JP6931730B1 - 光学測定装置及び光学測定方法 - Google Patents

光学測定装置及び光学測定方法 Download PDF

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JP6931730B1
JP6931730B1 JP2020066069A JP2020066069A JP6931730B1 JP 6931730 B1 JP6931730 B1 JP 6931730B1 JP 2020066069 A JP2020066069 A JP 2020066069A JP 2020066069 A JP2020066069 A JP 2020066069A JP 6931730 B1 JP6931730 B1 JP 6931730B1
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light
signal
irradiation
detection
calibration
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Japanese (ja)
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JP2021162509A (ja
Inventor
房宣 近藤
房宣 近藤
直樹 岩田
直樹 岩田
朋和 松村
朋和 松村
照雄 竹下
照雄 竹下
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Hamamatsu Photonics KK
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Hamamatsu Photonics KK
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Priority to JP2020066069A priority Critical patent/JP6931730B1/ja
Application filed by Hamamatsu Photonics KK filed Critical Hamamatsu Photonics KK
Priority to PCT/JP2021/002104 priority patent/WO2021199605A1/ja
Priority to EP21779692.9A priority patent/EP4123291A4/en
Priority to CN202180026082.5A priority patent/CN115398210B/zh
Priority to KR1020227031968A priority patent/KR20220159971A/ko
Priority to US17/914,434 priority patent/US20230124819A1/en
Priority to TW110109328A priority patent/TWI895383B/zh
Priority to JP2021132233A priority patent/JP7348933B2/ja
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Publication of JP6931730B1 publication Critical patent/JP6931730B1/ja
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64—Fluorescence; Phosphorescence
    • G01N21/645—Specially adapted constructive features of fluorimeters
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/27—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands using photo-electric detection ; circuits for computing concentration
    • G01N21/274—Calibration, base line adjustment, drift correction
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G01N21/4738—Diffuse reflection, e.g. also for testing fluids, fibrous materials
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64—Fluorescence; Phosphorescence
    • G01N21/6408—Fluorescence; Phosphorescence with measurement of decay time, time resolved fluorescence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/8483—Investigating reagent band
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G01N2021/473—Compensating for unwanted scatter, e.g. reliefs, marks
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64—Fluorescence; Phosphorescence
    • G01N21/645—Specially adapted constructive features of fluorimeters
    • G01N2021/6463—Optics
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/75—Systems in which material is subjected to a chemical reaction, the progress or the result of the reaction being investigated
    • G01N21/77—Systems in which material is subjected to a chemical reaction, the progress or the result of the reaction being investigated by observing the effect on a chemical indicator
    • G01N2021/7756—Sensor type
    • G01N2021/7759—Dipstick; Test strip
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/75—Systems in which material is subjected to a chemical reaction, the progress or the result of the reaction being investigated
    • G01N21/77—Systems in which material is subjected to a chemical reaction, the progress or the result of the reaction being investigated by observing the effect on a chemical indicator
    • G01N2021/7769—Measurement method of reaction-produced change in sensor
    • G01N2021/7786—Fluorescence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/12—Circuits of general importance; Signal processing
    • G01N2201/127—Calibration; base line adjustment; drift compensation

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  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Immunology (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Pathology (AREA)
  • Analytical Chemistry (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Mathematical Physics (AREA)
  • Molecular Biology (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
JP2020066069A 2020-04-01 2020-04-01 光学測定装置及び光学測定方法 Active JP6931730B1 (ja)

Priority Applications (8)

Application Number Priority Date Filing Date Title
JP2020066069A JP6931730B1 (ja) 2020-04-01 2020-04-01 光学測定装置及び光学測定方法
EP21779692.9A EP4123291A4 (en) 2020-04-01 2021-01-21 OPTICAL MEASURING DEVICE AND OPTICAL MEASURING METHOD
CN202180026082.5A CN115398210B (zh) 2020-04-01 2021-01-21 光学测定装置及光学测定方法
KR1020227031968A KR20220159971A (ko) 2020-04-01 2021-01-21 광학 측정 장치 및 광학 측정 방법
PCT/JP2021/002104 WO2021199605A1 (ja) 2020-04-01 2021-01-21 光学測定装置及び光学測定方法
US17/914,434 US20230124819A1 (en) 2020-04-01 2021-01-21 Optical measurement device and optical measurement method
TW110109328A TWI895383B (zh) 2020-04-01 2021-03-16 光學測定裝置及光學測定方法
JP2021132233A JP7348933B2 (ja) 2020-04-01 2021-08-16 光学測定装置及び光学測定方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2020066069A JP6931730B1 (ja) 2020-04-01 2020-04-01 光学測定装置及び光学測定方法

Related Child Applications (1)

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JP2021132233A Division JP7348933B2 (ja) 2020-04-01 2021-08-16 光学測定装置及び光学測定方法

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JP6931730B1 true JP6931730B1 (ja) 2021-09-08
JP2021162509A JP2021162509A (ja) 2021-10-11

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JP2021132233A Active JP7348933B2 (ja) 2020-04-01 2021-08-16 光学測定装置及び光学測定方法

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US (1) US20230124819A1 (enExample)
EP (1) EP4123291A4 (enExample)
JP (2) JP6931730B1 (enExample)
KR (1) KR20220159971A (enExample)
CN (1) CN115398210B (enExample)
TW (1) TWI895383B (enExample)
WO (1) WO2021199605A1 (enExample)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6923702B1 (ja) * 2020-04-01 2021-08-25 浜松ホトニクス株式会社 光学測定装置及び光学測定方法
TW202245178A (zh) 2021-01-21 2022-11-16 日商邦德科技股份有限公司 接合方法、接合裝置及接合系統
WO2024085899A1 (en) * 2022-10-19 2024-04-25 Wang ying ting Methods and apparatuses for fluorospectrometric measurements of low photon budget samples
TWI849658B (zh) * 2022-12-29 2024-07-21 致茂電子股份有限公司 複合式校正片

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JPH04106470A (ja) * 1990-08-28 1992-04-08 Hitachi Ltd 粒子免疫測定方法及びその装置
US5270548A (en) * 1992-07-31 1993-12-14 The United States Of America As Represented By The United States Department Of Energy Phase-sensitive flow cytometer
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JP2010518394A (ja) 2007-02-06 2010-05-27 ナンヤン・テクノロジカル・ユニバーシティー 基板上に置かれた蛍光サンプルを分析するための装置および方法
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Also Published As

Publication number Publication date
EP4123291A4 (en) 2024-04-24
WO2021199605A1 (ja) 2021-10-07
JP2021162509A (ja) 2021-10-11
KR20220159971A (ko) 2022-12-05
US20230124819A1 (en) 2023-04-20
TW202141022A (zh) 2021-11-01
JP7348933B2 (ja) 2023-09-21
TWI895383B (zh) 2025-09-01
CN115398210B (zh) 2025-11-07
EP4123291A1 (en) 2023-01-25
JP2021179447A (ja) 2021-11-18
CN115398210A (zh) 2022-11-25

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