JP6924755B2 - 光子計数放射線検出器、撮像システム、およびスペクトル放射線検出方法 - Google Patents

光子計数放射線検出器、撮像システム、およびスペクトル放射線検出方法 Download PDF

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JP6924755B2
JP6924755B2 JP2018526916A JP2018526916A JP6924755B2 JP 6924755 B2 JP6924755 B2 JP 6924755B2 JP 2018526916 A JP2018526916 A JP 2018526916A JP 2018526916 A JP2018526916 A JP 2018526916A JP 6924755 B2 JP6924755 B2 JP 6924755B2
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pixels
dark current
radiation
photon counting
radiation detector
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JP2019504297A (ja
JP2019504297A5 (enExample
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ブーケル ロヘル ステッドマン
ブーケル ロヘル ステッドマン
エワルト ロエッスル
エワルト ロエッスル
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Koninklijke Philips NV
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/24—Measuring radiation intensity with semiconductor detectors
    • G01T1/244—Auxiliary details, e.g. casings, cooling, damping or insulation against damage by, e.g. heat, pressure or the like
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/24—Measuring radiation intensity with semiconductor detectors

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  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Molecular Biology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Measurement Of Radiation (AREA)
  • Transforming Light Signals Into Electric Signals (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Apparatus For Radiation Diagnosis (AREA)
  • Light Receiving Elements (AREA)
JP2018526916A 2015-11-26 2016-11-23 光子計数放射線検出器、撮像システム、およびスペクトル放射線検出方法 Expired - Fee Related JP6924755B2 (ja)

Applications Claiming Priority (3)

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EP15196524 2015-11-26
EP15196524.1 2015-11-26
PCT/EP2016/078481 WO2017089363A1 (en) 2015-11-26 2016-11-23 Dark current compensation

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JP2019504297A JP2019504297A (ja) 2019-02-14
JP2019504297A5 JP2019504297A5 (enExample) 2019-12-05
JP6924755B2 true JP6924755B2 (ja) 2021-08-25

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US (1) US10267928B2 (enExample)
EP (1) EP3380870A1 (enExample)
JP (1) JP6924755B2 (enExample)
CN (1) CN108291973B (enExample)
RU (1) RU2734452C2 (enExample)
WO (1) WO2017089363A1 (enExample)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP3658960B1 (en) 2017-07-26 2022-09-07 Shenzhen Xpectvision Technology Co., Ltd. X-ray detector capable of managing charge sharing at its periphery
EP3444826A1 (en) * 2017-08-14 2019-02-20 Koninklijke Philips N.V. Low profile anti scatter and anti charge sharing grid for photon counting computed tomography
EP3704514A4 (en) * 2017-10-30 2021-04-21 Shenzhen Xpectvision Technology Co., Ltd. DARK NOISE COMPENSATION IN A RADIATION DETECTOR
EP3567405A1 (en) 2018-05-08 2019-11-13 Koninklijke Philips N.V. Photon counting spectral ct
US10813607B2 (en) * 2018-06-27 2020-10-27 Prismatic Sensors Ab X-ray sensor, method for constructing an x-ray sensor and an x-ray imaging system comprising such an x-ray sensor
CN116507283A (zh) * 2020-09-18 2023-07-28 美国亚德诺半导体公司 用于光子计数计算机断层扫描的δ调制基线恢复
US11985438B2 (en) 2021-03-18 2024-05-14 Taiwan Semiconductor Manufacturing Company, Ltd. Pixel array including dark pixel sensors
JP7439027B2 (ja) * 2021-09-08 2024-02-27 富士フイルムヘルスケア株式会社 放射線撮像装置及び放射線検出器
CN118604868A (zh) * 2024-05-28 2024-09-06 福建福清核电有限公司 一种位置灵敏型门式辐射探测器干扰隔离装置

Family Cites Families (26)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4100739B2 (ja) 1996-10-24 2008-06-11 キヤノン株式会社 光電変換装置
DE19734717A1 (de) * 1997-08-11 1999-02-25 Sirona Dental Systems Gmbh Verfahren zur Kompensation des Dunkelstroms bei der Erstellung von zahnärztlichen Panorama- und/oder cephalometrischen Schichtaufnahmen
JP3832615B2 (ja) * 1999-08-26 2006-10-11 株式会社島津製作所 放射線検出装置
GB2370960A (en) 2001-01-05 2002-07-10 Spectral Fusion Technologies L Partially shielded photodiode array
JP2001340324A (ja) * 2001-03-16 2001-12-11 Toshiba Medical System Co Ltd Ｘ線検出器及びそれを使ったｘ線診断装置
JP4723767B2 (ja) * 2001-09-13 2011-07-13 株式会社東芝 Ｘ線画像診断装置
JP2003209665A (ja) 2002-01-16 2003-07-25 Fuji Photo Film Co Ltd 画像読取方法および画像記録読取装置
CN100477239C (zh) * 2002-08-09 2009-04-08 浜松光子学株式会社 光电二极管阵列和放射线检测器
US20110168892A1 (en) 2005-01-06 2011-07-14 Koninklijke Philips Electronics N.V. Pixel Implemented Current Amplifier
JP5345383B2 (ja) * 2005-04-22 2013-11-20 コーニンクレッカ フィリップス エヌ ヴェ 検出器画素、放射線検出器および方法、陽電子放出断層撮影システム、撮像検出器およびその較正方法、検出器セルの無効化方法
JP4555785B2 (ja) 2006-02-10 2010-10-06 シャープ株式会社 固定パターン雑音除去装置、固体撮像装置、電子機器、及び固定パターン雑音除去プログラム
EP2070313B1 (en) 2006-09-25 2012-05-02 Philips Intellectual Property & Standards GmbH Compensation of leakage current and residual signals for integrating detector based on direct x-ray conversion
US7829860B2 (en) * 2006-10-31 2010-11-09 Dxray, Inc. Photon counting imaging detector system
JP4462299B2 (ja) * 2007-07-17 2010-05-12 ソニー株式会社 撮像装置、および画像処理方法、並びにコンピュータ・プログラム
EP2276408B1 (en) * 2008-05-08 2019-07-10 Arineta Ltd. X ray imaging system with scatter radiation correction and method of using same
JP2009284424A (ja) 2008-05-26 2009-12-03 Sony Corp 撮像装置、撮像方法及びプログラム
WO2010007544A1 (en) * 2008-07-14 2010-01-21 Koninklijke Philips Electronics N.V. Anti-scatter grid
EP2356486A2 (en) * 2008-11-10 2011-08-17 Koninklijke Philips Electronics N.V. Converter element for a radiation detector
EP2376942B1 (en) * 2008-12-15 2013-03-27 Koninklijke Philips Electronics N.V. Temperature compensation circuit for silicon photomultipliers and other single photon counters
EP2404196B1 (en) 2009-03-06 2013-10-16 Koninklijke Philips N.V. Temperature compensation and control circuit for single photon counters
JP2012045044A (ja) * 2010-08-24 2012-03-08 Fujifilm Corp 放射線画像検出装置
CN103314307B (zh) 2011-01-10 2016-04-13 皇家飞利浦电子股份有限公司 用于探测由辐射源发射的光子的探测装置
KR20140010553A (ko) * 2012-07-13 2014-01-27 삼성전자주식회사 픽셀 어레이, 이를 포함하는 이미지 센서, 및 상기 이미지 센서의 로컬 다크 전류 보상 방법
JP2014048171A (ja) * 2012-08-31 2014-03-17 Tele Systems:Kk 放射線検出器に駆動用のバイアス電圧を供給する装置及びその方法
US9510792B2 (en) * 2013-05-17 2016-12-06 Toshiba Medical Systems Corporation Apparatus and method for collimating X-rays in spectral computer tomography imaging
JP2015021843A (ja) * 2013-07-19 2015-02-02 株式会社島津製作所 放射線検出器、放射線検出装置及び放射線分析装置

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Publication number Publication date
RU2734452C2 (ru) 2020-10-16
US10267928B2 (en) 2019-04-23
WO2017089363A1 (en) 2017-06-01
CN108291973A (zh) 2018-07-17
JP2019504297A (ja) 2019-02-14
RU2018122963A3 (enExample) 2020-02-10
EP3380870A1 (en) 2018-10-03
CN108291973B (zh) 2022-09-09
RU2018122963A (ru) 2019-12-26
US20180321395A1 (en) 2018-11-08

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