CN109314517A - 用于存储系统校准和修整的频率信息的系统和方法 - Google Patents
用于存储系统校准和修整的频率信息的系统和方法 Download PDFInfo
- Publication number
- CN109314517A CN109314517A CN201780026137.6A CN201780026137A CN109314517A CN 109314517 A CN109314517 A CN 109314517A CN 201780026137 A CN201780026137 A CN 201780026137A CN 109314517 A CN109314517 A CN 109314517A
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- CN
- China
- Prior art keywords
- frequency
- dut
- circuit
- input
- test circuit
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000000034 method Methods 0.000 title claims description 41
- 238000003860 storage Methods 0.000 title claims description 41
- 238000012360 testing method Methods 0.000 claims abstract description 80
- 230000015654 memory Effects 0.000 claims abstract description 30
- 238000005259 measurement Methods 0.000 claims abstract description 25
- 238000005538 encapsulation Methods 0.000 claims description 27
- 239000003990 capacitor Substances 0.000 claims description 9
- 230000008859 change Effects 0.000 claims description 9
- 238000006243 chemical reaction Methods 0.000 claims description 6
- 238000004519 manufacturing process Methods 0.000 description 34
- 230000035882 stress Effects 0.000 description 20
- 238000010586 diagram Methods 0.000 description 9
- 230000004044 response Effects 0.000 description 6
- 239000013078 crystal Substances 0.000 description 5
- 230000005611 electricity Effects 0.000 description 5
- 238000004806 packaging method and process Methods 0.000 description 5
- 230000004087 circulation Effects 0.000 description 4
- 238000012937 correction Methods 0.000 description 4
- 238000009966 trimming Methods 0.000 description 4
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 3
- 238000006073 displacement reaction Methods 0.000 description 3
- 230000008569 process Effects 0.000 description 3
- 229910052710 silicon Inorganic materials 0.000 description 3
- 239000010703 silicon Substances 0.000 description 3
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- 238000012804 iterative process Methods 0.000 description 2
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- 230000007246 mechanism Effects 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- 238000012545 processing Methods 0.000 description 2
- 239000004065 semiconductor Substances 0.000 description 2
- 239000000919 ceramic Substances 0.000 description 1
- 230000000295 complement effect Effects 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 230000007613 environmental effect Effects 0.000 description 1
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- 239000012535 impurity Substances 0.000 description 1
- 229910044991 metal oxide Inorganic materials 0.000 description 1
- 150000004706 metal oxides Chemical class 0.000 description 1
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- 239000010453 quartz Substances 0.000 description 1
- 238000007789 sealing Methods 0.000 description 1
- 238000007493 shaping process Methods 0.000 description 1
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 1
- 238000007711 solidification Methods 0.000 description 1
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Classifications
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03L—AUTOMATIC CONTROL, STARTING, SYNCHRONISATION OR STABILISATION OF GENERATORS OF ELECTRONIC OSCILLATIONS OR PULSES
- H03L1/00—Stabilisation of generator output against variations of physical values, e.g. power supply
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03L—AUTOMATIC CONTROL, STARTING, SYNCHRONISATION OR STABILISATION OF GENERATORS OF ELECTRONIC OSCILLATIONS OR PULSES
- H03L1/00—Stabilisation of generator output against variations of physical values, e.g. power supply
- H03L1/02—Stabilisation of generator output against variations of physical values, e.g. power supply against variations of temperature only
- H03L1/021—Stabilisation of generator output against variations of physical values, e.g. power supply against variations of temperature only of generators comprising distributed capacitance and inductance
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/282—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere
- G01R31/2822—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere of microwave or radiofrequency circuits
- G01R31/2824—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere of microwave or radiofrequency circuits testing of oscillators or resonators
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
- G01R31/2836—Fault-finding or characterising
- G01R31/2837—Characterising or performance testing, e.g. of frequency response
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03L—AUTOMATIC CONTROL, STARTING, SYNCHRONISATION OR STABILISATION OF GENERATORS OF ELECTRONIC OSCILLATIONS OR PULSES
- H03L1/00—Stabilisation of generator output against variations of physical values, e.g. power supply
- H03L1/02—Stabilisation of generator output against variations of physical values, e.g. power supply against variations of temperature only
- H03L1/022—Stabilisation of generator output against variations of physical values, e.g. power supply against variations of temperature only by indirect stabilisation, i.e. by generating an electrical correction signal which is a function of the temperature
- H03L1/026—Stabilisation of generator output against variations of physical values, e.g. power supply against variations of temperature only by indirect stabilisation, i.e. by generating an electrical correction signal which is a function of the temperature by using a memory for digitally storing correction values
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03L—AUTOMATIC CONTROL, STARTING, SYNCHRONISATION OR STABILISATION OF GENERATORS OF ELECTRONIC OSCILLATIONS OR PULSES
- H03L7/00—Automatic control of frequency or phase; Synchronisation
- H03L7/02—Automatic control of frequency or phase; Synchronisation using a frequency discriminator comprising a passive frequency-determining element
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03J—TUNING RESONANT CIRCUITS; SELECTING RESONANT CIRCUITS
- H03J2200/00—Indexing scheme relating to tuning resonant circuits and selecting resonant circuits
- H03J2200/01—Circuitry controlling the selecting or switching action
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03J—TUNING RESONANT CIRCUITS; SELECTING RESONANT CIRCUITS
- H03J2200/00—Indexing scheme relating to tuning resonant circuits and selecting resonant circuits
- H03J2200/10—Tuning of a resonator by means of digitally controlled capacitor bank
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K2217/00—Indexing scheme related to electronic switching or gating, i.e. not by contact-making or -breaking covered by H03K17/00
- H03K2217/94—Indexing scheme related to electronic switching or gating, i.e. not by contact-making or -breaking covered by H03K17/00 characterised by the way in which the control signal is generated
- H03K2217/9401—Calibration techniques
- H03K2217/94031—Calibration involving digital processing
Landscapes
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Semiconductor Integrated Circuits (AREA)
- Tests Of Electronic Circuits (AREA)
- Oscillators With Electromechanical Resonators (AREA)
- Inductance-Capacitance Distribution Constants And Capacitance-Resistance Oscillators (AREA)
Applications Claiming Priority (5)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US201662379632P | 2016-08-25 | 2016-08-25 | |
| US62/379,632 | 2016-08-25 | ||
| US15/685,570 US10551428B2 (en) | 2016-08-25 | 2017-08-24 | Systems and methods for storing frequency information for system calibration/trimming |
| US15/685,570 | 2017-08-24 | ||
| PCT/US2017/048574 WO2018039538A1 (en) | 2016-08-25 | 2017-08-25 | Systems and methods for storing frequency information for system calibration and trimming |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN109314517A true CN109314517A (zh) | 2019-02-05 |
Family
ID=61242213
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201780026137.6A Pending CN109314517A (zh) | 2016-08-25 | 2017-08-25 | 用于存储系统校准和修整的频率信息的系统和方法 |
Country Status (7)
| Country | Link |
|---|---|
| US (1) | US10551428B2 (https=) |
| EP (1) | EP3504798B1 (https=) |
| JP (1) | JP6978437B2 (https=) |
| KR (1) | KR102458148B1 (https=) |
| CN (1) | CN109314517A (https=) |
| TW (1) | TW201813313A (https=) |
| WO (1) | WO2018039538A1 (https=) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US10866269B2 (en) * | 2017-11-16 | 2020-12-15 | Microchip Technology Incorporated | Fast frequency calculator |
| CN114421890A (zh) * | 2022-01-21 | 2022-04-29 | 南京扬贺扬微电子科技有限公司 | 一种优化校正的rc振荡模块及方法 |
Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20070155341A1 (en) * | 2005-12-29 | 2007-07-05 | Intel Corporation | Temperature compensated crystal oscillator |
| WO2012137590A1 (ja) * | 2011-04-01 | 2012-10-11 | ルネサスエレクトロニクス株式会社 | 半導体装置 |
| CN104067519A (zh) * | 2011-11-21 | 2014-09-24 | 密克罗奇普技术公司 | 使用充电时间测量单元进行的对嵌入式微控制器振荡器的精确板上调谐 |
Family Cites Families (12)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5796312A (en) * | 1996-05-24 | 1998-08-18 | Microchip Technology Incorporated | Microcontroller with firmware selectable oscillator trimming |
| US6813529B2 (en) * | 2001-01-19 | 2004-11-02 | Microchip Technology Incorporated | Method and apparatus for signal frequency decoding without an analog bandpass filter |
| US7889013B2 (en) * | 2007-08-28 | 2011-02-15 | Intel Corporation | Microelectronic die having CMOS ring oscillator thereon and method of using same |
| US7737794B2 (en) * | 2008-05-14 | 2010-06-15 | International Business Machines Corporation | Phase locked loop with temperature and process compensation |
| US20100244969A1 (en) * | 2009-03-30 | 2010-09-30 | Mediatek Inc. | Temperature compensated oscillation circuits |
| WO2012001846A1 (ja) * | 2010-06-28 | 2012-01-05 | パナソニック株式会社 | 基準周波数生成回路、半導体集積回路、電子機器 |
| US8451064B2 (en) * | 2010-10-07 | 2013-05-28 | Advanced Micro Devices, Inc. | Voltage-controlled oscillator module having adjustable oscillator gain and related operating methods |
| US9236852B2 (en) | 2012-02-01 | 2016-01-12 | Microchip Technology Incorporated | Input capture peripheral with gating logic |
| JP6116305B2 (ja) * | 2013-03-25 | 2017-04-19 | 三菱電機株式会社 | 周波数検出回路 |
| JP2015152416A (ja) * | 2014-02-14 | 2015-08-24 | 株式会社東芝 | キャパシタンス検出装置 |
| US9341658B2 (en) * | 2014-02-28 | 2016-05-17 | Texas Instruments Incorporated | Fast on-chip oscillator trimming |
| DE102015202694A1 (de) * | 2015-02-13 | 2016-08-18 | Infineon Technologies Ag | Stresskompensierte Oszillatorschaltungsanordnung und integrierte Schaltung, die diese verwendet |
-
2017
- 2017-08-24 US US15/685,570 patent/US10551428B2/en not_active Expired - Fee Related
- 2017-08-25 CN CN201780026137.6A patent/CN109314517A/zh active Pending
- 2017-08-25 EP EP17764717.9A patent/EP3504798B1/en active Active
- 2017-08-25 KR KR1020187031999A patent/KR102458148B1/ko active Active
- 2017-08-25 JP JP2018560005A patent/JP6978437B2/ja not_active Expired - Fee Related
- 2017-08-25 TW TW106128988A patent/TW201813313A/zh unknown
- 2017-08-25 WO PCT/US2017/048574 patent/WO2018039538A1/en not_active Ceased
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20070155341A1 (en) * | 2005-12-29 | 2007-07-05 | Intel Corporation | Temperature compensated crystal oscillator |
| WO2012137590A1 (ja) * | 2011-04-01 | 2012-10-11 | ルネサスエレクトロニクス株式会社 | 半導体装置 |
| CN104067519A (zh) * | 2011-11-21 | 2014-09-24 | 密克罗奇普技术公司 | 使用充电时间测量单元进行的对嵌入式微控制器振荡器的精确板上调谐 |
Also Published As
| Publication number | Publication date |
|---|---|
| EP3504798B1 (en) | 2023-04-05 |
| JP6978437B2 (ja) | 2021-12-08 |
| WO2018039538A1 (en) | 2018-03-01 |
| KR102458148B1 (ko) | 2022-10-25 |
| EP3504798A1 (en) | 2019-07-03 |
| JP2019533318A (ja) | 2019-11-14 |
| US10551428B2 (en) | 2020-02-04 |
| US20180059171A1 (en) | 2018-03-01 |
| TW201813313A (zh) | 2018-04-01 |
| KR20190040482A (ko) | 2019-04-18 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| AD01 | Patent right deemed abandoned |
Effective date of abandoning: 20240112 |
|
| AD01 | Patent right deemed abandoned |