JP6978437B2 - システムの較正及びトリミングのための周波数情報を記憶するシステム及び方法 - Google Patents

システムの較正及びトリミングのための周波数情報を記憶するシステム及び方法 Download PDF

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Publication number
JP6978437B2
JP6978437B2 JP2018560005A JP2018560005A JP6978437B2 JP 6978437 B2 JP6978437 B2 JP 6978437B2 JP 2018560005 A JP2018560005 A JP 2018560005A JP 2018560005 A JP2018560005 A JP 2018560005A JP 6978437 B2 JP6978437 B2 JP 6978437B2
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Japan
Prior art keywords
frequency
circuit
input
integrated circuit
memory
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Expired - Fee Related
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JP2018560005A
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Japanese (ja)
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JP2019533318A5 (https=
JP2019533318A (ja
Inventor
アジャイ クマール，
ヒョンス ヨム，
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Microchip Technology Inc
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Microchip Technology Inc
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    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03L—AUTOMATIC CONTROL, STARTING, SYNCHRONISATION OR STABILISATION OF GENERATORS OF ELECTRONIC OSCILLATIONS OR PULSES
    • H03L1/00—Stabilisation of generator output against variations of physical values, e.g. power supply
    • H03L1/02—Stabilisation of generator output against variations of physical values, e.g. power supply against variations of temperature only
    • H03L1/021—Stabilisation of generator output against variations of physical values, e.g. power supply against variations of temperature only of generators comprising distributed capacitance and inductance
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/282—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere
    • G01R31/2822—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere of microwave or radiofrequency circuits
    • G01R31/2824—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere of microwave or radiofrequency circuits testing of oscillators or resonators
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03L—AUTOMATIC CONTROL, STARTING, SYNCHRONISATION OR STABILISATION OF GENERATORS OF ELECTRONIC OSCILLATIONS OR PULSES
    • H03L1/00—Stabilisation of generator output against variations of physical values, e.g. power supply
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
    • G01R31/2836—Fault-finding or characterising
    • G01R31/2837—Characterising or performance testing, e.g. of frequency response
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03L—AUTOMATIC CONTROL, STARTING, SYNCHRONISATION OR STABILISATION OF GENERATORS OF ELECTRONIC OSCILLATIONS OR PULSES
    • H03L1/00—Stabilisation of generator output against variations of physical values, e.g. power supply
    • H03L1/02—Stabilisation of generator output against variations of physical values, e.g. power supply against variations of temperature only
    • H03L1/022—Stabilisation of generator output against variations of physical values, e.g. power supply against variations of temperature only by indirect stabilisation, i.e. by generating an electrical correction signal which is a function of the temperature
    • H03L1/026—Stabilisation of generator output against variations of physical values, e.g. power supply against variations of temperature only by indirect stabilisation, i.e. by generating an electrical correction signal which is a function of the temperature by using a memory for digitally storing correction values
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03L—AUTOMATIC CONTROL, STARTING, SYNCHRONISATION OR STABILISATION OF GENERATORS OF ELECTRONIC OSCILLATIONS OR PULSES
    • H03L7/00—Automatic control of frequency or phase; Synchronisation
    • H03L7/02—Automatic control of frequency or phase; Synchronisation using a frequency discriminator comprising a passive frequency-determining element
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03J—TUNING RESONANT CIRCUITS; SELECTING RESONANT CIRCUITS
    • H03J2200/00—Indexing scheme relating to tuning resonant circuits and selecting resonant circuits
    • H03J2200/01—Circuitry controlling the selecting or switching action
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03J—TUNING RESONANT CIRCUITS; SELECTING RESONANT CIRCUITS
    • H03J2200/00—Indexing scheme relating to tuning resonant circuits and selecting resonant circuits
    • H03J2200/10—Tuning of a resonator by means of digitally controlled capacitor bank
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K2217/00—Indexing scheme related to electronic switching or gating, i.e. not by contact-making or -breaking covered by H03K17/00
    • H03K2217/94—Indexing scheme related to electronic switching or gating, i.e. not by contact-making or -breaking covered by H03K17/00 characterised by the way in which the control signal is generated
    • H03K2217/9401—Calibration techniques
    • H03K2217/94031—Calibration involving digital processing

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  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Oscillators With Electromechanical Resonators (AREA)
  • Inductance-Capacitance Distribution Constants And Capacitance-Resistance Oscillators (AREA)
JP2018560005A 2016-08-25 2017-08-25 システムの較正及びトリミングのための周波数情報を記憶するシステム及び方法 Expired - Fee Related JP6978437B2 (ja)

Applications Claiming Priority (5)

Application Number Priority Date Filing Date Title
US201662379632P 2016-08-25 2016-08-25
US62/379,632 2016-08-25
US15/685,570 US10551428B2 (en) 2016-08-25 2017-08-24 Systems and methods for storing frequency information for system calibration/trimming
US15/685,570 2017-08-24
PCT/US2017/048574 WO2018039538A1 (en) 2016-08-25 2017-08-25 Systems and methods for storing frequency information for system calibration and trimming

Publications (3)

Publication Number Publication Date
JP2019533318A JP2019533318A (ja) 2019-11-14
JP2019533318A5 JP2019533318A5 (https=) 2020-09-10
JP6978437B2 true JP6978437B2 (ja) 2021-12-08

Family

ID=61242213

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2018560005A Expired - Fee Related JP6978437B2 (ja) 2016-08-25 2017-08-25 システムの較正及びトリミングのための周波数情報を記憶するシステム及び方法

Country Status (7)

Country Link
US (1) US10551428B2 (https=)
EP (1) EP3504798B1 (https=)
JP (1) JP6978437B2 (https=)
KR (1) KR102458148B1 (https=)
CN (1) CN109314517A (https=)
TW (1) TW201813313A (https=)
WO (1) WO2018039538A1 (https=)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US10866269B2 (en) * 2017-11-16 2020-12-15 Microchip Technology Incorporated Fast frequency calculator
CN114421890A (zh) * 2022-01-21 2022-04-29 南京扬贺扬微电子科技有限公司 一种优化校正的rc振荡模块及方法

Family Cites Families (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5796312A (en) * 1996-05-24 1998-08-18 Microchip Technology Incorporated Microcontroller with firmware selectable oscillator trimming
US6813529B2 (en) * 2001-01-19 2004-11-02 Microchip Technology Incorporated Method and apparatus for signal frequency decoding without an analog bandpass filter
US7541878B2 (en) * 2005-12-29 2009-06-02 Intel Corporation Temperature compensated crystal oscillator
US7889013B2 (en) * 2007-08-28 2011-02-15 Intel Corporation Microelectronic die having CMOS ring oscillator thereon and method of using same
US7737794B2 (en) * 2008-05-14 2010-06-15 International Business Machines Corporation Phase locked loop with temperature and process compensation
US20100244969A1 (en) * 2009-03-30 2010-09-30 Mediatek Inc. Temperature compensated oscillation circuits
WO2012001846A1 (ja) * 2010-06-28 2012-01-05 パナソニック株式会社 基準周波数生成回路、半導体集積回路、電子機器
US8451064B2 (en) * 2010-10-07 2013-05-28 Advanced Micro Devices, Inc. Voltage-controlled oscillator module having adjustable oscillator gain and related operating methods
WO2012137590A1 (ja) 2011-04-01 2012-10-11 ルネサスエレクトロニクス株式会社 半導体装置
US8390384B1 (en) 2011-11-21 2013-03-05 Microchip Technology Incorporated Precision on-board tuning of embedded microcontroller oscillator using charge time measurement unit
US9236852B2 (en) 2012-02-01 2016-01-12 Microchip Technology Incorporated Input capture peripheral with gating logic
JP6116305B2 (ja) * 2013-03-25 2017-04-19 三菱電機株式会社 周波数検出回路
JP2015152416A (ja) * 2014-02-14 2015-08-24 株式会社東芝 キャパシタンス検出装置
US9341658B2 (en) * 2014-02-28 2016-05-17 Texas Instruments Incorporated Fast on-chip oscillator trimming
DE102015202694A1 (de) * 2015-02-13 2016-08-18 Infineon Technologies Ag Stresskompensierte Oszillatorschaltungsanordnung und integrierte Schaltung, die diese verwendet

Also Published As

Publication number Publication date
EP3504798B1 (en) 2023-04-05
WO2018039538A1 (en) 2018-03-01
KR102458148B1 (ko) 2022-10-25
EP3504798A1 (en) 2019-07-03
CN109314517A (zh) 2019-02-05
JP2019533318A (ja) 2019-11-14
US10551428B2 (en) 2020-02-04
US20180059171A1 (en) 2018-03-01
TW201813313A (zh) 2018-04-01
KR20190040482A (ko) 2019-04-18

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