TWI895383B - 光學測定裝置及光學測定方法 - Google Patents

光學測定裝置及光學測定方法

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Publication number
TWI895383B
TWI895383B TW110109328A TW110109328A TWI895383B TW I895383 B TWI895383 B TW I895383B TW 110109328 A TW110109328 A TW 110109328A TW 110109328 A TW110109328 A TW 110109328A TW I895383 B TWI895383 B TW I895383B
Authority
TW
Taiwan
Prior art keywords
light
signal
calibration
detection
measurement
Prior art date
Application number
TW110109328A
Other languages
English (en)
Chinese (zh)
Other versions
TW202141022A (zh
Inventor
近藤房宣
岩田直樹
松村朋和
竹下照雄
Original Assignee
日商濱松赫德尼古斯股份有限公司
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 日商濱松赫德尼古斯股份有限公司 filed Critical 日商濱松赫德尼古斯股份有限公司
Publication of TW202141022A publication Critical patent/TW202141022A/zh
Application granted granted Critical
Publication of TWI895383B publication Critical patent/TWI895383B/zh

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64Fluorescence; Phosphorescence
    • G01N21/645Specially adapted constructive features of fluorimeters
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/27Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands using photo-electric detection ; circuits for computing concentration
    • G01N21/274Calibration, base line adjustment, drift correction
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47Scattering, i.e. diffuse reflection
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47Scattering, i.e. diffuse reflection
    • G01N21/4738Diffuse reflection, e.g. also for testing fluids, fibrous materials
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64Fluorescence; Phosphorescence
    • G01N21/6408Fluorescence; Phosphorescence with measurement of decay time, time resolved fluorescence
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/8483Investigating reagent band
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47Scattering, i.e. diffuse reflection
    • G01N2021/473Compensating for unwanted scatter, e.g. reliefs, marks
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64Fluorescence; Phosphorescence
    • G01N21/645Specially adapted constructive features of fluorimeters
    • G01N2021/6463Optics
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/75Systems in which material is subjected to a chemical reaction, the progress or the result of the reaction being investigated
    • G01N21/77Systems in which material is subjected to a chemical reaction, the progress or the result of the reaction being investigated by observing the effect on a chemical indicator
    • G01N2021/7756Sensor type
    • G01N2021/7759Dipstick; Test strip
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/75Systems in which material is subjected to a chemical reaction, the progress or the result of the reaction being investigated
    • G01N21/77Systems in which material is subjected to a chemical reaction, the progress or the result of the reaction being investigated by observing the effect on a chemical indicator
    • G01N2021/7769Measurement method of reaction-produced change in sensor
    • G01N2021/7786Fluorescence
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00Features of devices classified in G01N21/00
    • G01N2201/12Circuits of general importance; Signal processing
    • G01N2201/127Calibration; base line adjustment; drift compensation

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Immunology (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Pathology (AREA)
  • Analytical Chemistry (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Mathematical Physics (AREA)
  • Molecular Biology (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
TW110109328A 2020-04-01 2021-03-16 光學測定裝置及光學測定方法 TWI895383B (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2020-066069 2020-04-01
JP2020066069A JP6931730B1 (ja) 2020-04-01 2020-04-01 光学測定装置及び光学測定方法

Publications (2)

Publication Number Publication Date
TW202141022A TW202141022A (zh) 2021-11-01
TWI895383B true TWI895383B (zh) 2025-09-01

Family

ID=77549888

Family Applications (1)

Application Number Title Priority Date Filing Date
TW110109328A TWI895383B (zh) 2020-04-01 2021-03-16 光學測定裝置及光學測定方法

Country Status (7)

Country Link
US (1) US20230124819A1 (enExample)
EP (1) EP4123291A4 (enExample)
JP (2) JP6931730B1 (enExample)
KR (1) KR20220159971A (enExample)
CN (1) CN115398210B (enExample)
TW (1) TWI895383B (enExample)
WO (1) WO2021199605A1 (enExample)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6923702B1 (ja) * 2020-04-01 2021-08-25 浜松ホトニクス株式会社 光学測定装置及び光学測定方法
TW202245178A (zh) 2021-01-21 2022-11-16 日商邦德科技股份有限公司 接合方法、接合裝置及接合系統
WO2024085899A1 (en) * 2022-10-19 2024-04-25 Wang ying ting Methods and apparatuses for fluorospectrometric measurements of low photon budget samples
TWI849658B (zh) * 2022-12-29 2024-07-21 致茂電子股份有限公司 複合式校正片

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001523830A (ja) * 1997-11-19 2001-11-27 ユニバーシティ オブ ワシントン 高処理能力光学スキャナー
US20080314114A1 (en) * 2007-06-20 2008-12-25 Carestream Health, Inc. Fluorescence calibrator for multiple band flat field correction
TW201512648A (zh) * 2013-09-27 2015-04-01 Frank Jiann-Fu Yang 智慧型自動化化學物質定性及定量之檢測裝置及檢測方法

Family Cites Families (25)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS613043A (ja) * 1984-06-18 1986-01-09 Hitachi Ltd 核酸塩基配列決定装置
WO1990009637A1 (en) * 1989-02-13 1990-08-23 Research Corporation Technologies, Inc. Method and means for parallel frequency acquisition in frequency domain fluorometry
JPH04106470A (ja) * 1990-08-28 1992-04-08 Hitachi Ltd 粒子免疫測定方法及びその装置
US5270548A (en) * 1992-07-31 1993-12-14 The United States Of America As Represented By The United States Department Of Energy Phase-sensitive flow cytometer
JP3483217B2 (ja) * 1994-02-08 2004-01-06 チノン株式会社 画像読取装置
JPH1151856A (ja) * 1997-08-07 1999-02-26 Nippon Telegr & Teleph Corp <Ntt> フォトリフレクタンスマッピング測定法
US6251688B1 (en) * 1998-03-20 2001-06-26 Ia, Inc. Method and apparatus for measurement of binding between a protein and a nucleotide
JP2001137173A (ja) * 1999-11-11 2001-05-22 Fuji Photo Film Co Ltd 蛍光画像測定方法および装置
JP4660691B2 (ja) * 2005-04-08 2011-03-30 コニカミノルタセンシング株式会社 蛍光試料の光学特性測定方法及びこれを用いた光学特性測定装置
JP2010518394A (ja) 2007-02-06 2010-05-27 ナンヤン・テクノロジカル・ユニバーシティー 基板上に置かれた蛍光サンプルを分析するための装置および方法
JP5094484B2 (ja) * 2008-03-11 2012-12-12 富士フイルム株式会社 蛍光検出方法および蛍光検出装置
JP5239442B2 (ja) * 2008-03-25 2013-07-17 コニカミノルタオプティクス株式会社 蛍光試料の光学特性測定方法および装置
US20100032582A1 (en) * 2008-08-07 2010-02-11 General Electric Company Fluorescence detection system and method
CN102150035A (zh) * 2008-09-19 2011-08-10 三井造船株式会社 采用强度调制激光的荧光检测装置和荧光检测方法
JP5558178B2 (ja) * 2010-04-07 2014-07-23 オリンパス株式会社 蛍光観察装置
JP5487150B2 (ja) * 2011-03-31 2014-05-07 富士フイルム株式会社 光学的測定方法および光学的測定装置
JP2013200125A (ja) * 2012-03-23 2013-10-03 Mitsui Eng & Shipbuild Co Ltd 蛍光検出装置及び蛍光検出方法
JP5944843B2 (ja) * 2013-02-04 2016-07-05 浜松ホトニクス株式会社 分光測定装置及び分光測定方法
CA2904031A1 (en) * 2013-03-14 2014-10-02 Profusa, Inc. Method and device for correcting optical signals
US10031063B2 (en) * 2013-07-23 2018-07-24 Sony Corporation Particle analysis apparatus and method for optically detecting particles
FR3036187B1 (fr) * 2015-05-12 2019-09-13 Commissariat A L'energie Atomique Et Aux Energies Alternatives Procede de correction d’une image de fluorescence
KR102444477B1 (ko) * 2016-05-19 2022-09-16 후지 덴키 가부시키가이샤 수질 분석계
US10401605B2 (en) * 2017-05-02 2019-09-03 SCREEN Holdings, Co., Ltd. Structured illumination in inverted light sheet microscopy
CN112912715B (zh) * 2018-10-25 2024-08-09 浜松光子学株式会社 光学测定装置及光学测定方法
JP6923702B1 (ja) * 2020-04-01 2021-08-25 浜松ホトニクス株式会社 光学測定装置及び光学測定方法

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001523830A (ja) * 1997-11-19 2001-11-27 ユニバーシティ オブ ワシントン 高処理能力光学スキャナー
US20080314114A1 (en) * 2007-06-20 2008-12-25 Carestream Health, Inc. Fluorescence calibrator for multiple band flat field correction
TW201512648A (zh) * 2013-09-27 2015-04-01 Frank Jiann-Fu Yang 智慧型自動化化學物質定性及定量之檢測裝置及檢測方法

Also Published As

Publication number Publication date
EP4123291A4 (en) 2024-04-24
WO2021199605A1 (ja) 2021-10-07
JP2021162509A (ja) 2021-10-11
KR20220159971A (ko) 2022-12-05
US20230124819A1 (en) 2023-04-20
TW202141022A (zh) 2021-11-01
JP7348933B2 (ja) 2023-09-21
JP6931730B1 (ja) 2021-09-08
CN115398210B (zh) 2025-11-07
EP4123291A1 (en) 2023-01-25
JP2021179447A (ja) 2021-11-18
CN115398210A (zh) 2022-11-25

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