JP5796430B2 - Sheet glass inspection apparatus, sheet glass inspection method, sheet glass manufacturing apparatus, and sheet glass manufacturing method - Google Patents

Description

  The present invention relates to a sheet glass inspection apparatus, a sheet glass inspection method, a sheet glass manufacturing apparatus, and a sheet glass manufacturing method used for inspection of a sheet glass, and more particularly to a technique for more accurately detecting defects that occur continuously.

  In recent years, the spread of thin flat panel displays has been remarkable, with the largest number of liquid crystal displays being produced. Most of the substrate glass for liquid crystal used in the liquid crystal display is produced by the overflow down draw method.

  According to the overflow downdraw method, it is possible to produce a high-quality plate glass because it can be molded with a smooth surface at a nano level without requiring polishing. However, for example, defects may occur in the glass sheet due to factors such as insufficient melting of the glass raw material, mixing of foreign substances, aging of the apparatus, and fluctuations in molding conditions.

  Glass defects include, for example, defects (knots, striae (also referred to as codes), bubbles (also referred to as seeds and blisters), etc.) caused by contamination of foreign materials and insufficient melting of glass raw materials, and occurrence on the surface of plate glass. Defects (swells, streaks, open pores, irregularities, scratches, etc.). In particular, striae occur continuously, and the cause of occurrence is diverse and often takes time to deal with. Therefore, it is necessary to detect as accurately as possible at an early stage after sheet glass forming and feed back the detection result to the forming process. There is.

  Here, Patent Documents 1 to 4 disclose devices that detect light defects such as striae by receiving a light beam transmitted through a plate glass.

JP 2010-48745 A JP 2010-19834 JP 2008-170429 A JP 2004-251878 A

  The apparatuses described in Patent Documents 1 to 4 still have room for improvement and improvement with respect to inspection accuracy, inspection speed, apparatus cost, and the like.

  For example, Patent Document 2 states that “in order to reliably detect minute defects on the surface of a continuous sheet of glass, three inspection apparatuses are provided, and one sheet glass is inspected simultaneously using three inspection apparatuses. Thus, despite the simple configuration of each inspection device, a high detection rate and high-speed productivity could be ensured ”(paragraph 0083 of Patent Document 2). .

  However, since the plate glass defect inspection apparatus described in Patent Document 2 is provided with the same inspection apparatus and simultaneously inspects one sheet glass, the apparatus configuration is complicated and the apparatus cost is increased.

  If the number of inspection devices is simply increased, the inspection accuracy and inspection speed can generally be improved. However, it would be very useful if the inspection accuracy and inspection speed could be improved without increasing the number of inspection devices.

  In the inspection of glass defects such as striae that are continuously generated in a plurality of plate glasses at the time of forming the plate glass, the present invention suppresses the device cost without complicating the device configuration, and further increases the number of inspection devices. It aims at providing the plate glass test | inspection apparatus, plate glass test | inspection method, plate glass manufacturing apparatus, and plate glass manufacturing method which can improve a precision and inspection speed.

  In order to achieve the above object, a plate glass inspection apparatus according to the present invention is a plate glass inspection apparatus that inspects a plurality of plate glasses, and includes a defect candidate range of a first plate glass and a second plate glass different from the first plate glass. The detection unit for detecting the defect candidate range, the position of the defect candidate range of the first plate glass, and the position of the defect candidate range of the second plate glass are compared, and based on the result of the comparison, the first plate glass And a determination unit that determines the presence or absence of a continuous defect in the second glass sheet.

  Here, in the plate glass inspection apparatus, the detection unit includes an imaging unit and a calculation unit, the imaging unit captures images on the first plate glass and the second plate glass, and the calculation unit includes: A defect candidate portion is extracted based on the image captured by the imaging unit, and the defect candidate range may be set based on the defect candidate portion so that the defect candidate range is larger than the defect candidate portion. .

  Here, in the plate glass inspection apparatus, the first plate glass and the second plate glass are plate glasses formed by drawing in a predetermined direction, and the detection unit is configured to detect the first plate glass in the predetermined direction. A part and a part of the second glass sheet may be inspected, and for a direction orthogonal to the predetermined direction, the entire range of the first glass sheet and the entire range of the second glass sheet may be inspected.

  Here, in the plate glass inspection apparatus, a conveyance unit that conveys the first plate glass and the second plate glass in the direction orthogonal to the predetermined direction, and a conveyance path between the first plate glass and the second plate glass It is preferable to include a photographing unit that captures an image at a fixed position.

  Here, in the plate glass inspection apparatus, the transport unit may include a pulse output unit that outputs a pulse corresponding to the amount of movement of the plate glass, and the imaging unit may capture an image according to the pulse.

  In order to achieve the above object, a plate glass inspection method according to the present invention is a plate glass inspection method for inspecting a plurality of plate glasses, and includes a defect candidate range of the first plate glass and a second plate glass different from the first plate glass. The detection step of detecting the defect candidate range, the position of the defect candidate range of the first glass sheet, and the position of the defect candidate range of the second glass sheet are compared, and based on the result of the comparison, the first glass sheet And a step of determining whether or not there is a continuous defect in the second glass sheet.

  In order to achieve the above object, a flat glass manufacturing apparatus according to the present invention is a flat glass manufacturing apparatus that manufactures a plurality of flat glasses, and forms a first flat glass and a second flat glass that is different from the first flat glass. A detection unit that detects a defect candidate range of the first plate glass, a defect candidate range of the second plate glass, a position of the defect candidate range of the first plate glass, and a defect candidate range of the second plate glass A determination unit that compares the position and determines the presence or absence of a continuous defect in the first glass sheet and the second glass sheet based on the result of the comparison.

  In order to achieve the above object, a plate glass manufacturing method according to the present invention is a plate glass manufacturing method for manufacturing a plurality of plate glasses, and is a method for forming a first plate glass and a second plate glass different from the first plate glass. A detection step of detecting a defect candidate range of the first glass sheet, a defect candidate range of the second glass sheet, a position of the defect candidate range of the first glass sheet, and a defect candidate range of the second glass sheet A determination step of comparing the position and determining the presence or absence of a continuous defect in the first glass sheet and the second glass sheet based on the result of the comparison.

  According to the configuration of the plate glass inspection apparatus, the plate glass inspection method, the plate glass manufacturing apparatus, and the plate glass manufacturing method described in the means for solving the problem, the position of the defect candidates of the two sheet glasses is inspected by examining the two sheet glasses. When they match or are close to each other, it can be determined that the defect is a continuous defect in the two glass sheets. Therefore, in the inspection of glass defects such as striae that occur continuously in a plurality of plate glasses at the time of forming the plate glass, it is determined whether or not it is a defect as compared with the case of individually inspecting the plate glass one by one. Inspection accuracy can be increased.

  As a result, the apparatus cost can be suppressed without complicating the apparatus configuration.

  Further, when the number of inspection devices is increased, inspection accuracy and inspection speed can be improved as compared with the conventional case.

It is a figure which shows typically the outline | summary of conveyance of the plate glass to be examined, and image capture. It is a figure which shows the outline of the plate glass test | inspection apparatus which concerns on Embodiment 1. FIG. It is a figure for demonstrating the determination method of the defect candidate part in a calculating part. It is a figure which shows the relationship between a defect candidate part and a defect candidate range. It is a flowchart which shows the outline | summary of an inspection process. It is a figure which shows the outline of the plate glass manufacturing apparatus which concerns on the modification 1. FIG.

[Embodiment 1]
<Overview>
In the first embodiment, a sheet glass inspection apparatus for detecting a glass defect that continuously occurs in the sheet glass forming direction (hereinafter referred to as “sheet drawing direction”) will be described. In the plate glass inspection apparatus according to the first embodiment, when two plate glass images are captured, the positions of the respective defect candidates existing in the two plate glass images coincide with each other or are close to each other. The defect candidate is determined to be a glass defect.

<Configuration>
FIG. 1 is a diagram schematically showing an outline of conveyance of a plate glass to be inspected and image capture.

  As shown in FIG. 1, the continuous glass plate 11 continuously formed by the overflow down draw method in the forming apparatus 10 is drawn out in the vertical direction A (downward direction in FIG. 1) as time elapses. When the continuous plate glass 11 is formed into an appropriate plate, the cutting machine 12 cuts the continuous plate glass 11 into a necessary size to generate the plate glass 13. Here, the striae defect 14 continuously generated on the continuous plate glass 11 and the plate glass 13 is slightly bent or cut off when viewed in detail, and a plurality of defects may exist in adjacent regions. is there.

  Subsequently, the conveying device 15 holds a part of the upper portion of the plate glass 13 and conveys the plate glass 13 toward the next manufacturing process in a suspended state. In detail, the conveying apparatus 15 conveys the plate glass 13 to the direction C (left direction in FIG. 1) parallel to the main surface of the plate glass 13, and orthogonal to a drawing direction. In the present embodiment, the speed at which the transport device 15 transports the plate glass 13 can be up to about 2000 mm / sec.

  In addition, a photographing point 18 is provided on the transport path to the next manufacturing process, a light source 16 is installed on the back side of the plate glass 13, and a line camera 17 is installed on the front side of the plate glass 13.

  When the plate glass 13 is conveyed to the shooting point 18, the light emitted from the light source 16 irradiates the portion of the plate glass 13 at the shooting point 18, and the line camera 17 captures an image of the portion of the plate glass 13 at the shooting point 18. Here, the line camera 17 only captures an image for one line instantaneously.

  Therefore, while the plate glass 13 is being conveyed, the line camera 17 continuously captures images at relatively short intervals, so that an image in the camera field of view 19 (hatched portion in FIG. 1) on the plate glass 13 is obtained. Can be taken in without gaps.

  In the present embodiment, the number of pixels of one line captured by the line camera 17 is 2048 pixels, and only data for 100 pixels within a set range of 2048 pixels is used for measurement. The number of pixels used for measurement can be arbitrarily set by the user. Here, an imaging region on the plate glass 13 that is captured instantaneously by 100 pixels used for measurement has a length of about 10 mm in the drawing direction B. The line camera 17 receives a pulse representing the amount of movement of the plate glass 13 from a pulse output unit (not shown) provided in the transfer device 15, and captures an image for one line every time the plate glass 13 is transferred by 0.1 mm. .

  FIG. 2 is a diagram schematically illustrating the plate glass inspection apparatus 100 according to the first embodiment.

  The plate glass inspection apparatus 100 detects striae defects that occur continuously in the drawing direction of plate glass mainly formed by the overflow downdraw method. As shown in FIG. 2, the glass plate inspection apparatus 100 includes a detection unit 110 and a determination unit 120.

  The detection unit 110 inspects the glass sheets in the order in which they are formed, and calculates a defect candidate range. The detection unit 110 includes a conveyance unit 111, an imaging unit 112, and a calculation unit 113.

  The transport unit 111 corresponds to the transport device 15 in FIG. The conveyance unit 111 is molded in a direction (direction C in FIG. 1) parallel to the main surface of the plate glass 13 and orthogonal to the plate drawing direction using a power source capable of position control such as a servo motor. The plate glass (the plate glass 13 in FIG. 1) is conveyed in the order. Further, the transport unit 111 includes a pulse output unit 114 that outputs a plurality of pulses according to the amount of movement of the plate glass 13. The conveyance unit 111 outputs a movement pulse signal every time the power source moves by a predetermined amount while conveying the plate glass. In this embodiment, the movement pulse signal is an A-phase and B-phase encoder output that is output every time the plate glass moves 0.1 mm, and is output from a servo motor driver.

  The imaging unit 112 corresponds to the light source 16 and the line camera 17 in FIG. The imaging unit 112 captures images of a plurality of areas on the two plate glasses. Details of the photographing unit 112 will be described below.

  The imaging unit 112 receives the movement pulse signal from the pulse output unit 114, and captures an image of the imaging point every time a predetermined number of movement pulse signals are received. In this embodiment, every time the plate glass moves 0.1 mm, the photographing unit 112 captures an image. Therefore, the photographing unit 112 captures an image for one line every time a moving pulse signal is received from the pulse output unit 114.

  Further, since the position where the conveyance unit 111 holds the plate glass is not constant, the imaging unit 112 starts imaging before the plate glass reaches the imaging point, and ends imaging after the plate glass passes the imaging point.

  The calculation unit 113 extracts a defect candidate portion based on the image captured by the imaging unit 112, and sets the defect candidate range based on the extracted defect candidate portion so that the defect candidate range is larger than the defect candidate region. To do. Details of the calculation unit 113 will be described below.

  The calculation unit 113 calculates the one-dimensional data corresponding to the glass width direction by averaging only the data in the setting range for each image captured each time the plate glass moves by the photographing unit 112. Here, the calculation unit 113 calculates one-dimensional data by averaging only 100 pixels of the image data captured every time the plate glass moves 0.1 mm by the photographing unit 112.

  Here, since the image data captured by the photographing unit 112 includes image data outside the glass range photographed when the plate glass is not at the photographing point, the calculation unit 113 calculates the glass data from the one-dimensional data corresponding to the glass width direction. The edge is detected, and the portion corresponding to the outside of the glass range is excluded from the one-dimensional data, and only the portion corresponding to the glass range is extracted. Specifically, the calculation unit 113 excludes data corresponding to a preset width from both ends of the one-dimensional data corresponding to the glass width direction, and then sequentially sets the set values inward from both ends of the one-dimensional data. Search the following data, and the glass edge is the place where the data below the set value is found for each end. And the calculating part 113 determines the glass range from the one glass edge to the other glass edge in the said one-dimensional data. Here, the reason why the calculation unit 113 excludes the data corresponding to the preset glass width is to eliminate the extremely low brightness portion due to the disturbance. The reason why the calculation unit 113 searches for data below the set value in order from both ends inward is that the striatal defect may have a very large luminance, so that the striatal defect is not erroneously determined as the glass edge. It is.

  Subsequently, the calculation unit 113 performs luminance correction and enhancement processing as necessary to make the characteristics of the glass defect to be detected remarkable, and uses an existing data conversion program such as Fourier transform or wavelet transform to detect the glass range. Only one-dimensional data corresponding to is converted. In the plate glass inspection apparatus 100, ten types of data conversion programs are prepared, and the user can set the data conversion program to be used and the parameters and setting values for each data conversion program.

  Subsequently, the calculation unit 113 calculates a defect candidate range.

  FIG. 3 is a diagram for explaining a defect candidate portion determination method in the calculation unit 113.

  FIG. 3 shows lines indicating the level of the one-dimensional data converted using the data conversion program. In FIG. 3, four threshold values, that is, a + side failure threshold value 21, a + side warning threshold value 22, a −side warning threshold value 23, and a −side failure threshold value 24 are shown. Here, the four threshold values can be set by the user.

  The calculation unit 113 uses a position where the one-dimensional data converted using the data conversion program is not less than the + side warning threshold value 22 and not more than the −side warning threshold value 23 as a defect candidate position, and is a collection of adjacent defect candidate positions. Is a defect candidate portion 25.

  Subsequently, the calculation unit 113 expands the defect candidate portion 25 in the glass width direction in accordance with a predetermined rule described below, and calculates a defect candidate range used by the determination unit 120 for determining whether or not the glass sheet is a defect. .

  In addition, when there is little bending of the defect to detect, you may make it into a defect candidate range as it is, without extending the defect candidate part 25 to a glass width direction.

  FIG. 4 is a diagram illustrating a relationship between a defect candidate portion and a defect candidate range.

  FIG. 4 shows a line 32 indicating the level of the one-dimensional data converted using the data conversion program. The one-dimensional data shown in FIG. 4 is divided into the width of the defect detection unit 31 having a predetermined width. Here, the division into the width of the defect detection unit 31 is to divide the one-dimensional data of only the portion corresponding to the glass range into a unit region having the width of the defect detection unit 31 by dividing the one-dimensional data by a predetermined number from the glass center toward both ends. Means that. A straight line 36 below the line 32 indicates the correspondence between the one-dimensional data and the unit area.

  In the present embodiment, the width of the defect detection unit 31 corresponding to the width of 5 mm of the plate glass is determined, and the one-dimensional data of only the portion corresponding to the glass range is divided into unit areas composed of 50 pieces of data from one end. .

  The calculation unit 113 sets a unit area including at least one defect candidate for each unit area as a defect candidate unit area. In the example illustrated in FIG. 4, the calculation unit 113 recognizes the unit area 33 and the unit area 34 as defect candidate unit areas. Further, the calculation unit 113 collectively recognizes the unit area 33 and the unit area 34 as a defect candidate range 35.

  When there are a plurality of defect candidate portions and the defect candidate ranges calculated based on the respective defect candidate portions are adjacent to each other, two adjacent defect candidate ranges are collectively handled as one defect candidate range.

  Subsequently, the calculation unit 113 recognizes the defect candidate defect degree in the defect candidate range 35. Specifically, as shown in FIG. 4, the arithmetic unit 113 determines that the defect candidate range 35 is defective if there is even one portion that is greater than or equal to the positive defect threshold 21 or less than or equal to the negative defect threshold 24. Qualify as a candidate. In addition, the calculation unit 113 determines that the defect candidate range 35 is a warning candidate when there is no portion that is greater than or equal to the + side defect threshold 21 or less than or equal to the −side defect threshold 24.

  In the present embodiment, the detection unit 110 inspects the glass sheets in the order in which they are formed. However, as long as the order of forming is managed, the plurality of glass sheets may be inspected in any order.

  Moreover, in this Embodiment, the detection part 110 is a direction orthogonal to the plate drawing direction about the predetermined part range of plate glass about the plate drawing direction (equivalent to the direction B in FIG. 1) of plate glass. For (corresponding to direction C in FIG. 1), the entire range of the plate glass is inspected. Here, the predetermined partial range is set closer to the side to be molded later (upper side in FIG. 1) and closer to the side to be molded first (lower side in FIG. 1). It is preferable to This is because there is a high possibility that the plate glass in which the defect has occurred can be found early in the initial stage in which consecutive defects have occurred.

  The details of the determination unit 120 will be described with reference to FIG. The determination unit 120 compares the position of the defect candidate range of one plate glass with the position of the defect candidate range of the second plate glass, and determines the presence or absence of a defect that continuously occurs in the two plate glasses based on the comparison result. To do.

  The determination unit 120 includes a storage unit 121, a comparison unit 122, and a defect recognition unit 123.

  When the defect candidate range is detected by the computing unit 113, the storage unit 121 stores the position of the defect candidate range calculated this time for the next inspection of the plate glass.

  The comparison unit 122 calculates the defect candidate range when the detection unit 110 inspects the current plate glass, and stores the position of the defect candidate range in the storage unit 121 when the inspection object formed immediately before is inspected. In this case, the position of the defect candidate range detected this time is compared with the position of the stored defect candidate range. Furthermore, the comparison unit 122 checks whether or not there is an overlapping range, and when there is an overlapping range, the comparison unit 122 determines that there is a continuous defect in both the plate glass inspected this time and the plate glass inspected immediately before.

  The defect certifying unit 123 certifies the degree of defect of the plate glass determined to have a defect.

  In the defect candidate range, the defect level of the defect candidate such as whether it is a defect candidate or a warning candidate is recognized by the calculation unit 113. Therefore, when the defect candidate range determined to have an overlapping range is recognized as a defect candidate, the defect recognition unit 123 recognizes the degree of the corresponding plate glass defect as a defective product. On the other hand, when the defect candidate range determined to have an overlapping range is recognized as a warning candidate, the defect recognition unit 123 recognizes the degree of the corresponding plate glass defect as a warning product. In addition, the defect certification | authentication part 123 recognizes that it is inferior goods, when the certification with a single plate glass and the certification | authentication with a warning product overlap. Moreover, the defect certification | authentication part 123 recognizes the plate glass which receives neither the certification | authentication that it is a defective product, and the certification | authentication that it is a warning product as a good product.

  The comparison result by the comparison unit 122 and the certification result by the defect certification unit 123 are output and used for, for example, a sheet glass forming site or a sampling inspection process.

  In addition, in this Embodiment, although the determination part 120 performs the determination of the plate glass in the order formed, you may determine in any order as long as the order which formed is managed.

  Moreover, the plate glass inspection apparatus 100 may be provided with a device that excludes the plate glass that is recognized as a defective product by the defect recognition unit 123 so that the defective product is not put into a subsequent production process.

<Control method>
FIG. 5 is a flowchart showing an outline of the inspection process. The outline of the inspection process will be described below with reference to FIGS.

  (1) The photographing unit 112 waits until the plate glass is conveyed to a position that is a predetermined distance before the image capturing position (corresponding to the photographing point 18 in FIG. 1) (step S1).

  (2) The imaging unit 112 waits for input of a moving pulse signal output from the pulse output unit 114 (step S2).

  (3) The photographing unit 112 captures an image for one line (step S3).

  (4) Image capture is continued until the glass sheet is conveyed to a position after a predetermined distance from the image capture position (step S4).

  (5) When the image capture is completed (step S4: NO), the calculation unit 113 calculates one-dimensional data by averaging only the data in the set range (step S5).

  (6) The calculation unit 113 detects the glass edge from the one-dimensional data calculated in step S5, excludes the portion corresponding to the outside of the glass range, and extracts the one-dimensional data only for the portion corresponding to the glass range ( Step S6).

  (7) The calculation unit 113 converts the one-dimensional data using the data conversion program (step S7).

  (8) The calculation unit 113 calculates a defect candidate range according to a predetermined rule (step S8).

  (9) The calculation unit 113 recognizes the degree of defects in the defect candidate range (step S9).

  (10) It is determined whether or not the defect candidate range is calculated when the comparison unit 122 inspects the sheet glass this time (step S10). When the defect candidate range is not calculated (step S10: NO), the process returns to step S1 to inspect the next plate glass.

  (11) When the defect candidate range is calculated (step S10: YES), the storage unit 121 stores the position of the defect candidate range of the plate glass calculated this time for the next plate glass inspection (step S11). ).

  (12) When the comparison unit 122 inspects the inspection object molded immediately before in the storage unit 121, the comparison unit 122 determines whether the position of the defect candidate range is stored (step S12). When not memorize | stored (step S12: NO), in order to test | inspect the next plate glass, it returns to step S1.

  (13) If stored (step S12: YES), the comparison unit 122 compares the position of the defect candidate range detected this time with the position of the stored defect candidate range, and the overlapping range is found. It is confirmed whether or not there is (step S13). If there is no overlapping range (step S13: NO), the process returns to step S1 to inspect the next plate glass.

(14) When there is an overlapping range (step S13: YES), the comparison unit 122 determines that both the plate glass inspected this time and the plate glass inspected immediately before are defective. Moreover, the defect recognition part 123 recognizes the grade of the defect of the plate glass determined with the defect (step S14).
[Modification 1]
<Overview>
In the modification 1, the plate glass manufacturing apparatus provided with the plate glass test | inspection apparatus which concerns on Embodiment 1 is shown.

<Configuration>
FIG. 6 is a diagram illustrating an outline of a plate glass manufacturing apparatus 200 according to the first modification.

  The plate glass manufacturing apparatus 200 includes the plate glass inspection apparatus 100 and the forming unit 201 according to the first embodiment.

  In addition, in the plate glass manufacturing apparatus 200 which concerns on the modification 1, the same number is attached | subjected to the structure similar to the plate glass test | inspection apparatus 100 of Embodiment 1, and the description is abbreviate | omitted.

  The molding unit 201 is the same as the molding apparatus 10 shown in FIG.

<Summary>
As mentioned above, according to the plate glass inspection apparatus which concerns on Embodiment 1, and the plate glass manufacturing apparatus which concerns on the modification 1, each image which takes in the image of two plate glass shape | molded in order, and exists in the image of two plate glasses When the candidate positions match or are close to each other, it is possible to determine that the two glass sheet defect candidates are glass defects. Therefore, in the inspection of glass defects such as striae that occur continuously in a plurality of plate glasses at the time of forming the plate glass, it is determined whether or not it is a defect as compared with the case of individually inspecting the inspection object one by one Inspection accuracy can be increased.

  Further, when the number of inspection devices is increased, inspection accuracy and inspection speed can be improved as compared with the conventional case.

  INDUSTRIAL APPLICABILITY The present invention can be applied to inspection of glass defects such as striae that are continuously generated in a plurality of plate glasses when the plate glass is formed.

  According to the present invention, since it is possible to increase the inspection accuracy when determining whether or not a defect is present without complicating the apparatus configuration, the industrial utility value is extremely high.

DESCRIPTION OF SYMBOLS 10 Molding apparatus 11 Continuous plate glass 12 Cutting machine 13 Sheet glass 14 Striae defect 15 Conveyance device 16 Light source 17 Line camera 18 Imaging point 19 Camera view 100 Plate glass inspection device 110 Detection unit 111 Conveyance unit 112 Imaging unit 113 Calculation unit 114 Pulse output unit 120 Determination unit 121 Storage unit 122 Comparison unit 123 Defect recognition unit 200 Sheet glass manufacturing apparatus 201 Molding unit

Claims (8)

A plate glass inspection apparatus for inspecting a plurality of plate glasses,
A detection unit for detecting a defect candidate range of the first plate glass and a defect candidate range of the second plate glass different from the first plate glass;
When there is an overlapping range between the position of the defect candidate range of the first plate glass and the position of the defect candidate range of the second plate glass, it is determined that there is a continuous defect in the first plate glass and the second plate glass. and a determination unit,
The detection unit includes a photographing unit and a calculation unit,
The photographing unit captures images on the first plate glass and the second plate glass,
The calculation unit extracts a defect candidate portion based on the image captured by the photographing unit, and widens the defect candidate portion in the glass width direction so that the defect candidate range is larger than the defect candidate portion. A plate glass inspection apparatus for setting the defect candidate range . The first plate glass and the second plate glass are plate glasses formed by being drawn in a predetermined direction,
The photographing unit
For the predetermined direction, a part of the first glass sheet and a part of the second glass sheet are photographed ,
The plate glass inspection apparatus according to claim 1, wherein the whole range of the first plate glass and the whole range of the second plate glass are photographed in a direction orthogonal to the predetermined direction. A transport unit that transports the first glass sheet and the second glass sheet in a direction perpendicular to the predetermined direction ;
The said glass part is a plate glass test | inspection apparatus of Claim 2 which takes in the image of the fixed position in the conveyance path | route of a said 1st plate glass and a said 2nd plate glass. The transport unit includes a pulse output unit that outputs a pulse according to the amount of movement of the plate glass,
The said imaging | photography part is a plate glass test | inspection apparatus of Claim 3 which takes in an image according to the said pulse.   The calculation unit calculates one-dimensional data corresponding to the glass width direction, detects a glass edge from the one-dimensional data, excludes a portion corresponding to outside the glass range from the one-dimensional data, and enters the glass range. The plate glass inspection apparatus according to any one of claims 1 to 4, wherein one-dimensional data of only a corresponding portion is extracted, and the defect candidate range is set based on the extracted one-dimensional data. A plate glass inspection method for inspecting a plurality of plate glasses,
A detection step of detecting a defect candidate range of the first plate glass and a defect candidate range of the second plate glass different from the first plate glass;
When there is an overlapping range between the position of the defect candidate range of the first plate glass and the position of the defect candidate range of the second plate glass, it is determined that there is a continuous defect in the first plate glass and the second plate glass. and a determination step seen including,
The detecting step includes
Capturing images on the first glass sheet and on the second glass sheet;
Extracting a defect candidate portion based on the captured image, and setting the defect candidate range by expanding the defect candidate portion in a glass width direction so that the defect candidate range is larger than the defect candidate portion. When
A method for inspecting flat glass. A plate glass manufacturing apparatus for manufacturing a plurality of plate glasses,
A forming part for forming a first plate glass and a second plate glass different from the first plate glass;
A detection unit for detecting a defect candidate range of the first plate glass and a defect candidate range of the second plate glass;
When there is an overlapping range between the position of the defect candidate range of the first plate glass and the position of the defect candidate range of the second plate glass, it is determined that there is a continuous defect in the first plate glass and the second plate glass. and a determination unit,
The detection unit includes a photographing unit and a calculation unit,
The photographing unit captures images on the first plate glass and the second plate glass,
The calculation unit extracts a defect candidate portion based on the image captured by the photographing unit, and widens the defect candidate portion in the glass width direction so that the defect candidate range is larger than the defect candidate portion. A sheet glass manufacturing apparatus for setting the defect candidate range . A plate glass manufacturing method for manufacturing a plurality of plate glasses,
A forming step of forming a first plate glass and a second plate glass different from the first plate glass;
A detection step of detecting a defect candidate range of the first glass sheet and a defect candidate range of the second glass sheet;
When there is an overlapping range between the position of the defect candidate range of the first plate glass and the position of the defect candidate range of the second plate glass, it is determined that there is a continuous defect in the first plate glass and the second plate glass. and a determination step seen including,
The detecting step includes
Capturing images on the first glass sheet and on the second glass sheet;
Extracting a defect candidate portion based on the captured image, and setting the defect candidate range by expanding the defect candidate portion in a glass width direction so that the defect candidate range is larger than the defect candidate portion. When
A method for producing flat glass.

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