JP6996736B2 - 異物検査装置 - Google Patents

異物検査装置 Download PDF

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Publication number
JP6996736B2
JP6996736B2 JP2017178792A JP2017178792A JP6996736B2 JP 6996736 B2 JP6996736 B2 JP 6996736B2 JP 2017178792 A JP2017178792 A JP 2017178792A JP 2017178792 A JP2017178792 A JP 2017178792A JP 6996736 B2 JP6996736 B2 JP 6996736B2
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Japan
Prior art keywords
light
image pickup
image
foreign matter
glass bottle
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Active
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JP2017178792A
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English (en)
Japanese (ja)
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JP2019053000A (ja
Inventor
宏幸 戸塚
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Kirin Techno System Co Ltd
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Kirin Techno System Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
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Application filed by Kirin Techno System Co Ltd filed Critical Kirin Techno System Co Ltd
Priority to JP2017178792A priority Critical patent/JP6996736B2/ja
Priority to PCT/JP2018/034014 priority patent/WO2019059097A1/ja
Priority to KR1020207010035A priority patent/KR102627123B1/ko
Priority to CN201880060193.6A priority patent/CN111094951A/zh
Publication of JP2019053000A publication Critical patent/JP2019053000A/ja
Application granted granted Critical
Publication of JP6996736B2 publication Critical patent/JP6996736B2/ja
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/90—Investigating the presence of flaws or contamination in a container or its contents
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/94—Investigating contamination, e.g. dust

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  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
JP2017178792A 2017-09-19 2017-09-19 異物検査装置 Active JP6996736B2 (ja)

Priority Applications (4)

Application Number Priority Date Filing Date Title
JP2017178792A JP6996736B2 (ja) 2017-09-19 2017-09-19 異物検査装置
PCT/JP2018/034014 WO2019059097A1 (ja) 2017-09-19 2018-09-13 異物検査装置
KR1020207010035A KR102627123B1 (ko) 2017-09-19 2018-09-13 이물 검사 장치
CN201880060193.6A CN111094951A (zh) 2017-09-19 2018-09-13 异物检查装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2017178792A JP6996736B2 (ja) 2017-09-19 2017-09-19 異物検査装置

Publications (2)

Publication Number Publication Date
JP2019053000A JP2019053000A (ja) 2019-04-04
JP6996736B2 true JP6996736B2 (ja) 2022-01-17

Family

ID=65809709

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2017178792A Active JP6996736B2 (ja) 2017-09-19 2017-09-19 異物検査装置

Country Status (4)

Country Link
JP (1) JP6996736B2 (ko)
KR (1) KR102627123B1 (ko)
CN (1) CN111094951A (ko)
WO (1) WO2019059097A1 (ko)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102021115493A1 (de) * 2021-06-15 2022-12-15 Heuft Systemtechnik Gmbh Verfahren und Vorrichtung zur Vollbehälterinspektion

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2016217866A (ja) 2015-05-20 2016-12-22 キリンテクノシステム株式会社 容器の検査装置および検査方法
WO2017117566A1 (en) 2015-12-31 2017-07-06 Industrial Dynamics Company, Ltd. System and method for inspecting containers using multiple images of the containers

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0721464B2 (ja) * 1988-10-24 1995-03-08 日立プラント建設株式会社 アンプル等の容器の異物検査装置
JP2001221746A (ja) * 2000-02-03 2001-08-17 Suntory Ltd 液体充填用容器の撮像方法および装置
JP2002257716A (ja) * 2001-02-28 2002-09-11 Nippon Sheet Glass Co Ltd 付着物検出装置およびそれを用いた制御装置
JP3785342B2 (ja) 2001-09-28 2006-06-14 日立エンジニアリング株式会社 被検体検査装置及び透明容器の充填液体中の異物検査装置
JP2004317426A (ja) 2003-04-18 2004-11-11 Kirin Techno-System Corp 容器の底異物検査装置
JP4668354B1 (ja) * 2010-07-20 2011-04-13 トリオ・セラミックス株式会社 透明管の泡検出装置および泡検出方法
JP5724077B2 (ja) 2010-08-20 2015-05-27 キリンテクノシステム株式会社 異物検査装置
JP2012122912A (ja) 2010-12-10 2012-06-28 Kirin Techno-System Co Ltd 検査領域の決定方法および異物検査装置
JP2013134099A (ja) * 2011-12-26 2013-07-08 Kirin Techno-System Co Ltd 異物検査装置
JP6409178B2 (ja) 2013-04-19 2018-10-24 キリンテクノシステム株式会社 容器の検査方法及び検査装置

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2016217866A (ja) 2015-05-20 2016-12-22 キリンテクノシステム株式会社 容器の検査装置および検査方法
WO2017117566A1 (en) 2015-12-31 2017-07-06 Industrial Dynamics Company, Ltd. System and method for inspecting containers using multiple images of the containers

Also Published As

Publication number Publication date
WO2019059097A1 (ja) 2019-03-28
KR102627123B1 (ko) 2024-01-23
JP2019053000A (ja) 2019-04-04
CN111094951A (zh) 2020-05-01
KR20200054233A (ko) 2020-05-19

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