A (ja) 2018-05-24

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