TWI895383B - 光學測定裝置及光學測定方法 - Google Patents
光學測定裝置及光學測定方法Info
- Publication number
- TWI895383B TWI895383B TW110109328A TW110109328A TWI895383B TW I895383 B TWI895383 B TW I895383B TW 110109328 A TW110109328 A TW 110109328A TW 110109328 A TW110109328 A TW 110109328A TW I895383 B TWI895383 B TW I895383B
- Authority
- TW
- Taiwan
- Prior art keywords
- light
- signal
- calibration
- detection
- measurement
- Prior art date
Links
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
- G01N21/64—Fluorescence; Phosphorescence
- G01N21/645—Specially adapted constructive features of fluorimeters
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/27—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands using photo-electric detection ; circuits for computing concentration
- G01N21/274—Calibration, base line adjustment, drift correction
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/47—Scattering, i.e. diffuse reflection
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/47—Scattering, i.e. diffuse reflection
- G01N21/4738—Diffuse reflection, e.g. also for testing fluids, fibrous materials
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
- G01N21/64—Fluorescence; Phosphorescence
- G01N21/6408—Fluorescence; Phosphorescence with measurement of decay time, time resolved fluorescence
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/8483—Investigating reagent band
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/47—Scattering, i.e. diffuse reflection
- G01N2021/473—Compensating for unwanted scatter, e.g. reliefs, marks
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
- G01N21/64—Fluorescence; Phosphorescence
- G01N21/645—Specially adapted constructive features of fluorimeters
- G01N2021/6463—Optics
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/75—Systems in which material is subjected to a chemical reaction, the progress or the result of the reaction being investigated
- G01N21/77—Systems in which material is subjected to a chemical reaction, the progress or the result of the reaction being investigated by observing the effect on a chemical indicator
- G01N2021/7756—Sensor type
- G01N2021/7759—Dipstick; Test strip
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/75—Systems in which material is subjected to a chemical reaction, the progress or the result of the reaction being investigated
- G01N21/77—Systems in which material is subjected to a chemical reaction, the progress or the result of the reaction being investigated by observing the effect on a chemical indicator
- G01N2021/7769—Measurement method of reaction-produced change in sensor
- G01N2021/7786—Fluorescence
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2201/00—Features of devices classified in G01N21/00
- G01N2201/12—Circuits of general importance; Signal processing
- G01N2201/127—Calibration; base line adjustment; drift compensation
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Immunology (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Chemical & Material Sciences (AREA)
- Pathology (AREA)
- Analytical Chemistry (AREA)
- Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
- Engineering & Computer Science (AREA)
- Theoretical Computer Science (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Mathematical Physics (AREA)
- Molecular Biology (AREA)
- Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2020-066069 | 2020-04-01 | ||
| JP2020066069A JP6931730B1 (ja) | 2020-04-01 | 2020-04-01 | 光学測定装置及び光学測定方法 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| TW202141022A TW202141022A (zh) | 2021-11-01 |
| TWI895383B true TWI895383B (zh) | 2025-09-01 |
Family
ID=77549888
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW110109328A TWI895383B (zh) | 2020-04-01 | 2021-03-16 | 光學測定裝置及光學測定方法 |
Country Status (7)
| Country | Link |
|---|---|
| US (1) | US20230124819A1 (enExample) |
| EP (1) | EP4123291A4 (enExample) |
| JP (2) | JP6931730B1 (enExample) |
| KR (1) | KR20220159971A (enExample) |
| CN (1) | CN115398210B (enExample) |
| TW (1) | TWI895383B (enExample) |
| WO (1) | WO2021199605A1 (enExample) |
Families Citing this family (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP6923702B1 (ja) * | 2020-04-01 | 2021-08-25 | 浜松ホトニクス株式会社 | 光学測定装置及び光学測定方法 |
| TW202245178A (zh) | 2021-01-21 | 2022-11-16 | 日商邦德科技股份有限公司 | 接合方法、接合裝置及接合系統 |
| WO2024085899A1 (en) * | 2022-10-19 | 2024-04-25 | Wang ying ting | Methods and apparatuses for fluorospectrometric measurements of low photon budget samples |
| TWI849658B (zh) * | 2022-12-29 | 2024-07-21 | 致茂電子股份有限公司 | 複合式校正片 |
Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2001523830A (ja) * | 1997-11-19 | 2001-11-27 | ユニバーシティ オブ ワシントン | 高処理能力光学スキャナー |
| US20080314114A1 (en) * | 2007-06-20 | 2008-12-25 | Carestream Health, Inc. | Fluorescence calibrator for multiple band flat field correction |
| TW201512648A (zh) * | 2013-09-27 | 2015-04-01 | Frank Jiann-Fu Yang | 智慧型自動化化學物質定性及定量之檢測裝置及檢測方法 |
Family Cites Families (25)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS613043A (ja) * | 1984-06-18 | 1986-01-09 | Hitachi Ltd | 核酸塩基配列決定装置 |
| WO1990009637A1 (en) * | 1989-02-13 | 1990-08-23 | Research Corporation Technologies, Inc. | Method and means for parallel frequency acquisition in frequency domain fluorometry |
| JPH04106470A (ja) * | 1990-08-28 | 1992-04-08 | Hitachi Ltd | 粒子免疫測定方法及びその装置 |
| US5270548A (en) * | 1992-07-31 | 1993-12-14 | The United States Of America As Represented By The United States Department Of Energy | Phase-sensitive flow cytometer |
| JP3483217B2 (ja) * | 1994-02-08 | 2004-01-06 | チノン株式会社 | 画像読取装置 |
| JPH1151856A (ja) * | 1997-08-07 | 1999-02-26 | Nippon Telegr & Teleph Corp <Ntt> | フォトリフレクタンスマッピング測定法 |
| US6251688B1 (en) * | 1998-03-20 | 2001-06-26 | Ia, Inc. | Method and apparatus for measurement of binding between a protein and a nucleotide |
| JP2001137173A (ja) * | 1999-11-11 | 2001-05-22 | Fuji Photo Film Co Ltd | 蛍光画像測定方法および装置 |
| JP4660691B2 (ja) * | 2005-04-08 | 2011-03-30 | コニカミノルタセンシング株式会社 | 蛍光試料の光学特性測定方法及びこれを用いた光学特性測定装置 |
| JP2010518394A (ja) | 2007-02-06 | 2010-05-27 | ナンヤン・テクノロジカル・ユニバーシティー | 基板上に置かれた蛍光サンプルを分析するための装置および方法 |
| JP5094484B2 (ja) * | 2008-03-11 | 2012-12-12 | 富士フイルム株式会社 | 蛍光検出方法および蛍光検出装置 |
| JP5239442B2 (ja) * | 2008-03-25 | 2013-07-17 | コニカミノルタオプティクス株式会社 | 蛍光試料の光学特性測定方法および装置 |
| US20100032582A1 (en) * | 2008-08-07 | 2010-02-11 | General Electric Company | Fluorescence detection system and method |
| CN102150035A (zh) * | 2008-09-19 | 2011-08-10 | 三井造船株式会社 | 采用强度调制激光的荧光检测装置和荧光检测方法 |
| JP5558178B2 (ja) * | 2010-04-07 | 2014-07-23 | オリンパス株式会社 | 蛍光観察装置 |
| JP5487150B2 (ja) * | 2011-03-31 | 2014-05-07 | 富士フイルム株式会社 | 光学的測定方法および光学的測定装置 |
| JP2013200125A (ja) * | 2012-03-23 | 2013-10-03 | Mitsui Eng & Shipbuild Co Ltd | 蛍光検出装置及び蛍光検出方法 |
| JP5944843B2 (ja) * | 2013-02-04 | 2016-07-05 | 浜松ホトニクス株式会社 | 分光測定装置及び分光測定方法 |
| CA2904031A1 (en) * | 2013-03-14 | 2014-10-02 | Profusa, Inc. | Method and device for correcting optical signals |
| US10031063B2 (en) * | 2013-07-23 | 2018-07-24 | Sony Corporation | Particle analysis apparatus and method for optically detecting particles |
| FR3036187B1 (fr) * | 2015-05-12 | 2019-09-13 | Commissariat A L'energie Atomique Et Aux Energies Alternatives | Procede de correction d’une image de fluorescence |
| KR102444477B1 (ko) * | 2016-05-19 | 2022-09-16 | 후지 덴키 가부시키가이샤 | 수질 분석계 |
| US10401605B2 (en) * | 2017-05-02 | 2019-09-03 | SCREEN Holdings, Co., Ltd. | Structured illumination in inverted light sheet microscopy |
| CN112912715B (zh) * | 2018-10-25 | 2024-08-09 | 浜松光子学株式会社 | 光学测定装置及光学测定方法 |
| JP6923702B1 (ja) * | 2020-04-01 | 2021-08-25 | 浜松ホトニクス株式会社 | 光学測定装置及び光学測定方法 |
-
2020
- 2020-04-01 JP JP2020066069A patent/JP6931730B1/ja active Active
-
2021
- 2021-01-21 CN CN202180026082.5A patent/CN115398210B/zh active Active
- 2021-01-21 EP EP21779692.9A patent/EP4123291A4/en active Pending
- 2021-01-21 KR KR1020227031968A patent/KR20220159971A/ko active Pending
- 2021-01-21 US US17/914,434 patent/US20230124819A1/en active Pending
- 2021-01-21 WO PCT/JP2021/002104 patent/WO2021199605A1/ja not_active Ceased
- 2021-03-16 TW TW110109328A patent/TWI895383B/zh active
- 2021-08-16 JP JP2021132233A patent/JP7348933B2/ja active Active
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2001523830A (ja) * | 1997-11-19 | 2001-11-27 | ユニバーシティ オブ ワシントン | 高処理能力光学スキャナー |
| US20080314114A1 (en) * | 2007-06-20 | 2008-12-25 | Carestream Health, Inc. | Fluorescence calibrator for multiple band flat field correction |
| TW201512648A (zh) * | 2013-09-27 | 2015-04-01 | Frank Jiann-Fu Yang | 智慧型自動化化學物質定性及定量之檢測裝置及檢測方法 |
Also Published As
| Publication number | Publication date |
|---|---|
| EP4123291A4 (en) | 2024-04-24 |
| WO2021199605A1 (ja) | 2021-10-07 |
| JP2021162509A (ja) | 2021-10-11 |
| KR20220159971A (ko) | 2022-12-05 |
| US20230124819A1 (en) | 2023-04-20 |
| TW202141022A (zh) | 2021-11-01 |
| JP7348933B2 (ja) | 2023-09-21 |
| JP6931730B1 (ja) | 2021-09-08 |
| CN115398210B (zh) | 2025-11-07 |
| EP4123291A1 (en) | 2023-01-25 |
| JP2021179447A (ja) | 2021-11-18 |
| CN115398210A (zh) | 2022-11-25 |
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