JP6846869B2 - Optical film defect detection device and method - Google Patents

Description

The present invention relates to a technique for detecting defects generated in the process of an optical film.

Generally, when a large number of defects occur in a certain area in the process of an optical film roll, the area is designated as a special control area and further inspected by an inspector.

At this time, the inspector looks at the defect detection map (two-dimensional graph) and determines whether or not the defect is a dense defect. However, since the skill level of the inspectors is different and it is difficult to detect the difference in the density standard between defects due to the change in the scale of the X / Y axis of the defect detection map, it is accurate for many rolls. Moreover, it is difficult to consistently confirm and manage poor congestion. Further, when the inspection is performed by an inspector, there is a problem that the inspection work requires a lot of cost and time.

Korean Patent Application Laid-Open No. 2009-0009314

An object of the present invention is to provide a defect detection device and a method for detecting a density defect generated in a process of an optical film.

1. 1. A receiver that receives defective information on the optical film roll from at least one inspection device, and
Based on the defect information, a defect position determining unit that determines the position of the defect on the two-dimensional plane corresponding to the optical film roll, and a defect position determining unit.
Based on the position of the defect, a search unit that searches for a region in which the defect exists in the number already set or more on the two-dimensional plane, and a search unit.
A defect detection device for an optical film including a defect detection unit that detects a density defect based on the density of the defect included in the searched region.

2. In item 1, the search unit
For each defective position, a search area having a certain size including the respective defective positions is set, and the positions of the search areas are sequentially changed around the respective defective positions, and each search area is changed. A defect detection device for an optical film that searches for the region in which the defects are present in an number equal to or larger than the already set number.

3. 3. In item 1, the search unit
Defective optical film that sets a plurality of search regions of a certain size with the position of each defect as the center coordinate, and searches for the region in which the defect is present in the number already set or more in each search region. Detection device.

4. In item 1, the search unit
A defect detection device for an optical film that divides the two-dimensional plane into a plurality of search regions having a constant size and searches for the region in which the defects are present in an already set number or more among the divided search regions. ..

5. In item 1, the search unit
A search area having a certain size is set in the two-dimensional plane, the position of the search area is sequentially changed by a certain distance, and the area in each search area in which the number of defects already set exists or more is defined. A defect detection device for optical films to be searched.

6. In the item 1, the defect detection unit is
A memory unit that stores the position of the searched area and
A candidate area determination unit that determines a defective candidate area based on the position of the searched area,
A defect determination unit that calculates the density of the defects included in the defect candidate region and determines the presence or absence of the density defect in the defect candidate region based on the calculated density. Defect detection device for optical films including.

7. In item 6, the candidate area determination unit
A defect detection device for an optical film that determines the searched region as the defect candidate region.

8. In item 7, the candidate area determination unit
A defect detection device for an optical film that integrates the overlapping region or the continuous region and determines the integrated region as the defect candidate region when the superimposed or continuous region exists in the searched region.

9. In the item 8, the candidate area determination unit
A defect detection device for an optical film that determines a minimum region including all the defects included in each region as a defect candidate region for each of the searched region or the integrated region.

10. In item 6, the memory unit is
A defect detection device for an optical film that stores position information of the searched region using a two-dimensional array.

11. In item 6, the density is
A defect detection device for an optical film including at least one of the number of defects per unit area of the defect candidate region and the total area occupied by each defect in the defect candidate region.

12. In item 9, the density is
A defect detection device for an optical film including the area of the minimum region.

13. In the item 6, the defect determination unit is
A defect detection device for an optical film that determines that the density is poor when the density is equal to or higher than a set value.

14. In the item 1, the defect detection unit is
A defect detection device for an optical film including a defect detection information generation unit that generates defect detection information including information on a position where the density defect occurs in a process line of the optical film when the density defect is detected.

15. In item 14, the defect detection information generation unit
A defect detection device for an optical film that transmits the defect detection information to at least one of a terminal of a manager of a process management system, a terminal of a worker of the process line of the optical film, and an alarm device on the process line. ..

16. At the stage of receiving defect information of the optical film roll from at least one inspection device,
Based on the defect information, a step of determining the position of the defect on the two-dimensional plane corresponding to the optical film roll, and
Based on the position of the defect, a step of searching for a region where the defect exists in the number already set or more on the two-dimensional plane, and
A method for detecting a defect in an optical film, which includes a step of detecting a density defect based on the density of the defect contained in the searched region.

17. In item 16, the search step is
A search area having a certain size including the position of each defect is set for each defect position in the two-dimensional plane, and the position of the search area is sequentially changed around the position of each defect. A method for detecting defects in an optical film that searches for the region in which the defects are present in an number equal to or more than the already set number in each search region.

18. In item 16, the search step is
Defective optical film that sets a plurality of search regions of a certain size with the position of each defect as the center coordinate, and searches for the region in which the defect is present in the number already set or more in each search region. Detection method.

19. In item 16, the search step is
A method of detecting defects in an optical film by dividing the two-dimensional plane into a plurality of search regions having a constant size and searching for the regions in which the defects are present in an already set number or more among the divided search regions. ..

20. In item 16, the search step is
Optics to set a search region of a certain size in the two-dimensional plane, sequentially change the position of the search region, and search for the region in each search region in which the number of defects already set exists or more. Film defect detection method.

21. In item 16, the detection step is
The stage of storing the position of the searched area and
A step of determining a defective candidate region based on the position of the searched region, and
A step of calculating the density of the defects included in the defect candidate region, and
A method for detecting defects in an optical film, which includes a step of determining the presence or absence of the density defect in the defect candidate region based on the calculated density.

22. In the item 21, the step of determining the defective candidate region is
A method for detecting defects in an optical film, in which the searched region is determined as the defect candidate region.

23. In item 22, the step of determining the defective candidate region is
A method for detecting defects in an optical film, in which, when a superposed or continuous region exists among the searched regions, the superposed region or the continuous region is integrated and the integrated region is determined as the defect candidate region.

24. In item 23, the step of determining the defective candidate region is
A method for detecting defects in an optical film, in which a minimum region including all the defects contained in each region is determined as a defect candidate region for each of the searched region or the integrated region.

25. In the item 21, the storage step is
A method for detecting defects in an optical film that stores position information of the searched region using a two-dimensional array.

26. In item 21, the density is
A method for detecting defects in an optical film, which comprises at least one of the number of defects per unit area of the defect candidate region and the total area occupied by each defect in the defect candidate region.

27. In item 24, the density is
A method for detecting defects in an optical film including the area of the minimum region.

28. In the item 21, the determination step is
A method for detecting defects in an optical film that determines that the density is poor when the density is equal to or higher than a set value.

29. In item 16,
A method for detecting a defect in an optical film, further comprising a step of generating defect detection information including information on a position where the defect is generated in the process line of the optical film when the defect is detected.

30. In item 29,
An optical film further comprising a step of transmitting the defect detection information to at least one of a terminal of a manager of a process management system, a terminal of a worker of the process line of the optical film, and an alarm device on the process line. Defect detection method.

31. Combined with hardware,
At the stage of receiving defect information of the optical film roll from at least one inspection device,
Based on the defect information, a step of determining the position of the defect on the two-dimensional plane corresponding to the optical film roll, and
Based on the position of the defect, a step of searching for a region where the defect exists in the number already set or more on the two-dimensional plane, and
A computer program stored in a recording medium for causing a computer to perform a step of detecting a density defect based on the density of the defect contained in the searched area.

According to the present invention, the quality of the optical film is controlled according to a consistent standard regardless of the production amount of the optical film by automatically determining whether or not the density defect contained in the optical film is generated. At the same time, productivity can be improved by shortening the detection time of poor density.

Further, according to the present invention, by making it possible to promptly grasp and notify the presence or absence of the occurrence of poor density in the optical film, it is possible to quickly take measures against the occurrence of the poor density, and the production loss (Loss) of the optical film ) Can be reduced.

FIG. 1 is a block diagram of an optical film defect detection device according to an embodiment of the present invention. FIG. 2 is a detailed configuration diagram of a defect detection unit according to an embodiment of the present invention. FIG. 3 is an exemplary diagram for explaining the process of searching for a region where defects exist. FIG. 4 is an exemplary diagram for explaining the process of searching for a region where defects exist. FIG. 5 is an exemplary diagram for explaining the process of searching for a region where defects exist. FIG. 6 is an exemplary diagram for explaining a process of searching for a region where a defect exists. FIG. 7 is an example diagram for explaining the setting of the defective candidate region. FIG. 8 is an example diagram for explaining the setting of the defective candidate region. FIG. 9 is an example diagram for explaining the setting of the defective candidate region. FIG. 10 is an example diagram for explaining the setting of the defective candidate region. FIG. 11 is an example diagram for explaining the setting of the defective candidate region. FIG. 12 is a flowchart of a defect detection method for an optical film according to an embodiment of the present invention. FIG. 13 is a flowchart showing a process of detecting a poor density according to an embodiment of the present invention.

Hereinafter, specific embodiments of the present invention will be described with reference to the drawings. The following detailed description is provided to aid in a comprehensive understanding of the methods, devices, and / or systems described herein. However, these are merely examples, and the present invention is not limited thereto.

In explaining the embodiments of the present invention, if it is determined that a specific explanation for the related known technology may obscure the gist of the present invention, the detailed description thereof will be omitted. Further, the terms described later are terms defined in consideration of the functions in the present invention, and may differ depending on the intentions or customs of the user and the operator. Therefore, the definition should be based on the content throughout this specification. The terms used in the detailed description are merely for the purpose of describing embodiments of the present invention and should never be restrictive. Unless used in a distinctly different sense, the singular representation includes the plural meaning. In this description, expressions such as "include" or "provide" are intended to refer to any characteristic, number, stage, action, element, part or combination thereof, and one other than those described. Or any other characteristic, number, stage, action, element, existence or possibility of a part or combination thereof shall not be excluded from the interpretation.

FIG. 1 is a block diagram of an optical film defect detection device according to an embodiment of the present invention.

Referring to FIG. 1, the defect detection device 100 for an optical film according to an embodiment of the present invention includes a reception unit 110, a defect positioning unit 120, a search unit 130, and a defect detection unit 140.

The receiving unit 110 receives defective information of the optical film roll from at least one inspection device. At this time, each inspection device is arranged at a different position on the process line of the optical film, and means a device for detecting defects generated in the process of manufacturing the optical film and generating defect information regarding the detected defects. To do.

For example, the inspection device can include a camera module that is placed on the upper surface of the optical film in the process line of the optical film so that the camera module is used to photograph the optical film and detect defects from the captured image. It may be configured. Further, for this purpose, a light source can be provided on the opposite surface of the surface on which the camera module is located with reference to the optical film. The camera module may be configured to capture light emitted from a light source and transmitted through an optical film. In this case, if there is a defect in the optical film, the light transmittance of the corresponding portion becomes low, so that the defect can be easily detected.

The defect information generated by the inspection device can include the position, size, brightness of the detected defect, an image of the detected defect, an inspection start time, an inspection end time, and the like.

The defect positioning unit 120 determines the position of the defect on the two-dimensional plane corresponding to the optical film roll based on the defect information received from the inspection device.

For example, the defect positioning unit 120 constitutes a two-dimensional plane corresponding to the length and width of the optical film roll, integrates defect information received from each inspection device, and determines the position of the defect in the two-dimensional plane. Can be decided. At this time, the position of the defect in the two-dimensional plane can be determined based on the defect position included in the defect information received from each inspection device. Further, preset values can be used for the length and width of the optical film roll.

The search unit 130 searches for a region on the two-dimensional plane in which a number of defects already set or more exists, based on the position of the defect determined by the defect position determination unit 120.

For example, the search unit 130 sets a search area of a certain size, and while patrolling the set search area on a two-dimensional plane, counts the number of defects included in the search area. It is possible to search for an area where there are more than the set number of defects. This will be specifically described with reference to FIGS. 3 to 6.

In FIGS. 3 to 6, the area represented by the dotted line indicates the search area, and the portion represented by the circle indicates the position of the defect. Although FIGS. 3 to 6 show that the search area has a quadrangular shape, the present invention is not limited to this. For example, the search area may be circular and can be transformed into an appropriate shape at the user's choice. Further, the size of the search area can be set by the user in consideration of, for example, the calculation load and the accuracy of the calculation.

According to one embodiment of the present invention, the search unit 130 may set a search region having a certain size including each defect position for each defect position included in the two-dimensional plane. it can. Then, the search unit 130 can change the position of the search area around the position of each defect and search for an area in each search area in which a number or more of defects already set exists.

Specifically, referring to FIG. 3, the search unit 130 can set a search area 321 including a specific defect 310 among a plurality of defects included on the two-dimensional plane 300. Then, the search unit 130 can count the number of defects in the set search area 321 and determine whether or not the number of defects is equal to or greater than the already set number.

Next, the search unit 130 moves the search area 321 by a certain distance in the X-axis direction around the position of the defect 310, counts the number of defects in the search area 322 at the position after the movement, and the number of defects has already been set. It is possible to judge whether or not the number is equal to or more than the specified number.

Next, the search unit 130 further moves the search area 322 about the position of the defect 310 by a certain distance in the X-axis direction, counts the number of defects in the search area 323 at the position after the movement, and the number of defects has already been reached. It is possible to determine whether or not the number is equal to or greater than the set number.

Next, the search unit 130 moves the search area 323 around the position of the defect 310 by a certain distance in the Y-axis direction, counts the number of defects in the search area 324 at the position after the movement, and the number of defects has already been set. It is possible to judge whether or not the number is equal to or more than the specified number.

In this way, the search unit 130 sequentially moves the search area in the X-axis and Y-axis directions by a certain distance around the specific defect 310, counts the number of defects in the search area at each position, and has already It is possible to search for an area containing a set number of defects or more.

In the illustrated example, the moving distance of the search area can be preset by the user.

Further, the search unit 130 sets a search area for each defect included in the two-dimensional plane 300 in the same manner, and moves the set search area into the search area at each position. It is possible to determine whether the number of defects included is greater than or equal to the already set number.

On the other hand, according to another embodiment of the present invention, the search unit 130 sets a search area having a certain size with the position of each defect as the center coordinate in the two-dimensional plane, and is already set in each search area. It is possible to search for areas where there are more than a few defects.

As a specific example, referring to FIG. 4, the search unit 130 has a search area 410 of a certain size with each defect as the center coordinate for each defect included in the two-dimensional plane 400. 420, 430, 440, 450 can be set. Then, the search unit 130 counts the number of defects for each of the search areas 410, 420, 430, 440, and 450, and can search for an area containing more than the already set number of defects. ..

On the other hand, according to still another embodiment of the present invention, the search unit 130 divides the two-dimensional plane into a plurality of search regions having a certain size, and the number or more of each of the divided search regions already set. It is possible to search the area where the defect exists.

As a specific example, referring to FIG. 5, the search unit 130 can divide the two-dimensional plane 500 into search regions 510, 520, 530, and 540 of a certain size. Then, the search unit 130 can count the number of defects included in the respective search areas 510, 520, 530, and 540, and determine whether or not the number of defects already set is included. ..

On the other hand, according to still another embodiment of the present invention, the search unit 130 sets a search area having a certain size in the two-dimensional plane, sequentially changes the position of the search area in the two-dimensional plane, and changes each search area. It is possible to search for an area in which there are more than the set number of defects.

As a specific example, referring to FIG. 6, the search unit 130 can set a search region 610 of a certain size at a specific position on the two-dimensional plane 600. Then, the search unit 130 can count the number of defects in the set search area 610 and determine whether or not the number of defects is equal to or greater than the already set number.

Next, the search unit 130 sequentially moves the search area 610 in the Y-axis direction by a certain distance, counts the number of defects in the search areas 620, 630, 640, and 650 at each position, and the number of defects has already been set. It is possible to judge whether or not the number is greater than or equal to the number.

If the search area cannot be moved any further in the Y-axis direction, the search unit 130 counts the number of defects in the search area 660 after moving the search area by a certain distance in the X-axis direction. , It is possible to determine whether the number of defects is equal to or greater than the already set number.

Next, the search unit 130 sequentially moves the search area 660 in the X-axis direction by a certain distance, counts the number of defects in the search area at each position, and the number of defects is equal to or greater than the already set number. It is possible to judge whether or not.

By such a method, the search unit 130 counts the number of defects in the search area at each position while patrolling the entire area of the two-dimensional plane 600 using the search area, and is equal to or more than the number already set. It is possible to search the area where the defect exists.

In the example shown in FIG. 6, the moving direction and moving distance of the search area can be preset by the user.

The defect detection unit 140 can detect the density defect based on the density of defects included in the region searched by the search unit 130. Here, the poor density means that a plurality of defects are densely packed in a certain area.

Specifically, the defect detection unit 140 can set one or more defect candidate regions based on the region searched by the search unit 130. In addition, the defect detection unit 140 can detect the density defect by calculating the density of defects included in each of the set defect candidate regions.

FIG. 2 is a detailed configuration diagram of the defect detection unit 140 according to the embodiment of the present invention.

Referring to FIG. 2, the defect detection unit 140 according to the embodiment of the present invention includes a memory unit 141, a candidate area determination unit 142, a defect determination unit 143, and a defect detection information generation unit 144.

The memory unit 141 can store the position of the area where the number of defects already set or more is found, which is searched by the search unit 130. Specifically, the memory unit 141 can store the position on the two-dimensional plane of the area searched by the search unit 130. According to one embodiment of the present invention, the memory unit 141 can be realized in the form of an image buffer composed of a two-dimensional array corresponding to a two-dimensional plane, and the area searched by the search unit 120 using the two-dimensional array. The position of can be stored.

The candidate area determination unit 142 can determine one or more defective candidate areas based on the position of the searched area stored in the memory unit 141.

For example, the candidate area determination unit 142 can determine each searched area stored in the memory unit 141 as a defective candidate area.

At this time, according to one embodiment of the present invention, the candidate area determination unit 142 integrates the superimposed or continuous areas when there are overlapping or continuous areas among the searched areas stored in the memory unit 141. Then, the integrated area can be determined as a defective candidate area. At this time, a labeling algorithm such as a Blob Labeling algorithm may be used for superimposing or integrating contiguous regions.

As a specific example, referring to FIG. 7, the regions 711, 712, 713 searched by the search unit 130 on the two-dimensional plane 710 corresponding to the optical film roll are the memory unit 141 composed of the two-dimensional array. It can be stored in the corresponding positions 721, 722, 723 of the storage area 720, respectively.

At this time, the candidate area determination unit 142 can determine the areas of 721, 722, and 723, which are the areas searched by the search unit 130, as defective candidate areas, respectively.

As another example, in FIG. 7, since the region of 721 and the region of 722 are continuous regions, the candidate region determination unit 142 sets the region of 721 and the region of 722 as the example shown in FIG. It can be integrated into one region 724, and the integrated region 724 and 723 regions can be determined as defective candidate regions, respectively.

As another example, referring to FIG. 9, the areas 911, 912, 913 searched by the search unit 130 on the two-dimensional plane 910 corresponding to the optical film roll are the storage of the memory unit 141 composed of the two-dimensional array. It can be stored in the corresponding positions 921, 922, 923 of the area 920, respectively.

At this time, the candidate area determination unit 142 can determine the areas of 921, 922 and 923, which are the areas searched by the search unit 130, as defective candidate areas, respectively.

As another example, since the 921 area and the 922 area of the searched area stored in the memory unit 141 are overlapping areas, the candidate area determination unit 142 is the 921 area and the 922 area. The regions can be integrated into one region 924 as in the example shown in FIG. 10, and the integrated regions 924 and 923 regions can be determined as defective candidate regions, respectively.

On the other hand, according to one embodiment of the present invention, the candidate region determination unit 142 sets the minimum region including all the defects contained in each region for each of the region searched by the search unit 130 or the integrated region. It can be determined as a defective candidate area.

As a specific example, referring to FIGS. 10 and 11, the candidate region determination unit 142 includes all the defects contained in each region for each of the integrated region 924 and the non-integrated region 923. The minimum areas 925 and 926 can be set, and the set minimum areas 925 and 926 can be determined as defective candidate areas, respectively.

In the example shown in FIG. 11, it is shown that the minimum region has a quadrangular shape, but the present invention is not limited to this, and the shape of the minimum region is various shapes such as a circular shape. May be good.

The defect determination unit 143 can detect the density defect based on the density of defects included in each defect candidate region.

For example, the defect determination unit 143 calculates the density of defects included in the defect candidate region, and when the calculated density is equal to or higher than the already set value, it can determine that the density is poor. At this time, the density can be calculated as, for example, the total area occupied by each defect in the defect candidate region.

As another example, when the defective candidate region is determined as the minimum region 925,926 shown in FIG. 11, the density can be calculated as the area of the minimum region.

As yet another example, the density may be calculated as the number of defects per unit area of the defect candidate region. At this time, the number of defects per unit area can be calculated as a value obtained by dividing the number of defects included in the defect candidate area by the area of the defect candidate area.

When the defect detection information generation unit 144 is detected, the defect detection information generation unit 144 can generate defect detection information regarding the detected density defect. At this time, the defect detection information can include, for example, information regarding the occurrence position of the density defect in the defect detection process line of the optical film, and the occurrence position of the density defect in the process line of the optical film is on the optical film. It can be calculated based on the detected location of the poor density. For example, the defect detection information generation unit 144 refers to the transport direction of the optical film in the process line of the optical film, and is based on the distance from the start position of the optical film to the occurrence position of the density defect detected by the optical film. It is possible to determine the position where the density defect occurs in the process line of the optical film.

On the other hand, according to one embodiment of the present invention, the defect detection information generation unit 144 uses the generated defect detection information, for example, on the terminal of the manager of the process management system, the terminal of the worker of the process line, or on the process line. By transmitting to the alarm device, it is possible to take prompt measures against the occurrence of poor congestion.

FIG. 12 is a flowchart of a defect detection method for an optical film according to an embodiment of the present invention.

Referring to FIG. 12, the optical film defect detection device 100 receives defect information of the optical film roll from at least one inspection device (1210).

After that, the defect detection device 100 of the optical film determines the position of the defect on the two-dimensional plane corresponding to the optical film roll based on the received defect information (1220).

After that, the defect detection device 100 of the optical film searches for a region on the two-dimensional plane in which the number of defects already set or more exists, based on the determined position of the defect (1230).

For example, the defect detection device 100 for an optical film sets a search region of a certain size including each defect position for each defect position in a two-dimensional plane, and centers on each defect position. By sequentially changing the position of the search area, it is possible to search for an area in each search area in which a set number or more of defects exist.

As another example, the defect detection device 100 of the optical film sets a plurality of search regions having a certain size with the position of each defect included in the two-dimensional plane as the center coordinate, and already among the search regions. It is possible to search for an area where there are more than the set number of defects.

As yet another example, the optical film defect detection device 100 divides the two-dimensional plane into a plurality of search regions having a constant size, and among the divided search regions, defects of the number already set or more are found. You can search for existing areas.

As yet another example, the defect detection device 100 for the optical film sets a search region of a certain size in a two-dimensional plane, sequentially changes the position of the search region, and is a number already set in each search region. It is possible to search for an area where the above defects exist.

After that, the defect detection device 100 of the optical film detects the density defect based on the density of the defect contained in the searched region (1240).

After that, the defect detection device 100 of the optical film generates defect detection information regarding the detected density defect (1250). At this time, the defect detection information can include, for example, information on the position where the density defect occurs in the process line of the optical film.

After that, the defect detection device 100 of the optical film transmits the generated defect detection information to, for example, the terminal of the manager of the process management system, the terminal of the worker of the process line, or the alarm device on the process line (1260). ).

FIG. 13 is a flowchart showing a process of detecting a poor density according to an embodiment of the present invention.

Referring to FIG. 13, the optical film defect detection device 100 stores the position of the region searched in the search step (1230) of FIG. 12 (1310). At this time, the defect detection device 100 of the optical film can store the position information of the searched region by using the two-dimensional array.

After that, the defect detection device 100 of the optical film determines a defect candidate region based on the position of the searched region (1320).

For example, the defect detection device 100 of the optical film can determine each of the searched regions as a defect candidate region.

As another example, when the defect detection device 100 of the optical film has a superposed or continuous region in the searched region, the superposed region or the continuous region is integrated, and the integrated region is the defect candidate region. Can be determined as.

As yet another example, the defect detection device 100 of the optical film determines the minimum region including all the defects contained in each region as a defect candidate region for each of the searched region or the integrated region. be able to.

After that, the defect detection device 100 of the optical film calculates the density of defects included in the defect candidate region (1330).

Here, the density can be calculated as, for example, the total area occupied by each defect in the defect candidate region, or the number of defects per unit area of the defect candidate region.

As another example, if the defective candidate region is determined as the minimum region 925,926 shown in FIG. 11, the density can be calculated as the area of the minimum region.

After that, the defect detection device 100 of the optical film determines the presence or absence of the density defect in the defect candidate region based on the calculated density (1340).

For example, the defect detection device 100 for an optical film can determine that the density is poor when the calculated density is equal to or higher than a set value.

In the flowcharts of FIGS. 12 and 13, the method is shown in a plurality of stages, but at least some of the stages are executed in a different order, in combination with other stages, or omitted. Alternatively, it may be executed in small steps, or it may be executed by adding one or more steps (not shown).

On the other hand, embodiments of the present invention may include a computer-readable recording medium that includes a program for performing the methods described herein on a computer. The computer-readable recording medium may include program instructions, local data files, local data structures, etc., alone or in combination. The medium may be one specially designed and configured for the present invention, or one commonly available in the field of computer software. Examples of computer-readable recording media include magnetic media such as hard disks, floppy (registered trademark) disks and magnetic tapes, optical recording media such as CD-ROMs and DVDs, and magnetics such as floppy (registered trademark) disks. It includes an optical medium and a hardware device specially configured to store and execute program instructions such as ROM, RAM, and flash memory. Examples of program instructions include not only machine language code created by a compiler, but also high-level language code that can be executed by a computer using an interpreter or the like.

Although some embodiments of the present invention have been described above, these embodiments are presented as examples and are not intended to limit the scope of the invention. These novel embodiments can be implemented in various other embodiments, and various omissions, replacements, and changes can be made without departing from the gist of the invention. These embodiments and modifications thereof are included in the scope and gist of the invention, and are also included in the scope of the invention described in the claims and the equivalent scope thereof.

100: Optical film defect detection device 110: Receiver 120: Defect position determination unit 130: Search unit 140: Defect detection unit 141: Memory unit 142: Candidate area determination unit 143: Defect determination unit 144: Defect detection information generation unit

Claims (27)

A receiver that receives defective information on the optical film roll from at least one inspection device, and
Based on the defect information, a defect position determining unit that determines the position of the defect on the two-dimensional plane corresponding to the optical film roll, and a defect position determining unit.
A search area having a certain size is set, and while the position of the search area is changed based on the position of the defect, a region in which the defect exists in the number already set or more on the two-dimensional plane is searched. Search department and
A defect detection device for an optical film, which includes a defect detection unit that detects a density defect based on the density of the defect included in the searched region. The search area is set to include each of the defective positions for each defective position.
The claim that the search unit sequentially changes the position of the search region around the position of each defect, and searches each search region for the region in which the defect is present in an already set number or more. The defect detection device for an optical film according to 1. The search area includes a plurality of search areas having a constant size with the position of each defect as the center coordinate.
The defect detection device for an optical film according to claim 1, wherein the search unit searches for the region in which the defect is present in the number already set or more in each search region. The defect detection unit
A memory unit that stores the position of the searched area and
A candidate area determination unit that determines a defective candidate area based on the position of the searched area,
A defect determination unit that calculates the density of the defects included in the defect candidate region and determines the presence or absence of the density defect in the defect candidate region based on the calculated density. The defective detection device for an optical film according to any one of claims 1 to 3, which includes. The defect detection device for an optical film according to claim 4 , wherein the candidate region determination unit determines the searched region as the defect candidate region. When a superposed or continuous region exists among the searched regions, the candidate region determining unit integrates the superposed region or the continuous region and determines the integrated region as the defective candidate region. The defect detection device for an optical film according to claim 5. The candidate region determining unit, for each of the search area or the integrated area, to determine the minimum area including all the defective contained in each region as said possible defective region, according to claim 6 The optical film defect detection device described in 1. The defect detection device for an optical film according to any one of claims 4 to 7 , wherein the memory unit stores position information of the searched area using a two-dimensional array. The density of claims 4 to 8 includes at least one of the number of defects per unit area of the defect candidate region and the total area occupied by each defect in the defect candidate region. The optical film defect detection device according to any one. The defect detection device for an optical film according to claim 7 , wherein the density includes the area of the minimum region. The defect detecting device for an optical film according to any one of claims 4 to 10 , wherein the defect determining unit determines that the density is defective when the density is equal to or higher than a set value. The defect detection unit includes a defect detection information generation unit that generates defect detection information including information on the occurrence position of the density defect in the process line of the optical film when the density defect is detected. The defect detection device for an optical film according to any one of 1 to 11. The defect detection information generation unit transmits the defect detection information to at least one of a terminal of a manager of a process management system, a terminal of a worker of the process line of the optical film, and an alarm device on the process line. The defect detection device for an optical film according to claim 12 , which is transmitted. At the stage of receiving defect information of the optical film roll from at least one inspection device,
Based on the defect information, a step of determining the position of the defect on the two-dimensional plane corresponding to the optical film roll, and
A search area having a certain size is set, and while the position of the search area is changed based on the position of the defect, a region in which the defect exists in the number already set or more on the two-dimensional plane is searched. Stages and
A method for detecting a defect in an optical film, which comprises a step of detecting a density defect based on the density of the defect contained in the searched region. The search area is set to include each of the defective positions with respect to each defective position in the two-dimensional plane.
In the search step, the position of the search region is sequentially changed around the position of each defect, and the region in each search region in which the defect is present in an already set number or more is searched. Item 14. The method for detecting defects in an optical film according to item 14. The search area includes a plurality of search areas having a certain size with the position of each defect as the center coordinate.
The defect detection method for an optical film according to claim 14 , wherein the search step is to search for the region in which the defect is present in the number already set or more in each search region. The detection step is
The stage of storing the position of the searched area and
A step of determining a defective candidate region based on the position of the searched region, and
A step of calculating the density of the defects included in the defect candidate region, and
The defect detection method for an optical film according to any one of claims 14 to 16, further comprising a step of determining the presence or absence of the density defect in the defect candidate region based on the calculated density. The defect detection method for an optical film according to claim 17 , wherein the step of determining the defect candidate region is to determine the searched region as the defect candidate region. In the step of determining the defective candidate region, when a superposed or continuous region exists among the searched regions, the superposed region or the continuous region is integrated, and the integrated region is designated as the defective candidate region. The method for detecting defects in an optical film according to claim 18 , which is determined. In the step of determining the defect candidate region, for each of the searched region or the integrated region, the minimum region including all the defects contained in each region is determined as the defect candidate region. The method for detecting defects in an optical film according to claim 19. The method for detecting defects in an optical film according to any one of claims 17 to 20 , wherein the storage step stores the position information of the searched region using a two-dimensional array. 17 to 21 , wherein the density includes at least one of the number of defects per unit area of the defect candidate region and the total area occupied by each defect in the defect candidate region. The method for detecting defects in an optical film according to any one of them. The method for detecting defects in an optical film according to claim 20 , wherein the density includes the area of the minimum region. The method for detecting a defect in an optical film according to any one of claims 17 to 23 , wherein the determination step is to determine that the density is poor when the density is equal to or higher than a set value. The invention according to any one of claims 14 to 24 , further comprising a step of generating defect detection information including information on the position where the density defect occurs in the process line of the optical film when the density defect is detected. Defect detection method for optical film. A claim further comprising transmitting the defect detection information to at least one of a terminal of a manager of a process management system, a terminal of a worker of the process line of the optical film, and an alarm device on the process line. Item 25. The method for detecting defects in an optical film according to Item 25. Combined with hardware,
At the stage of receiving defect information of the optical film roll from at least one inspection device,
Based on the defect information, a step of determining the position of the defect on the two-dimensional plane corresponding to the optical film roll, and
A search area having a certain size is set, and while the position of the search area is changed based on the position of the defect, a region in which the defect exists in the number already set or more on the two-dimensional plane is searched. Stages and
A computer program stored in a recording medium for causing a computer to perform a step of detecting a density defect based on the density of the defect contained in the searched area.

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