KR101935979B1 - Plate glass inspection device, plate glass inspection method, plate glass manufacturing device, and plate glass manufacturing method - Google Patents

Plate glass inspection device, plate glass inspection method, plate glass manufacturing device, and plate glass manufacturing method Download PDF

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KR101935979B1
KR101935979B1 KR1020147002925A KR20147002925A KR101935979B1 KR 101935979 B1 KR101935979 B1 KR 101935979B1 KR 1020147002925 A KR1020147002925 A KR 1020147002925A KR 20147002925 A KR20147002925 A KR 20147002925A KR 101935979 B1 KR101935979 B1 KR 101935979B1
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plate glass
glass
defect candidate
defect
plate
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KR1020147002925A
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KR20140060280A (en
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다케오 다니다
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니폰 덴키 가라스 가부시키가이샤
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/892—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
    • G01N21/896—Optical defects in or on transparent materials, e.g. distortion, surface flaws in conveyed flat sheet or rod

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Abstract

Provided is a glass plate inspecting apparatus which inspects continuously occurring glass defects while increasing the inspection speed while ensuring necessary inspection accuracy and suppressing the apparatus cost without complicating the structure of the apparatus. A defect inspection apparatus for inspecting a plurality of plate glasses, comprising: a detector for detecting a defect candidate range of a first plate glass and a defect candidate range of a second plate glass different from the first plate glass; A defective candidate range position of the second plate glass, and determining whether or not there is a defect continuing to the first plate glass and the second plate glass based on the comparison result.

Figure R1020147002925

Description

TECHNICAL FIELD [0001] The present invention relates to a plate glass inspecting apparatus, a plate glass inspection method, a plate glass manufacturing apparatus, and a plate glass manufacturing method.

The present invention relates to a plate glass inspection apparatus, a plate glass inspection method, a plate glass manufacturing apparatus, and a plate glass manufacturing method used for inspecting plate glass, and more particularly, to a technique for more accurately detecting defects continuously occurring.

In recent years, thin flat panel displays have become widespread, among which the number of liquid crystal displays is the largest. Most of the substrate glass for liquid crystal used in the liquid crystal display is produced by the overflow down-draw method.

According to the overflow down-draw method, it is possible to form a nano-level smooth surface without polishing, so that a high-quality plate glass can be produced. However, defects may occur in the plate glass due to, for example, insufficient melting of the glass raw material, incorporation of foreign materials, deterioration of the apparatus, and variations in molding conditions.

Glass defects include, for example, defects (such as a knot, a malt (also referred to as a cord) and bubbles (also referred to as a seed or a blister)) caused by the inclusion of a foreign substance or a lack of dissolution of a glass raw material, (Wave, stripes, open pores, irregularities and flaws). In particular, it is necessary to accurately detect as much as possible at the early stage of plate glass molding and to feed back the detection results to the molding process since the occurrence of the malleies is continuous and the causes of the occurrence vary.

Here, Patent Literatures 1 to 4 disclose an apparatus for detecting glass defects such as fines by receiving light rays transmitted through a plate glass.

Japanese Patent Application Laid-Open No. 2010-48745 Japanese Patent Application Laid-Open No. 2010-19834 Japanese Patent Application Laid-Open No. 2008-170429 Japanese Patent Application Laid-Open No. 2004-251878

The apparatuses described in Patent Documents 1 to 4 still have room for improvement in inspection accuracy, inspection speed, apparatus cost, and the like.

For example, Patent Document 2 discloses "In order to reliably detect fine defects on a continuous plate glass surface, three inspection apparatuses are arranged in parallel and one sheet glass is inspected simultaneously using three inspection apparatuses, Can achieve a high detection rate and high productivity despite the simple construction "(paragraph 0083 of Patent Document 2).

However, in the plate glass defect inspection apparatus described in Patent Document 2, since the same inspection apparatuses are provided in parallel to inspect a single sheet glass at the same time, the apparatus configuration becomes complicated and the apparatus cost becomes high.

Simply increasing the number of inspection devices generally improves inspection accuracy and inspection speed. However, it is very useful if it is possible to improve inspection accuracy and inspection speed without increasing the number of inspection devices.

An object of the present invention is to provide a method of inspecting glass defects such as spots which are generated continuously in a plurality of plate glasses at the time of molding a plate glass without reducing the cost of the apparatus without complicating the structure of the apparatus, And to provide a plate glass inspection apparatus, a plate glass inspection method, a plate glass manufacturing apparatus, and a plate glass manufacturing method which can improve the inspection speed.

In order to attain the above object, a plate glass inspection apparatus according to the present invention is a plate glass inspection apparatus for inspecting a plurality of plate glasses, wherein a defect candidate range of a first plate glass and a defect candidate range of a second plate glass different from the first plate glass are detected A defect candidate range position of the first plate glass and a defect candidate range position of the second plate glass are compared with each other and a presence or absence of a defect continuing to the first plate glass and the second plate glass is judged And a judging unit for judging

Here, in the plate glass inspection apparatus, the detection unit may include a photographing unit and an operation unit, and the photographing unit may introduce an image on the first sheet glass and the second sheet glass, It is preferable to extract the defect candidate portion based on the defect candidate portion and set the defect candidate range such that the defect candidate range is larger than the defect candidate portion.

Here, in the plate glass inspecting apparatus, the first plate glass and the second plate glass are plate glass formed by drawing a plate glass in a predetermined direction, and the detecting unit may detect a part of the first plate glass and the second plate glass, It is preferable to inspect a part of the first plate glass and the entire range of the first plate glass and the entire range of the second plate glass with respect to a direction orthogonal to the predetermined direction.

The conveying unit conveys the first sheet glass and the second sheet glass in the orthogonal direction with respect to the predetermined direction. The conveying unit conveys the first sheet glass and the second sheet glass to a fixing position of the conveying path of the first sheet glass and the second sheet glass, And a photographing unit for taking in an image of the image.

Here, in the plate glass inspection apparatus, it is preferable that the carry section includes a pulse output section for outputting a pulse according to the movement amount of the plate glass, and the photographing section introduces an image in accordance with the pulse.

In order to achieve the above object, a plate glass inspection method according to the present invention is a plate glass inspection method for inspecting a plurality of plate glasses, wherein a defect candidate range of a first plate glass and a defect candidate range of a second plate glass different from the first plate glass are detected A defective candidate range position of the first plate glass and a defective candidate range position of the second plate glass are compared with each other, and the presence or absence of a defect continuing to the first plate glass and the second plate glass And a judgment step of judging the judgment result.

In order to attain the above object, a plate glass manufacturing apparatus according to the present invention for manufacturing a plurality of plate glasses includes a first plate glass, a molding unit for molding a second plate glass different from the first plate glass, A defective candidate range position of the first plate glass and a defective candidate range position of the second plate glass are compared with each other based on the comparison result, And determining whether there is a defect continuing to the first plate glass and the second plate glass.

In order to achieve the above object, a method of manufacturing a plate glass according to the present invention is a method for manufacturing a plurality of plate glasses, comprising the steps of: forming a first plate glass and a second plate glass different from the first plate glass; A defect candidate range of the first plate glass and a defect candidate range position of the second plate glass are compared with each other and a defect candidate range of the first plate glass is compared with a defect candidate range position of the second plate glass, And determining whether there is a defect continuing to the first plate glass and the second plate glass.

When two plate glasses are inspected by the constitution of the plate glass inspection device, the plate glass inspection method, the plate glass manufacturing device and the plate glass manufacturing method described in the means for solving the problems and the defect candidate positions of the two sheet glasses are matched or close to each other It can be judged that the defect is a continuous defect in two sheets of glass. Therefore, in the inspection of glass defects such as spots which are generated continuously in a plurality of plate glasses at the time of forming the plate glass, it is possible to improve the inspection accuracy at the time of judging whether or not the plate glass is defective as compared with the case of individually inspecting the plate glass.

As a result, the device cost can be suppressed without complicating the device configuration.

Further, when the number of inspection apparatuses is increased, the inspection accuracy and the inspection speed can be improved as compared with the prior art.

BRIEF DESCRIPTION OF THE DRAWINGS Fig. 1 is a diagram schematically showing an outline of conveyance and image introduction of a plate glass to be inspected. Fig.
Fig. 2 is a schematic view of a plate glass inspection apparatus according to the first embodiment; Fig.
3 is a diagram for explaining a defect candidate portion judging method in an arithmetic section;
4 is a diagram showing a relationship between a defect candidate portion and a defect candidate range;
5 is a flowchart showing an outline of an inspection process;
Fig. 6 is a schematic view of an apparatus for manufacturing a plate glass according to Modification 1. Fig.

[First Embodiment]

<Overview>

In the first embodiment, a glass plate inspection apparatus for detecting glass defects continuously generated in a forming direction of a plate glass (hereinafter referred to as "drawing direction of plate glass") is shown. In the plate glass inspection apparatus according to the first embodiment, two plate glass images are introduced, and when the positions of defect candidates existing in two plate glass images coincide with each other or are close to each other, the defect candidates of the two plate glasses are regarded as glass defects .

<Configuration>

BRIEF DESCRIPTION OF DRAWINGS FIG. 1 is a diagram schematically showing an outline of conveyance and image introduction of a plate glass to be inspected. FIG.

As shown in Fig. 1, the continuous plate glass 11 continuously formed by the overflow down-draw method in the molding apparatus 10 is drawn out in the vertical direction A (downward direction in Fig. 1) as time elapses . When the continuous plate glass 11 is formed into a suitable plate, the cutter 12 cuts the continuous plate glass 11 to a required size to produce the plate glass 13. [ Here, the garnet defects 14 continuously generated on the continuous glass plate 11 and the plate glass 13 are slightly bent or broken in detail, and a plurality of defects may be present in the adjacent region.

Then, the transfer device 15 holds a part of the upper side of the plate glass 13, and conveys the plate glass 13 from the stepped state to the next manufacturing step. Specifically, the conveying device 15 conveys the plate glass 13 in a direction parallel to the main surface of the plate glass 13 and perpendicular to the drawing direction of the plate glass (left direction in FIG. 1). In the present embodiment, the speed at which the transporting device 15 transports the plate glass 13 can be up to about 2000 mm / sec.

A photographing point 18 is provided on the conveyance path to the next manufacturing process and a light source 16 is provided on the rear side of the plate glass 13 and a line camera 17 is provided on the front side of the plate glass 13.

When the plate glass 13 is conveyed to the photographing point 18, the light emitted from the light source 16 irradiates the photographing point 18 of the plate glass 13 and the line camera 17 moves the photographing point 18 of the plate glass 13 The image of the part of the image 18 is introduced. Here, the line camera 17 merely instantaneously introduces an image of one line.

Therefore, the line camera 17 continuously introduces images at relatively short intervals while the plate glass 13 is being conveyed, so that the image in the camera field of view 19 (diagonal line portion in Fig. 1) Can be introduced.

In the present embodiment, the number of pixels of one line introduced by the line camera 17 is 2048 pixels. Of the 2048 pixels, only data of 100 pixels in the set range are used for measurement. The number of pixels used for measurement can be arbitrarily set by the user. Here, the photographing region on the plate glass 13 instantaneously captured by 100 pixels used for measurement has a length of about 10 mm in the drawing direction B of the plate glass. The line camera 17 receives a pulse representing the amount of movement of the plate glass 13 from a pulse output unit (not shown) provided in the transfer device 15, Is introduced.

2 is a diagram schematically showing the plate glass inspection apparatus 100 according to the first embodiment.

The plate glass inspection apparatus 100 mainly detects the fuzzy defects continuously generated in the drawing direction of the plate glass formed by the overflow down-draw method. As shown in FIG. 2, the plate glass inspection apparatus 100 includes a detection unit 110 and a determination unit 120.

The detection unit 110 inspects the plate glass in the order in which it is formed and calculates the defect candidate range. The detecting unit 110 includes a carrying unit 111, a photographing unit 112, and a calculating unit 113.

The carry section 111 corresponds to the transfer apparatus 15 in Fig. The conveying section 111 is driven by a power source capable of controlling the position, such as a servo motor, in a direction parallel to the main surface of the plate glass 13 and perpendicular to the drawing direction of the plate glass (direction C in FIG. 1) (The plate glass 13 in Fig. 1) in this order. The carry section 111 also includes a pulse output section 114 for outputting a plurality of pulses in accordance with the movement amount of the plate glass 13. In the carry section 111, the power source outputs a movement pulse signal every time a plate glass is conveyed and a predetermined amount of plate glass is moved. In this embodiment, the movement pulse signal is outputted from the driver of the servo motor to the encoder output of the A-phase and B-phase outputted every time the plate glass moves by 0.1 mm.

The photographing section 112 corresponds to the light source 16 and the line camera 17 in Fig. The photographing unit 112 introduces the images of each of a plurality of regions on two sheet glass. Hereinafter, the photographing unit 112 will be described in detail.

The photographing unit 112 receives the moving pulse signal from the pulse output unit 114 and introduces the image of the photographing point every time the moving pulse signal is received a predetermined number of times. In the present embodiment, the photographing unit 112 introduces an image every time the plate glass moves by 0.1 mm, so that the photographing unit 112 introduces an image for one line every time when the photographing unit 112 receives the movement pulse signal from the pulse output unit 114 do.

In addition, since the position where the carry section 111 holds the plate glass is not constant, the photographing section 112 starts photographing before the plate glass reaches the photographing point, and finishes photographing after the plate glass passes the photographing point.

The calculation unit 113 extracts the defect candidate portion based on the image introduced by the photographing unit 112 and sets the defect candidate range such that the defect candidate range is larger than the defect candidate region based on the extracted defect candidate portion. Hereinafter, the operation unit 113 will be described in detail.

The calculation unit 113 calculates one-dimensional data corresponding to the glass width direction by averaging only the data of the setting range for each image introduced every time the plate glass moves by the photographing unit 112. [ Here, the calculation unit 113 calculates one-dimensional data by averaging only 100 pixels among the introduced image data every time the plate glass moves by 0.1 mm by the photographing unit 112. [

Since the image data introduced by the photographing unit 112 includes image data outside the glass range photographed when the plate glass is not at the photographing point, the calculating unit 113 calculates the image data from the one-dimensional data corresponding to the glass width direction ), And one-dimensional data of only a portion corresponding to the free range is extracted from the one-dimensional data by excluding portions corresponding to the outside of the free range. Specifically, the calculation unit 113 searches for data having a set value or less sequentially from both ends of the one-dimensional data after excluding a predetermined width of data from both ends of the one-dimensional data corresponding to the glass width direction, The data in which the data is less than the set value is found as the free end. Then, the calculation unit 113 determines, as the glass range, from one glass edge to the other glass edge in the one-dimensional data. The reason why the calculation unit 113 excludes data of a predetermined glass width is to exclude the extreme decrease in luminance due to disturbance. The reason why the arithmetic operation unit 113 sequentially finds data smaller than the set value in each direction from both ends is that the garnet defect has a very large luminance, so that the garnet defect is not erroneously determined as the free edge.

Then, the arithmetic operation section 113 performs luminance correction or emphasis processing as necessary to remarkably characterize the glass defect to be detected, and uses a conventional data conversion program such as Fourier transform or wavelet transform One-dimensional data of only the portion of the image data. In the plate glass inspection apparatus 100, ten types of data conversion programs are prepared, and the user can set parameters and setting values for each data conversion program and data conversion program to be used.

Next, the operation unit 113 calculates the defect candidate range.

3 is a diagram for explaining a defect candidate portion judging method of the calculating section 113. Fig.

3 shows a line indicating the level of one-dimensional data converted using the data conversion program. In FIG. 3, four threshold values of the + side failure threshold value 21, the + side warning threshold value 22, the - side warning threshold value 23 and the - side failure threshold value 24 are shown. Here, the four threshold values can be set by the user.

The calculation unit 113 regards the position where the one-dimensional data converted using the data conversion program is equal to or more than the + side warning threshold value 22 and the - side warning threshold value 23 as the defect candidate position, Quot; defect candidate portion 25 &quot;.

The calculating unit 113 then enlarges the defect candidate portion 25 in the glass width direction according to a predetermined rule to be described below and determines whether or not the defect of the plate glass used for the determination by the determination unit 120 The candidate range is calculated.

If the defect to be detected is less bent, the defect candidate portion 25 may be set to the defect candidate range without enlarging it in the glass width direction.

4 is a diagram showing the relationship between a defect candidate portion and a defect candidate range.

4 shows a line 32 indicating the level of the converted one-dimensional data by using the data conversion program. The one-dimensional data shown in Fig. 4 is divided into the width of the defect detection unit 31 having a predetermined width. Here, the division by the width of the defect detection unit 31 means that the one-dimensional data of only a portion corresponding to the free range is divided into a predetermined number from the center of the glass toward both ends to be divided into unit areas of the width of the defect detection unit 31 . Here, the straight line 36 on the lower side of the line 32 represents the corresponding relationship between the one-dimensional data and the unit area.

In the present embodiment, the width of the defect detection unit 31 corresponding to the width of 5 mm of the plate glass is determined, and the one-dimensional data of only the portion corresponding to the glass range is divided into unit regions each consisting of 50 pieces of data from one end do.

The operation unit 113 sets a unit area including one defect candidate as a defect candidate unit area for each unit area. In the example shown in Fig. 4, the operation unit 113 recognizes the unit area 33 and the unit area 34 as defect candidate unit areas. The calculation unit 113 recognizes the continuous unit area 33 and the unit area 34 as a defect candidate range 35 as a single unit.

If there is a plurality of defect candidates and a defect candidate range calculated based on each defect candidate portion is adjacent to each other, two adjacent defect candidate ranges are treated as one defect candidate range.

Subsequently, the calculation unit 113 recognizes the degree of defect of the defect candidate with respect to the defect candidate range 35. More specifically, as shown in Fig. 4, when there is at least one portion in the defect candidate range 35 that is equal to or more than the + side defect threshold value 21 or the - side defectiveness threshold value 24 or less Is recognized as a bad candidate. The calculation unit 113 also recognizes the candidate as a warning candidate when there is neither a positive defect threshold value 21 nor a negative defect threshold value 24 in the defect candidate range 35.

In the present embodiment, the detection unit 110 inspects the plate glass in the order in which the plates are formed, but if the order in which the plates are formed is managed, a plurality of plate glasses may be inspected in any order.

In the present embodiment, the detecting unit 110 inspects a predetermined partial range of the plate glass with respect to the drawing direction of the plate glass (corresponding to the direction B in Fig. 1), and detects the direction perpendicular to the drawing direction of the plate glass 1 direction C), the entire range of the plate glass is inspected. Here, the predetermined partial range is preferably set closer to the side to be molded later (upper side in FIG. 1) than to the side closer to the first molded side (lower side in FIG. 1). This is because, at an early stage in which defects occurring continuously occur, the possibility of quickly finding a defective sheet glass is increased.

Next, the determination unit 120 will be described in detail with reference to FIG. The judging unit 120 compares the first plate glass defect candidate range position with the second plate glass defect candidate range position and judges the presence or absence of a defect continuously occurring in the two plate glass based on the comparison result.

The determination section 120 includes a storage section 121, a comparison section 122, and a defect recognition section 123.

The storage unit 121 stores the position of the defect candidate range calculated in this test for the next plate glass inspection when the defect candidate range is detected by the operation unit 113. [

The comparator 122 compares the position of the defect candidate range with the position of the defective candidate range in the storage unit 121 when the defect candidate range is calculated by the detection unit 110 in this inspection, , The position of the defect candidate range detected in this test is compared with the position of the stored defect candidate range. The comparing unit 122 also checks whether or not there is a range to be overlapped. If there is an overlapped range, the comparator 122 determines that there is a continuous defect in both the plate glass examined in this test and the plate glass tested immediately before.

The defective portion 123 recognizes the degree of defects of the plate glass determined to be defective.

In the defect candidate range, the degree of defect of the defect candidate such as whether it is a defect candidate or a warning candidate is recognized by the operation unit 113. Therefore, when the defective candidate range recognized as overlapping range is recognized as a defective candidate, the defective portion 123 recognizes the defective degree of the corresponding plate glass as a defective product. On the other hand, when the defect candidate range recognized as overlapping range is recognized as a warning candidate, the defect 123 determines the degree of defect of the corresponding plate glass as a warning product. Also, the defective part 123 is recognized as a defective product when the defective product recognition and warning product recognition are duplicated in a single plate glass. In addition, the government 123, which is a defect, recognizes the non-defective sheet glass as a good product without accepting the rejected product or the warning product.

The comparison result by the comparison unit 122 and the recognition result by the unit 123 that is a defect are outputted and used for, for example, a molding process of a plate glass or a sampling inspection process.

In this embodiment, the judging unit 120 judges the plate glass in the order in which it is molded, but it may be judged in any order if only the forming order is managed.

The plate glass inspection apparatus 100 may be provided with a device for rejecting the plate glass recognized as a defective by the defective portion 123 so that the defective product is not put into the subsequent production process.

<Control method>

5 is a flowchart showing the outline of the inspection process. The outline of the inspection process will be described below with reference to Figs. 1, 2, and 5. Fig.

(1) The photographing unit 112 waits until the plate glass is conveyed to the preceding position a predetermined distance from the image introduction position (corresponding to the photographing point 18 in Fig. 1) (step S1).

(2) The photographing unit 112 waits for input of the movement pulse signal output from the pulse output unit 114 (step S2).

(3) The photographing section 112 introduces an image for one line (step S3).

(4) The introduction of the image is continued until the plate glass is conveyed backward by a predetermined distance from the image introduction position (step S4).

(5) When the introduction of the image is completed (step S4: NO), the arithmetic unit 113 averages only the data in the set range to calculate the one-dimensional data (step S5).

(6) The calculating unit 113 detects the free end from the one-dimensional data calculated in step S5, and extracts one-dimensional data of only the portion corresponding to the free range excluding the portion outside the free range (step S6).

(7) The operation unit 113 converts the one-dimensional data using the data conversion program (step S7).

(8) The calculating section 113 calculates a defect candidate range according to a predetermined rule (step S8).

(9) The calculation unit 113 calculates the degree of defect of the defect candidate range (step S9).

(10) When the comparing unit 122 inspects the plate glass in this inspection, it is determined whether or not the defect candidate range is calculated (step S10). If the defect candidate range is not calculated (step S10: NO), the process returns to step S1 for inspecting the next plate glass.

(11) If the defect candidate range is calculated (step S10: YES), the storage unit 121 stores the defect candidate range position of the plate glass calculated in this test for the next plate glass inspection (step S11).

(12) The comparing unit 122 determines whether the position of the defect candidate range is stored in the storage unit 121 when the inspected object formed immediately before is inspected (step S12). If not stored (step S12: NO), the process returns to step S1 to check the next plate glass.

(Step S12: YES), the comparing unit 122 compares the position of the defect candidate range detected in the present test with the position of the stored defect candidate range, and determines whether the overlapped range is (Step S13). If there is no overlapped range (step S13: NO), the process returns to step S1 to check the next plate glass.

(Step S13: YES), the comparator 122 determines that there is a defect in both of the plate glass inspected at this time and the plate glass inspected immediately before. In addition, the defective section 123 recognizes the degree of defects of the plate glass determined to be defective (S14).

[Modified Example 1]

<Overview>

Modified Example 1 shows a plate glass manufacturing apparatus equipped with the plate glass inspection apparatus according to the first embodiment.

<Configuration>

6 is a diagram schematically showing an apparatus 200 for manufacturing a planar glass according to Modification 1. Fig.

The plate glass manufacturing apparatus 200 includes a plate glass inspection apparatus 100 according to the first embodiment and a forming section 201. [

In the plate glass manufacturing apparatus 200 according to the first modification, the same constituent elements as those of the first embodiment of the plate glass inspection apparatus 100 are denoted by the same reference numerals and description thereof is omitted.

The molding part 201 is the same as the molding device 10 shown in Fig. 1 of the first embodiment.

<Summary>

As described above, according to the plate glass inspection apparatus of the first embodiment and the plate glass manufacturing apparatus of the first modification, images of two sheet glass plates formed in order are introduced, and the position of each defect candidate existing in two sheet glass images is It is possible to judge that the defect candidate of the two sheet glass is a glass defect. Therefore, compared with the case of inspecting an object to be inspected one by one in the inspection of glass defects such as spots which are generated continuously in a plurality of plate glasses at the time of molding the plate glass, the inspection accuracy at the time of judging whether the defect is defective can be increased have.

In addition, when the number of inspection apparatuses is increased, the inspection accuracy and the inspection speed can be improved as compared with the prior art.

INDUSTRIAL APPLICABILITY The present invention can be applied to inspections of glass defects such as spots which are generated continuously in a plurality of glass sheets during molding of glass sheets.

According to the present invention, it is possible to increase the inspection accuracy at the time of determining whether or not a defect is a defect without complicating the device configuration, and thus the value of industrial use is very high.

10: molding device 11: continuous plate glass
12: cutter 13: plate glass
14: Mali defect 15:
16: light source 17: line camera
18: Shooting point 19: Camera view
100: plate glass inspection device 110: detection part
111: conveying section 112: photographing section
113: Operation unit 114: Pulse output unit
120: Judgment section 121:
122: comparison unit 123: defect recognition unit
200: plate glass manufacturing apparatus 201: forming section

Claims (8)

A plate glass inspection apparatus for inspecting a plurality of plate glasses,
A defect candidate range of the first plate glass and a defect candidate range of the second plate glass different from the first plate glass;
And a determination unit that determines that there is a defect continuing to the first plate glass and the second plate glass when there is a range in which the defect candidate range position of the first plate glass overlaps the defect candidate range position of the second plate glass ,
Wherein the detecting unit includes a photographing unit and a calculating unit,
Wherein,
Introducing an image on the first sheet glass and the second sheet glass,
The operation unit,
And a defective candidate region extracting means for extracting a defect candidate portion based on the image introduced by the photographing section and enlarging the defect candidate portion in the glass width direction so as to make the defect candidate region larger than the defect candidate portion, Plate glass inspection system. The method according to claim 1,
Wherein the first plate glass and the second plate glass are plate glass formed by drawing a plate glass in a predetermined direction,
Wherein,
Taking a part of the first plate glass and a part of the second plate glass with respect to the predetermined direction,
And the entire range of the first plate glass and the entire range of the second plate glass are photographed with respect to a direction orthogonal to the predetermined direction. The method of claim 2,
And a conveying section for conveying the first plate glass and the second plate glass in the orthogonal direction with respect to the predetermined direction,
Wherein the photographing unit introduces an image at a fixed position in a conveying path of the first and second sheets of glass. The method of claim 3,
Wherein the conveying unit includes a pulse output unit for outputting a pulse corresponding to a movement amount of the plate glass,
Wherein the photographing unit introduces an image in accordance with the pulse. The method according to any one of claims 1 to 4,
Wherein the calculation unit calculates the one-dimensional data corresponding to the glass width direction, detects a glass end from the one-dimensional data, and excludes a portion outside the glass range from the one-dimensional data, And sets the defect candidate range based on the extracted one-dimensional data. 1. A plate glass inspection method for inspecting a plurality of plate glasses,
A detecting step of detecting a defect candidate range of the first plate glass and a defect candidate range of the second plate glass different from the first pane glass;
And a determination step of determining that there is a defect continuing from the first plate glass and the second plate glass when there is a range in which the defect candidate range position of the first plate glass overlaps the defect candidate range position of the second plate glass and,
Wherein the detecting step comprises:
Introducing an image on the first sheet glass and the second sheet glass;
Extracting a defect candidate portion based on the introduced image and setting the defect candidate range by enlarging the defect candidate portion in the glass width direction so that the defect candidate range is larger than the defect candidate portion; Method of inspecting plate glass. 1. A plate glass manufacturing apparatus for manufacturing a plurality of plate glasses,
A molding unit for molding a first plate glass, a second plate glass different from the first plate glass,
A detector for detecting a defect candidate range of the first plate glass and a defect candidate range of the second plate glass;
And a determination unit that determines that there is a defect continuing to the first plate glass and the second plate glass when there is a range in which the defect candidate range position of the first plate glass overlaps the defect candidate range position of the second plate glass ,
Wherein the detecting unit includes a photographing unit and a calculating unit,
Wherein,
Introducing an image on the first sheet glass and the second sheet glass,
The operation unit,
And a defective candidate region extracting means for extracting a defect candidate portion based on the image introduced by the photographing section and enlarging the defect candidate portion in the glass width direction so as to make the defect candidate region larger than the defect candidate portion, A device for manufacturing a plate glass. A method for manufacturing a plurality of plate glasses,
A forming step of forming a first plate glass and a second plate glass different from the first plate glass;
A detection step of detecting a defect candidate range of the first plate glass and a defect candidate range of the second plate glass;
And a determination step of determining that there is a defect continuing to the first plate glass and the second plate glass when a defect candidate range position of the first plate glass and a defect candidate range position of the second plate glass overlap each other and,
Wherein the detecting step comprises:
Introducing an image on the first sheet glass and the second sheet glass;
Extracting a defect candidate portion based on the introduced image and setting the defect candidate range by enlarging the defect candidate portion in the glass width direction so that the defect candidate range is larger than the defect candidate portion; Method of manufacturing a plate glass.
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Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN105121365B (en) * 2014-02-21 2017-09-19 安瀚视特控股株式会社 The manufacture method of glass plate and the manufacture device of glass plate
KR101733018B1 (en) * 2015-02-25 2017-05-24 동우 화인켐 주식회사 Apparatus and method for detecting defect of optical film
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Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2004125686A (en) * 2002-10-04 2004-04-22 Nippon Steel Corp Method and apparatus for detecting flaw of steel sheet, computer program, and computer-readable recording medium
JP2005069989A (en) * 2003-08-27 2005-03-17 Apollo Mec:Kk Inspection apparatus

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3218908B2 (en) * 1995-03-23 2001-10-15 日本鋼管株式会社 Surface flaw inspection method and apparatus
EP1816466B1 (en) * 2004-11-24 2010-06-23 Asahi Glass Company, Limited Method and device for inspecting defect of transparent plate body
JP4626982B2 (en) * 2005-02-10 2011-02-09 セントラル硝子株式会社 Defect detection device and detection method for end face of glass plate
US7283227B2 (en) * 2005-11-21 2007-10-16 Corning Incorporated Oblique transmission illumination inspection system and method for inspecting a glass sheet
WO2008072693A1 (en) * 2006-12-14 2008-06-19 Nippon Electric Glass Co., Ltd. Glass sheet defect detection device, glass sheet manufacturing method, glass sheet, glass sheet quality judging device, and glass sheet inspection method
JP2010019834A (en) * 2008-06-13 2010-01-28 Nippon Electric Glass Co Ltd Glass plate defect inspection apparatus and manufacturing method of glass plate for flat panel display
KR101609007B1 (en) * 2008-07-18 2016-04-04 아사히 가라스 가부시키가이샤 Image data processing apparatus and method for defect inspection, defect inspecting apparatus and method using the image data processing apparatus and method, board-like body manufacturing method using the defect inspecting apparatus and method, and recording medium
JP5206697B2 (en) * 2009-01-15 2013-06-12 新日鐵住金株式会社 Continuous defect determination method, continuous defect determination device, and program
JP5373593B2 (en) * 2009-12-25 2013-12-18 シャープ株式会社 Image processing method, image processing apparatus, program, and recording medium

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2004125686A (en) * 2002-10-04 2004-04-22 Nippon Steel Corp Method and apparatus for detecting flaw of steel sheet, computer program, and computer-readable recording medium
JP2005069989A (en) * 2003-08-27 2005-03-17 Apollo Mec:Kk Inspection apparatus

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