CN110646432A - Glass crack inspection system and method - Google Patents
Glass crack inspection system and method Download PDFInfo
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- CN110646432A CN110646432A CN201810670013.8A CN201810670013A CN110646432A CN 110646432 A CN110646432 A CN 110646432A CN 201810670013 A CN201810670013 A CN 201810670013A CN 110646432 A CN110646432 A CN 110646432A
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- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8806—Specially adapted optical and illumination features
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Abstract
The invention relates to a glass defect inspection system and a method, in the glass defect inspection system for inspecting the defects of a continuously conveyed glass substrate, the system comprises: an adapter in which a glass substrate is inserted and removed in a specific direction, and a viewing port capable of realizing light transmission is formed at a position where an upper surface and a lower surface face each other, and which is in a rectangular parallelepiped shape; more than one LED light source, locate at view port of the upper or lower surface of the said adapter, and illuminate the light to the direction of glass substrate in the adapter; more than two cameras, which are positioned on the upper surface of the adapter and shoot images of the glass substrate in the adapter; and an inspection unit for detecting defects of the glass substrate by receiving image information of the glass substrate photographed by the camera.
Description
Technical Field
The present invention relates to a glass defect inspection system, and more particularly, to a system for detecting various defects including cracks, chips, and lifting of glass edges or surfaces, which affect a production process, in real time when a touch screen-based mobile device such as a smart phone, a tablet computer, etc. and a protective glass applied to a display are produced.
Background
The invention relates to a glass defect inspection system, wherein Cover glass (Cover glass) is used as mobile equipment based on a touch screen such as a smart phone, a tablet personal computer and the like and protective glass applied to a display, and when the defects such as cracks, scraps, tilting and the like exist on the surface of the glass due to insufficient melting of glass raw materials, mixing of foreign matters, aging of the device, change of forming conditions and the like in the production process of the glass, damage or poor engineering is caused in a cavity in a CVD (chemical vapor deposition) process.
Therefore, it is required to accurately check whether foreign substances exist on the glass substrate provided before depositing the microcircuit pattern.
Accordingly, the present invention provides a system that is capable of detecting in real time various defects including cracks, chips, lifting, etc. of the edge or surface of glass that may occur when the glass is processed.
Next, the conventional techniques in the art to which the present invention pertains will be briefly described, and further, technical matters of the present invention different from the conventional techniques will be described.
First, korean granted patent No. 10-1127796 (2012.03.12) relates to a glass substrate crack inspection method and apparatus, and more particularly, describes a technique as follows: the periodicity of the inherent image pattern of the TFT glass substrate is converted into frequency information represented by digital data, the frequency information serving as a reference is stored in a database from the glass substrate without cracks, the frequency information of the glass substrate to be inspected is detected, then the frequency information serving as the reference is subtracted from the frequency information, and if a crack exists, the residual and detected specific frequency information is converted into image information and displayed, so that even a tiny crack can be detected.
Further, korean laid-open patent No. 10-2014-0060280 (2014.05.19) relates to a sheet glass inspection apparatus, a sheet glass inspection method, a sheet glass manufacturing apparatus, and a sheet glass manufacturing method, and more specifically describes a technique relating to the following sheet glass inspection apparatus: as a sheet glass inspection apparatus for inspecting a plurality of sheet glasses, comprising: a detection unit that detects a defect candidate range of a first flat glass sheet and a defect candidate range of a second flat glass sheet different from the first flat glass sheet; and a judging section that compares the defect candidate range position of the first flat glass with the defect candidate range position of the second flat glass, and judges whether or not there is a defect continuous to the first flat glass and the second flat glass based on the comparison result.
Further, korean patent No. 10-1209857 (2012.12.03) relates to an apparatus and method for inspecting foreign matter on a glass surface, and more particularly describes a technique as follows: the method includes the steps of arranging laser irradiation parts for detecting foreign matters of the glass substrate on the upper side surface and the lower side surface of the glass substrate respectively at a preset gap, and irradiating light emitted from the laser irradiation parts in a direction perpendicular to the conveying direction of the glass substrate, so that the foreign matters stuck on the surface of the glass can be accurately detected without omission.
The above-mentioned prior arts are similar to the present invention in that they are inspection technologies for defects of glass, but it is difficult to inspect minute defects in a chamber, and there are problems in terms of inspection, inspection accuracy, inspection speed, apparatus cost, and the like of all four sides including a fixing portion (finger) of a glass substrate, and the above problems are to be improved by the present invention.
Disclosure of Invention
The invention aims to provide a system for detecting various defects such as cracks, chippings, tilting and the like on the edge or the surface of a glass substrate in real time through image information.
It is another object of the present invention to provide a structure for supporting or moving the glass substrate so that the defect of the glass substrate is not disturbed by the structure for supporting or moving the glass substrate in the process of detecting the defect of the glass substrate.
According to an embodiment of the present invention, a glass defect inspection system for inspecting defects of a continuously transferred glass substrate includes: an adapter, wherein the glass substrate is inserted and removed along a specific direction, and a view port capable of realizing light transmission is formed on the upper surface of the adapter; one or more coaxial lights (coaxial lights) positioned above the top view port of the adapter for irradiating light to the direction of the glass substrate in the adapter; more than two cameras, which are positioned on the upper surface of the adapter and shoot images of the glass substrate in the adapter at a set resolution; and an inspection unit for detecting defects of the glass substrate by receiving image information of the glass substrate photographed by the camera, wherein the camera is selected according to a set resolution and a transfer speed of the glass substrate into and out of the adapter.
A reflector plate for reflecting light irradiated from the coaxial illumination toward the adapter inner glass substrate is disposed on a lower surface facing the adapter upper view port.
As another embodiment, a glass defect inspection system for inspecting defects of a continuously transferred glass substrate, comprising: an adapter, wherein a glass substrate is inserted and removed along a specific direction, and a view port capable of realizing light transmission is formed at a position where an upper surface and a lower surface face each other; more than one backlight (back light) which is positioned at the lower part of the lower surface view port of the adapter in order to irradiate light to the direction of the glass substrate in the adapter; more than two cameras, which are positioned on the upper surface of the adapter and shoot images of the glass substrate in the adapter at a set resolution; and an inspection unit for detecting defects of the glass substrate by receiving image information of the glass substrate photographed by the camera, wherein the camera is selected according to a set resolution and a transfer speed of the glass substrate into and out of the adapter.
As still another embodiment, a glass defect inspection system for inspecting defects of a continuously transferred glass substrate, comprising: an adapter, wherein a glass substrate is inserted and removed along a specific direction, and a view port capable of realizing light transmission is formed at a position where an upper surface and a lower surface face each other; one or more coaxial lights (coaxial lights) and one or more backlight lights (back lights), the coaxial lights being positioned above the upper surface view port of the adapter and the backlight lights being positioned below the lower surface view port of the adapter for directing light toward the glass substrate within the adapter; more than two cameras, which are positioned on the upper surface of the adapter and shoot images of the glass substrate in the adapter at a set resolution; and an inspection unit for detecting defects of the glass substrate by receiving image information of the glass substrate photographed by the camera, wherein the camera is selected according to a set resolution and a transfer speed of the glass substrate into and out of the adapter.
In one embodiment, the adapter may include a glass substrate transfer unit for supporting and transferring a glass substrate, and the fixing unit for supporting the glass substrate in the glass substrate transfer unit may be made of a transparent material, or may be made of a transparent Quartz (Quartz) or polycarbonate (Polycabonate) material so that an edge surface portion of the glass substrate supported by the fixing unit may be inspected.
The inspection unit may analyze a parameter of the received image information to determine whether or not the glass substrate has a defect, and the parameter of the image information may be one or more of a contrast, a shape of the defect, a size of the defect, and a position of the defect apart from the chamfer.
Further, the inspection unit may compare the image information received from the glass substrate determined to have a defect in the parameter analysis with the image information of the normal glass when a specific pattern or form needs to be distinguished, and may operate in any one of the following modes when a defect is detected in the glass substrate: a first mode of notifying a manager of a defect result in a wired/wireless manner; a second mode of stopping the transfer of the glass substrate and notifying a manager of a defect result in a wired/wireless manner; a third mode in which the glass substrate on which the defect is detected is discharged through a different path from a normal glass substrate; and a fourth mode in which the glass substrate on which the defect is detected is discharged through a different path from the normal glass substrate, and the defect result is notified to the administrator by a wired/wireless method.
The invention relates to a glass defect inspection system, wherein light of coaxial illumination and/or backlight illumination is irradiated to a glass substrate in an adapter through a view port positioned at the lower part and/or the upper part of the adapter, and image information of the irradiated glass is collected by more than one camera at the view port positioned at the upper part of the adapter to judge whether defects exist, thereby realizing tiny defect inspection which cannot be carried out by the conventional glass inspection device such as laser, frequency and the like, realizing image confirmation after inspection, providing inspection reliability, and accurately detecting various defects such as cracks, scraps, tilting and the like on the edge or the surface of the glass substrate in real time.
A flow is constructed based on the above inspection results so that various appropriate processes such as stop processes, expert inspections, alarms, and the like can be performed, whereby the productivity of the glass substrate can be improved.
Also, a transparent glass substrate fixing part (finger) such as PC or quartz is used, thereby improving a portion that is covered by the glass substrate fixing part and cannot be inspected.
Drawings
Fig. 1 is a diagram for illustrating the types of glass defects.
FIG. 2 is a diagram for explaining a glass defect inspection system according to an embodiment of the present invention.
Fig. 3 is a diagram for explaining a glass defect inspection system according to still another embodiment of the present invention.
Fig. 4 is a diagram for explaining a glass defect inspection system according to still another embodiment of the present invention.
FIG. 5 illustrates the process of taking an image of glass in the glass defect inspection system of the present invention.
Fig. 6 is an exemplary view of a fishbone (fish bone) and a robot finger portion disposed at a distal end of the fishbone according to an embodiment of the invention.
Fig. 7 is an exemplary view for explaining a finger part of the fishbone robot according to an embodiment of the invention.
Fig. 8 is an image taken by a glass defect inspection system to which a transparent robot finger according to an embodiment of the present invention is applied.
Fig. 9 is a flowchart for explaining a glass defect inspection method according to an embodiment of the present invention.
Description of the symbols
10: glass substrate 100: glass defect inspection system
110: the adapter 111: viewport
112: fixing part 113: fish bone
120: the camera 130: LED light source
135: the reflection plate 140: inspection section
Detailed Description
Hereinafter, preferred embodiments of a glass defect inspection system according to the present invention will be described in detail with reference to the accompanying drawings so that those having the basic knowledge in the technical field to which the present invention pertains can easily carry out the present invention.
In the drawings of the present invention, for clarity of the present invention, the structure is illustrated in a size larger or smaller than that of the actual structure, and a known structure is omitted, and a characteristic structure is shown, so that the present invention is not limited to the case shown in the drawings.
In describing the principle of the preferred embodiment of the present invention in detail, if it is determined that detailed description of related known techniques or configurations may unnecessarily obscure the gist of the present invention, detailed description thereof will be omitted.
Further, the embodiment described in the present specification and the configuration shown in the drawings are only the most preferable embodiment of the present invention and do not represent all the technical ideas of the present invention, and therefore it should be understood that various equivalents and modifications capable of replacing them may exist from the time point of application of the present invention.
As shown in fig. 1, cracks (crack), lift-off (chipping), chipping (chipping), edge defects (edge defect), stain (stain), scratch (scratch), etc. may occur at the edge surface or surface of a glass substrate in a glass substrate manufacturing process (CVD process).
The present invention is used for detecting defects of an edge face or a surface of a glass substrate, which may occur in a glass substrate production process (CVD process), thereby reducing a defective rate of the glass substrate and improving productivity.
In the present invention, the coaxial illumination (coaxial light) is a case where light is irradiated to the upper surface of the glass substrate by a light source disposed coaxially with the camera, and the backlight illumination (back light) is a case where light is irradiated to the lower surface of the glass substrate while being positioned coaxially with the camera. Coaxial illumination and backlighting may use a wide variety of light sources, but LED illumination is most preferred.
To this end, the present invention is characterized by comprising: an adapter (adapter) for allowing the glass substrate to enter and exit in a specific direction and forming a view port on the upper surface thereof, the view port being capable of light transmission; one or more coaxial lights (coaxial lights) positioned above the top view port of the adapter for irradiating light to the direction of the glass substrate in the adapter; more than two cameras, which are positioned on the upper surface of the adapter and shoot images of the glass substrate in the adapter at a set resolution; and an inspection unit for detecting defects of the glass substrate by receiving image information of the glass substrate photographed by the camera, wherein the camera is selected according to a set resolution and a transfer speed of the glass substrate into and out of the adapter.
In addition, the present invention may further include, on a lower surface opposite to the adapter upper surface view port: and a reflecting plate for reflecting the light irradiated from the coaxial illumination toward the glass substrate in the adapter.
According to another example of the present invention, a glass defect inspection system for inspecting defects of a continuously transported glass substrate, includes: an adapter, wherein a glass substrate is inserted and removed along a specific direction, and a view port capable of realizing light transmission is formed at a position where an upper surface and a lower surface face each other; more than one backlight (back light) which is positioned at the lower part of the lower surface view port of the adapter in order to irradiate light to the direction of the glass substrate in the adapter; more than two cameras, which are positioned on the upper surface of the adapter and shoot images of the glass substrate in the adapter at a set resolution; and an inspection unit for detecting defects of the glass substrate by receiving image information of the glass substrate photographed by the camera, wherein the camera is selected according to a set resolution and a transfer speed of the glass substrate into and out of the adapter.
According to still another example of the present invention, there is provided a glass defect inspection system for inspecting defects of a continuously transferred glass substrate, comprising: an adapter, wherein a glass substrate is inserted and removed along a specific direction, and a view port capable of realizing light transmission is formed at a position where an upper surface and a lower surface face each other; one or more coaxial lights (coaxial lights) and one or more backlight lights (back lights), wherein the coaxial lights are positioned on the upper part of the upper surface view port of the adapter and the backlight lights are positioned on the lower part of the lower surface view port of the adapter in order to irradiate light to the direction of the glass substrate in the adapter; more than two cameras, which are positioned on the upper surface of the adapter and shoot images of the glass substrate in the adapter at a set resolution; and an inspection unit for detecting defects of the glass substrate by receiving image information of the glass substrate photographed by the camera, wherein the camera is selected according to a set resolution and a transfer speed of the glass substrate into and out of the adapter.
Hereinafter, the configuration of the present invention will be described in more detail with reference to the drawings.
Fig. 2 to 4 are diagrams for explaining a glass defect inspection system 100 according to an embodiment of the present invention.
As shown, the glass defect inspection system 100 of the present invention may include an adapter 110, a camera 120, a light source 130, an inspection unit 140, and a reflection plate 135 (fig. 2).
The adapter 110 transfers the glass substrate 10 to detect defects on the edge surface or the surface of the glass substrate 10, and is generally in the form of a rectangular parallelepiped case, but is not limited thereto.
If foreign matter such as dust sticks to the glass substrate 10 in the glass substrate production process, there is a risk that the foreign matter will cause poor circuit deposition and will not work properly after depositing the microcircuit pattern on the surface of the glass substrate. Therefore, preferably, the entire face of the adapter 110 is covered by the adapter 110 housing.
The adapter 110 includes a glass substrate transfer unit that fixes a glass substrate and transfers the glass substrate from an entrance to an exit, and the entrance through which the glass substrate enters and exits is formed at the front and rear surfaces.
A view port (viewport)111 is formed on the upper surface of the adapter 110, and the view port 111 may be formed of a material that allows light to pass through, or may be formed as a hole (hole), so that the camera 120 does not interfere with the collection of the image of the glass substrate due to distortion of light.
Further, another view port 111 may be formed on the lower surface portion of the adapter 110 at a position vertically opposite to the view port 111 on the upper surface portion, and the light source 130 or the reflector 135 may be formed on the view port 111 on the lower surface portion of the adapter 110 formed in this manner.
The glass crack inspection system shown in fig. 2 includes: a coaxial illumination 130 which is positioned on the same axis as a camera which irradiates the upper surface of the glass substrate through a view port 111 formed on the upper surface of the adapter 110; and a reflecting plate located on a lower surface of the adapter 110 so as to face the coaxial illumination.
The glass crack inspection system shown in fig. 3 has view ports 111 formed on the upper and lower surfaces of the adapter facing each other, and a backlight 130 irradiates the lower surface of the glass substrate through the view ports on the lower surface.
In the glass crack inspection system shown in fig. 4, the upper surface and the lower surface of the adapter are opposed to each other to form the view ports 111, and the upper surface and the lower surface of the glass substrate are irradiated with the coaxial illumination and the backlight illumination through the view ports 111 formed in the upper surface and the lower surface, respectively.
The camera 120 is positioned above the upper view port 111 of the adapter 110, captures an image of a portion of the glass substrate, which is positioned in a direction perpendicular to the lower view port 111 from the view port 111 on the upper surface of the adapter 110, among portions of the glass substrate transferred in the adapter 110, and transmits the image to the inspection unit 140.
In this case, the camera to be used should be selected so as to capture an image satisfying a set resolution, and the camera should be selected in consideration of a required resolution of the image and a transfer speed of the glass substrate. For example, when the glass substrate is transferred at a speed of 4600mm/s and the desired image has a pixel size (pixel size) of 50 μm, a camera having a line rate of at least 92KHz is selected. In general, when the glass substrate is transferred at a speed ranging from 1000mm/s to 4600mm/s and the pixel size is 50 μm, the line frequency corresponds to a range of about 40KHz to 100 KHz.
If a camera having a line frequency smaller than the line frequency of the camera required for the transfer speed and the set resolution of the glass substrate is used, the captured image is unclear, and it is difficult to accurately detect the defect of the glass substrate.
FIG. 5 illustrates the process of taking an image of glass in the glass defect inspection system of the present invention.
In this case, the glass defect inspection system 100 of the present invention uses two cameras 120 when configured for inspecting only both edge portions of a glass substrate, but is not limited to this, and in response to this, two view ports 111 on the upper surface portion of the adapter 110 are formed. As shown in fig. 5, two cameras 120 are disposed on the edge surface of the glass to be inspected to capture images of the glass surface.
In the case of inspecting the entire edge surface and the surface of the glass substrate, two or more cameras are necessary according to the camera imaging angle, but the present invention is not limited thereto, and a camera capable of imaging the entire surface of the glass including the edge surface of the glass according to the camera imaging angle is necessary.
The view port 111 on the upper surface of the adapter 110 may be formed corresponding thereto, or an extended view port 111 may be formed, so that the plurality of cameras 120 collect images of the edge surface and the surface of the glass substrate through the view port 111.
That is, the view port 111 is preferably configured as a rectangular view port in which two of the two sides of the glass substrate or four sides of the view port can be observed.
As described above, the light source 130 is positioned on the upper surface and/or the lower surface of the adapter 110 to irradiate light onto the upper surface and/or the lower surface of the glass substrate positioned on the line connecting the upper and lower surface portions of the adapter 110, so that when the camera 120 captures an image of the glass substrate, it is possible to more accurately collect a defect of the glass substrate and a foreign object image.
In addition, in order to more accurately capture the defect and foreign object image of the glass substrate by the camera 120 when the light source 130 is positioned on the upper surface of the adapter 110 and irradiates light to the upper surface of the glass substrate, a reflecting plate 135 for reflecting the light to the lower surface of the glass substrate may be disposed in the view port 11 of the lower surface portion of the adapter 110 so that the light of the light source is irradiated to the lower surface of the glass substrate.
The inspection part 140 receives image information of the glass substrate photographed by the camera 120 to inspect whether there is a defect thereof, and controls operations of the adapter 110, the camera 120, and the illumination.
In the first inspection, when a Defect (Defect) exists, the inspection unit selects and calculates one or more specific parameter values, such as contrast, Defect shape, Defect size, Defect position from the chamfer, and the like, which can be determined whether or not the Defect exists, by a filtering algorithm (filtering algorithm) with reference to the chamfer line of the glass fed in. Judging whether the glass has defects from the calculated parameter values, and classifying the glass as normal glass if the glass is judged not to have any defects which may be defects. In the present invention, a value that is a property capable of determining whether or not glass is defective may be selected as the "parameter".
Even if there is no defect in the introduced glass in reality, traces such as minute dust or foreign matter may occur on the glass surface in the process, and in this case, it is possible to determine that there is a defect in the glass in the inspection based on the parameter value performed at the time of the first inspection. In other words, in the first inspection, even if there is any defect that may be a defect, it is determined that there is a defect.
Since there is a possibility that the above-described case, that is, the case where the defect is determined to be present although there is no defect, a second inspection is added to the glass determined to be defective. The second inspection requires a precise inspection of the glass, and in this case, the types (or forms) of defects are classified into type 1, type 2, and type 3 based on the first inspection result in order to shorten the inspection time. The types of defects may be divided into various types as shown in fig. 1, and are not limited only to the types shown in fig. 1.
After the types are separated, a plurality of types of determination criteria are applied based on each type combination. Depending on the type, defects may be determined by parameter values such as contrast (gray level), angle of cut, and the like, and in order to measure these parameter values, a specific function such as shake correction or Image resizing may be involved.
In a specific case, that is, in a case where it is necessary to distinguish a specific pattern of a defect or a defect form from each other in addition to the judgment based on such parameters, in order to judge whether or not the specific image is normal, the specific image is compared with a Database (DB) in which images of normal glass (mother glass) are stored, and whether or not the glass has a defect is checked, and a final inspection result is obtained.
Also, when the inspection unit 140 detects a defect of the glass substrate from the image information received from the camera 120, it may notify a manager of the detected defect result, or stop the transfer of the glass substrate, or discharge the glass substrate through a path different from a normal glass substrate, or perform a control operation in which the above operations are mixed.
That is, when a defect is detected in a glass substrate, the inspection unit 140 may operate in any one of a first mode in which a defect result is notified to a manager in a wired/wireless manner, a second mode in which the transfer of the glass substrate is stopped and the defect result is notified to the manager in a wired/wireless manner, a third mode in which the glass substrate on which the defect is detected is discharged through a path different from a normal glass substrate, and a fourth mode in which the glass substrate on which the defect is detected is discharged through a path different from a normal glass substrate and the defect result is notified to the manager in a wired/wireless manner.
Fig. 6 is an exemplary view of a fishbone (fish bone)113 and a robot finger part 112 disposed at a distal end of the fishbone according to an embodiment of the invention, and fig. 7 is an exemplary view for explaining the fishbone robot finger part according to an embodiment of the invention.
As shown in the drawing, in the glass substrate transfer part for fixing and transferring the glass substrate in the adapter 110, since the fixing part 112 corresponding to the finger part of the robot fixes the edge surface of the glass substrate, the image information of the edge surface part of the glass substrate fixed by the fixing part 112 cannot be collected in the camera 120, and if there is a defect in the glass part where the fixing part is located, the defect cannot be grasped, and there may be a problem in the production process.
In order to solve these problems, in the present invention, the fixing part 112 is formed of a transparent material that can transmit light, so that image information of the entire glass substrate including the edge surface portion of the glass substrate that cannot be photographed due to the conventional fixing part can be collected. The fixing portion 112 is preferably made of Quartz (Quartz) or Polycarbonate (Polycarbonate) which is a transparent material.
Fig. 8 is an image taken by the glass defect inspection system 100 to which the transparent robot finger (fixing part) according to the embodiment of the present invention is applied, and illustrates a case where a defect occurring at an edge surface covered by the fixing part 112 is also sensed because the transparent fixing part is used.
Fig. 9 is a flowchart for explaining a glass defect inspection method according to an embodiment of the present invention.
As shown in fig. 9, the glass defect inspection method of the present invention first selects a camera according to a set resolution and a transfer speed of a substrate, and transfers the glass substrate into an adapter (S501). The camera is selected to have a line frequency that satisfies the resolution required for the captured image, as described above.
The adapter recognizes an ID (identification number) of the glass substrate that is introduced (S502), and scans an image of an edge face and/or a surface of the glass substrate in real time by a camera formed at the viewport (S503).
Based on the image scanned by the camera, whether a defect exists is judged by comparing with the normal glass information, or whether a defect exists is determined by judging whether a portion of uneven light exists in the scanned image information, and if it is judged that the glass substrate has a defect, the position and size of the defect in the glass are measured (S504).
The inspection result for whether the glass substrate is defective and the size of the defective portion is stored and output through a display (S505).
When the defect is not found, the glass substrate is normally discharged (S506), and when the defect is found, the glass substrate is operated in any one of a first mode in which a defect result is notified to a manager in a wired/wireless manner, a second mode in which the transfer of the glass substrate is stopped and the defect result is notified to the manager in a wired/wireless manner, a third mode in which the glass substrate in which the defect is detected is discharged through a path different from that of the normal glass substrate, and a fourth mode in which the glass substrate in which the defect is detected is discharged through a path different from that of the normal glass substrate and the defect result is notified to the manager in a wired/wireless manner (S507).
Although the present invention has been described with reference to the embodiments shown in the drawings, these are merely illustrative, and it will be understood by those having ordinary skill in the art that various modifications and equivalent other embodiments can be made. Therefore, the technical scope of the present invention should be determined by the claims.
Claims (13)
1. A glass defect inspection system for inspecting defects of a glass substrate which is continuously transferred, comprising:
an adapter, wherein the glass substrate is inserted and removed along a specific direction, and a view port capable of realizing light transmission is formed on the upper surface of the adapter;
more than one coaxial lighting, in order to irradiate the light to the direction of the glass substrate in the adapter, the lighting is positioned on the upper part of the viewport on the upper surface of the adapter;
more than two cameras, which are positioned on the upper surface of the adapter and shoot images of the glass substrate in the adapter at a set resolution; and
an inspection unit for receiving image information of the glass substrate photographed by the camera and detecting a defect of the glass substrate,
wherein the camera is selected according to a set resolution and a transfer speed of the glass substrate in and out of the adapter.
2. The glass defect inspection system of claim 1,
a reflector plate for reflecting light irradiated from the coaxial illumination toward the inner glass substrate of the adapter is disposed on a lower surface opposite to the upper view port of the adapter.
3. A glass defect inspection system for inspecting defects of a glass substrate which is continuously transferred, comprising:
an adapter, wherein a glass substrate is inserted and removed along a specific direction, and a view port capable of realizing light transmission is formed at a position where an upper surface and a lower surface face each other;
more than one back light illumination, which is positioned at the lower part of the lower surface view port of the adapter in order to irradiate light to the direction of the glass substrate in the adapter;
more than two cameras, which are positioned on the upper surface of the adapter and shoot images of the glass substrate in the adapter at a set resolution; and
an inspection unit for receiving image information of the glass substrate photographed by the camera and detecting a defect of the glass substrate,
wherein the camera is selected according to a set resolution and a transfer speed of the glass substrate in and out of the adapter.
4. A glass defect inspection system for inspecting defects of a glass substrate which is continuously transferred, comprising:
an adapter, wherein a glass substrate is inserted and removed along a specific direction, and a view port capable of realizing light transmission is formed at a position where an upper surface and a lower surface face each other;
more than one coaxial illumination and more than one backlight illumination, in order to irradiate light to the direction of the glass substrate in the adapter, the coaxial illumination is positioned on the upper part of the upper surface view port of the adapter, and the backlight illumination is positioned on the lower part of the lower surface view port of the adapter;
more than two cameras, which are positioned on the upper surface of the adapter and shoot images of the glass substrate in the adapter at a set resolution; and
an inspection unit for receiving image information of the glass substrate photographed by the camera and detecting a defect of the glass substrate,
wherein the camera is selected according to a set resolution and a transfer speed of the glass substrate in and out of the adapter.
5. The glass defect inspection system of any of claims 1 to 4,
the adapter includes a glass substrate transfer part for supporting and transferring a glass substrate, and a fixing part for supporting the glass substrate in the glass substrate transfer part is made of a transparent material so that an edge surface portion of the glass substrate supported by the fixing part can be inspected.
6. The glass defect inspection system of claim 5,
the fixing part is made of transparent quartz or polycarbonate.
7. The glass defect inspection system of any of claims 1 to 4,
the inspection unit analyzes the parameters of the received image information to determine whether the glass substrate has a defect.
8. The glass defect inspection system of claim 7,
the parameter of the image information is more than one of contrast, defect shape, defect size and defect position apart from the chamfer.
9. The glass defect inspection system of claim 7,
the inspection unit compares the image information received from the glass substrate determined to have a defect in the parameter analysis with the image information of the normal glass when a specific pattern or form needs to be distinguished.
10. The glass defect inspection system of any of claims 1 to 4,
the inspection section operates in any one of the following modes when a defect is detected in the glass substrate:
a first mode of notifying a manager of a defect result in a wired/wireless manner;
a second mode of stopping the transfer of the glass substrate and notifying a manager of a defect result in a wired/wireless manner;
a third mode in which the glass substrate on which the defect is detected is discharged through a different path from a normal glass substrate;
and a fourth mode in which the glass substrate on which the defect is detected is discharged through a different path from the normal glass substrate, and the defect result is notified to the administrator by a wired/wireless method.
11. A glass defect inspection method is characterized by comprising the following steps:
selecting a camera according to the set resolution and the transfer speed of the substrate;
transferring the glass substrate into an adapter;
the adapter identifies an ID of an incoming glass substrate;
the light source is positioned on the upper part of the upper surface view port of the adapter and/or on the lower part of the lower surface view port of the adapter, and irradiates light to the direction of the glass substrate in the adapter;
scanning images of the edge face and/or the surface of the glass substrate in real time;
judging whether the glass substrate has defects or not based on the scanned image;
measuring the position and size of the defect in the glass substrate under the condition that the glass substrate is judged to have the defect;
the inspection results for whether the glass substrate is defective and the size of the defective portion are stored and output through a display.
12. The glass defect inspection method according to claim 11,
in the step of determining whether the glass substrate has a defect, analyzing the parameters of the received image information to determine whether the glass substrate has a defect,
the parameter of the image information is more than one of contrast, defect shape, defect size and defect position apart from the chamfer.
13. The glass defect inspection method according to claim 11,
in the step of determining whether the glass substrate is defective, if it is necessary to distinguish a specific pattern or form, the received image information of the glass substrate determined to be defective in the parameter analysis is compared with the image information of normal glass.
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| CN201810670013.8A CN110646432A (en) | 2018-06-26 | 2018-06-26 | Glass crack inspection system and method |
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| CN201810670013.8A CN110646432A (en) | 2018-06-26 | 2018-06-26 | Glass crack inspection system and method |
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Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US11836912B2 (en) * | 2020-09-22 | 2023-12-05 | Future Dial, Inc. | Grading cosmetic appearance of a test object based on multi-region determination of cosmetic defects |
| US11900581B2 (en) | 2020-09-22 | 2024-02-13 | Future Dial, Inc. | Cosmetic inspection system |
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2018
- 2018-06-26 CN CN201810670013.8A patent/CN110646432A/en active Pending
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US11836912B2 (en) * | 2020-09-22 | 2023-12-05 | Future Dial, Inc. | Grading cosmetic appearance of a test object based on multi-region determination of cosmetic defects |
| US11900581B2 (en) | 2020-09-22 | 2024-02-13 | Future Dial, Inc. | Cosmetic inspection system |
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Application publication date: 20200103 |