TW201813313A - 儲存用於系統校正及修整的頻率資訊之系統及方法 - Google Patents
儲存用於系統校正及修整的頻率資訊之系統及方法 Download PDFInfo
- Publication number
- TW201813313A TW201813313A TW106128988A TW106128988A TW201813313A TW 201813313 A TW201813313 A TW 201813313A TW 106128988 A TW106128988 A TW 106128988A TW 106128988 A TW106128988 A TW 106128988A TW 201813313 A TW201813313 A TW 201813313A
- Authority
- TW
- Taiwan
- Prior art keywords
- frequency
- input
- dut
- circuit
- test circuit
- Prior art date
Links
- 238000000034 method Methods 0.000 title claims description 23
- 238000009966 trimming Methods 0.000 title description 18
- 238000012360 testing method Methods 0.000 claims abstract description 79
- 238000004806 packaging method and process Methods 0.000 claims description 19
- 238000005259 measurement Methods 0.000 claims description 14
- 239000003990 capacitor Substances 0.000 claims description 11
- 238000004364 calculation method Methods 0.000 abstract description 3
- 238000004519 manufacturing process Methods 0.000 description 35
- 238000012937 correction Methods 0.000 description 9
- 230000008859 change Effects 0.000 description 8
- 239000013078 crystal Substances 0.000 description 7
- 238000010586 diagram Methods 0.000 description 7
- 230000004044 response Effects 0.000 description 7
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 3
- 229910052710 silicon Inorganic materials 0.000 description 3
- 239000010703 silicon Substances 0.000 description 3
- 238000006243 chemical reaction Methods 0.000 description 2
- 238000012804 iterative process Methods 0.000 description 2
- 239000000463 material Substances 0.000 description 2
- 230000007246 mechanism Effects 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- 230000000737 periodic effect Effects 0.000 description 2
- 239000004065 semiconductor Substances 0.000 description 2
- 230000004075 alteration Effects 0.000 description 1
- 239000000919 ceramic Substances 0.000 description 1
- 230000000295 complement effect Effects 0.000 description 1
- 230000008602 contraction Effects 0.000 description 1
- 125000004122 cyclic group Chemical group 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 230000005484 gravity Effects 0.000 description 1
- 239000012535 impurity Substances 0.000 description 1
- 238000009434 installation Methods 0.000 description 1
- 229910044991 metal oxide Inorganic materials 0.000 description 1
- 150000004706 metal oxides Chemical class 0.000 description 1
- 230000010355 oscillation Effects 0.000 description 1
- 238000005192 partition Methods 0.000 description 1
- 239000010453 quartz Substances 0.000 description 1
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 1
- 238000006467 substitution reaction Methods 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03L—AUTOMATIC CONTROL, STARTING, SYNCHRONISATION OR STABILISATION OF GENERATORS OF ELECTRONIC OSCILLATIONS OR PULSES
- H03L1/00—Stabilisation of generator output against variations of physical values, e.g. power supply
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/282—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere
- G01R31/2822—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere of microwave or radiofrequency circuits
- G01R31/2824—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere of microwave or radiofrequency circuits testing of oscillators or resonators
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
- G01R31/2836—Fault-finding or characterising
- G01R31/2837—Characterising or performance testing, e.g. of frequency response
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03L—AUTOMATIC CONTROL, STARTING, SYNCHRONISATION OR STABILISATION OF GENERATORS OF ELECTRONIC OSCILLATIONS OR PULSES
- H03L1/00—Stabilisation of generator output against variations of physical values, e.g. power supply
- H03L1/02—Stabilisation of generator output against variations of physical values, e.g. power supply against variations of temperature only
- H03L1/021—Stabilisation of generator output against variations of physical values, e.g. power supply against variations of temperature only of generators comprising distributed capacitance and inductance
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03L—AUTOMATIC CONTROL, STARTING, SYNCHRONISATION OR STABILISATION OF GENERATORS OF ELECTRONIC OSCILLATIONS OR PULSES
- H03L1/00—Stabilisation of generator output against variations of physical values, e.g. power supply
- H03L1/02—Stabilisation of generator output against variations of physical values, e.g. power supply against variations of temperature only
- H03L1/022—Stabilisation of generator output against variations of physical values, e.g. power supply against variations of temperature only by indirect stabilisation, i.e. by generating an electrical correction signal which is a function of the temperature
- H03L1/026—Stabilisation of generator output against variations of physical values, e.g. power supply against variations of temperature only by indirect stabilisation, i.e. by generating an electrical correction signal which is a function of the temperature by using a memory for digitally storing correction values
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03L—AUTOMATIC CONTROL, STARTING, SYNCHRONISATION OR STABILISATION OF GENERATORS OF ELECTRONIC OSCILLATIONS OR PULSES
- H03L7/00—Automatic control of frequency or phase; Synchronisation
- H03L7/02—Automatic control of frequency or phase; Synchronisation using a frequency discriminator comprising a passive frequency-determining element
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03J—TUNING RESONANT CIRCUITS; SELECTING RESONANT CIRCUITS
- H03J2200/00—Indexing scheme relating to tuning resonant circuits and selecting resonant circuits
- H03J2200/01—Circuitry controlling the selecting or switching action
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03J—TUNING RESONANT CIRCUITS; SELECTING RESONANT CIRCUITS
- H03J2200/00—Indexing scheme relating to tuning resonant circuits and selecting resonant circuits
- H03J2200/10—Tuning of a resonator by means of digitally controlled capacitor bank
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K2217/00—Indexing scheme related to electronic switching or gating, i.e. not by contact-making or -breaking covered by H03K17/00
- H03K2217/94—Indexing scheme related to electronic switching or gating, i.e. not by contact-making or -breaking covered by H03K17/00 characterised by the way in which the control signal is generated
- H03K2217/9401—Calibration techniques
- H03K2217/94031—Calibration involving digital processing
Landscapes
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Semiconductor Integrated Circuits (AREA)
- Tests Of Electronic Circuits (AREA)
- Oscillators With Electromechanical Resonators (AREA)
- Inductance-Capacitance Distribution Constants And Capacitance-Resistance Oscillators (AREA)
Applications Claiming Priority (4)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US201662379632P | 2016-08-25 | 2016-08-25 | |
| US62/379,632 | 2016-08-25 | ||
| US15/685,570 US10551428B2 (en) | 2016-08-25 | 2017-08-24 | Systems and methods for storing frequency information for system calibration/trimming |
| US15/685,570 | 2017-08-24 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| TW201813313A true TW201813313A (zh) | 2018-04-01 |
Family
ID=61242213
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW106128988A TW201813313A (zh) | 2016-08-25 | 2017-08-25 | 儲存用於系統校正及修整的頻率資訊之系統及方法 |
Country Status (7)
| Country | Link |
|---|---|
| US (1) | US10551428B2 (https=) |
| EP (1) | EP3504798B1 (https=) |
| JP (1) | JP6978437B2 (https=) |
| KR (1) | KR102458148B1 (https=) |
| CN (1) | CN109314517A (https=) |
| TW (1) | TW201813313A (https=) |
| WO (1) | WO2018039538A1 (https=) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US10866269B2 (en) * | 2017-11-16 | 2020-12-15 | Microchip Technology Incorporated | Fast frequency calculator |
| CN114421890A (zh) * | 2022-01-21 | 2022-04-29 | 南京扬贺扬微电子科技有限公司 | 一种优化校正的rc振荡模块及方法 |
Family Cites Families (15)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5796312A (en) * | 1996-05-24 | 1998-08-18 | Microchip Technology Incorporated | Microcontroller with firmware selectable oscillator trimming |
| US6813529B2 (en) * | 2001-01-19 | 2004-11-02 | Microchip Technology Incorporated | Method and apparatus for signal frequency decoding without an analog bandpass filter |
| US7541878B2 (en) * | 2005-12-29 | 2009-06-02 | Intel Corporation | Temperature compensated crystal oscillator |
| US7889013B2 (en) * | 2007-08-28 | 2011-02-15 | Intel Corporation | Microelectronic die having CMOS ring oscillator thereon and method of using same |
| US7737794B2 (en) * | 2008-05-14 | 2010-06-15 | International Business Machines Corporation | Phase locked loop with temperature and process compensation |
| US20100244969A1 (en) * | 2009-03-30 | 2010-09-30 | Mediatek Inc. | Temperature compensated oscillation circuits |
| WO2012001846A1 (ja) * | 2010-06-28 | 2012-01-05 | パナソニック株式会社 | 基準周波数生成回路、半導体集積回路、電子機器 |
| US8451064B2 (en) * | 2010-10-07 | 2013-05-28 | Advanced Micro Devices, Inc. | Voltage-controlled oscillator module having adjustable oscillator gain and related operating methods |
| WO2012137590A1 (ja) | 2011-04-01 | 2012-10-11 | ルネサスエレクトロニクス株式会社 | 半導体装置 |
| US8390384B1 (en) | 2011-11-21 | 2013-03-05 | Microchip Technology Incorporated | Precision on-board tuning of embedded microcontroller oscillator using charge time measurement unit |
| US9236852B2 (en) | 2012-02-01 | 2016-01-12 | Microchip Technology Incorporated | Input capture peripheral with gating logic |
| JP6116305B2 (ja) * | 2013-03-25 | 2017-04-19 | 三菱電機株式会社 | 周波数検出回路 |
| JP2015152416A (ja) * | 2014-02-14 | 2015-08-24 | 株式会社東芝 | キャパシタンス検出装置 |
| US9341658B2 (en) * | 2014-02-28 | 2016-05-17 | Texas Instruments Incorporated | Fast on-chip oscillator trimming |
| DE102015202694A1 (de) * | 2015-02-13 | 2016-08-18 | Infineon Technologies Ag | Stresskompensierte Oszillatorschaltungsanordnung und integrierte Schaltung, die diese verwendet |
-
2017
- 2017-08-24 US US15/685,570 patent/US10551428B2/en not_active Expired - Fee Related
- 2017-08-25 CN CN201780026137.6A patent/CN109314517A/zh active Pending
- 2017-08-25 EP EP17764717.9A patent/EP3504798B1/en active Active
- 2017-08-25 KR KR1020187031999A patent/KR102458148B1/ko active Active
- 2017-08-25 JP JP2018560005A patent/JP6978437B2/ja not_active Expired - Fee Related
- 2017-08-25 TW TW106128988A patent/TW201813313A/zh unknown
- 2017-08-25 WO PCT/US2017/048574 patent/WO2018039538A1/en not_active Ceased
Also Published As
| Publication number | Publication date |
|---|---|
| EP3504798B1 (en) | 2023-04-05 |
| JP6978437B2 (ja) | 2021-12-08 |
| WO2018039538A1 (en) | 2018-03-01 |
| KR102458148B1 (ko) | 2022-10-25 |
| EP3504798A1 (en) | 2019-07-03 |
| CN109314517A (zh) | 2019-02-05 |
| JP2019533318A (ja) | 2019-11-14 |
| US10551428B2 (en) | 2020-02-04 |
| US20180059171A1 (en) | 2018-03-01 |
| KR20190040482A (ko) | 2019-04-18 |
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