JP2016156814A - Optical film defect detecting device and method - Google Patents

Abstract

PROBLEM TO BE SOLVED: To provide an optical film defect defecting device and method.SOLUTION: An optical film defect detecting device includes: a receiving unit which receives defect information of an optical film roll from at least one inspection device; a defect position determining unit which determines a defect position on a two-dimensional plane corresponding to the optical film roll on the basis of the defect information; a searching unit which searches for a region in which defects are present over the number of defects already set on the two-dimensional plane on the basis of the defect position; and a defect detecting unit which detects a dense defect on the basis of the density of the defects included in the searched region.SELECTED DRAWING: Figure 1

Description

  The present invention relates to a technique for detecting defects that occur in the process of an optical film.

  In general, when a large number of defects occur in a certain area during the process of optical film roll, the area is designated as a special management area and further inspected by an inspector.

  At this time, the inspector looks at the defect detection map (two-dimensional graph) and determines whether or not the defect is a dense defect. However, since the level of skill among inspection staff is different and it is difficult to perceive a difference in the density standard between defects due to changes in the scale of the X / Y axis of the defect detection map, it is accurate for many rolls. In addition, it is difficult to confirm and manage a consistent congestion defect. Furthermore, when inspection is performed by an inspector, there is a problem that the inspection work requires a lot of cost and time.

Korean Unexamined Patent Publication No. 2009-0009314

  An object of the present invention is to provide a defect detection apparatus and method for detecting a density defect occurring in the process of an optical film.

1. A receiver for receiving defect information of the optical film roll from at least one inspection device;
Based on the defect information, a defect position determination unit that determines a position of a defect on a two-dimensional plane corresponding to the optical film roll;
Based on the position of the defect, a search unit that searches for an area where the number of defects or more already set on the two-dimensional plane exists,
A defect detection apparatus for an optical film, comprising: a defect detection unit that detects a density defect based on the density of the defects included in the searched area.

2. In the item 1, the search unit includes:
A search area having a certain size including the position of each defect is set for each defect position, and the position of the search area is sequentially changed around each defect position. A defect detection device for an optical film that searches for the region in which the number of defects equal to or greater than the preset number is present.

3. In the item 1, the search unit includes:
A plurality of search areas having a certain size with the position of each defect as a central coordinate, and a defect in the optical film that searches for the area in which there are more than the set number of defects among the search areas Detection device.

4). In the item 1, the search unit includes:
An optical film defect detection device that divides the two-dimensional plane into a plurality of search areas having a predetermined size, and searches the divided search areas for the areas where the defects equal to or more than the preset number are present. .

5. In the item 1, the search unit includes:
A search area of a certain size is set on the two-dimensional plane, the position of the search area is sequentially changed by a certain distance, and the areas where the defects of the number already set or more exist in each search area. Optical film defect detection device to search for.

6). In the item 1, the defect detection unit includes:
A memory unit for storing the position of the searched area;
A candidate area determination unit that determines a defect candidate area based on the position of the searched area;
A defect determination unit that calculates the density of the defects included in the defect candidate area, and determines whether or not the density defect exists in the defect candidate area based on the calculated density. Including an optical film defect detection device.

7). In the item 6, the candidate area determination unit
An optical film defect detection apparatus for determining the searched area as the defect candidate area.

8). In the item 7, the candidate area determination unit
An optical film defect detection device that, when there is an overlapping or continuous area among the searched areas, integrates the overlapping area or the continuous area and determines the integrated area as the defect candidate area.

9. In the item 8, the candidate area determination unit
An optical film defect detection apparatus for determining, as the defect candidate area, a minimum area including all the defects included in each area for each of the searched area or the integrated area.

10. In the item 6, the memory unit includes:
An optical film defect detection device for storing position information of the searched area using a two-dimensional array.

11 In the item 6, the density is
An optical film defect detection device including at least one of the number of defects per unit area of the defect candidate area and the total area occupied by the defects in the defect candidate area.

12 In the item 9, the density is
An optical film defect detection apparatus including an area of the minimum region.

13. In the item 6, the defect determination unit includes:
An optical film defect detection device that determines that the density is poor when the density is equal to or greater than a preset value.

14 In the item 1, the defect detection unit includes:
An optical film defect detection apparatus including a defect detection information generation unit that generates defect detection information including information related to the occurrence position of the density defect in the process line of the optical film when the density defect is detected.

15. In the item 14, the defect detection information generation unit includes:
An optical film defect detection device that transmits the defect detection information to at least one of a process management system manager terminal, an optical film worker terminal, and an alarm device on the process line. .

16. Receiving optical film roll defect information from at least one inspection device;
Determining a position of a defect on a two-dimensional plane corresponding to the optical film roll based on the defect information;
Based on the position of the defect, searching for an area in which the number of defects or more already set on the two-dimensional plane exists;
A defect detection method for an optical film, comprising: detecting a density defect based on the density of the defects included in the searched area.

17. In the item 16, the searching step includes:
For each defect position on the two-dimensional plane, a search area having a fixed size including each defect position is set, and the position of the search area is sequentially changed around each defect position. And the defect detection method of the optical film which searches the said area | region in which the said predetermined number or more of said defect exists among each search area | region.

18. In the item 16, the searching step includes:
A plurality of search areas having a certain size with the position of each defect as a central coordinate, and a defect in the optical film that searches for the area in which there are more than the set number of defects among the search areas Detection method.

19. In the item 16, the searching step includes:
An optical film defect detection method for dividing the two-dimensional plane into a plurality of search areas having a predetermined size, and searching the divided search areas for the areas having the predetermined number or more of the defects. .

20. In the item 16, the searching step includes:
An optical for setting a search area of a certain size on the two-dimensional plane, sequentially changing the position of the search area, and searching for the area in which the number of the defects more than the preset number exists in each search area Film defect detection method.

21. In the item 16, the detecting step includes:
Storing the location of the searched area;
Determining a defect candidate area based on the position of the searched area;
Calculating the density of the defects included in the defect candidate area;
Determining a presence or absence of the density defect in the defect candidate area based on the calculated density.

22. In the item 21, the step of determining the defect candidate area includes:
An optical film defect detection method for determining the searched area as the defect candidate area.

23. In the item 22, the step of determining the defect candidate area includes:
A method for detecting a defect in an optical film, in which, when there is an overlapping or continuous area among the searched areas, the overlapping area or the continuous area is integrated, and the integrated area is determined as the defective candidate area.

24. In the item 23, the step of determining the defect candidate area includes:
An optical film defect detection method for determining, as the defect candidate area, a minimum area including all of the defects included in each area for each of the searched area or the integrated area.

25. In the item 21, the storing step includes:
An optical film defect detection method for storing position information of the searched area using a two-dimensional array.

26. In the item 21, the density is
An optical film defect detection method including at least one of the number of defects per unit area of the defect candidate area and a total area occupied by the defects in the defect candidate area.

27. In the item 24, the density is
An optical film defect detection method including an area of the minimum region.

28. In the item 21, the determining step includes:
A method for detecting a defect in an optical film, in which, when the degree of congestion is equal to or greater than a preset value, the density is determined to be poor.

29. In the item 16,
An optical film defect detection method, further comprising: generating defect detection information including information related to the occurrence position of the congestion defect in the process line of the optical film when the congestion defect is detected.

30. In item 29 above,
The optical film further includes a step of transmitting the defect detection information to at least one of a process management system manager terminal, an optical film operator terminal of the optical film, and an alarm device on the process line. Defect detection method.

31. Combined with hardware,
Receiving optical film roll defect information from at least one inspection device;
Determining a position of a defect on a two-dimensional plane corresponding to the optical film roll based on the defect information;
Based on the position of the defect, searching for an area in which the number of defects or more already set on the two-dimensional plane exists;
A computer program stored in a recording medium for causing a computer to execute a step of detecting a density defect based on the density of the defects included in the searched area.

  According to the present invention, the quality of the optical film is controlled based on a consistent standard regardless of the production amount of the optical film by automatically determining whether or not the density defect included in the optical film has occurred. In addition, the productivity can be improved by shortening the detection time of the denseness defect.

  In addition, according to the present invention, by promptly grasping and notifying the occurrence of denseness failure in an optical film, it is possible to quickly take measures against the occurrence of denseness failure, and to reduce production loss (Loss of optical film). ) Can be reduced.

FIG. 1 is a configuration diagram of an optical film defect detection apparatus according to an embodiment of the present invention. FIG. 2 is a detailed configuration diagram of the defect detection unit according to the embodiment of the present invention. FIG. 3 is an exemplary diagram for explaining a process of searching for a region where a defect exists. FIG. 4 is an exemplary diagram for explaining a process of searching for a region where a defect exists. FIG. 5 is an exemplary diagram for explaining a process of searching for a region where a defect exists. FIG. 6 is an exemplary diagram for explaining a process of searching for a region where a defect exists. FIG. 7 is an exemplary diagram for explaining the setting of defect candidate areas. FIG. 8 is an exemplary diagram for explaining the setting of defect candidate areas. FIG. 9 is an exemplary diagram for explaining the setting of a defect candidate area. FIG. 10 is an exemplary diagram for explaining the setting of a defect candidate area. FIG. 11 is an exemplary diagram for explaining the setting of a defect candidate area. FIG. 12 is a flowchart of an optical film defect detection method according to an embodiment of the present invention. FIG. 13 is a flowchart illustrating a process of detecting a congestion defect according to an embodiment of the present invention.

  Hereinafter, specific embodiments of the present invention will be described with reference to the drawings. The following detailed description is provided to assist in a comprehensive understanding of the methods, apparatus, and / or systems described herein. However, these are only examples, and the present invention is not limited to these.

  In describing the embodiment of the present invention, when it is determined that there is a possibility that a specific description of a related known technique may obscure the gist of the present invention, a detailed description thereof will be omitted. Moreover, the term mentioned later is a term defined in consideration of the function in this invention, and may differ with a user, an operator's intention, or a custom. Therefore, the definition should be made based on the contents throughout this specification. The terminology used in the detailed description is merely to describe the embodiments of the present invention and should not be limiting in any way. Unless expressly used to the contrary, the singular forms include the plural forms. In this description, expressions such as “including” or “comprising” are intended to refer to any property, number, step, action, element, part or combination thereof, Or should not be interpreted as excluding the existence or possibility of other characteristics, numbers, steps, acts, elements, parts or combinations thereof.

  FIG. 1 is a configuration diagram of an optical film defect detection apparatus according to an embodiment of the present invention.

  Referring to FIG. 1, an optical film defect detection apparatus 100 according to an embodiment of the present invention includes a reception unit 110, a defect position determination unit 120, a search unit 130, and a defect detection unit 140.

  The receiving unit 110 receives defect information on the optical film roll from at least one inspection device. At this time, each inspection apparatus is arranged at a different position on the process line of the optical film, and means an apparatus for detecting defects generated in the optical film manufacturing process and generating defect information regarding the detected defects. To do.

  For example, the inspection apparatus may include a camera module disposed on the upper surface of the optical film in the process line of the optical film so that the optical film is photographed using the camera module and a defect is detected from the photographed image. It may be configured. For this purpose, a light source can be provided on the surface opposite to the surface on which the camera module is located, using the optical film as a reference. The camera module may be configured to capture light emitted from the light source and transmitted through the optical film. In this case, when there is a defect in the optical film, the pertinent portion has a low light transmittance, so that the defect can be easily detected.

  Note that the defect information generated by the inspection apparatus can include the position, size, and brightness of the detected defect, an image of the detected defect, an inspection start time, an end time, and the like.

  The defect position determination unit 120 determines the position of the defect on the two-dimensional plane corresponding to the optical film roll based on the defect information received from the inspection apparatus.

  For example, the defect position determination unit 120 configures a two-dimensional plane corresponding to the length and width of the optical film roll, integrates defect information received from each inspection apparatus, and determines the position of the defect on the two-dimensional plane. Can be determined. At this time, the position of the defect on the two-dimensional plane can be determined based on the defect position included in the defect information received from each inspection apparatus. Moreover, the length and width | variety of an optical film roll can use the preset value.

  Based on the position of the defect determined by the defect position determination unit 120, the search unit 130 searches for an area where there are more than the number of defects already set on the two-dimensional plane.

  For example, the search unit 130 sets a search area of a certain size, and counts the number of defects included in the search area while circulating around the set search area on a two-dimensional plane, It is possible to search for an area where there are more than a predetermined number of defects. This will be specifically described with reference to FIGS.

  3 to 6, a region represented by a dotted line represents a search region, and a portion represented by a circle represents a defective position. 3 to 6 show that the search area has a quadrangular shape, the present invention is not limited to this. For example, the search area may be circular, and can be transformed into an appropriate shape by user selection. In addition, the size of the search area can be set by the user in consideration of, for example, calculation load and calculation accuracy.

  According to an embodiment of the present invention, the search unit 130 may set a search area having a certain size including each defect position for each defect position included in the two-dimensional plane. it can. Then, the search unit 130 can change the position of the search area around the position of each defect, and search for an area in which more than a preset number of defects exist in each search area.

  Specifically, referring to FIG. 3, the search unit 130 can set a search region 321 including a specific defect 310 among a plurality of defects included on the two-dimensional plane 300. Then, the search unit 130 can count the number of defects in the set search area 321 and determine whether or not the number of defects is equal to or greater than the number already set.

  Next, the search unit 130 moves the search area 321 by a certain distance in the X-axis direction around the position of the defect 310, counts the number of defects in the search area 322 at the moved position, and the number of defects is already set. It is possible to determine whether or not the number is more than the specified number.

  Next, the search unit 130 further moves the search area 322 about the position of the defect 310 by a certain distance in the X-axis direction, counts the number of defects in the search area 323 at the moved position, and the number of defects is already It can be determined whether or not the number is greater than the set number.

  Next, the search unit 130 moves the search area 323 by a certain distance in the Y-axis direction around the position of the defect 310, counts the number of defects in the search area 324 at the moved position, and the number of defects is already set. It is possible to determine whether or not the number is more than the specified number.

  Thus, the search unit 130 sequentially moves the search area by a certain distance in the X-axis and Y-axis directions around the specific defect 310, and counts the number of defects in the search area at each position. It is possible to search for an area including a set number of defects or more.

  In the illustrated example, the moving distance of the search area can be set in advance by the user.

  Further, the search unit 130 sets a search area for each defect included in the two-dimensional plane 300 in the same manner, and moves within the search area at each position while moving the set search area. It can be determined whether or not the number of defects included is greater than or equal to a preset number.

  On the other hand, according to another embodiment of the present invention, the search unit 130 sets a search area having a certain size with the position of each defect as a central coordinate in a two-dimensional plane, and is already set in each search area. It is possible to search for a region where there are more than a few defects.

  As a specific example, referring to FIG. 4, for each defect included in the two-dimensional plane 400, the search unit 130 has a search area 410 having a certain size with each defect as a central coordinate. 420, 430, 440, and 450 can be set. Then, the search unit 130 can count the number of defects for each of the search areas 410, 420, 430, 440, and 450, and search for an area that includes more than a predetermined number of defects. .

  Meanwhile, according to still another embodiment of the present invention, the search unit 130 divides the two-dimensional plane into a plurality of search areas having a certain size, and the number of search areas that have been set is greater than or equal to a predetermined number. A region where a defect exists can be searched.

  As a specific example, referring to FIG. 5, the search unit 130 can divide the two-dimensional plane 500 into search areas 510, 520, 530, and 540 having a certain size. Then, the search unit 130 can count the number of defects included in each of the search areas 510, 520, 530, and 540, and determine whether or not more defects than the preset number are included. .

  On the other hand, according to another embodiment of the present invention, the search unit 130 sets a search area of a certain size in the two-dimensional plane, sequentially changes the position of the search area in the two-dimensional plane, and each search area Among them, it is possible to search for an area where there are more than a predetermined number of defects.

  As a specific example, referring to FIG. 6, the search unit 130 can set a search area 610 having a certain size at a specific position on the two-dimensional plane 600. Then, the search unit 130 can count the number of defects in the set search area 610 and determine whether or not the number of defects is equal to or greater than the number already set.

  Next, the search unit 130 sequentially moves the search area 610 by a certain distance in the Y-axis direction, counts the number of defects in the search areas 620, 630, 640, and 650 at each position, and the number of defects is already set. It is possible to determine whether the number is greater than or equal to the number.

  If the search area cannot be moved further in the Y-axis direction, the search unit 130 moves the search area by a certain distance in the X-axis direction, and then counts the number of defects in the search area 660. It is possible to determine whether or not the number of defects is equal to or greater than a preset number.

  Next, the search unit 130 sequentially moves the search area 660 again by a certain distance in the X-axis direction, counts the number of defects in the search area at each position, and the number of defects is equal to or more than the preset number. It can be determined whether or not.

  By such a method, the search unit 130 uses the search area to circulate the entire area of the two-dimensional plane 600, counts the number of defects in the search area at each position, and exceeds the preset number. A region where a defect exists can be searched.

  In the example shown in FIG. 6, the moving direction and moving distance of the search area can be set in advance by the user.

  The defect detection unit 140 can detect a density defect based on the density of defects included in the area searched by the search unit 130. Here, the denseness failure means that a plurality of failures are densely packed in a certain region.

  Specifically, the defect detection unit 140 can set one or more defect candidate areas based on the area searched by the search unit 130. In addition, the defect detection unit 140 can detect the density defect by calculating the density of defects included in each set defect candidate area.

  FIG. 2 is a detailed configuration diagram of the defect detection unit 140 according to an embodiment of the present invention.

  Referring to FIG. 2, the defect detection unit 140 according to an embodiment of the present invention includes a memory unit 141, a candidate area determination unit 142, a defect determination unit 143, and a defect detection information generation unit 144.

  The memory unit 141 can store the position of the area searched for by the search unit 130 where there are more than the preset number of defects. Specifically, the memory unit 141 can store the position on the two-dimensional plane of the area searched by the search unit 130. According to the embodiment of the present invention, the memory unit 141 can be realized in the form of an image buffer configured by a two-dimensional array corresponding to a two-dimensional plane, and can be an area searched by the search unit 120 using the two-dimensional array. Can be stored.

  The candidate area determination unit 142 can determine one or more defect candidate areas based on the position of the searched area stored in the memory unit 141.

  For example, the candidate area determination unit 142 can determine each searched area stored in the memory unit 141 as a defective candidate area.

  At this time, according to an embodiment of the present invention, the candidate area determination unit 142 integrates the overlapping or continuous areas when there are overlapping or continuous areas among the searched areas stored in the memory unit 141. Then, the integrated area can be determined as the defect candidate area. At this time, a labeling algorithm such as a Blob Labeling algorithm may be used for integration of overlapping or continuous regions.

  As a specific example, referring to FIG. 7, regions 711, 712, and 713 searched by the search unit 130 on the two-dimensional plane 710 corresponding to the optical film roll are stored in the memory unit 141 configured in a two-dimensional array. The data can be stored in the corresponding positions 721, 722, 723 of the storage area 720, respectively.

  At this time, the candidate area determination unit 142 can determine the areas 721, 722, and 723, which are areas searched by the search unit 130, as defective candidate areas, respectively.

  As another example, in FIG. 7, since the area 721 and the area 722 are continuous areas, the candidate area determination unit 142 converts the area 721 and the area 722 as shown in the example shown in FIG. The areas are integrated into one area 724, and the integrated areas 724 and 723 can be determined as defect candidate areas, respectively.

  As another example, referring to FIG. 9, the areas 911, 912, and 913 searched by the search unit 130 on the two-dimensional plane 910 corresponding to the optical film roll are stored in the memory unit 141 configured in a two-dimensional array. The data can be stored in the corresponding positions 921, 922, and 923 of the area 920, respectively.

  At this time, the candidate area determination unit 142 can determine the areas 921, 922, and 923, which are areas searched by the search unit 130, as defective candidate areas.

  As another example, since the area 921 and the area 922 of the searched areas stored in the memory unit 141 overlap with each other, the candidate area determination unit 142 includes the area 921 and the area 922. The areas can be integrated into one area 924 as in the example shown in FIG. 10, and the integrated areas 924 and 923 can be determined as defect candidate areas, respectively.

  On the other hand, according to an embodiment of the present invention, the candidate area determination unit 142 determines, for each of the areas searched by the search unit 130 or the integrated area, a minimum area that includes all the defects included in each area. It can be determined as a defect candidate area.

  As a specific example, referring to FIGS. 10 and 11, the candidate area determination unit 142 includes all the defects included in each area for each of the integrated area 924 and the non-integrated area 923. The minimum areas 925 and 926 can be set, and the set minimum areas 925 and 926 can be determined as defect candidate areas, respectively.

  In the example shown in FIG. 11, the minimum area has a quadrangular shape. However, the present invention is not limited to this, and the minimum area has various shapes such as a circular shape. Also good.

  The defect determination unit 143 can detect a density defect based on the density of defects included in each defect candidate area.

  For example, the defect determination unit 143 can calculate the density of defects included in the defect candidate area, and can determine that the density is poor when the calculated density is equal to or greater than a preset value. At this time, the density can be calculated as, for example, the total area occupied by each defect in the defect candidate region.

  As another example, when the defect candidate area is determined as the minimum areas 925 and 926 shown in FIG. 11, the density can be calculated as the area of the minimum area.

  As yet another example, the density may be calculated as the number of defects per unit area of the defect candidate region. At this time, the number of defects per unit area can be calculated as a value obtained by dividing the number of defects included in the defect candidate area by the area of the defect candidate area.

  The defect detection information generation unit 144 can generate defect detection information related to the detected congestion defect when a congestion defect is detected. At this time, the defect detection information can include, for example, information on the occurrence position of the density defect in the defect detection process line of the optical film, and the occurrence position of the density defect in the process line of the optical film is on the optical film. It can be calculated on the basis of the detected position of occurrence of the density defect. For example, the defect detection information generation unit 144 is based on the transport direction of the optical film in the process line of the optical film, based on the distance from the start position of the optical film to the occurrence position of the congestion defect detected by the optical film, It is possible to determine the occurrence position of the density defect in the process line of the optical film.

  On the other hand, according to an embodiment of the present invention, the defect detection information generation unit 144 generates generated defect detection information on, for example, a process management system administrator terminal, a process line operator terminal, or a process line. By transmitting to the alarm device, it is possible to take a quick measure against the occurrence of a congestion defect.

  FIG. 12 is a flowchart of an optical film defect detection method according to an embodiment of the present invention.

  Referring to FIG. 12, the optical film defect detection apparatus 100 receives optical film roll defect information from at least one inspection apparatus (1210).

  Thereafter, the optical film defect detection device 100 determines the position of the defect on the two-dimensional plane corresponding to the optical film roll based on the received defect information (1220).

  Thereafter, the optical film defect detection device 100 searches for a region where there are more than a predetermined number of defects on the two-dimensional plane based on the determined defect positions (1230).

  For example, the optical film defect detection apparatus 100 sets a search area of a certain size including each defect position for each defect position in a two-dimensional plane, and centers each defect position. By sequentially changing the position of the search area, it is possible to search for an area where there are more than a predetermined number of defects among the search areas.

  As another example, the optical film defect detection device 100 sets a plurality of search areas having a fixed size with the position of each defect included in the two-dimensional plane as a central coordinate, It is possible to search for an area where there are more than a set number of defects.

  As still another example, the optical film defect detection apparatus 100 divides a two-dimensional plane into a plurality of search areas having a certain size, and among the divided search areas, there are more than the predetermined number of defects. An existing area can be searched.

  As yet another example, the optical film defect detection device 100 sets a search area having a certain size in a two-dimensional plane, sequentially changes the position of the search area, and sets the number of search areas that are already set in each search area. It is possible to search for a region where the above defects exist.

  Thereafter, the optical film defect detection device 100 detects a density defect based on the density of defects included in the searched area (1240).

  Thereafter, the optical film defect detection device 100 generates defect detection information relating to the detected congestion defect (1250). At this time, the defect detection information can include, for example, information on the occurrence position of the density defect in the process line of the optical film.

  Thereafter, the optical film defect detection device 100 transmits the generated defect detection information to, for example, a process management system manager terminal, a process line operator terminal, or an alarm device on the process line (1260). ).

  FIG. 13 is a flowchart illustrating a process of detecting a congestion defect according to an embodiment of the present invention.

  Referring to FIG. 13, the optical film defect detection apparatus 100 stores the position of the area searched in the search step (1230) of FIG. 12 (1310). At this time, the optical film defect detection apparatus 100 can store the position information of the searched area using the two-dimensional array.

  Thereafter, the optical film defect detection device 100 determines a defect candidate area based on the searched position of the area (1320).

  For example, the optical film defect detection device 100 can determine each searched area as a defect candidate area.

  As another example, the optical film defect detection device 100 integrates overlapping or continuous areas in the searched areas when overlapping or continuous areas exist, and integrates the integrated areas into defect candidate areas. Can be determined as

  As yet another example, the optical film defect detection device 100 determines, as a defect candidate area, a minimum area that includes all defects included in each area for each of the searched areas or the integrated areas. be able to.

  Thereafter, the optical film defect detection device 100 calculates the density of defects included in the defect candidate region (1330).

  Here, the density can be calculated as, for example, the total area occupied by each defect in the defect candidate area, or the number of defects per unit area of the defect candidate area.

  As another example, when the defect candidate area is determined as the minimum areas 925 and 926 shown in FIG. 11, the density can be calculated as the area of the minimum area.

  Thereafter, the optical film defect detection device 100 determines the presence / absence of a density defect in the defect candidate area based on the calculated density (1340).

  For example, the optical film defect detection device 100 can determine that the density is poor when the calculated density is equal to or greater than a preset value.

  In the flowcharts of FIGS. 12 and 13, the method is divided into a plurality of stages, but at least some of the stages are executed in a different order, executed in combination with other stages, or omitted. Alternatively, the process may be performed in fine steps, or one or more steps not shown may be added and executed.

  On the other hand, the embodiment of the present invention may include a computer-readable recording medium including a program for executing the method described in this specification on a computer. The computer-readable recording medium may include program instructions, local data files, local data structures, etc. alone or in combination. The medium may be one specially designed and constructed for the present invention or one that is normally usable in the field of computer software. Examples of computer-readable recording media include magnetic media such as hard disks, floppy (registered trademark) disks and magnetic tape, optical recording media such as CD-ROM and DVD, and magnetic media such as floppy (registered trademark) disks. Optical media and hardware devices specially configured to store and execute program instructions such as ROM, RAM, flash memory, and the like are included. Examples of the program instructions include not only machine language codes created by a compiler but also high-level language codes that can be executed by a computer using an interpreter or the like.

  As mentioned above, although some embodiment of this invention was described, these embodiment is shown as an example and is not intending limiting the range of invention. These novel embodiments can be implemented in various other forms, and various omissions, replacements, and changes can be made without departing from the scope of the invention. These embodiments and modifications thereof are included in the scope and gist of the invention, and are included in the invention described in the claims and the equivalents thereof.

100: optical film defect detection device 110: reception unit 120: defect position determination unit 130: search unit 140: defect detection unit 141: memory unit 142: candidate region determination unit 143: defect determination unit 144: defect detection information generation unit

Claims (31)

A receiver for receiving defect information of the optical film roll from at least one inspection device;
Based on the defect information, a defect position determination unit that determines a position of a defect on a two-dimensional plane corresponding to the optical film roll;
Based on the position of the defect, a search unit that searches for an area where the number of defects or more already set on the two-dimensional plane exists;
A defect detection device for an optical film, comprising: a defect detection unit that detects a density defect based on the density of the defects included in the searched area.   The search unit sets a search area having a certain size including each defect position for each defect position, and sequentially changes the position of the search area around each defect position. And the defect detection apparatus of the optical film of Claim 1 which searches the said area | region where the said defect more than the said preset number exists among each search area | region.   The search unit sets a plurality of search areas having a fixed size with the position of each defect as a central coordinate, and searches the search areas for the areas where the number of defects already set is present. The optical film defect detection device according to claim 1.   The search unit divides the two-dimensional plane into a plurality of search areas having a certain size, and searches the divided search areas for the areas in which the number of defects or more already set exists. The optical film defect detection device according to claim 1.   The search unit sets a search area of a certain size in the two-dimensional plane, sequentially changes the position of the search area by a fixed distance, and the number of the defects that are already set or more in each search area The optical film defect detection device according to claim 1, wherein the existing region is searched. The defect detection unit
A memory unit for storing the position of the searched area;
A candidate area determination unit that determines a defect candidate area based on the position of the searched area;
A defect determination unit that calculates the density of the defects included in the defect candidate area, and determines whether or not the density defect exists in the defect candidate area based on the calculated density. An optical film defect detection device according to claim 1, comprising:   The optical film defect detection device according to claim 6, wherein the candidate area determination unit determines the searched area as the defect candidate area.   The candidate area determination unit integrates the overlapping area or the continuous area when there is an overlapping or continuous area among the searched areas, and determines the integrated area as the defective candidate area. The optical film defect detection device according to claim 7.   The candidate area determination unit determines, as the defect candidate area, a minimum area that includes all of the defects included in each area for each of the searched area or the integrated area. An optical film defect detection device as described in 1 above.   10. The optical film defect detection device according to claim 6, wherein the memory unit stores position information of the searched area using a two-dimensional array. 11.   11. The density according to claim 6, wherein the density includes at least one of the number of defects per unit area of the defect candidate area and a total area occupied by the defects in the defect candidate area. The optical film defect detection device according to any one of the above.   The optical film defect detection device according to claim 9, wherein the density includes an area of the minimum region.   The optical film defect detection device according to any one of claims 6 to 12, wherein the defect determination unit determines that the congestion is poor when the density is equal to or greater than a preset value.   The defect detection unit includes a defect detection information generation unit that generates defect detection information including information related to the occurrence position of the congestion defect in the process line of the optical film when the congestion defect is detected. 14. The optical film defect detection device according to any one of 1 to 13.   The defect detection information generation unit supplies the defect detection information to at least one of a process management system administrator terminal, an optical film operator terminal of the process line, and an alarm device on the process line. The optical film defect detection device according to claim 14, which transmits the optical film. Receiving optical film roll defect information from at least one inspection device;
Determining a position of a defect on a two-dimensional plane corresponding to the optical film roll based on the defect information;
Based on the position of the defect, searching for an area in which the number of defects or more already set on the two-dimensional plane exists;
And detecting a density defect based on the density of the defects included in the searched area.   In the searching step, a search area having a certain size including each defect position is set for each defect position on the two-dimensional plane, and the search is performed around each defect position. The optical film defect detection method according to claim 16, wherein the position of the region is sequentially changed, and the region in which the number of the defects equal to or greater than the preset number is searched among the search regions.   In the searching step, a plurality of search areas having a certain size with the position of each defect as a central coordinate are set, and the search area is searched for the areas where the number of defects or more already set is present. The optical film defect detection method according to claim 16.   The searching step divides the two-dimensional plane into a plurality of search areas having a certain size, and searches the divided search areas for the areas in which the number of defects or more that is already set exists. The optical film defect detection method according to claim 16.   The searching step sets a search area of a certain size on the two-dimensional plane, sequentially changes the position of the search area, and there are more than the predetermined number of defects in each search area. The optical film defect detection method according to claim 16, wherein the region is searched. The detecting step includes
Storing the location of the searched area;
Determining a defect candidate area based on the position of the searched area;
Calculating the density of the defects included in the defect candidate area;
21. The optical film defect detection method according to claim 16, further comprising: determining whether or not the density defect exists in the defect candidate area based on the calculated density.   The optical film defect detection method according to claim 21, wherein the step of determining the defect candidate area determines the searched area as the defect candidate area.   In the step of determining the defect candidate area, when there is an overlapping or continuous area among the searched areas, the overlapping area or the continuous area is integrated, and the integrated area is set as the defect candidate area. The optical film defect detection method according to claim 22, wherein the optical film defect detection method is determined.   The step of determining the defect candidate area determines, for each of the searched area or the integrated area, a minimum area that includes all the defects included in each area as the defect candidate area. The optical film defect detection method according to claim 23.   The optical film defect detection method according to any one of claims 21 to 24, wherein the storing step stores position information of the searched area using a two-dimensional array.   26. The density according to any one of claims 21 to 25, wherein the density includes at least one of the number of defects per unit area of the defect candidate area and a total area occupied by the defects in the defect candidate area. The defect detection method of the optical film in any one.   The optical film defect detection method according to claim 24, wherein the density includes an area of the minimum region.   The optical film defect detection method according to any one of claims 21 to 27, wherein the determining step determines that the density is poor when the density is equal to or greater than a preset value.   29. The method according to any one of claims 16 to 28, further comprising: generating defect detection information including information related to the occurrence position of the density defect in the process line of the optical film when the density defect is detected. Optical film defect detection method.   The method further comprises: transmitting the defect detection information to at least one of a process management system manager terminal, an optical film operator terminal of the optical film, and an alarm device on the process line. Item 30. A defect detection method for optical films according to Item 29. Combined with hardware,
Receiving optical film roll defect information from at least one inspection device;
Determining a position of a defect on a two-dimensional plane corresponding to the optical film roll based on the defect information;
Based on the position of the defect, searching for an area in which the number of defects or more already set on the two-dimensional plane exists;
A computer program stored in a recording medium for causing a computer to execute a step of detecting a density defect based on the density of the defects included in the searched area.

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