JP6931730B1 - 光学測定装置及び光学測定方法 - Google Patents

光学測定装置及び光学測定方法 Download PDF

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JP6931730B1
JP6931730B1 JP2020066069A JP2020066069A JP6931730B1 JP 6931730 B1 JP6931730 B1 JP 6931730B1 JP 2020066069 A JP2020066069 A JP 2020066069A JP 2020066069 A JP2020066069 A JP 2020066069A JP 6931730 B1 JP6931730 B1 JP 6931730B1
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light
signal
irradiation
detection
calibration
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Japanese (ja)
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JP2021162509A (ja
Inventor
房宣 近藤
房宣 近藤
直樹 岩田
直樹 岩田
朋和 松村
朋和 松村
照雄 竹下
照雄 竹下
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Hamamatsu Photonics KK
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Hamamatsu Photonics KK
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Priority to JP2020066069A priority Critical patent/JP6931730B1/ja
Application filed by Hamamatsu Photonics KK filed Critical Hamamatsu Photonics KK
Priority to US17/914,434 priority patent/US20230124819A1/en
Priority to EP21779692.9A priority patent/EP4123291B1/en
Priority to PCT/JP2021/002104 priority patent/WO2021199605A1/ja
Priority to CN202180026082.5A priority patent/CN115398210B/zh
Priority to KR1020227031968A priority patent/KR102999756B1/ko
Priority to TW110109328A priority patent/TWI895383B/zh
Priority to JP2021132233A priority patent/JP7348933B2/ja
Application granted granted Critical
Publication of JP6931730B1 publication Critical patent/JP6931730B1/ja
Publication of JP2021162509A publication Critical patent/JP2021162509A/ja
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64—Fluorescence; Phosphorescence
    • G01N21/645—Specially adapted constructive features of fluorimeters
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/27—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands using photo-electric detection ; circuits for computing concentration
    • G01N21/274—Calibration, base line adjustment, drift correction
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G01N21/4738—Diffuse reflection, e.g. also for testing fluids, fibrous materials
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64—Fluorescence; Phosphorescence
    • G01N21/6408—Fluorescence; Phosphorescence with measurement of decay time, time resolved fluorescence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/8483—Investigating reagent band
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G01N2021/473—Compensating for unwanted scatter, e.g. reliefs, marks
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64—Fluorescence; Phosphorescence
    • G01N21/645—Specially adapted constructive features of fluorimeters
    • G01N2021/6463—Optics
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/75—Systems in which material is subjected to a chemical reaction, the progress or the result of the reaction being investigated
    • G01N21/77—Systems in which material is subjected to a chemical reaction, the progress or the result of the reaction being investigated by observing the effect on a chemical indicator
    • G01N2021/7756—Sensor type
    • G01N2021/7759—Dipstick; Test strip
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/75—Systems in which material is subjected to a chemical reaction, the progress or the result of the reaction being investigated
    • G01N21/77—Systems in which material is subjected to a chemical reaction, the progress or the result of the reaction being investigated by observing the effect on a chemical indicator
    • G01N2021/7769—Measurement method of reaction-produced change in sensor
    • G01N2021/7786—Fluorescence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/12—Circuits of general importance; Signal processing
    • G01N2201/127—Calibration; base line adjustment; drift compensation

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  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Pathology (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Immunology (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Engineering & Computer Science (AREA)
  • Mathematical Physics (AREA)
  • Theoretical Computer Science (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Molecular Biology (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
JP2020066069A 2020-04-01 2020-04-01 光学測定装置及び光学測定方法 Active JP6931730B1 (ja)

Priority Applications (8)

Application Number Priority Date Filing Date Title
JP2020066069A JP6931730B1 (ja) 2020-04-01 2020-04-01 光学測定装置及び光学測定方法
EP21779692.9A EP4123291B1 (en) 2020-04-01 2021-01-21 Optical measurement device and optical measurement method
PCT/JP2021/002104 WO2021199605A1 (ja) 2020-04-01 2021-01-21 光学測定装置及び光学測定方法
CN202180026082.5A CN115398210B (zh) 2020-04-01 2021-01-21 光学测定装置及光学测定方法
US17/914,434 US20230124819A1 (en) 2020-04-01 2021-01-21 Optical measurement device and optical measurement method
KR1020227031968A KR102999756B1 (ko) 2020-04-01 2021-01-21 광학 측정 장치 및 광학 측정 방법
TW110109328A TWI895383B (zh) 2020-04-01 2021-03-16 光學測定裝置及光學測定方法
JP2021132233A JP7348933B2 (ja) 2020-04-01 2021-08-16 光学測定装置及び光学測定方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2020066069A JP6931730B1 (ja) 2020-04-01 2020-04-01 光学測定装置及び光学測定方法

Related Child Applications (1)

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JP2021132233A Division JP7348933B2 (ja) 2020-04-01 2021-08-16 光学測定装置及び光学測定方法

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JP6931730B1 true JP6931730B1 (ja) 2021-09-08
JP2021162509A JP2021162509A (ja) 2021-10-11

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US (1) US20230124819A1 (enExample)
EP (1) EP4123291B1 (enExample)
JP (2) JP6931730B1 (enExample)
CN (1) CN115398210B (enExample)
TW (1) TWI895383B (enExample)
WO (1) WO2021199605A1 (enExample)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6923702B1 (ja) * 2020-04-01 2021-08-25 浜松ホトニクス株式会社 光学測定装置及び光学測定方法
WO2022158563A1 (ja) 2021-01-21 2022-07-28 ボンドテック株式会社 接合方法、接合装置および接合システム
DE102022002352A1 (de) * 2022-06-29 2024-01-04 Giesecke+Devrient Currency Technology Gmbh Vorrichtung und Verfahren zur Prüfung von flächigen Proben
US20260146952A1 (en) * 2022-10-19 2026-05-28 Ying-Ting Wang Methods and apparatuses for fluorospectrometric measurements of low photon budget samples
TWI849658B (zh) * 2022-12-29 2024-07-21 致茂電子股份有限公司 複合式校正片

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Also Published As

Publication number Publication date
CN115398210B (zh) 2025-11-07
EP4123291A1 (en) 2023-01-25
JP2021162509A (ja) 2021-10-11
US20230124819A1 (en) 2023-04-20
WO2021199605A1 (ja) 2021-10-07
EP4123291A4 (en) 2024-04-24
KR20220159971A (ko) 2022-12-05
JP7348933B2 (ja) 2023-09-21
TW202141022A (zh) 2021-11-01
JP2021179447A (ja) 2021-11-18
CN115398210A (zh) 2022-11-25
TWI895383B (zh) 2025-09-01
EP4123291B1 (en) 2026-02-25

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