KR102458148B1 - 시스템 교정 및 트리밍을 위한 주파수 정보를 저장하기 위한 시스템들 및 방법들 - Google Patents

시스템 교정 및 트리밍을 위한 주파수 정보를 저장하기 위한 시스템들 및 방법들 Download PDF

Info

Publication number
KR102458148B1
KR102458148B1 KR1020187031999A KR20187031999A KR102458148B1 KR 102458148 B1 KR102458148 B1 KR 102458148B1 KR 1020187031999 A KR1020187031999 A KR 1020187031999A KR 20187031999 A KR20187031999 A KR 20187031999A KR 102458148 B1 KR102458148 B1 KR 102458148B1
Authority
KR
South Korea
Prior art keywords
frequency
input
circuit
dut
test
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
KR1020187031999A
Other languages
English (en)
Korean (ko)
Other versions
KR20190040482A (ko
Inventor
아자이 쿠마르
현수 염
Original Assignee
마이크로칩 테크놀로지 인코포레이티드
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 마이크로칩 테크놀로지 인코포레이티드 filed Critical 마이크로칩 테크놀로지 인코포레이티드
Publication of KR20190040482A publication Critical patent/KR20190040482A/ko
Application granted granted Critical
Publication of KR102458148B1 publication Critical patent/KR102458148B1/ko
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/282—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere
    • G01R31/2822—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere of microwave or radiofrequency circuits
    • G01R31/2824—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere of microwave or radiofrequency circuits testing of oscillators or resonators
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
    • G01R31/2836—Fault-finding or characterising
    • G01R31/2837—Characterising or performance testing, e.g. of frequency response
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03L—AUTOMATIC CONTROL, STARTING, SYNCHRONISATION OR STABILISATION OF GENERATORS OF ELECTRONIC OSCILLATIONS OR PULSES
    • H03L1/00—Stabilisation of generator output against variations of physical values, e.g. power supply
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03L—AUTOMATIC CONTROL, STARTING, SYNCHRONISATION OR STABILISATION OF GENERATORS OF ELECTRONIC OSCILLATIONS OR PULSES
    • H03L1/00—Stabilisation of generator output against variations of physical values, e.g. power supply
    • H03L1/02—Stabilisation of generator output against variations of physical values, e.g. power supply against variations of temperature only
    • H03L1/021—Stabilisation of generator output against variations of physical values, e.g. power supply against variations of temperature only of generators comprising distributed capacitance and inductance
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03L—AUTOMATIC CONTROL, STARTING, SYNCHRONISATION OR STABILISATION OF GENERATORS OF ELECTRONIC OSCILLATIONS OR PULSES
    • H03L1/00—Stabilisation of generator output against variations of physical values, e.g. power supply
    • H03L1/02—Stabilisation of generator output against variations of physical values, e.g. power supply against variations of temperature only
    • H03L1/022—Stabilisation of generator output against variations of physical values, e.g. power supply against variations of temperature only by indirect stabilisation, i.e. by generating an electrical correction signal which is a function of the temperature
    • H03L1/026—Stabilisation of generator output against variations of physical values, e.g. power supply against variations of temperature only by indirect stabilisation, i.e. by generating an electrical correction signal which is a function of the temperature by using a memory for digitally storing correction values
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03L—AUTOMATIC CONTROL, STARTING, SYNCHRONISATION OR STABILISATION OF GENERATORS OF ELECTRONIC OSCILLATIONS OR PULSES
    • H03L7/00—Automatic control of frequency or phase; Synchronisation
    • H03L7/02—Automatic control of frequency or phase; Synchronisation using a frequency discriminator comprising a passive frequency-determining element
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03J—TUNING RESONANT CIRCUITS; SELECTING RESONANT CIRCUITS
    • H03J2200/00—Indexing scheme relating to tuning resonant circuits and selecting resonant circuits
    • H03J2200/01—Circuitry controlling the selecting or switching action
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03J—TUNING RESONANT CIRCUITS; SELECTING RESONANT CIRCUITS
    • H03J2200/00—Indexing scheme relating to tuning resonant circuits and selecting resonant circuits
    • H03J2200/10—Tuning of a resonator by means of digitally controlled capacitor bank
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K2217/00—Indexing scheme related to electronic switching or gating, i.e. not by contact-making or -breaking covered by H03K17/00
    • H03K2217/94—Indexing scheme related to electronic switching or gating, i.e. not by contact-making or -breaking covered by H03K17/00 characterised by the way in which the control signal is generated
    • H03K2217/9401—Calibration techniques
    • H03K2217/94031—Calibration involving digital processing

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Oscillators With Electromechanical Resonators (AREA)
  • Inductance-Capacitance Distribution Constants And Capacitance-Resistance Oscillators (AREA)
KR1020187031999A 2016-08-25 2017-08-25 시스템 교정 및 트리밍을 위한 주파수 정보를 저장하기 위한 시스템들 및 방법들 Active KR102458148B1 (ko)

Applications Claiming Priority (5)

Application Number Priority Date Filing Date Title
US201662379632P 2016-08-25 2016-08-25
US62/379,632 2016-08-25
US15/685,570 US10551428B2 (en) 2016-08-25 2017-08-24 Systems and methods for storing frequency information for system calibration/trimming
US15/685,570 2017-08-24
PCT/US2017/048574 WO2018039538A1 (en) 2016-08-25 2017-08-25 Systems and methods for storing frequency information for system calibration and trimming

Publications (2)

Publication Number Publication Date
KR20190040482A KR20190040482A (ko) 2019-04-18
KR102458148B1 true KR102458148B1 (ko) 2022-10-25

Family

ID=61242213

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020187031999A Active KR102458148B1 (ko) 2016-08-25 2017-08-25 시스템 교정 및 트리밍을 위한 주파수 정보를 저장하기 위한 시스템들 및 방법들

Country Status (7)

Country Link
US (1) US10551428B2 (https=)
EP (1) EP3504798B1 (https=)
JP (1) JP6978437B2 (https=)
KR (1) KR102458148B1 (https=)
CN (1) CN109314517A (https=)
TW (1) TW201813313A (https=)
WO (1) WO2018039538A1 (https=)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US10866269B2 (en) * 2017-11-16 2020-12-15 Microchip Technology Incorporated Fast frequency calculator
CN114421890A (zh) * 2022-01-21 2022-04-29 南京扬贺扬微电子科技有限公司 一种优化校正的rc振荡模块及方法

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20090285344A1 (en) * 2008-05-14 2009-11-19 International Business Machines Corporation Phase Locked Loop with Temperature and Process Compensation

Family Cites Families (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5796312A (en) * 1996-05-24 1998-08-18 Microchip Technology Incorporated Microcontroller with firmware selectable oscillator trimming
US6813529B2 (en) * 2001-01-19 2004-11-02 Microchip Technology Incorporated Method and apparatus for signal frequency decoding without an analog bandpass filter
US7541878B2 (en) * 2005-12-29 2009-06-02 Intel Corporation Temperature compensated crystal oscillator
US7889013B2 (en) * 2007-08-28 2011-02-15 Intel Corporation Microelectronic die having CMOS ring oscillator thereon and method of using same
US20100244969A1 (en) * 2009-03-30 2010-09-30 Mediatek Inc. Temperature compensated oscillation circuits
WO2012001846A1 (ja) * 2010-06-28 2012-01-05 パナソニック株式会社 基準周波数生成回路、半導体集積回路、電子機器
US8451064B2 (en) * 2010-10-07 2013-05-28 Advanced Micro Devices, Inc. Voltage-controlled oscillator module having adjustable oscillator gain and related operating methods
WO2012137590A1 (ja) 2011-04-01 2012-10-11 ルネサスエレクトロニクス株式会社 半導体装置
US8390384B1 (en) 2011-11-21 2013-03-05 Microchip Technology Incorporated Precision on-board tuning of embedded microcontroller oscillator using charge time measurement unit
US9236852B2 (en) 2012-02-01 2016-01-12 Microchip Technology Incorporated Input capture peripheral with gating logic
JP6116305B2 (ja) * 2013-03-25 2017-04-19 三菱電機株式会社 周波数検出回路
JP2015152416A (ja) * 2014-02-14 2015-08-24 株式会社東芝 キャパシタンス検出装置
US9341658B2 (en) * 2014-02-28 2016-05-17 Texas Instruments Incorporated Fast on-chip oscillator trimming
DE102015202694A1 (de) * 2015-02-13 2016-08-18 Infineon Technologies Ag Stresskompensierte Oszillatorschaltungsanordnung und integrierte Schaltung, die diese verwendet

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20090285344A1 (en) * 2008-05-14 2009-11-19 International Business Machines Corporation Phase Locked Loop with Temperature and Process Compensation

Also Published As

Publication number Publication date
EP3504798B1 (en) 2023-04-05
JP6978437B2 (ja) 2021-12-08
WO2018039538A1 (en) 2018-03-01
EP3504798A1 (en) 2019-07-03
CN109314517A (zh) 2019-02-05
JP2019533318A (ja) 2019-11-14
US10551428B2 (en) 2020-02-04
US20180059171A1 (en) 2018-03-01
TW201813313A (zh) 2018-04-01
KR20190040482A (ko) 2019-04-18

Similar Documents

Publication Publication Date Title
US7466209B2 (en) System and method for providing temperature correction in a crystal oscillator
US10250266B2 (en) Oscillator calibration system
US20090146746A1 (en) Self-calibrating temperature-compensated oscillator
US8729976B2 (en) Methods and apparatus for calibration and temperature compensation of oscillators having mechanical resonators
JP2004201280A (ja) 水晶発振器エミュレータ
US20120200269A1 (en) Calibration apparatus and calibration method thereof
KR102458148B1 (ko) 시스템 교정 및 트리밍을 위한 주파수 정보를 저장하기 위한 시스템들 및 방법들
US20050110513A1 (en) Semiconductor test module and method of testing semiconductor device
US10069498B2 (en) Simultaneous multi-effect oscillator compensation using piecewise interdependent polynomials
CN110880933B (zh) 具有一半步级解析度的片载校正电路及方法
JP2002076774A (ja) 温度補償発振器の調整方法
JP2011103564A (ja) 温度補償圧電発振器及びその周波数調整方法
JP2018164188A (ja) 温度補償装置、温度補償型発振器、および温度補償方法
KR100836530B1 (ko) 보정가능한 온칩 발진 회로
JP2019533318A5 (https=)
JP2018017544A (ja) 温度検出回路および温度検出方法
JP7429114B2 (ja) デジタル制御発振器を備える半導体デバイスおよびその試験方法
EP4653881A1 (en) Rail-to-rail voltage detector including multiple voltage converters
US9270283B2 (en) Frequency generation device
US20240146308A1 (en) Calibration device and method for calibrating frequency drift and electronic device using the same
Banerjee et al. A Machine Learning Based Built-In Self-Test Method for Lifetime Frequency Drift Compensation of Precision Oscillators
JP2011103636A (ja) 温度補償圧電発振器の周波数調整方法
JP2011160081A (ja) 温度特性調整データ生成方法

Legal Events

Date Code Title Description
PA0105 International application

Patent event date: 20181102

Patent event code: PA01051R01D

Comment text: International Patent Application

PG1501 Laying open of application
A201 Request for examination
PA0201 Request for examination

Patent event code: PA02012R01D

Patent event date: 20200812

Comment text: Request for Examination of Application

E902 Notification of reason for refusal
PE0902 Notice of grounds for rejection

Comment text: Notification of reason for refusal

Patent event date: 20220331

Patent event code: PE09021S01D

E701 Decision to grant or registration of patent right
PE0701 Decision of registration

Patent event code: PE07011S01D

Comment text: Decision to Grant Registration

Patent event date: 20220930

GRNT Written decision to grant
PR0701 Registration of establishment

Comment text: Registration of Establishment

Patent event date: 20221019

Patent event code: PR07011E01D

PR1002 Payment of registration fee

Payment date: 20221020

End annual number: 3

Start annual number: 1

PG1601 Publication of registration