JP7079609B2 - 電磁波シールド形成用マスキングテープ - Google Patents
電磁波シールド形成用マスキングテープ Download PDFInfo
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- JP7079609B2 JP7079609B2 JP2018006883A JP2018006883A JP7079609B2 JP 7079609 B2 JP7079609 B2 JP 7079609B2 JP 2018006883 A JP2018006883 A JP 2018006883A JP 2018006883 A JP2018006883 A JP 2018006883A JP 7079609 B2 JP7079609 B2 JP 7079609B2
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- masking tape
- sensitive adhesive
- pressure
- adhesive layer
- meth
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Description
1つの実施形態においては、上記電磁波シールド形成用マスキングテープは、基材をさらに備え、該基材の少なくとも片側に前記粘着剤層が配置される。
1つの実施形態においては、上記電磁波シールド形成用マスキングテープは、上記粘着剤層の片側に配置される中間層をさらに備える。
1つの実施形態においては、上記電磁波シールド形成用マスキングテープは、上記粘着剤層と上記基材との間に配置される中間層をさらに備える。
1つの実施形態においては、上記粘着剤層の弾性率(活性エネルギー線照射前)が、0.07MPa~0.70MPaである。
1つの実施形態においては、上記中間層の弾性率が、0.07MPa~0.30MPaである。
1つの実施形態においては、上記電磁波シールド形成用マスキングテープは、60℃~300℃の加熱を行う加熱工程に供される。
1つの実施形態においては、上記電磁波シールド形成用マスキングテープは、高さ50μm以上のバンプを有する面のマスキングに用いられる。
図1は、本発明の1つの実施形態による電磁波シールド形成用マスキングテープの概略断面図である。この実施形態による電磁波シールド形成用マスキングテープ100は、基材10と基材10の少なくとも片側に配置された粘着剤層20とを備える。図示していないが、本発明のマスキングテープは、使用に供するまでの間、粘着面を保護する目的で、粘着剤層の外側に剥離ライナーが設けられていてもよい。なお、以下、本明細書において、電磁波シールド形成用マスキングテープを単にマスキングテープということもある。
上記のとおり、粘着剤層は、活性エネルギー線照射により、弾性率が活性エネルギー線照射前の20倍以上となる。好ましくは、粘着剤層は、活性エネルギー線照射により、弾性率が活性エネルギー線照射前の20倍~6000倍となり、より好ましくは50倍~5500倍となり、さらに好ましくは100倍~4000倍となる。このような範囲であれば、本願発明の上記効果はより顕著となる。なお、本明細書において、特にことわりのない場合、「粘着剤層」とは活性エネルギー線照射前の粘着剤層を意味する。
(測定装置及び測定条件)
装置:Hysitron Inc.製 Tribo Indenter
使用圧子:Berkovich(三角錐型)
測定方法:単一押し込み測定
押し込み深さ設定:2500nm
押込み速度:2000nm/sec
測定雰囲気:空気中
試料サイズ:1cm×1cm
上記基材は、任意の適切な樹脂から構成され得る。該樹脂としては、例えば、低密度ポリエチレン、直鎖状ポリエチレン、中密度ポリエチレン、高密度ポリエチレン、超低密度ポリエチレン、ランダム共重合ポリプロピレン、ブロック共重合ポリプロピレン、ホモポリプロピレン、ポリブテン、ポリメチルペンテン等のポリオレフィン、エチレン-酢酸ビニル共重合体、アイオノマー樹脂、エチレン-(メタ)アクリル酸共重合体、エチレン-(メタ)アクリル酸エステル(ランダム、交互)共重合体、エチレン-ブテン共重合体、エチレン-ヘキセン共重合体、ポリウレタン、ポリエチレンナフタレート等のポリエステル、ポリイミド、ポリエーテルケトン、ポリスチレン、ポリ塩化ビニル、ポリ塩化ビニリデン、フッ素樹脂、シリコン樹脂、セルロース系樹脂、および、これらの架橋体等が挙げられる。
中間層の弾性率は、活性エネルギー線照射後の粘着剤層の弾性率よりも低いことが好ましい。また、中間層は、その弾性率が活性エネルギー線照射により変化する構成であってもよいが、活性エネルギー線照射後の中間層の弾性率は、活性エネルギー線照射後の粘着剤層の弾性率よりも低いことが好ましい。
上記マスキングテープは、任意の適切な方法により製造され得る。マスキングテープは、例えば、基材上に、上記粘着剤を塗工して得られ得る。塗工方法としては、バーコーター塗工、エアナイフ塗工、グラビア塗工、グラビアリバース塗工、リバースロール塗工、リップ塗工、ダイ塗工、ディップ塗工、オフセット印刷、フレキソ印刷、スクリーン印刷など種々の方法を採用することができる。また、別途、剥離ライナーに粘着剤層を形成した後、それを基材に貼り合せる方法等を採用してもよい。また、マスキングテープが中間層を備える場合、当該マスキングテープは、基材上に中間層形成用組成物を塗工(必要に応じて、硬化)して中間層を形成した後、上記粘着剤を中間層上に塗工して得られ得る。
本発明のマスキングテープは、凹凸面を有する電子部品(例えば、バンプを備える電子部品)に電磁波シールドを設ける際に、電磁波シールドの形成を要さない凹凸面(バンプ形成面)をマスキングする際に好適に用いられ得る。また、マスキングされた電子部品が加熱工程に供される場合のマスキングテープとして好適に用いられ得る。
マスキングテープの粘着剤層を1cm角に切り出し、これを測定用試料とした。測定用試料を所定の支持体に固定し、についてナノインデンターで弾性率を測定した。
ナノインデンター装置ならびに測定条件は下記のとおりである。
(測定装置及び測定条件)
装置:Hysitron Inc.製 Tribo Indenter
使用圧子:Berkovich(三角錐型)
測定方法:単一押し込み測定
押し込み深さ設定:2500nm
押込み速度:2000nm/sec
測定雰囲気:空気中、23℃
試料サイズ:1cm×1cm
また、日東精機社製のUM-810を用いて積算光量1000mJ/cm2の紫外線を、粘着剤層に照射し、その後、粘着剤層の弾性率を上記の方法にて測定した。
BGA半導体パッケージのバンプ形成面にマスキングテープを貼着し、日東精機社製のUM-810を用いて積算光量1000mJ/cm2の紫外線を、粘着剤層に照射した。その後、芝浦メカトロニクス社製のCCS-1300にてSUS0.2μm/Cu5μm/SUS0.5μmから構成される層をパッケージ上にスパッタにより作製した。次いで、マスキングテープを剥離して、バンプ面を顕微鏡にて観察し、パッケージ周辺部のメタル侵入量により、マスキングテープの浮きを下記の基準で評価した。なお、BGA半導体パッケージは、サイズ10mm×10mm×0.9mmtで、BGA(バンプ)の高さが200μmであり、直径が200μmであるものを使用した。また、マスキングテープの貼着は、40℃の環境下で、2kgのゴムロール1往復にて行った。
〇:パッケージの周辺のメタル侵入が50μm以下
×:パッケージの周辺のメタル侵入が100μm以上
上記(2)のようにして、BGA半導体パッケージにマスキングテープを貼着した後、日東精機社製のUM-810を用いて積算光量1000mJ/cm2の紫外線を、粘着剤層に照射した。その後、マスキングテープを剥離して、バンプ形成面に残存した粘着剤層成分の有無を、SEM(50倍)で確認した。
〇:糊残りがない
△:数十μmレベル少量で、電気的接続には問題ないと考えられる糊残りが存在する
×:100μm以上の糊残りが、多数認められる
冷却管、窒素導入管、温度計および撹拌装置を備えた反応容器に、アクリル酸2-エチルヘキシル(以下、「2EHA」という。)88.8部、アクリル酸-2-ヒドロキシエチル(以下、「HEA」という。)11.2部、過酸化ベンゾイル0.2部及びトルエン65部を入れ、窒素気流中で61℃にて6時間重合処理をし、重量平均分子量85万のアクリル系ポリマーAを得た。2EHAとHEAとのモル比は、100mol:20molとした。
このアクリル系ポリマーAに2-メタクリロイルオキシエチルイソシアネート(以下、「MOI」という。)12部(HEAに対し80mol%)を加え、空気気流中で50℃にて48時間、付加反応処理をし、アクリル系ポリマーA’を得た。
次に、アクリル系ポリマーA’100部に対し、ポリイソシアネート化合物(商品名「コロネートL」、日本ポリウレタン社製)2.5部、及び光重合開始剤(商品名「イルガキュア127」、BASF社製)5部、ジペンタエリスリトールペンタアクリレートおよびジペンタエリスリトールヘキサアクリレートの混合物(商品名「KAYARAD DPHA」、日本化薬社製)30部と、ポリウレタンアクリレート(商品名「紫光UV-3000B」、日本合成化学工業社製)6部とを加えて、粘着剤Aを作製した。
「KAYARAD DPHA」の配合量を60部とし、「紫光UV-3000B」の配合量を12部としたこと以外は、製造例1と同様にして粘着剤Bを調製した。
「KAYARAD DPHA」の配合量を100部とし、「紫光UV-3000B」を配合しなかったこと以外は、製造例1と同様にして粘着剤Cを調製した。
「KAYARAD DPHA」、「紫光UV-3000B」ともに配合しなかったこと以外は、製造例1と同様にして粘着剤Dを調製した。
「KAYARAD DPHA」の配合量を130部とし、「紫光UV-3000B」を配合しなかったこと以外は、製造例1と同様にして粘着剤Eを調製した。
2-エチルヘキシルアクリレート(2EHA)90部、アクリル酸(AA)10部、光重合開始剤(商品名「イルガキュア184」、BASF社製)0.05部、および光重合開始剤(商品名「イルガキュア651」、BASF社製)0.05部を4つ口フラスコに投入した。そして、混合物を窒素雰囲気下で紫外線に曝露して部分的に光重合させることによって、重合率約8質量%の部分重合物(アクリル系ポリマーシロップ)を得た。
上記アクリル系ポリマーシロップ100部に、光重合開始剤(商品名「イルガキュア651」、BASF社製)0.04部、およびジペンタエリスリトールヘキサアクリレート0.04部を添加した後、これらを均一に混合して中間層形成用組成物を調製した。
片面をシリコーンで剥離処理した厚さ38μmのポリエステルフィルム(商品名:MRF、三菱化学ポリエステル社製)の剥離処理面に、上述したアクリル系粘着剤組成物を最終的な厚みが300μmになるように塗布して塗布層を形成した。次いで、塗布されたアクリル系粘着剤組成物の表面に、片面をシリコーンで剥離処理した厚さ38μmのポリエステルフィルム(商品名:MRE、三菱化学ポリエステル株式会社製)を、当該フィルムの剥離処理面が塗布層側になるようにして積層した。これにより、光学用アクリル系粘着剤組成物の塗布層(粘着剤層)を酸素から遮断した。このようにして得られた積層体に、高圧水銀ランプ(株式会社東芝ライテック製)を用いて照度200mW/cm2(約350nmに最大感度をもつトプコンUVR-T1で測定)の紫外線を光量3000mW/cm2になるまで紫外線を照射し、ポリエステルフィルムに挾持された中間層を得た。
粘着剤Aを、PET基材(厚み:100μm)のシリコーン処理を施した面上に塗布し、120℃で2分間加熱架橋して、厚さ10μmの粘着剤層を形成した。
次いで、製造例6で得られた中間層を上記粘着剤層に転写した後、50℃の環境下で48時間保存して、マスキングテープ(基材(100μm)/中間層(300μm)/粘着剤層(10μm))を得た。
得られたマスキングテープを上記評価(2)および(3)に供した。結果を表1に示す。
粘着剤Aに代えて、表1に示す粘着剤を用いたこと以外は、実施例1-1と同様にして、マスキングテープを得た。得られたマスキングテープを上記評価(2)および(3)に供した。結果を表1に示す。
粘着剤Aを、PET基材(厚み:100μm)のシリコーン処理を施した面上に塗布し、80℃で5分間加熱架橋して、厚さ135μmの粘着剤層aを形成した。
別途、PET剥離ライナー上に、粘着剤Aを塗布し、80℃で5分間加熱架橋して、厚さ135μmの粘着剤層bを形成した。
粘着剤層bを粘着剤層aに転写し、その後、得られた積層体を50℃にて48時間保存し、厚み270μmの粘着剤層を有するマスキングテープを得た。
得られたマスキングテープを上記評価(2)および(3)に供した。結果を表1に示す。
粘着剤Aに代えて、表1に示す粘着剤を用いたこと以外は、実施例1-2と同様にして、マスキングテープを得た。得られたマスキングテープを上記評価(2)および(3)に供した。結果を表1に示す。
20 粘着剤層
30 中間層
100 マスキングテープ
Claims (3)
- 活性エネルギー線照射により、弾性率が活性エネルギー線照射前の20倍以上となる、粘着剤層と、
該粘着剤層の片側に配置される中間層とを備える、電磁波シールド形成用マスキングテープであって、
該粘着剤層の弾性率(活性エネルギー線照射前)が、0.07MPa~0.70MPaであり、
該粘着剤層の活性エネルギー線照射後の弾性率が、10MPa~500MPaであり、
該中間層の弾性率が、0.07MPa~0.70MPaであり、
該電磁波シールド形成用マスキングテープが、基材をさらに備え、
該基材の少なくとも片側に前記粘着剤層が配置され、
該中間層が、前記粘着剤層と前記基材との間に配置される、
電磁波シールド形成用マスキングテープ。 - 60℃~270℃の加熱を行う加熱工程に供される、請求項1に記載の電磁波シールド形成用マスキングテープ。
- 高さ50μm以上のバンプを有する面のマスキングに用いられる、請求項1または2に記載の電磁波シールド形成用マスキングテープ。
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